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1、 Reference number ISO 7637-3:2007(E) ISO 2007 INTERNATIONAL STANDARD ISO 7637-3 Second edition 2007-07-01 Road vehicles Electrical disturbances from conduction and coupling Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines Vhicules routi
2、ers Perturbations lectriques par conduction et par couplage Partie 3: Transmission des perturbations lectriques par couplage capacitif ou inductif le long des lignes autres que les lignes dalimentation Copyright International Organization for Standardization Provided by IHS under license with ISO Li
3、censee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobes licensing policy, this file may b
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6、ile is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. COPYRIGHT PROTECTED DOCUMENT ISO 2007 All rights reserved. Unless otherwise specified, no part of this publication may be repr
7、oduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22
8、749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO 2007 All rights reserved Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/
9、2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) ISO 2007 All rights reserved iii Contents Page Foreword iv Introduction v 1 Scope . 1 2 Normative references. 1 3 Test methods. 2 3.1 General. 2 3.2 Standard test conditions 3 3.3 Ground plane.
10、 3 3.4 Test set-up. 3 3.5 Application of transient test pulses 8 4 Test instrument description and specification 10 4.1 Power supply. 10 4.2 Oscilloscope 10 4.3 Test pulse generator. 10 4.4 Capacitive coupling clamp 14 4.5 Direct coupling capacitor. 17 4.6 Inductive coupling clamp. 17 Annex A (norma
11、tive) Calibration fixture used for the ICC test method 18 Annex B (informative) Example of test severity levels associated with functional performance status classification 19 Annex C (informative) Estimation of the inductive coupling factor 22 Bibliography. 24 Copyright International Organization f
12、or Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) iv ISO 2007 All rights reserved Foreword ISO (the Internatio
13、nal Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been
14、established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standar
15、dization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for v
16、oting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all s
17、uch patent rights. ISO 7637-3 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3, Electrical and electronic equipment. This second edition cancels and replaces the first edition (ISO 7637-3:1995), which has been technically revised. It also incorporates the Technical Cor
18、rigendum ISO 7637-3:1995/Cor.1:1995. ISO 7637 consists of the following parts, under the general title Road vehicles Electrical disturbances from conduction and coupling: Part 1: Definitions and general considerations Part 2: Electrical transient conduction along supply lines only Part 3: Electrical
19、 transient transmission by capacitive and inductive coupling via lines other than supply lines Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction o
20、r networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) ISO 2007 All rights reserved v Introduction Experience collected over a long period of immunity testing of instruments, equipment and devices under test (DUTs) shows that a test simulating transient coupling phenomena is needed
21、 for a sufficient coverage of the wide range of electric and electromagnetic interferences. The knowledge of these facts is common among electomagnetic conductivity (EMC) experts, and many companies have developed such coupling tests. The fast transient test uses bursts composed of a number of fast
22、transients, which are coupled into lines of electronic equipment, in particular input/output (I/O) lines. The fast rise time, the repetition rate and the low energy of the fast transient bursts are significant to the test. The slow transient test uses a single pulse similar to that used for conducte
23、d transient, applied a number of times to the DUT. During system development, the production wiring harness is not available and the vehicles electrical noises are not known. The test shall therefore be performed with the worst case situation, which is represented by the capacitive and inductive cou
24、pling described in this part of ISO 7637. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,-
25、 Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- INTERNATIONAL STANDARD ISO 7637-3:2007(E
26、) ISO 2007 All rights reserved 1 Road vehicles Electrical disturbances from conduction and coupling Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines 1 Scope This part of ISO 7637 establishes a bench top test for the evaluation of the im
27、munity of devices under test (DUTs) to transient transmission by coupling via lines other than supply lines. The test transient pulses simulate both fast and slow transient disturbances, such as those caused by the switching of inductive loads and relay contact bounce. Three test methods are describ
28、ed in this part of ISO 7637: the capacitive coupling clamp (CCC) method; the direct capacitive coupling (DCC) method; and the inductive coupling clamp (ICC) method. NOTE The applicability of the three test methods is shown in Table 1. Only one test method need be selected for slow transients and onl
