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1、J I S ZS2280 93 = 4933608 0512589 350 = JIS JAPANESE INDUSTRIAL STANDARD Test method for Youngs modulus of metallic materials at elevated temperature JIS Z 2280-1993 Translated and Published by Japanese Standards Association UDC 539.32.08:669 Printed in Japan 7s Copyright Japanese Standards Associat
2、ion Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- I J I S Z*ZZAO 93 4933b08 0532590 O72 W In the event of any doubt arising, the original Standar
3、d in Japanese is to be final authority. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*2280 93 m
4、4933608 0512591 TO9 m , UDC 539.32.08:669 JAPANESE INDUSTRIAL STANDARD J I S Test method for Youngs modulus of Z 2280-1993 metallic materials at elevated temperature 1. Scope This Japanese Industrial Standard specifies test methods for dynamic and static Youngs modulus of metallic materials at eleva
5、ted temperature. Remarks: The standards cited in this Standard are the following. JIS B 0601-Definitions and designation of surface roughness JIS B 0621-Definitions and designations of geometrical deviations JIS B 7502-Micrometer callipers for external measurement JIS B 7503-Dial gauges reading in 0
6、.01 mm JIS B 7507-Vernier callipers JIS G 0567-Method of high temperature tensile test for steels and heat-resisting alloys JIS Z 8401-Rules for rounding off of numerical values 2. Definitions as follows. The principal terms used in this Standard are as defined (1) dynamic Youngs modulus A Youngs mo
7、dulus determined by measurement of the resonant frequency of test piece (resonance method) and the propagation velocity of ultrasonic pulse thereof (ultrasonic pulse technique). (2) static Youngs modulus A Youngs modulus determined by the stress - strain relationship within the elastic deformation a
8、rea obtained by applying static load. Youngs modulus at elevated temperature elevated temperature which exceed room temperature. (3) A Youngs modulus at an - 3 . In this respect, a Youngs modulus at an elevated temperature is calculated by using the dimensions and bulk density of the test piece at r
9、oom temperature. Classification of test methods 3 . 1 Youngs modulus shall be as given in the following. Test method for dynamic Youngs modulus The test method for dynamic (1) Transverse resonance method (2) Longitudinal resonance method (3) Ultrasonic pulse technique (Transmission method and reflec
10、tion method) Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*2280 93 W 4933b08 0532592 945 9 2 Z 2
11、280-1993 3.2 Youngs modulus shall be as given i n the following. T e s t method for static Youngs modulus The test method for s t a t i c (1) Strain gauge method (2) Pressing method of displacement gauge 4. 4.1 test piece temperature shall be as given i n the following. Test method for dynamic Young
12、s modulus Heating apparatus and test piece temperature A heating apparatus and (1) Heating apparatus A heating apparatus shall be capable of heating the test piece until the specified temperature and t o hold that temperature during the test so that it is heated uniformly and constantly within the p
13、ermissible range given i n Table 1 . or lower or 1473 K or over, however, it shall be agreed between the purchaser and supplier. In the case where it is 573 K Table 1 . Permissible range of temperature of test piece Unit: K Over 573, up t o Over 873, up t o Over 1073, up t o and incl. 873 and incl.
