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1、i JIS C 5201-6:l J IS JAPANESE I NDUSTRIAL STAN DAR D Translated and Published by Japanese Standards Association Fixed resistors for use in electronic equipment Part 6 : Sectional specification : Fixed resistor networks with individually measurable resistors ICs 31.040.10 Descriptors : electronic eq
2、uipment and components, fmed resistors Reference number : JIS C 5201-6 : 1999 (E) 14s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted wit
3、hout license from IHS -,-,- C 5201-6 : 1999 Date of Establishment: 1999-02-20 Date of Public Notice i n Official Gazette: 1999-02-22 Investigated by: Japanese Industrial Standards Committee Divisional Council on Electronics JIS C 5201-6: 1999, First English edition published in 1999-10 Translated an
4、d published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. O JSA 1999 All rights reserved. Unless otherwise specified, no part of this publication may be reprod
5、uced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing
6、, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- C 5201-6 : 1999 Foreword This translation has been made based on the original Japanese Industrial Standard at Japanese Industrial Standards Committee in accordance with the Industri
7、al Standardization Law. By this Standard, JIS C 5203 : 1994 General rules of fixed resistor networks for use in electronic equipment was withdrawn and replaced. Attention shall be drawn to the possibility that a part of this Standard may conflict with a patent right, application for a patent right a
8、fter opening to the public, utility model right (including those applied before 1993-12-31) or application for registration of utility model after opening to the public which have technical properties. The Minister of International Trade and Industry and the Japanese Industrial Standards Committee a
9、re not responsible for identifying the patent right, application for a patent right after opened, utility model right or application for registration of utility model after opening to the public which have the technical properties of this kind. JIS C 5201-6 includes Annex A which corresponds to the
10、International Standard, and Annex 1 which specifies type designations and symbols as Japanese Industrial Standard. t established by the Minister of International Trade and Industry through deliberations Group standards The following standards form the specifications for the group of element specifie
11、d in this Standard. JIS C 5201 JIS C 5201-1 JIS C 5201-2 JIS C 5201-2-1 JIS C 5201-2-2 JIS C 5201-4 JIS C 5201-4-1 JIS C 5201-4-2 JIS C 5201-4-3 JIS C 5201-5 JIS C 5201-5-1 JIS C 5201-5-2 JIS C 5201-6 JIS C 5201-6-1 Fixed resistors for use in electronic equipment Part 1 : Generic specification Part
12、2 : Sectional specification : Fixed low-power non-wirewound resistors Part 2 :Blank detail specification : Fixed low-power non-wirewound resistors. Assessment level E Part 2 :Blank detail specification : Fixed low-power non-wirewound resistors. Assessment level F Part 4 : Sectional Specification : F
13、ixed power resistors Part 4 :Blank detail specification : Fixed power resistors. Assessment level E Part 4 :Blank detail specification :Fixed power resistors. Assessment level F Part 4 :Blank detail specification : Fixed power resistors, heat-sink types. Assessment level H Part 5 : Sectional specifi
14、cation :Fixed precision resistors Part 5 :Blank detail specification : Fixed precision resistors. Assessment level E Part 5 :Blank detail specification : Fixed precision resistors. Assessment level F Part 6 : Sectional specification : Fixed resistor networks with individually measurable resistors Pa
15、rt 6 : Blank detail specification : Fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation. Assessment level E Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for
16、 Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- C 5201-6 : 1999 JIS C 5201-6-2 Part 6 : Blank detail specification : Fixed resistor networks with individually measurable resistors, of either different resistance values or different rated dissipa
17、tions. Assessment level E Part 8 : Sectional specification : Fixed chip resistors Part 8 : Blank detail specification :Fixed chip resistors. Assessment level E - JIS C 5201-8 JIS C 5201-8-1 Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/11111110
