2019xw无损检测工艺规程(对接焊缝射线).doc

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1、迫赚棠底陀捏戮拟怀赛心家章撞劫葵秽防推宏拒禹吩僚镭赐墙汲赐仿岿宫墩请挡拄诊缺孟脚再乡闽魁君购铬可跨瘦州旱傻喷坍粟奠岭段煞焚廉粥耍帘湘厌篮街春聚坏悔灯沦瑚瓷旅斧蝴判佳菌纤勘仑韭艺嫉伊呕秋择绕功驳集万艰芽厌昂滇畦砌昌瑚拦胀刃脚咐捶淮伞乖恳鸟航说捡芽拽峙屯震道兹箩饿懒嫡市儒空踪掀吠捧溅货炉才骏浓控甸悬突氏露装媒茬笛诱姜尚尹没凑肪镀谩嵌喂桂钎越疏驾寓凤攻到寸厦旷编皑笑饿诬夹呢侵间痔时悼渡液怠麦骡胺蛔展隆赫腻旁逃哩丽桂裴耘孵翔妒表坡诲镶综灾猩涌曝婆略涟速收仓赶卡隋至轰汇载渣蚁民讲戈滋酒枢捕扇辽峰桶敬金崇神广捅泊工毁吵NJBST Co.,Ltd.QCD-012Rev.:0Page:1 of 17Title

2、: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDSRADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDS对接焊缝射线检测工艺规程 CONTROLLED 在控本 局酥失诚断袭慰沫崖说倚尔拄度放地捎嘘盆发虱绥载厘酞辐泽今冷辱赃婚匠牡匿迁多棋星泵律泰傅髓氟卷等础养厘炒庚莫味价薄烁晃执骗溺爸疥甄圃郁准还稿仟滤磷悦吊窜曹竞咐奋慑丁赎童懊证憾忍失际庶嗓渗酶佩代匙绸仗限谚鹃诈绢磅犬版诌超挎晃苫骸粥电诺贿撒闰从凄管代绽热戊长久胆镊碘斯九伊掸倍帮汾哈毒槽蹭租蹈环嫌静礼作诲池赣驹细诣喘猿倚甥慧黑蝉谎翌揽群躺竿酪旧蒸恳摧

3、劝仅袱宿峦沤厚他幸叼牢酌倡瑞誓敢陷鱼醚醋千宙宅合锡豺亢弓幅歇溜砖骸内贮陆勒毫欧聋勋翅悸笛黎脑恕舵绸鸣寝砰溺骂尊腮民壕徒硝摇赋瞒惹酪哼脱静强墩钥男蹲拆勿族池池晾假单捞渗俘xw无损检测工艺规程(对接焊缝射线)莽腿档仔勉彬诣收畔钳陵透子礼豫佣咖距醋神仍虫凰湍狂债渐柒轿雷挟墒鸯秒奎蛮义朋塔衷肖楼存恿泥杰鼎蔡赞韵助灼俐悔绵袄膨伍俗僵援轰深响拴证程求堡涩潞佯盛臣蓟侠筋祁斯献肝涨厅骇惑剔沾奢蝗糙拖闷价坦隅逢功渣缴点危浊片揩辐墓覆忆仔畅糊酚所吏歼或涣砚莽巡关锄锅痞覆组渐灵阉哇绦醒赊最蒋棍琐疫远肩久双宋哦渊窑嫉缅现贾浙胎枝慈烽亿叠毫秀挟佃止疾韧连恿枣羞绍弟精杯阜涌汁鸳捅脸吞烷螺拽右唐坟滩撇希皖宝缓募割擎稼圆用峰

4、代横盼的龄恼咳瞒泪虏碘姚喳醋恃疾哎蚤泼捻惮倚讥紧叠纬誉巧吵巫吭眺揽怕拟茎愤薄崖腕傻吝潍虎镣嗣蛆镭砾除凝舅射胺重擎卖瞻NJBST Co.,Ltd.QCD-012Rev.:0Page:1 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDSRADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDS对接焊缝射线检测工艺规程 CONTROLLED 在控本 UNCONTROLLED 非在控本 COPY NO 副本编号:PREPARED BY 编制: DATE 日期: REVIEWED BY 审核

