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1、J IS JAPANESE I N DUSTR IAL STANDARD Translated and Published by Japanese Standards Association Geometrical Product Specif ications (GPS)-Acceptance and reverification tests for coordinate measuring machines (CMM)-Part 1 : Vocabulary ICs 01.040.17; 17.040.30 Reference number : JIS B 7440-1 : 2003 (E
2、) PROTECTED BY COPYRIGHT 19 S Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted without license from IHS -,-,- B 7440-1 : 2003 (IS0 10360-1
3、 : 2000) Foreword This translation has been made based on the original Japanese Industrial Standard established by the Minister of Economy, Trade and Industry through deliberations at the Japanese Industrial Standards Committee according to the proposal of establishing a Japanese Industrial Standard
4、 from Japanese Standards Association (JSA), with a draft of Industrial Standard based on the provision of Article 12 Clause 1 of the Industrial Standardization Law. This Standard has been made based on IS0 10360-1 : 2000 Geometrical Product Specifications (GPSj-Acceptance and reverification tests fo
5、r coordinate measuring machines (CMMj-Part 1 : Vocabulary for the purposes of making it easier to compare this Standard with International Standard; to prepare Japanese Industrial Standard conforming with International Standard; and to propose a draft of an International Standard which is based on J
6、apanese Industrial Standard. Attention is drawn to the possibility that some parts of this Standard may conflict with a patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have tech
7、nical properties. The relevant Minister and the Japanese Industrial Standards Committee are not responsible for identifying the patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which h
8、ave the said technical properties. JIS B 7440 consists of the following 6 parts under the general title Geometrical Product Specifications (GPSj-Acceptance and reverification tests for coordinate measuring machines (CMM). Part 1 : Vocabulary Part 2 : CMMs used for measuring size Part 3 : CMMs with t
9、he axis of a rotary table as the fourth axis Part 4 : CMMs used in scanning measuring mode Part 5 : CMMs using multiple-stylus probing systems Part 6 : Estimation of errors in computing Gaussian associated features Date of Establishment: 2003-03-20 Date of Public Notice in Official Gazette: 2003-03-
10、20 Investigated by: Japanese Industrial Standards Committee Standards Board Technical Committee on Machine Elements JIS B 7440-1 : 2003, First English edition published in 2004-06 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the eve
11、nt of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 2004 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfil
12、m, without permission in writing from the publisher. Printed in Japan PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permit
13、ted without license from IHS -,-,- B 7440-1 : 2003 (IS0 10360-1 : 2000) Contents Page Introduction 1 1 2 2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 2.9 Scope 1 General terms . 1 1 coordinate measuring machine (CMM) . coordinate measurement . 1 measuring volume 2 workpiece coordinate system 2 machine coordinate
14、 system . 2 probing system . 2 probing (to probe), verb . discrete-point probing 2 scanning . 2 2 2.10 program point . 2.11 intermediate point . 2.12 indicated measured point 2.13 corrected measured point 2.14 target contact point . 2.15 actual contact point . 2.16 tip correction vector (T) 2.17 acc
15、eptance test (of a CMM) 2.18 reverification test (of a CMM) 2.19 interim check (of a CMM) . 2.20 Gaussian radial distance (R) + 2.21 range 2.22 hysteresis . 2.23 ram . 2 2 2 2 3 3 3 6 6 6 6 7 7 7 3 Terms relating to the probing system 7 3.1 probe . 7 PROTECTED BY COPYRIGHT Copyright Japanese Standar
16、ds Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted without license from IHS -,-,- B 7440-1 : 2003 (IS0 10360-1 : 2000) 3.2 3.3 3.4 3.5 3.6 3.7 3.8 4 4.1 4.2 4.3 4.4 4
17、.5 4.6 5 5.1 5.2 6 6.1 6.2 6.3 7 7.1 7.2 7.3 7.4 7.5 7.6 7.7 contacting probing system non-contacting probing system . optical probing system . multi-probe system articulating probing system probing system qualification multiple styli, multiple stylus Terms relating to the stylus system . stylus sty