14、1073 and incl. 1473 + 3 - + 4 - + 5 - (2) Heating up and holding t i m e temperature, the whole of test piece shall be kept at the said temperature while the measurement is made. After heating up t o the specified (3) Measurement of temperature The temperature of test piece shall be measured w i t h
15、 a thermocouple at as near a place t o the test piece as possible avoiding contact thereto. 4.2 Measurement of dimensions and mass for test piece mass for the test piece shall be measured as given i n the following. The dimensions and (1) Length gauge The length gauge enumerated in the following sha
16、ll be used. (a) Micrometer As t o the micrometer, those specified i n JIS B 7502 or those of equivalent or superior precision shall be used. (b) D i a l gauge As t o the dial gauge, those specified i n JIS B 7503 or those of equivalent or superior precision shall be used. (c) Vernier calliper As t o
17、 the vernier calliper, those specified i n JIS B 7507 of minimum reading of 0.05 mm shal1,be used. (2) Measurement of dimensions The dimensions of test piece shall be measured with length gauges enumerated i n (1). thickness and diameter shall be measured at five points, respectively, and expressed
18、as the average values of respective three measurements excluding the maximum and minimum values. The length, width, Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproducti
19、on or networking permitted without license from IHS -,-,- e e e I J I S Z82280 93 m 4933608 0532593 883 m oscillo- scope 3 Z 2280-1993 ( 3 ) Gravimetric instrument For a gravimetric instrument, a chemical balance shall be used. A chemical balance of 5 mg or at least equivalent in sensitivity and of
20、100 g to 200 g in weighing capacity shall be used. ( 4 ) Measurement of mass The mass of test piece shall be measured to + 0.2 - % by means of the instrument specified in ( 3 ) . 4.3 Transverse resonance method The transverse resonance method shall be as given in the following. (1) Apparatus and dev
21、ice The testing apparatus shall, as a rule, consist of the circuits and instruments as shown in Fig. 1, and applicable apparatuses shall be as follows. Fig. 1 . Fundamental structure diagram of apparatus for transverse resonance method Pine l i n e (suspension string) 7 I (a) Actuating circuit The a
22、ctuating circuit shall consist of an oscillator, frequency counter, amplifier and actuator. An oscillator of which the oscillation frequency is variable and the frequency resolving power is within the range of 0 . 1 Hz shall be used. The actuator shall vibrate to the test piece by converting electri
23、c oscillation to mechanical vibration (e.g. a speaker). (b) Detecting circuit The detecting circuit shall consist of a detector (pickup, microphone, etc.), amplifier and oscilloscope. The detector shall be able to generate voltage which is pro- portional to amplitude and velocity or acceleration of
24、vibration of the test piece. (cl Supporting device of test piece such structure that a test piece is fundamentally able to vibrate without restriction. be outside the characteristic frequency of the measuring unit including the supporting device. The supporting device shall have In this case, the fr
25、equency to be used shall (d) Heating apparatus The heating apparatus shall be as given in 4 . 1 (1) (e) Length gauge The length gauge shall be as given in 4.2 (1). Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not
26、for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- JIS Z*Z280 93 = 4933608 0532594 718 4 Z 2280-1993 (2) Test piece The test piece shall be of a rectangular parallelepiped which is 40 mm or more i n length (Z), 5 mm or more i n width (w) and 1.0
27、 mm or more i n thickness (h), and the length t o thickness ratio (4) of test piece shall be 20 or more (e.g. 1 = 100 mm, W = 20 mm and h = 2 mm). In this case, the parallelarity( ) between upside and downside faces and between both sides of width of the test piece shall be 0.5 % or less of its thic
28、kness (h) and width ( W ) , respectively. Note (I) The parallelism shall be as given i n J I S B 0621. ( 3 ) Test method The test method shall be as given i n the following: (a) Measurement of dimensions and mass of test piece of dimensions and mass of the test D i e c e shall be as sDecified i n Th
29、e measurement 4.2 ( 2 ) and 4.2 ( 4 ) . Supporting method of test piece supported i n such a manner that free flexural vibration is not restricted. For instance, the detector is supported with a fine line at the right node or its vicinity of the test piece as shown i n Fig. 1, and for the actuator s
30、ide, the test piece is supported at the vicinity of outside of the node of test piece (0.224 Z apart from the edge section) with a fine line adhered or tied t o the center of the speaker cone of actuator. (b) The test piece shall be (cl Heating up and holding t i m e as given i n 4.1 (2). Heating up
31、 and holding t i m e shall be (d) Measurement of temperature Measurement of temperature of the test piece shall be as given i n 4.1 (3). e) Measurement of primary resonant frequency The actuating power shall be applied perpen4icularly t o the upside and downside faces of test piece through the fine
