《JIS-G-1351-1987-R2004-ENG.pdf》由会员分享，可在线阅读，更多相关《JIS-G-1351-1987-R2004-ENG.pdf（8页珍藏版）》请在三一文库上搜索。
1、J I S G*i,35L 87 4933608 0046992 2 - UDC 669.15-198 543.426 J.IS JAPANESE INDUSTRIAL STANDARD Method for X-Ray Fluorescence Spectrometric Analysis of Ferroalloys Translated and Published by Japanese Standards Association Printed in Japan Copyright Japanese Standards Association Provided by IHS under
2、 license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction or networking permitted without license from IHS -,-,- I J I S G81351 87 M 4933bO 004b993 4 In the event of any doubt arising, the original Standard in Japanese is to be final
3、 authority. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction or networking permitted without license from IHS -,-,- JIS G*K1351 87 m 4933608 O046994 b = UDC 669.1
4、5-198:543.426 JAPANESE INDUSTRIAL STANDARD J I S Method for X-Ray Fluorescence Spectrometric Analysis of Ferroalloys G 1351-1987 i. Scope This Japanese Industrial Standard specifies the method for X-ray fluorescence spectrometric analysis of ferroalloys specified in JI S G 2301, JIS G 2302, JIS G 23
5、03, JIS G 2304, JIS G 2312 and JIS G 2315. 2. Definitions 2.1 element for analysis An element for analysis of the ferroalloy to which this Standard is applied. 2.2 sample for component test A sample capable of being chemically analyzed for its component after a specific sample preparation has been c
6、ompleted. 0 Applicable Standards : JIS G 1311-Methods for Chemical Analysis of Ferromanganese JIS G 1312-Methods for Chemical Analysis of Ferrosilicon JIS G 1313-Methods for Chemical Analysis of Ferrochromium JIS G 1314-Methods for Chemical Analysis of Silicon-Manganese JIS G 1322-Methods for Chemic
7、al Analysis of Metallic Silicon JIS G 1325-Methods for Chemical Analysis of Ferrosilicon-Chromium JIS G 1501-General Rules for Sampling Ferroalloys JIS G 1601-Methods of Sampling for Chemical Analysis of Ferroalloys (Part 1 Ferromanganese , Ferrosilicon , Ferrochromium , Ferrosilicomanganese and Fer
8、rosilicochromium) JIS G 1603-Methods of Sampling for Chemical Analsyis of Ferroalloys (Part 3 Ferrophosphorus, Manganese Metal, Silicon Metal, Chromium Metal, Calcium Silicon and Ferroboron) JIS G 2301-Ferromanganese JIS G 2302-Ferrosilicon JIS G 2303-Ferrochromium JI S G 2 304-Silicon-Manganese JIS
9、 G 2312-Silicon Metal JIS G 2315-Silicon-Chromium SIS K 0119-General Rules for X-ray Fluorescence Spectrometric Analysis Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo repro
10、duction or networking permitted without license from IHS -,-,- J I S G*L35L 87 W 4933608 0046995 8 Kind E lement for analys is Manganes e Silicon Ferromanganese 2 G 1351-1987 Determination range wt % 73 to 85 3 . 0 max. 3. Element for Analysis and Determination Range The elements for analysis and. d
11、etermination ranges are shown in Table 1 for each kind of ferroalloy. Aluminium 14 to 20 3.0 max. Ferrosilicon High and medium carbon ferrochromium 40 to 45 Silicon Chromium 50 to 70 Silicon 8.0 max. Chromium Silicon Manganese Silicon Low carbon ferrochromium Silicon-manganese 60 to 70 1.5 max. 60 t
12、o 70 14 to 25 Silicon metal Silicon-chromium Aluminium 1.0 max. Iron 1.5 max. Calcium 1.0 max. Silicon 40 to 55 Chlomium 30 to 45 4. General Matters General matters for the methods for X-ray fluorescence spectrometric analysis shall be in accordance with JIS K 0119. 5 , Sample 5.1 Sampling The sampl
13、ing shall be.as specified in JIS G 1501, JIS G 1601 and JIS G 1603. chromium or the like are difficult to be pulverized, they shall be directly sampled from molten metal by using the spoon combinedly used for mould or the like, However, in the case where low carbon ferro- 5.2 Preparation of Sample 5
14、.2.1 Powdery Sample A suitable quantity of the sample for compo- nent test specified in JIS G 1601 and JIS G 1603 is taken, further ground (l) with a grinder, formed in a plate state by pressure (2) and one surface of said plate is made to be the irradiation surface for X-ray. Copyright Japanese Sta
15、ndards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction or networking permitted without license from IHS -,-,- Notes ( l ) 3 G 1351-1987 As the particle size of a sample is lessened, the prec
16、ision of analysis generally improves. In measurement, the particle size of grinding conditions of the sample are preliminarily compared with the intensity of fluorescence X-rays and the particle size or conditions with which the intensity of fluorescence X-rays becomes constant are obtained. Then, t
17、he sample should preferably be ground to not more than this particle size. The sample of bad formability is formed with pressure either by uniformly mixing the sample with cool, starch, etc. , or by lining copper powder, sodium sulfate, etc. in layers on the back face of irradiation surface of X-ray
18、. 5.2.2 Lumpy Sample After forming the specimen sampled with the spoon combinedly used for mould or the like to appropriate dimensions by using a cutter or the like, its one surface is processed with plane polishing by using abrasives of not less than No. 60 in particle size and made to be the irrad
