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1、JIS JAPANESE I NDUSTRIAL STANDARD Translated and Published by Japanese Standards Association JIS C 2170:2004 (IEC 6 1340-2-3 : 2000) Electrostatics-Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation ICs 17.220.99;2
2、9.020 Reference number JIS C 2170 : 2004 (E) PROTECTED BY COPYRIGHT 11 s C 2170 : 2004 (IEC 61340-2-3 : 20001 Foreword This translation has been made based on the original Japanese Indus- trial Standard established by the Minister of Economy, Trade and In- dustry through deliberations at the Japanes
3、e Industrial Standards Committee in accordance with the Industrial Standard Law: This Standard has been made based on IEC 61340-2-3:2000 Electrostat- ics -Part 2-3 : Methods of test for determining the resistance and resis- tivity of solid planar materials used to avoid electrostatic charge accu - m
4、ulation for the purposes of making it easier to compare this Standard with International Standard; to prepare Japanese Industrial Standard conforming with International Standard; and to propose a draft of an In- ternational Standard which is based on Japanese Industrial Standard. Attention is drawn
5、to the possibility that some parts of this Standard may conflict with a patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have technical properties. The relevant Minister and the
6、Japanese Industrial Standards Committee are not responsible for identifying the patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have the said technical properties. Date of Estab
7、lishment: 2004-03-20 Date of Public Notice in Official Gazette: Investigated by: 2004-03-22 Japanese Industrial Standards Committee Standards Board Technical Committee on Electricity Technology JIS C 2170 : 2004, First English edition published in 2005-02 Translated and published by: Japanese Standa
8、rds Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 2005 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced o r utilized in any form o
9、r by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan PROTECTED BY COPYRIGHT -,-,- C 2170 : 2004 (IEC 61340-2-3 : 2000) Contents Page Introduction 1 1 2 3 3.1 3.2 3.3 3.4 3.5 4 5 6 7 8 8.1 8.2 8.3 8.4 8.5 8.
10、6 9 9.1 9.2 10 11 Scope . 1 Normative references . 2 Definitions 2 volume resistance (QI 2 volume resistivity (Qm) . 2 surface resistance (Q2) 3 surface resistivity(Q2) . 3 measuring electrode . 3 Conditioning and test environment . 3 Selection of test method . 3 Resistance measurements of solid con
11、ductive materials 3 Resistance measurements of solid insulating materials . 4 Resistance measurements of electrostatic dissipative materials (used to avoid electrostatic charge accumulation) 4 Instrumentation . 4 Electrode assemblies 4 Sample preparation and handling . 7 System verification fixtures
12、 for surface resistance . 8 System verification for volume resistance measurements . 10 Test procedures 10 Conversion to resistivity values 12 Surface resistivity ps 12 Volume resistivity pv 13 Repeatability and reproducibility 13 Report . 14 . . . (i PROTECTED BY COPYRIGHT -,-,- JAPANESE INDUSTRIAL
13、 STANDARD JIS C 2170 : 2004 (IEC 61340-2-3 : 2000) Electrostatics-Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation Introduction This Japanese Industrial Standard has been prepared based on the first edition of IE
14、C 61340-2-3 Electrostatics-Part 2-3 : Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulation published in 2000 without modifying the technical contents. Portions underlined with dots are the matters not stated in the o
15、riginal Interna- tional Standard. Measurements of resistances and related calculations of resistivities belong to the fundamental objectives of electrical measuring techniques along with measurements of voltage and current. Resistivity is the electrical characteristic having the widest range, extend
16、ing over some thirty orders of magnitude from the most conductive metal to almost perfect in- sulators. The basis is Ohms law and is valid for d.c. current and instantaneous values of a.c. current in electron conductors (metals, carbon, etc.). Values of resistance measure- ments using a.c. current c
17、an be influenced by capacitive/inductive reactance, depend- ing on the frequency. Thus, existing national and international standards dealing with resistance measurements of solid materials normally require the application of d.c. current. Most non-metal materials such as plastics are classified as
18、polymers and ion con- ductors. The transport of charges can be dependent upon the applied electrical field strength during the measurement. Beside the measuring current, there exists a charging current that polarizes andor electrostatically charges the material, indicated by an asymptotic decay of t