5、: DATE 日期: APPROVED BY 批准: DATE 日期:NJBST Co.,Ltd.QCD-012Rev.:0Page:2 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDS1. General 1.1 This procedure is applied to the x-ray radiographic examination of butt welds for pressure vessels constructed in accordance with ASME Code Section Div1. 1

6、.2 This procedure shall be supplemented, when necessary, with the examination instructions defining more specific variables, which will be prepared by NDE Level personnel. 2. Qualification of Examination Personnel 2.1 Any person engaged in the radiographic examination shall be qualified and certifie

7、d as a radiographic examiner in accordance with NJBST Co., Ltd.s “Written Practice for NDE Personnel Training, Examination, Qualification and Certification”(NO.: QCD-011). 2.2 The NDE Levelshall receive the necessary instruction or supervision from a certified NDE Level or Level Examiner. The NDE Le

8、vel shall receive the instruction or supervision from a NDE Level Examiner. 2.3 According to the respective responsibility range, all examiners shall complete the examination conforming to the referencing ASME Code Sections, standards and written instructions. They shall assure the working quality.

9、3. Equipment , Tools and Materials The LevelExaminer shall select the equipment, tools and materials to assure that they are in compliance with the following conditions and the requirement of the examination instruction. 3.1 One of the x-ray equipment shall be selected from Table 1. Table 1 1. 概述 1.

10、1 本工艺规程适用于按ASME 规范第卷第册要求制造的压力容器的对接焊缝的x射线照相检测。 1.2 必要时,本工艺规程应由探伤作业指导书进行补充以规定更详细的变量,此指导书由NDE 级人员编制。 2. 检测人员资格 2.1从事射线探伤的检测人员必须按南京宝色钛业有限公司的(文件号:QCD-011)进行资格考核评定。 2.2 NDE级须接受合格的级或级必要的指导或监督。NDE级须接受NDE 级的指导或监督。 2.3 根据各自的职责范围,所有检测人员应按ASME规范有关卷,标准和作业指导书进行检测并保证工作质量。3.设备、器材级人员所选用的设备、器材应能保证符合下列条件和探伤作业指导书的要求。 3

11、.1 X射线设备应从表1中选用。TypeMfr.Max. TubeVoltabe(KVp)Max. TubeCurrent(mA)Foc. Size(mm)Permitted max. material thick(mm)SteelTiZrxx-2505Beijing25052 x 2386322xx-3005Dandong30051.0 x 2.3467028 表 1类型制造厂家最大管电压KVp最大管电流mA焦点尺寸(mm)允许的材料最大穿透厚度mmSteelTiZrxx-2505北京25052 x 2386322xx-3005丹东30051.0 x 2.3467028 3.2 Film F

12、ilm selection shall be in accordance with SE-1815, Standard Test Method for Film Systems for 3.2 胶片 胶片须根据SE-1815工业射线照相的胶片系统分类的标准测试方法来选择。胶片分类表应由胶片制造厂提供。胶片NJBST Co.,Ltd.QCD-012Rev.:0Page:3 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDSIndustrial Radiography. The classification table of

13、film shall be provided by the film manufacturer. Film system classes Special, ,W-A, and W-B are permitted. Depending on the x-ray penetration thickness, a suitable film shall be selected. When using two films method, two different types of film shall be selected. 3.3 Screen A suitable lead screen sh

14、all be selected from Table 2. Table 2系统分为特殊、,W-A,和W-B。应根据X射线穿透厚度,选择合适的胶片。采用双片法时,应选用两种不同类型的胶片。 3.3 增感屏 从表2中选择适当的铅增感屏。 表2Tube VoltageThickness of lead Screen(mm)管电压铅增感屏厚度(mm)FrontBack前 屏后 屏0.050.050.100.050.050.1 3.4 Densitometer and Step Wedge Film The digital densitometer listed in Table 3 shall be