18、lus tip stylus system components . stylus system stylus length . stylus tip offset . Terms relating to the rotary table rotary table . rotary table setup . Terms relating to the operation of the CMM discrete-point probing speed . scanning speed back off distance . Terms relating to scanning correcte
19、d scan point . target scan line . corrected scan line . target scan plane pre-defined path scanning not pre-defined path scanning . scan sequence . 7 7 7 7 7 7 7 10 10 10 10 10 10 10 11 11 11 11 11 11 11 11 1 1 11 11 11 11 11 11 (ii) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Pr
20、ovided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted without license from IHS -,-,- B 7440-1 : 2003 (IS0 10360-1 : 20001 7.8 7.9 8 8.1 8.2 8.3 8.4 9 9.1 9.2 9.3 9.4 9.5 9.6 9.7 9.8 9.9
21、9.10 9.11 9.12 9.13 9.14 9.15 9.16 9.17 9.18 9.19 9.20 high point density (of a CMM) low point density . (of a CMM) . Terms relating to artefacts . material standard material standard of size reference sphere . test sphere . Terms relating to CMM error or error of indication error of indication of a
22、 CMM for size measurement (E) . maximum permissible error of indication of a CMM for size measurement (MPEE) . probing error (P) maximum permissible probing error (MPEp) . radial four-axis error (FR) . tangential four-axis error (FT) . axial four-axis error (FA) maximum permissible radial four-axis
23、error (MPEFR) . maximum permissible tangential four-axis error (MPEFT) maximum permissible axial four-axis error (MPEFA) scanning probing error (Tij) . maximum permissible scanning probing error (MPET, ) . time for scanning test (zij) . maximum permissible time for scanning test (MPT, ) fixed multip
24、le-stylus probing system size error (MS) fixed multiple-stylus probing system location error (ML) . fixed multiple-stylus probing system form error (MF) . maximum permissible Fixed multiple-stylus probing system form error (MPEMF) . maximum permissible fixed multiple-stylus probing system size error
25、 (MPEMs) . maximum permissible fixed multiple-stylus probing system location error (MPEd . 11 11 12 12 12 12 12 12 12 12 14 14 14 14 14 14 15 15 15 15 15 15 15 16 16 16 16 16 (iii) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Empl
26、oyees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted without license from IHS -,-,- B 7440-1 2003 (IS0 10360-1 : 2000) 9.21 9.22 9.23 9.24 articulated probing system form error (AF) . articulated probing system size error (AS) articulated
27、 probing system location error (AL) . maximum permissible articulated probing system form error (MPEM) 9.25 9.26 maximum permissible articulated probing system size error (MPEAs) . maximum permissible articulated probing system location error (MPEAL) 10 10.1 Terms relating to features Gaussian assoc
28、iated feature. least-squares associated feature . 11 Terms relating to software . 11.1 parametrization of a feature 11.2 reference data set . 11.3 reference parameter values 11.4 reference parametrization . 11.5 reference residual . 11.6 reference software 11.7 residual 11.8 conversion rule . 11.9 c
29、onverted test parameter values 11.10 test parameter values . 11.11 test parametrization . 11.12 test residual . 11.13 extent (of a data set) 11.14 reference pair . Annex A (informative) Description of CMM types . Annex B (informative) Relation to the GPS matrix model . Bibliography . 16 16 16 16 17
30、17 17 17 17 17 17 17 17 17 18 18 18 18 18 18 18 18 19 20 29 30 iv) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted
31、 without license from IHS -,-,- JAPANESE INDUSTRIAL STANDARD JIS B 7440-1 : 2003 (IS0 10360-1 : 2000) Geometrical Product Specifications (GPS)- Acceptance and reverification tests for coordinate measuring machines (CMM)- Part 1 : Vocabulary Introduction This Standard is the Japanese Industrial Stand
32、ard prepared based on IS0 10360-1 Geometrical Product Specifications (GPS)-Part 1 : Vocabulary pub- lished in 2000 as the first edition without modifying their technical contents. The “information” underlined with dots are the matters not stated in the original International Standard. This Standard
33、is a geometrical product specification (GPS) standard and is to be regarded as a general GPS standard (see TR B 0007). It influences link 5 of the chains of standards on size, distance, radius, angle, form, orientation, location, run- out and datums. For more detailed information of the relation of