19、iation surface for X-ray. 5.3 Standard Sample The standard sample shall be as follows: (i) For the standard sample, not less than 3 samples in one series contained within a determination range, the kind of which is as same as the sample, shall be used. (2) The standard sample shall be prepared by th
20、e same method as that for the sample. (3) For the contents of elements for analysis of the standard sample, the values accurately determined by respective Standards for ana- lytical methods JIS G 1311, JIS G 1312, JIS G 1313, JIS G 1314, JIS G 1322 and JIS G 13251 specified in Japanese Industrial St
21、andards shall be used. 6. Determination Method 6.1 Purport An element is excited by irradiating primary X-rays on the sample prepared in a plane state and the fluorescence X-ray of the generated element for analysis is diffracted with spectral crystal and conducted to a detector. O Then, its intensi
22、ty is measured, 6.2 Spectral Line shall be as given in Table 2. The spectral lines used in this analytical method Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction
23、 or networking permitted without license from IHS -,-,- J I S G*I351i 87 4933b08 004b97 I 4 G 1351-1987 Table 2. Spectral Lines Element for analysis Manganese Silicon Aluminium Chromium Iron Calcium Wavelength nm Spectral line Mn K a o. 210 3 Mn K o. 191 o Si K a O. 712 6 o. 834 o O. 229 1 O. 208 5
24、Fe K a O. 193 7 Ca K a o. 335 9 Spectral crystal (3) Degree LiF or topaz 1 EDDT o r PET 1 EDDT or PET 1 LiF 1 I LiF EDDT, PET or I LiF Note ( 3, LiF: lithium fluoride, EDDT : D-ethylenediamine tartrate, PET: pentaerythritol 6.3 Measurement A sample is accurately equipped to the sample cham- ber of a
25、n apparatus by using a sample holder and the irradiation area for X-rays is regulated by a sample mask or the diaphragm of X-ray tube, After either vacuuming the passage for X-rays or substituting it by helium gas or hydrogen gas as required, X-rays are irradiated under measuring conditions( 4, ( 5,
26、 preliminarily set and the intensity of fluorescence X-ray of the generated element for analysis is measured, The measurement shall be carried out by fixed time counting method (or fixed number timing method) or comparison method(6) for the apparatus of pulse counting system and by monitor method or
27、 fixed time integral method for the apparatus of integral voltage measuring system. Notes (4) In the case where chromium is determined by using the X-ray tube of chromium target, errors may occur by the affects of the background, the particle size and flatness of sample, and matrix, taken therefor.
28、Therefore, cares shall be necessarily The experimetally optimum measuring conditions shall be established by the type of the apparatus, determination element and its content. range, necessary determination accuracy, etc. For the measuring conditions, there are , the set conditions of X-ray generatio
29、n part (tube voltage, tube current, etc.), the set condition of spectral part (slit width or the like), the conditions of count recording part, etc, other than the spectral lines and spectral crystal given in Table 2. (6) In the case of using comparison method by the apparatus without automatic comp
30、arison mechanism, the measurements for analytical sample and contrast sample shall be, as a rule, continuously carried out. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo re
31、production or networking permitted without license from IHS -,-,- 5. G 1351-1987 6.4 Preparation of Working Curve The standard sample of 5.3 shall be measured in accordance with 6.3 and the relation between the obtained fluorescence X-ray intensity or intensity ratio to contrast sample and the conte
32、nt of the element for analysis, be prepared to be the working curve. 6.5 Calculation of Contents The content of the element for analysis shall be obtained from the working curve prepared in 6.4. Remarks 1. 2. 3. The working curve of ferromanganese shall be individually prepared for high carbon ferro
33、manganese and medium carbon ferromanganese. The working curve of ferrosilicon shall be prepared for each kind because the content range of silicon is broad. In the case of ferrochromium, powdery sample shall gen- erally be used for high and medium carbon ferrochromium and lumpy sample shall be used
34、for low carbon ferro- chromium. intensity of fluorescence X-ray occasionally fluctuates according to the contents of silicon and carbon in the case of powdery sample of high and medium carbon chromium, cares shall be taken therefor. Because the particle size of sample and the Copyright Japanese Stan
35、dards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction or networking permitted without license from IHS -,-,- a C b G 1351-1987 Edition 1 Japanese Text Established by Minister of Internationa
36、l Trade and Industry Date of Establishment: 1977-03-01 Date of Reaffirmation: 1987-09-01 Date of Public Notice in Official Gazette: 1987-09-02 Investigated by: Japanese Industrial Standards Committee Divisional Council on Iron and Steel This English translation is published by: Japanese Standards As
37、sociation 1-24 y Akasaka 4, Minato-ku y Tokyo 107 Japan O JSA, 1988 Printed in Tokyo by Hohbunsha Co., Ltd. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/10/2007 23:35:26 MSTNo reproduction or networking permitted without license from IHS -,-,-