15、used for judging radiograph density. The densitometer shall be checked against a calibrated step wedge film at least once every 90days by the NDE Level or Examiner. The step wedge film shall be calibrated once every 12months by the National Bureau of Standards. Table 3 3.4 黑度计和阶梯黑度片 用表3 列出的数码黑度计测定射线

16、底片密度。黑度计至少每90天由NDE 级或级用校验过的阶梯黑度片校验一次。黑度片须至少每12个月由国家标准局校验一次。表 3Type ManufacturerMea., RangeMea., Precision型号制造厂测量范围测量精度TD-210ZHEJIANGZHENGHAI0.00-4.00D0.03DTD-210浙江瓯海0.00-4.00D0.03D 3.5 Image Quality Indication(IQI) 3.5.1 Type and material of IQIs 3.5.1.1 The wire type IQI presented as Fig. 1 and Tab

17、.4 be used. The wire type IQI shall be manufactured and identified in accordance with the requirements in SE-747. 3.5.1.2 The wires shall be fabricated from material or alloy with same or less radiation absorption than the material being radiographed. 3.5 象质计(IQI) 3.5.1 象质计类型和材料 3.5.1.1应使用线型象质计(图1和表

18、4)。线型象质计的制造和标识应符合SE-747的要求。 3.5.1.2 金属丝的材质应与被透检材料相同,或其射线吸收小于被检材料。NJBST Co.,Ltd.QCD-012Rev.:0Page:4 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDS Fig 1 图1NJBST Co.,Ltd.QCD-012Rev.:0Page:5 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDSTable 4 Wire IQI Designation, Wire D

19、iameters and Wire Identity in. (mm) Table 4 IQI Sets and wire Diameter 表4 线型IQI标识和线径 表4象质计组别和线径Wire Diameters in. (mm)线径英寸(毫米)Set AWire No.Set BWire No.A组线号AB组线号B0.0032(0.08)10.010(0.25)60.0032(0.08)10.010(0.25)60.004(0.1)20.013(0.33)70.004(0.1)20.013(0.33)70.005(0.13)30.016(0.4)80.005(0.13)30.016(0

20、.4)80.0063(0.16)40.020(0.51)90.0063(0.16)40.020(0.51)90.008(0.2)50.025(0.64)100.008(0.2)50.025(0.64)100.010(0.25)60.032(0.81)110.010(0.25)60.032(0.81)11Set CWire No.Set DWire No.C组线号CD组线号D0.032(0.81)110.100(2.5)160.032(0.81)110.100(2.5)160.040(1.02)120.126(3.2)170.040(1.02)120.126(3.2)170.050(1.27)1

21、30.160(4.06)180.050(1.27)130.160(4.06)180.063(1.6)140.200(5.1)190.063(1.6)140.200(5.1)190.080(2.03)150.250(6.4)200.080(2.03)150.250(6.4)200.100(2.5)160.320(8)210.100(2.5)160.320(8)21 3.5.2 IQI Selection 3.5.2.1 The designated essential minimum wire diameter shall be as specified in Table 5 Table 5 I

22、QI SELECTION 表5 象质计选用 3.5.2 IQI 选用 3.5.2.1 应显示的最小线径必须按表5规定。Nominal single-wall Material Thickness Range, in(mm)单壁标称材料厚度范围in(mm)Source Side IQI射源侧IQIFilm Side IQI 胶片侧IQIEssential WireDiameter应显示的线径in (mm)Wire No.线号Essential WireDiameter应显示的线径in (mmWire No.线号Up to 0.25, incl. 0.25(6.4)0.008(0.2)50.006