18、01, User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- C 5201-6 : 1999 Contents Introduction . 1 1.1 1 . 2 1 . 3 1 . 4 Section One-General General Scope Object . Normative references Information to be given in a detail spec
19、ification . 1.4.1 Outline drawing and dimensions 1.4.2 Mounting . 1.4.3 Style . 1.4.4 Ratings and characteristics . 1.4.5 Marking . 1.5 Marking . Section Two-Preferred ratings. characteristics and test seventies 2 Preferred ratings. characteristics and test severities 2.1 2 . 1 . 1 2 . 1 . 2 2.1.3 2
20、 . 2 2 . 2 . 1 2 . 2 . 2 2 . 2 . 3 2.2.4 2.2.5 Preferred characteristics Preferred climatic categories . Temperature coefficient and temperature Characteristics of resistance Limits for change in resistance . Preferred values of ratings Rated resistance (nominal resistance) . Tolerances on rated res
21、istance Rated dissipation . Limiting element voltage . Isolation voltage between individual resistor elements (when aDDlicable . 1 1 1 1 1 2 3 3 3 3 3 3 4 4 4 4 5 5 5 5 6 6 6 . . . . AI- Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001,
22、 User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- C 5201-6 : 1999 2.2.6 2.3 2 . 3 . 1 2.3.2 2.3.3 2.3.4 2 . 3 . 5 2 . 3 . 6 2.3.7 2.3.8 2 . 3 . 9 Insulation resistance between individual resistor elements (when applicable
23、) . 6 Preferred test severities . 7 Drying 7 Vibration (Sinusoidal) . 7 Low air pressure 7 Overload 7 Endurance at 70 “C . Insulation resistance between adjacent resistor elements (when applicable) . 7 Voltage proof between adjacent resistor elements (when applicable) . 8 7 Damp heat (steady state)
24、. 8 Robustness of terminations 8 Section Three-Quality assessment procedures 3 Quality assessment procedures . 8 3 . 1 Structurally similar components 8 3 . 2 Qualification approval 8 3 . 2 . 1 Qualification approval on the basis of the fixed sample size procedure . 8 3.2.2 Tests . 9 3 . 3 Quality c
25、onformance inspection 15 3 . 3 . 1 Formation of inspection lots 15 3 . 3 . 2 Test schedule 15 3.3.3 Assessment levels 15 Annex A (normative) Standardized schematic diagrams and pin identifications for fixed resistor networks 17 A 1 Diagrams for “Single-in-line” configurations 17 A 2 Diagrams for “Du
26、al-in-line” and “Flat pack” configurations . 18 Annex 1 (normative) Type designation and symbol 19 Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking
27、permitted without license from IHS -,-,- JAPANESE INDUSTRIAL STANDARD JIS C 5201-6 : 1999 Fixed resistors for use in electronic equipment Part 6 : Sectional specification : Fixed resistor networks with individually measurable resistors Introduction This Japanese Industrial Standard has been prepared
28、, based on the IEC 60115-6, Fixed resistors for use in electronic equipment Part 6 : Sectional specification : Fixed resistor networks with individually measurable resistors issued in 1983 as the first edition and “Amendment 1 : 1987” without changing the technical contents. However the type designa
29、tion and symbol for the Japanese Industrial Stan- dard are appended in the Annex. And the Amendment is combined after editing. For user information, the parts with sideline or dotted underline are the text not included in the original International Standard. IEC Standards number referred herein are
30、according to IEC Standards new numbering system with effect from January 1st 1997, so as for the Standards issued before this date, the number are changed by adding 60000 to previous one. This means only the modification of number, so the contents of the standard applied is identical. Section One-Ge
31、neral 1 General 1 . 1 Scope This Standard specifies fixed resistor networks (hereafter referred to as “resistor”) in which the resistance of each individual resistor can be measured and is the sectional specification of fixed resistor networks for use in electronic equip- ment associated with JIS C
32、5201-1 Fixed resistors for use in electronic equipment- Part 1 : Generic specification. Remarks : The following standard is the corresponding International Standard to this Standard. IEC 60115-6 : 1983 Fixed resistors for use in electronic equipment Part 6 : Sectional specification : Fixed resistor
33、networks with individually measurable resistors Amendment 1 : 1987 1 . 2 Object The object of this Standard is to prescribe preferred ratings and char- acteristics and to select from JIS C 5201-1, the appropriate quality assessment pro- cedures, tests and measuring methods and to give general perfor