19、he measuring current with time and causing an apparent change in resistance. If this effect is observed, it will be advisable to repeat the meas- urement immediately after a definite electrification time has elapsed using the reverse polarity for the measuring current and averaging both obtained val
20、ues. 1 Scope This International Standard describes test methods for the determination of the electrical resistance and resistivity of solid materials in the range from lo4 S2 to 1012 S 2 used to avoid electrostatic charge accumulation. It takes account of existing IEC/ISO standards and other publish
21、ed information, and NOTE : The International Standard corresponding to this Standard is as follows. gives recommendations and guidelines on the appropriate method. In addition, symbols which denote the degree of correspondence in the PROTECTED BY COPYRIGHT 2 C 2170 : 2004 (IEC 61340-2-3 : 2000) cont
22、ents between the relevant International Standard and JIS are IDT (identical), MOD (modified), and NEQ (not equivalent) according to ISO/IEC Guide 21. IEC 61340-2-312000, Electrostatics-Part 2-3 : Methods of test for deter- mining the resistance and resistivity of solid planar materials used to a voi
23、d electrostatic charge accu- mulation (IDT) 2 Normative references The following standards contain provisions which, through reference in this Standard, constitute provisions of this Standard. If the indication of the year of publication is given to these referred standards, only the edition of the
24、in- dicated year constitutes the provision of this Standard but the revision and amend- ment made thereafter do not apply. IEC 60093:1980 IEC 6016711964 IEC 60212:1971 IEC 60260:1968 IS0 1853:1998 IS0 2951:1974 IS0 391511981 Methods of test for volume resistivity and surface resistivity of solid ele
25、ctrical insula ting ma terials Methods of test for the determination of insulation resistance of solid insulating materials Standard conditions fur use prior to and during the testing solid electrical insulating ma terials Test enclosures of non -injection type for constant relative hu- midity Condu
26、cting and dissipa tive rubber vulcanized or thermoplastic -Measurement of resistivity Vulcanized rubber - Determina tion of insulation resistance Plastics -Measurement of resistivity of conductive plastics 3 Definitions For the purpose of this Standard, the following definitions apply: 1 nformation
27、: The JFneral. .static-el.ectricit .t.erms are P-resc.ri?ebh TE G. 0 0 s .I _._._ 2000 ( T Y E S)LG!QSSarJi .sf .rerms d!sed- in- E!ectro b) for a material of initially unknown resistivity, start the measurements by using methods for conductive materials according to clause 6. Selection of test meth
28、od The following procedure shall be used to select the test If the measurement is not possible or the obtained result exceeds the given range for the application of the test method, it shall be regarded as being inadequate and the result shall not be taken into account. The measurement shall be repe
29、ated according to clause 8 for static-dissipative materials. If the situation described above occurs again, the measurement shall be repeated according to clause 7 for insulating materials. 6 Resistance measurements of solid conductive materials The resistance of solid conductive materials (non-meta
30、ls) shall be measured in accordance with IS0 3915 for plastics or IS0 1853 for rubbers. PROTECTED BY COPYRIGHT -,-,- 4 C 2170 : 2004 (IEC 61340-2-3 : 2000) For highly conductive materials, the contact resistances necessitate the method of a quadrupole measurement in order to avoid a non-linear poten
31、tial distribution over the specimen. The most important parameter is the current injected through the specimen or, even more precisely, the dissipated power in order to avoid significantly heating the material. 7 Resistance measurements of solid insulating materials The resistance of solid in- sulat
32、ing materials shall be measured in accordance with IEC 60093, IEC 60167 for plastics or IS0 2951 for rubbers. For highly insulating materials, the resistance along the surface can be much lower compared to the resistance through the material due to the effect of adsorbed con- taminants such as water
33、. Furthermore, there can exist a non-linear functional correla- tion between the applied voltage and the conducted current. Thus, the surface and volume resistance of solid insulating materials are conventionally measured under specified conditions (generally 500 V and 1 min time of electrification)
34、 with guarded electrodes. Liquid, painted or sprayed contact electrodes could modify the behaviour of the specimen under test and shall not be applied. The use of conductive rubber as contact material is strongly recommended instead. 8 Resistance measurements of electrostatic dissipative materials (