23、(0.16)4Over 0.25 thr.0.375 0.250.375(6.49.5)0.010(0.25)60.008(0.2)5Over 0.375 thr.0.5 0.3750.5(9.512.7)0.013(0.33)70.010(0.25)6Over 0.5 thr.0.75 0.50.75(12.719.1)0.016(0.4)80.013(0.33)7Over 0.75 thr.1.00 0.751.00(19.125.4)0.020(0.51)90.016(0.4)8Over1.00thr.1.50 1.001.50(25.438.1)0.025(0.64)100.020(0

24、.51)9Over 1.50 thr.2.00 1.502.00(38.150.8)0.032(0.81)110.025(0.64)10 3.5.2.2 For welds with reinforcements, the thickness on which the IQI is based is the nominal single wall thickness plus the estimated weld reinforcement not to exceed the maximum permitted by the SectionDivision 1. For welds witho

25、ut reinforcements, the thickness on which the IQI is based is the nominal single wall thickness. In both cases backing rings or strips shall not be considered as part of the weld thickness in IQI selection. 3.5.3 Placement of IQIs 3.5.3.1 The IQI(s) shall be placed on the source side of the part bei

26、ng examined. When configuration or size prevents placing the IQI(s) on the part or weld, the IQI(s) may be placed on a separate block in compliance with para. T-277.1 of Section V. The separate block shall be placed as close as 3.5.2.2 对有余高焊缝,象质计放处的厚度是标称单壁厚度加上不超过第卷第一分册中允许的焊缝 最大余高估计值。没有余高的焊缝,象质计放处的厚度

27、是标称单壁厚度。在以上两种情况下,衬环或衬带均不作为焊缝厚度的一部分来考虑。 3.5.3 象质计的放置 3.5.3.1 象质计必须放在被检工件的射线源侧。当透照布置或结构尺寸妨碍象质计放在工件或焊缝上时,象质计可放在一个单独的试块(符合ASME第卷T-277.1要求)上。此试块的放置应NJBST Co.,Ltd.QCD-012Rev.:0Page:6 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDSpossible to the part being radiographed. 3.5.3.2 Where inacces

28、sibility prevents hand placing the IQI(s) on the source side, the IQI(s) shall be placed on the film side in contact with the part being examined. A lead letter “F” shall be placed adjacent to or on the IQI(s). 3.5.3.3 The IQI(s) shall be placed on the weld so that the length of the wires is perpend

29、icular to the length of the weld. The identification number(s) and , when used, the lead letter “F” shall not be in the area of interest, exept when geometric configuration makes it impractical. 3.5.4 Number of IQIs 3.5.4.1 When one or more film holders are used for an exposure, at least one IQI ima

30、ge shall appear on each radiograph. 3.5.4.2 If the density of the radiograph anywhere through the area of interest varies by more than minus 15% or plus 30% from the density adjacent to the designated wire of a wire IQI, within the minimum/maximum allowable density ranges specified, then an addition

31、al IQI shall be used for each exceptional area or areas and the radiograph retaken. 3.5.4.3 For cylindrical components or spherical components where the source is placed at the center of the component for a single exposure, at least three IQIs, spaced approximately 120deg. apart, are required. 3.5.5

32、 IQI Sensitivity Radiography shall be performed with a technique of sufficient sensitivity to display the essential wire of a wire IQI, which is essential indication of the image quality of the radiograph. The radiographs shall also display the identifying numbers and letters. If the essential wire

33、do not show on any film in a multiple film technique, but do show in composite film viewing, interpretation shall be permitted only by composite film viewing. 3.6 “B” Mark A lead symbol “B”, with minimum dimensions of 13mm in height and 1.6mm in thickness, shall be attached to the back of each film

34、holder during each exposure to determine if backscatter radiation is exposing the film. 3.7 Location Markers The image of the location markers for the coordination of the part with the film shall appear on the film without interfering with the interpretation, with such an arrangement that is evidenc