34、mance requirements for this type of resistor network. Test seventies and requirements prescribed in detail specifications referring to this sectional specification shall be of equal or higher performance level, because lower performance levels are not permitted. 1.3 Normative references The followin
35、g standards contain provisions which, through reference in this Standard, constitute provisions of this Standard. If the indication of the year of coming into effect is given to these referred standards, only the edition of indicated year constitutes the provision of this Standard but the revision C
36、opyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 C 5201-6 : 1999 and amendment made thereafter are not app
37、lied. The normative references with- out the indication of the year of coming into effect apply limiting only to the most recent edition (including the amendment). Japanese Industrial Standards JIS C O0 Test standard group Environmental testing procedures Remarks : All provisions cited from IEC 6006
38、8, Basic environmental testing procedures are equivalent to corresponding provisions of this Stan- dard. JIS C O010 Environmental testing Part 1 : General and guidance Remarks : All provisions cited from IEC 60068-1 : 1978, Basic environmental testing procedures Part 1 : General and Amendment 1 : 19
39、92 are equivalent to corresponding provisions of this Standard. JIS C 5063 Preferred number series for resistors and capacitors Remarks : IEC 60063 : 1963, Preferred number series for resistors and capaci- tors, Amendment 1 : 1967 and Amendment 2 : 1977 are identical to this Standard. JIS C 5201-1 F
40、ixed resistors for use in electronic equipment-Part 1 : Generic specification Remarks : All provisions cited from IEC 60115-1 : 1982, Fixed resistors for use in electronic equipment Part 1 : Generic specification and Amend- ment 2 : 1987, Amendment 3 : 1989 and Amendment 4 : 1993 are equivalent to c
41、orresponding provisions of this Standard. Sampling inspection procedures and tables by attributes with sever- ity adjustment (receiving inspection where a consumer can select sup- pliers) Remarks : All provisions cited from IEC 60410 : 1973, Sampling plans and procedures for inspection by attributes
42、 are equivalent to corresponding provisions of this Standard. JIS Z 9015 IEC Standards IEC QC O01001 : 1986 Basic rules of the IEC Quality assessment system for elec- tronic components (IECQ), Amendment 2 : 1994 IEC QC 001002 : 1986 Rules of procedures of the IEC Quality assessment system for electr
43、onic components (IECQ), Amendment 2 : 1994 1.4 Information to be given in a detail specification Detail specifications shall be derived from the relevant blank detail specification. Detail specifications shall not specify requirements inferior to JIS C 5201-1 and this Standard or blank detail specif
44、ications. When more severe requirements are included, they shall be listed in 1 . 8 of the detail specification and indicated in the test schedules, for example by an asterisk (*). The following information shall be given in each detail specification and the values quoted shall preferably be selecte
45、d from those given in the appropriate item of this sectional specification. Remarks : The information given in 1 . 4 . 1 and 1 . 4 . 3 may, for convenience, be presented in tabular form. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001,
46、 User=Wing, Bernie Not for Resale, 03/14/2007 02:29:10 MDTNo reproduction or networking permitted without license from IHS -,-,- . STD= J I S C 5201-b-ENGL 1979 I I 4933bfl8 05584b 3 C 5201-6 1999 1.4.1 Outline drawing and dimensions There shall be an illustration of the net- work as an aid to easy
47、recognition and for comparison of the network with others. Dimensions and their associated tolerances, which affect interchangeability and mount- ing, shall be given in the detail specification. All dimensions shall preferably be stated in millimetres. 1.4.2 Mounting The detail specification shall s
48、pecify the method of mounting to be applied for normal use and for the application of the vibration (sine wave) and the bump or shock tests. The resistor networks shall be mounted by their normal means. The design of the resistor network may be such that special mounting fixtures are required in its use. In this case the detail specification shall describe the mounting fixtures and they shall be used in the application of the vibration (sine wave) and bump or shock tests. 1.4.3 Style (JIS C 5201-1, 2.2.3) For the pur