29、y one method need be selected for fast transients. This part of ISO 7637 applies to road vehicles fitted with nominal 12 V, 24 V or 42 V electrical systems. For transient immunity, Annex B provides recommended test severity levels in line with the functional performance status classification (FPSC)
30、principle described in ISO 7637-1. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments)
31、applies. ISO 7637-2, Road vehicles Electrical disturbances from conduction and coupling Part 2: Electrical transient conduction along supply lines only Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie
32、 Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) 2 ISO 2007 All rights reserved 3 Test methods 3.1 General This clause describes methods for testing the immunity of electrical system components or devices under test (DU
33、Ts) against coupled transients. These tests shall be performed in the laboratory. The test pulse severity levels should be mutually agreed upon between the vehicle manufacturer and the supplier prior to the test. The test pulses defined are typical pulses which represent the characteristics of most
34、of the actual transients which may occur in the vehicle. In special cases, it may be necessary to apply additional test pulses. Some test pulses may be omitted if a device, depending on its function or its configuration, is not influenced by comparable transients in the vehicle. It is part of the ve
35、hicle manufacturers responsibility to define the test pulses needed for specific components. A test plan shall be written to define the test methods to be used, the test pulses to be applied, the test pulse amplitudes, the number of pulses to be applied, the DUT operating modes, the wiring harness (
36、test versus production), the leads to be included in the capacitive coupling clamp, if used, the leads to be tested using the direct coupling capacitor method, if used, the capacitance values to be used, if the direct coupling capacitor method is used, the leads to be included in the inductive coupl
37、ing clamp, if used, the type of inductive coupling clamp, if the inductive coupling method is used. Suggested values for the evaluation of immunity of DUTs can be chosen from Tables B.1, B.2, B.3 and B.4. The applicability of the three different test methods is indicated in Table 1. Only one test me
38、thod need be selected for slow transients and only one method need be selected for fast transients. Table 1 Test method applicability Transient type CCC method DCC method ICC method Slow pulses of 4.3.3 Not applicable Applicable Applicable Fast pulses a and b of 4.3.2 Applicable Applicable Not appli
39、cable Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) ISO 2007 All rig
40、hts reserved 3 3.2 Standard test conditions The ambient temperature during the test shall be (23 5) C. Unless otherwise defined in this part of ISO 7637, the tolerance on time, resistance and capacitance is 10 %. Unless otherwise defined in this part of ISO 7637, the tolerance on voltage is 10 0 + %
41、. The supply voltage shall be as shown in Table 2 unless other values are agreed upon by the users of this part of ISO 7637, in which case such values shall be documented in the test reports. Table 2 Test voltages Nominal system voltage V Test voltage V 12 13,5 0,5 24 27 1 42 42 1,5 3.3 Ground plane
42、 The ground plane shall be a metallic sheet (e.g. copper, brass or galvanized steel) with a minimum thickness of 1 mm. The minimum size of the ground plane shall be 2 m 1 m; however, the final size depends on the dimensions of the DUT and the test harness. The ground plane shall be connected to the
43、facility earth ground. 3.4 Test set-up 3.4.1 General The DUT is arranged and connected according to its requirements. The DUT should be connected to the original operating devices (loads, sensors, etc.) using a test harness or the production wiring harness, as agreed upon between the vehicle manufac
44、turer and the supplier. If the actual DUT operating signal sources are not available they may be simulated. The DUT shall be separated from the ground plane by an insulating support having a thickness of 0,05 m to 0,1 m, unless the DUT case is connected to the chassis and has its own ground connecti
45、on. The DUT shall be connected to the grounding system according to the manufacturers installation specification; no additional grounding connections are allowed. Where possible, all loads, sensors, etc. are connected to the ground plane using the shortest possible lead length. NOTE To minimize extr
46、aneous capacitive coupling to the DUT, it is advisable that the minimum distance between the DUT and all other conductive structures, such as walls of a shielded room (with the exception of the ground plane underneath the test set-up), be more than 0,5 m. 3.4.2 Capacitive coupling clamp (CCC) method
47、 The CCC method is suitable for coupling the fast transient test pulses, particularly for DUTs with a moderate or large number of leads to be tested. It will not couple the slow transient test pulse. Copyright International Organization for Standardization Provided by IHS under license with ISO Lice
48、nsee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 07/16/2007 00:40:39 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO 7637-3:2007(E) 4 ISO 2007 All rights reserved The test method using the CCC is shown in Figure 1. The coupling circuit consists of a CCC through which all lines of the DUT are installed as agreed between the vehicle manufa