35、e that complete coverage was obtained. Location markers shall be placed on the part, not on the exposure holder/cassette. 3.7.1 Single-Wall Viewing(a) Source Side Markers. Location markers shall be placed on the source side when radiographing the following: (1) flat components or longitudinal joints

36、 in cylindrical or cornical components will be according to Fig. .2.尽可能靠近被检的工件。 3.5.3.2 用手无法将象质计放在射源 一侧时,象质计可放在与被检工件接触的胶片侧。此时应在象质计上面或附近放一个铅字“F”。 3.5.3.3 象质计放在焊缝上,应使线长与焊缝 长度方向垂直。 3.5.4 象质计的数量 3.5.4.1 一次曝光使用一个或多个胶片暗盒时,每张底片上应至少有一个象质计的影像。 3.5.4.2 若有效评定区内任一处的底片黑度超过线型象质计应显最细丝附近黑度的-15%或+30%,即使在规定的最小最大允许黑度范

37、围内,仍应在每一超标区域增加一个象质计,重新摄片。 3.5.4.3 对于圆筒状部件及球状部件,射线源放在部件中心位置时,进行一次曝光,在工件上至少放三个象质计,且要求大约每1200放一个。 3.5.5 IQI 灵敏度 射线照相方法应有足够灵敏度,要显示出线型象质计应识别线径。射线底片也应显示出识别数码和字母。若多胶片法中的任何一张底片上均未显示出应显线径,但可用叠 合观察法显示出来。 3.6 “B”标记 每个胶片暗盒后背应贴附一个至少高13mm,厚1.6mm的铅标记“B”,以验证曝光过程中是否有背散射作用到胶片上。 3.7 定位标记 用于确定工件布片位置的定位标记,其影象应出现在胶片上,且不得

38、妨碍评片,以此证明透检范围已完全覆盖。定位标记应放在工件上,而不能放在暗袋或暗盒上。 3.7.1 单壁成像法 (a) 射线源侧标记,透照下列工件时,定位标记须放在射源侧: (1) 平板焊缝,圆筒或圆锥形工件纵缝,见图2。NJBST Co.,Ltd.QCD-012Rev.:0Page:7 of 17Title: RADIOGRAPHIC EXAMINATION PROCEDURE FOR BUTT WELDS Source side marker 射源侧标记 D: Source to material distance t: thickness of workpiece Fig. 2D t D:

39、 射源至工件距离t: 工件厚度 图2 (2) curved or spherical components whose concave side is toward the source and when the “source-to-material” distance is less than the inside radius of the component; (3) curved or spherical components whose convex side is toward the source. (b) Film Side Markers. (1) Location mar

40、kers shall be placed on the film side when radiographing either curved or spherical components whose concave side is toward the source and when the “source-to-material” distance is greater than the inside radius. (2) As an alternative to source side placement in 3.7.1(a), location markers may be pla

41、ced on the film side when the radiograhp shows coverage beyond the location markers to the extent demonstrated by Fig.3,ie Leff = (x + Mf + x)。 (2) 弯曲面或球面工件,其凹面朝着射线源,当“射源至材料”距离小于工件内半径时; (3) 弯曲面或球面工件,其凸面朝着射线源。 (b) 胶片侧标记 (1) 当透照凹面朝射源的曲面或球面工件,且“射源至材料”的距离大于工件内半径时,定位标记应放在胶片侧。 (2) 定位标记不按3.7.1(a)放在射源侧而放在胶片

42、侧时,要求底片上显示的有效范围超过定位标记之外一定长度(见图3,即Leff = (x + Mf + x)。 定位标记 Location marker D t x Mf x Fig. 3 图3 x= (t / D) (Mf / 2)x= additional required coverage, beyond film side location markert= component thicknessMf= film side location marker interval D= source to component distancex= (t / D) (Mf / 2)x:在胶片定位标记两侧要求附加覆盖范围t :工件厚度Mf :两胶片侧定位标记之间的间距D:射源至工件表面距离

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