35、used to avoid elec- trostatic charge accumulation) The resistance of materials used to avoid electrostatic charge accumulation shall be measured according to the instructions given in the sub- clauses below. 8.1 Instrumentation The instrumentation may consist of either a d.c. power supply and an amm
36、eter or an integrated instrument (ohmmeter). National safety regulations shall be followed. If an ohmmeter without current reading facility is used for volume resistance meas- urements, a separate ammeter is required capable of reading at least from 10 pA to 10 mA with an accuracy off 5 %. The open
37、circuit voltage shall be 100 V f 5 % for measurements of 1 x lo6 Q and higher, and 10 V * 5 % for less than 1 x lo6 Q. Readings shall be possible at least from 1 x 103 i 2 to 1 x 1013 52. 8.2 Electrode assemblies The electrodes shall consist of a material that allows inti- mate contact with the spec
38、imen surface and introduces no appreciable error because of electrode resistance or contamination of the specimen. The electrode material shall be corrosion resistant under test conditions and shall not cause a chemical reaction with the material being tested. The assemblies described in the subclau
39、ses below are recommended to be suitable, but other configurations complying with national or international standards may also PROTECTED BY COPYRIGHT 5 C 2170 : 2004 (IEC 61340-2-3 : 2000) be used, if appropriate. Especially for volume resistance measurements of electrostatic dissipative materials,
40、it is important that applied probes of the guarded ring type have sufficient space between the centre (measuring) and ring (guard) contact electrode in order to minimize stray currents falsifying the readings. It is recommended, that the gap g shall be at least i0 mm. In cases of dispute, the assemb
41、lies described in this standard shall be applied. 8 . 2 . 1 Assembly for the measurement of surface resistance The electrode assembly (probe i) contains a central disc surrounded by a concentric ring made of conductive materials which make contact with the material under test (see figure i). The con
42、tact surface material shall have a volume resistance of less than lo3 Q when tested on a stainless, non-corrosive metal plate (not aluminum) as the counter elec- trode by applying 10 V. The material under test should be placed on an insulating support as described in 8.2.4. Unit : mm Total mass (2.5
43、 kg t 0.25 Instrumentation cable n Metal electrode mountin Conductive electrodes (Shore:A:50-70 3 mm tvuical thickness) Probe 1 base - Figure 1 Assembly for the measurement of surface and volume resistance PROTECTED BY COPYRIGHT 6 C 2170 : 2004 (IEC 61340-2-3 : 2000) T I Centre electrode (probe i 7
44、Ring electrode (probe i) I I/- Figure 2 Basic connections of the electrodes for surface resistance measurements 8.2.2 Assembly for the measurement of volume resistance The assembly consists of two electrodes placed on either side of the material under test (see figure 3 ) . The top electrode assembl
45、y (probe 1) shall be as described in 8 . 2 . 1 and shown in figure 1. The bottom electrode (probe 2) shall be a stainless, non-corrosive metal plate (not aluminium) sufficiently large to support the specimen under test. Probe 2 shall be equipped with a permanent connecting terminal (e.g. plug hole,
46、riveted connector). NOTE : The use of crocodile clips cannot be recommended. It should be placed either on an insulating support as described in 8.2.4 prior to test or be equipped with equivalent insulating feet. I Ring electrode (probe i) Specimen Support Figure 3 Basic connections of the electrode
47、s for volume resistance measurements 8 . 2 . 3 Assembly for the measurement of resistance to groundlgroundable point and point-to-point resistance The assembly consists of one (resistance to groundground- able point) or two (point-to-point resistance) electrodes (probe 3) containing a disk made of c
48、onductive material which makes contact with the material under test (see figure 4 ) . PROTECTED BY COPYRIGHT -,-,- 7 C 2170 : 2004 (IEC 61340-2-3 : 2000) Unit : mm Total mass (2.5 kg Instrumentation cable P n / * 0.25 II l-4 3 mm typical. thickness) Probe 3 Figure 4 Assembly for the measurement of r
49、esistance to groundl groundable point and point-to-point resistance The contact surface material shall be conductive enough that two probes placed on a metal surface (e.g. probe 2) have a point-to-point resistance of less than 103Q when tested with 10 V. The material under test should be placed on an insulating support as described in 8.2.4. 8.2.4 Test support The material shall be tested on a smoo