《IEEE Std 495-1986 故障电路指示器的试验指南.pdf》由会员分享，可在线阅读，更多相关《IEEE Std 495-1986 故障电路指示器的试验指南.pdf（10页珍藏版）》请在三一文库上搜索。
1、L STANDARD IEEE Guide for Testing Faulted Circuit Indicators ANSI/IEEE Std 495-1986 Published by The Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 1001 7, USA April 14. 1986 SHI O4 7, ANSI / IEEE SM 4951986 An American National Standard IEEE Guide for Test
2、ing Faulted Circuit Indicators Sponsor Transmission and Distribution Committee of the IEEE Power Engineering Society Approved September 19, 1985 IEEE Standards Board Approved February 19, 1986 American National Standards Institute Copyright 1986 by The Institute of Electrical and Electronics Enginee
3、rs, Inc 345 East 47th Street, New York NY 10017, USA No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Standards documents are developed within the Technical Com- mittees of the IEEE
4、Societies and the Standards Coordinating Commit- tees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily mem- bers of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subjec
5、t within the Institute as well as those activities outside of IEEE which have expressed an in- terest in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to pro- duce, test, me
6、asure, purchase, market, or provide other goods and ser- vices related to the scope of the IEEE Standard. Furthermore, the view- point expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from us
7、ers of the standard. Every IEEE Stan- dard is subjected to review at least once every five years for revision or reaffirmation. When a document is more than five years old, and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflec
8、t the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Sug- gestions for changes in documents shou
9、ld be in the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the mean- ing of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of
10、IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it is important to ensure that any interpretation has also received the con- currence of a balance of interests. For this reason IEEE and the mem- bers of
11、 its technical committees are not able to provide an instant re- sponse to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests for interpretations should be ad- dressed to : Secretary, IEEE Standards Board 34
12、5 East 47th Street New York, NY 10017 USA Foreword (This Foreword is not a part of ANSI/IEEE Std 495-1986, IEEE Guide for Testing Faulted Circuit Indicators.) This test code was prepared by the Task Group on Test Code for Faulted Circuit Indicators of the Working Group on Switching and Overcurrent P
13、rotection, Distribution Subcommittee, IEEE Trans- mission and Distribution Committee of the IEEE Power Engineering Society. At the time this guide was approved, the task group had the following membership: J. J. Burke, Chairman R. Arndt F. Astrove R.C. Brown William Brownell Dan Fleck Calvin H. Fost
14、er John Hickman H.P. Johnson F. William Koch J.R. Marek Thomas Marx L.V. McCall Paul Orehek D.G. Parvin Milt Powell Taft B. Russell Norman Sacks E.L. Sankey K.E. Schuessler William Shula Fred D. Truban J.E. Vann The following persons were on the balloting committee that approved this document for su
15、bmission to the IEEE Standards Board: L.A. Belfore V.L. Chartier W.H. Cole F.A. Denbrock C.C. Diemond J.J. Dougherty G.V. Fantozzi S.P. Maruvada D.T. Michael T.A. Pinkham R.L. Retallack C.F. Riederer R.G. Rocamora R.C. Seebald D.D. Wilson When the IEEE Standards Board approved this standard on Septe
16、mber 19,1985, it had the following membership: John E. May, Chairman John P. Riganati, Vice Chairman Sava I. Sherr, Secretary James H. Beall Fletcher J. Buckley Rene Castenschiold Edward Chelotti Edward J. &hen Paul G. Cummings Donald C. Fleckenstein Jay Forster Daniel L. Goldberg Kenneth D. Hendrix
17、 Irvin N. Howell Jack Kinn Joseph L. Koepfinger * Irving Kolodny R. F. Lawrence Lawrence V. McCall Donald T. Michael* Frank L. Rose Clifford 0. Swanson J. Richard Weger W. B. Wilkens Charles J. Wylie *Member emeritus Contents SECMON PAGE Scope and References . 1.1 Scope 1.2 References Definitions Se
18、rvice Conditions . 3.1 Usual Service Conditions . 3.2 Unusual Service Conditions Testing 4.1 Design Tests 4.2 Production Tests . 4.3 General Test Conditions 4.4 Specific Tests . 5 5 5 5 6 6 6 6 6 6 6 6 An American National Standard IEEE Guide for Testing Faulted Circuit Indicators 1. Scope and Refer
19、ences 1.1 Scope. This test code establishes definitions, service conditions, test procedures, and condi- tions for faulted circuit indicators (FCI) for use on power distribution systems. 1.2 References l ANSI / IEEE C37.41-1981, IEEE Standard De- sign Tests for High-Voltage Fuses, Distribution Enclo