32、lines as shown i n Fig. 1 . For instance, as shown i n Fig. 1, the detection is carried out after connecting the detector t o the opposite side of the actuator with a fine line, or by catching acoustic waves of vibration with a microphone. The frequency of oscillator shall be varied gradually, the a
33、ctuating force shall be applied accordingly t o vibrate the test piece, then the amplified output of the detector shall be observed. produced on the oscilloscope, and as t o the output of oscillator appeared on the oscilloscope and that of detector, the frequency of the lowest order shall be the pri
34、mary resonant frequency of flexural vibration. determined by five repetitions applied for the same test piece. In the case where distinctive maximum amplitude is The primary resonant frequency shall be Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employ
35、ees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*i I : length of test piece (m) f : primary resonant frequency obtained by longitudinal resonance method (s-l) (b) Youngs modulus at elevated tempera
36、ture shall be the average of three values which exclude the maximum and minimum values from five values that are obtained by measurement as stated i n (3)(e) and calculation according t o (a). Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/11111
37、11001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- JIS Z*2280 93 4933608 0512597 427 = 7 Z 2280-1993 4.5 Ultrasonic pulse method i n the following. The ultrasonic pulse method shall be as given (1) Apparatus and devi
38、ce the following. The apparatus and device shall be as given in (a) Measuring instrument The instrument which is capable t o excite ultrasonic pulse of high frequency by using vibrators for longitudinal and transverse wave and also t o measure accurately the acoustic waves being propagated in the ul
39、trasonic pulse test piece shall be used. I n this respect, the instrument shall be calibrated, as necessary, with materials of known longitudinal and transverse acoustic waves such as transparent quartz glass and high purity alumina (Alzo3) which are less affected by temperature. (b) Heating apparat
40、us The heating apparatus shall be as given i n 4.1 (1) (c) Length gauge The length gauge shall be as given in 4.2 (1). ( 2 ) Test piece The test piece shall be, as a rule, a regular prism of 10 mm or more i n side length or cylinder of 10 mm or more i n diameter. In the case where the transmission m
41、ethod is applied for measurement, as a rule, the length(2) of test piece shall be 20 mm or more, and i n the case of reflection method, it shall be 10 mm or more. The roughness of end section of the test piece shall be 0.40a (1.6 S) or under preferably 0.013 a (0.05 S ) specified i n JIS B 0601, and
42、 the parallelarity between both end sections shall be 0.02 mm or less. Note C2): As f a r as such conditions that &, the length of test piece used for transmission method, is sufficiently larger than V,-z , or ZR, the length of test piece used for reflection method, is sufficiently larger than -J!Lx
43、. , are satisfied, the length of the test piece may be varied. symbols stand for as follows: 2 Where, the & : length of test piece used for transmission method (m) Z , : length of test piece used for reflection method (m) V, : longitudinal wave velocity of test piece (m/s) z : minimum incident ultra
44、sonic pulse duration ( s ) ( 3 ) T e s t method The test method shall be as given i n the following: (a) Measurement of dimensions and mass of test piece of dimensions and mass of the test piece shall be as given i n 4.2 ( 2 ) and 4.2 ( 4 ) . The measurement Copyright Japanese Standards Association
45、Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/14/2007 03:01:14 MDTNo reproduction or networking permitted without license from IHS -,-,- J I S Z*Z280 93 4933b08 0512598 363 W 8 2 2280-1993 (b) Supporting method of test piece the test pi
46、ece shall be adhered with heat resistance adhesive, and at the other end, the vibrator is fixed, and then the test piece is fixed i n the furnace. I n adhering the vibrator, this shall not protrude from the test piece. A t one end of the buffer rod, (c) Heating up and holding time as given i n 4.1 (
47、2). Heating up and holding time shall be (d) Measurement of temperature Measurement of temperature of the test piece shall be as given i n 4.1 (3). (e) Measurement of acoustic velocity The longitudinal wave velocity (V,) and transverse wave velocity ( K ) shall be measured five times repeatedly by m
48、eans of pulse velocity of propagation. ( 4 ) Calculation of results i n the following. The calculation of results shall be as given (a) Youngs modulus at elevated temperature shall be calculated by formulae (3) t o ( 5 ) . G=P. (3) v=-X VL2-2K2 . ( 4 ) 2 v L - K2 3V12-4.K ( 5 ) VL2- K E = x (l+v)G=pV,X where, G : rigidity (N/m2) E : Youngs modulus (N/m2) v : Poissons ratio P : bulk density (kg/m3) V, : longitudinal acoustic wave velocity (m/s V, : transverse acoustic. wave velocity (m/