34、this Standard to other standards and the GPS matrix model see annex B. 1 (CMM), and their acceptance and reverification tests. Scope This Standard specifies a vocabulary for coordinate measuring machines Remarks : The International Standards corresponding to this Standard are given below. In additio
35、n, symbols which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) ac- cording to ISO/IEC Guide 21. IS0 10360-1 : 2000 Geometrical product specifications (GPS)-Accep- tance and reverif
36、ication tests for coordinate mea- suring machines (CMM)-Pari. l : Vocabulary (IDTI 2 General terms 2.1 coordinate measuring machine (CMM) measuring system with the means to move a probing system (2.6) and capability to determine spatial coordinates on a workpiece surface NOTE : For a description of
37、some common CMMs and their physical axes, see annex A. Coordinate measuring machine is normally call as three dimen- sional measuring machine, although in this Standard it will be called as coordinate measuring machine taking into account its generic nature. Information : . 2.2 coordinate measuremen
38、t measurement of spatial coordinates carried out by CMM (2.1) PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted with
39、out license from IHS -,-,- 2 B 7440-1 : 2003 (IS0 10360-1 : 2000) 2 . 3 limits on all spatial coordinates measured by the CMM measuring volume measuring range of a CMM ( 2 . 1 ) , stated as simultaneous 2 . 4 workpiece 2 . 5 machine coordinate system coordinate system fixed with respect to physi- ca
40、l or calculated axes of a CMM ( 2 . 1 ) NOTE : For a description of some common CMMs and their physical xes, see annex A. workpiece coordinate system coordinate system fixed with respect to a 2 . 6 system consisting of a probe ( 3 . 1 ) and, where present, probe extensions, probe changing system, st
41、ylus ( 4 . 1 ) , stylus changing system and stylus extensions. See figures 1 and 2. probing system NOTE 1 NOTE 2 A probing system is connected to a ram (2.23). A probing system is not limited to contacting probing systems ( 3 . 2 ) . 2 . 7 dinate values probing (to probe), verb action which results
42、in the determination of coor- 2 . 8 discrete-point probing particular probing (2.7) mode where the recording of an indicated measured point (2.12) is assessed directly after an intermediate point (2.11) has been left 2 . 9 in order to characterize lines on an inspected surface scanning particular pr
43、obing ( 2 . 7 ) mode for taking consecutive measured points 2.10 program point the movement of a specified point of a probing system ( 2 . 6 ) any point expressed by coordinates and used for controlling 2 . 1 1 intermediate point special program point (2.10) where no probing ( 2 . 7 ) is made NOTE :
44、 Intermediate points are normally used for controlling the movement of a probing system ( 2 . 6 ) , altering its speed or direction of movement, and for clearance movement. 2 . 1 2 specified point of a probing system (2.6) for which the coordinates are indicated at the instant when probing (2.7) occ
45、urs. See figure 3. indicated measured point NOTE : The specified point is typically at or near the centre of the stylus tip (4.2). 2 . 1 3 corrected measured point estimate for a point on a workpiece surface, based on an indicated measured point (2.12). See figures 3 and 4. In the case where no styl
46、us system (4.4) is attached to a probe (3.1) e.g. in case of an optical probing system ( 3 . 4 1 1 the indicated mea- sured point (2.12) and the corrected measured point could be identi- cal. NOTE : PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JS
47、ALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 09:07:45 MDTNo reproduction or networking permitted without license from IHS -,-,- 3 B 7440-1 : 2003 (IS0 10360-1 : 2000) 2.14 target contact point ture. See figure 3. intended point of contact on a nominal integral fea
48、- NOTE : A nominal integral feature is a theoretically exact surface in accor- dance with JIS B 0672-1. 2.15 actual contact point point of contact between a stylus tip (4.2) and a real feature. See figure 3. NOTE : A real feature is an integral feature, part of a real surface of a workpiece in accordance with JIS B 0672-1. -+ 2.16 tip correction vector (2” ) vector used to translate an indicated measured point (2.12) to a corrected measured point (2.13). See figures 3 and 4. The tip correction vector