20、sed Single-Pole Air Switches, Fuse Discon- necting Switches, and Accessories. 2 ANSI/IEEE Std 4-1978, IEEE Standard Techniques for High Voltage Testing. 2. Definitions fault current. Any current through the sensor equal to or in excess of the trip current of the faulted circuit indicator (FCI). faul
21、ted circuit indicator. A single or multi- phase device designed to sense fault current and ANSI documents are available from the Sales Depart- ment, American National Standards Institute, 1430 Broad- way, New York, NY 10018. provide an indication that the fault current has passed through the power c
22、onductor(s) at the point where the FCI sensor is installed. indicator. That portion of the FCI which indi- cates that fault current has been sensed. reset current or voltage. The nominal rms value of current or voltage that will cause the indicator of the automatic current or voltage reset FCI to ch
23、ange from FAULT to NORMAL indication. reset time. The time required for the FCI to return automatically to NORMAL indication after its reset current or voltage has been es- tablished, or for the elapsed time automatic reset FCI to reset. response time. The time required for the FCI to respond to a s
24、pecified value of fault current. suitable test. Where a condition or a set of con- ditions are so variable from one utility to an- other or even within the utility itself that no test can be properly specified for all conditions, it is left to the user to determine their individual test needs. A sui
25、table test and anticipated ser- vice life shall be that which is mutually agreed to between manufacturer and user. trip current. The actual value of current in amperes rms that will cause the FCI to indicate FAULT. 5 ANSI / IEEE Std 495-1986 IEEE GUIDE FOR trip current rating. The published rms sinu
26、- soidal fault current in amperes which cause the FCI to indicate FAULT. 3. Service Conditions 3.1 Usual Service Conditions 3.1.1 Environment. The FCI shall be suitable for use under one or more of the following ser- vice conditions: (1) In air, exposed to direct sunlight and salt spray (2) In air,
27、exposed to direct sunlight (3) In air, not exposed to direct sunlight or (4) Buried in earth (sensor only) (5) Submerged in water intermittently or con- 3.1.2 Ambient Temperature salt spray tinuously to a depth of 15 ft Ambient Temperature Range Class Sensor Indicator All -40 “C to 85 C -40 “C to 85
28、 “C 3.2 Unusual Service Conditions. Service con- ditions other than those listed in 3.1 are consid- ered to be unusual. 4. Testing 4.1 Design Tests. All tests specified in 4.4 shall be performed by the manufacturer on a suffi- cient number of FCIs made on production tool- ing, using production metho
29、ds to demonstrate that they meet their ratings and are suitable for operation under usual service conditions. 4.2 Production Tests. The following produc- tion tests shall be performed by the manufactuer on every FCI: (1) Trip current test, see 4.4.9 (2) Reset test, see 4.4.10 In addition, the manufa
30、cturer shall periodi- cally test a sufficient number of production FCIs to ensure continuing compliance with design tests. 4.3 General Test Conditions. The following test conditions shall apply unless otherwise spec- ified under specific tests: (1) FCIs shall be properly assembled with ac- tual comp
31、onents. All parts which are grounded 6 in a normal installation shall be connected to the ground of the test circuit (2) Test temperatures shall be selected by the manufacturer to verify that the FCI will meet its rating under the conditions shown in 3.1.2 (3) All ac voltage shall be in accordance w
32、ith ANSI / IEEE Std 4-1978 2.2 4.4 Specific Tests 4.4.1 Temperature Cycling Test. The pur- pose of this test is to ensure that the FCI will operate after aging. The FCI shall be subjected to five sequential thermal cycles with exposures at -40 “C, 50 “C, and 85 “C. Temperature equi- librium shall be
33、 achieved at each temperature level for the FCI before cycling can continue. Following these exposures, the FCI shall pass all of the other design tests. 4.4.2 Water Submersion Test. The purpose of this test is to verify that temperature cycling will not adversely affect the ability of the sub- mers
34、ible FCI to prevent the entrance of moisture at all interfaces. The FCI shall be placed under water with an equivalent pressure head of 15 ft of water at a temperature of 20 “C to 30 “C for 48 h. The equiv- alent pressure head of 15 ft of water shall then be maintained while the water temperature is
35、 raised to 70 “C and held for 48 h. The equivalent pressure head of 15ft of water shall then be maintained as the water temperature is allowed to return naturally to 20 “C to 30 “C and while the water temperature is further lowered to 5 “C. This equivalent pressure head of 15 ft of water and water t
36、emperature of 5C shall be main- tained for 48 h. The FCI shall be removed from the water and visually examined for moisture inside the indi- cator and sensor and for any surface deterio- ration. The temperature of the FCI shall be allowed to return to 20C to 30C naturally where it shall remain for 3
37、 h. The tests of 4.4.9 and 4.4.10 shall than be applied. The tempera- ture of the FCI shall be raised to 85 “C where it shall remain for 3 h. The temperature of the FCI shall be held at 85 “C and the tests of 4.4.9 and 4.4.10 shall again be applied. The temperature of the FCI shall then be lowered t
38、o -20 “C where it shall remain for 3 h. The temperature of the FCI shall be held at -20 “C and the tests of 4.4.9 and 4.4.10 shall again be applied. * Numbers in brackets correspond to those of .the refer- ences, Section 1.2 of this standard. TESTING FAULTED CIRCUIT INDICATORS ANSI / IEEE Std 495-19
39、86 4.4.3 Outdoor Weathering of Plastics Test. A suitable test shall be performed to demon- strate that FCIs installed in direct sunlight will perform satisfactorily for their anticipated ser- vice life. 4.4.4 Salt Spray Test. A suitable test shall be performed to demonstrate that FCIs installed expo
40、sed to salt spray will perform satisfactorily for their anticipated service life. 4.4.5 Immersion Corrosion Test. A suitable test shall be performed to demonstrate that FCIs installed submerged in water or buried in earth will perform satisfactorily for their antic- ipated service life. 4.4.6 Electr
41、ic Cord Pull-out Test. The pur- pose of this test is to ensure that electric cord strain relief on multipart FCIs can be accom- plished so that a force exerted on the flexible cord will not be transmitted to wiring connec- tions. The assembly of a cord and FCI sensor or indicator shall be capable of
42、 withstanding a steady straight pull of 30 lb. The detachment of any cord conductor or any other evidence of me- chanical or electrical failure is not acceptable. 4.4.7 Impact Resistance Test. The purpose of this test is to ensure that the FCI will not change an indication from NORMAL to FAULT or fr
43、om FAULT to NORMAL due to normal han- dling in the field. The FCI shall be mounted per the manufacturers instructions on number 2 15 kV class concentric neutral cable connected with a 200 A class elbow to a 25 kVA low-profile padmounted transformer with an upward open- ing hinged lid. The FCI shall
44、not change an in- dication from FAULT to NORMAL or from NORMAL to FAULT when the transformer lid is slammed open or shut. 4.4.8 Short-Time Current Test. The purpose of this test is to verify that the FCI is capable of withstanding short-time current of one of the magnitude and duration classes as fo
45、llows: Test Current Fault Current in Amperes Minimum Rating in RMS Time in Assymetry Amperes Symmetrical Seconds Factor 10 OOO 10 000 0.17 1.3 (X/R = 6) 25 000 25 OOO 0.17 1.6 (X/R = 20) Before imposing the short-time current test, the FCI shall be subjected to all of the other tests covered by 4.1
46、and shall meet the require- ments of those tests. The rms value of the first major loop of the current wave shall be equal to or greater than the symmetric value specified 7 in the table, times the appropriate asymmetry factor. The rms value of the symmetric current shall be equal to or greater than
47、 the value spec- ified in the table. This short-time current test shall be applied to the FCI two times, after which the FCI shall successfully pass the tests covered by 4.4.9, 4.4.10, and 4.4.11. 4.4.9 Trip Current Test. The purpose of this test is to verify that the FCI indicator will move from an
48、 indication of NORMAL to an indication of FAULT when tested in accordance with 4.4.9 (1) and will not move from an indication of NORMAL to an indication of FAULT when tested in accordance with 4.4.9 (2). If this test is being conducted as a design test, the specimens shall first have passed the shor
49、t-time current test, 4.4.8. (1) Trip Current Rating Verification Test. This test shall be performed by passing current through the conductor(s) to which the FCI is applied. The results shall demonstrate compli- ance with the manufacturers specified trip cur- rent rating and tolerances. The manufacturer shall perform this trip cur- rent test at various temperatures throughout the specified temperature range of the FCI with the selection designed to demonstrate compli- ance with the requirements of this test code. This test shall be performed a minimum of ten times a