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1、BRITISH STANDARD BS CECC 90102:1980 Incorporating Amendment Nos. 1, 2 and 3 Specification for Harmonized system of quality assessment for electronic components Family specification Digital integrated TTL-SCHOTTKY circuits Series 54S, 64S, 74S, 84S Licensed Copy: London South Bank University, London
2、South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 BSI 04-2000 ISBN 0 580 34753 2 Amendments issued since publication Amd. No.Date of issueComments 3641March 1981 5199August 1986 5623April 1987Indicated by a sideline in the margin Licensed Copy:
3、London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 BSI 04-2000i Contents Page National forewordii Forewordiii Text of CECC 901021 Licensed Copy: London South Bank University, London South Bank University, Sat
4、Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 ii BSI 04-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 90102 “Fami
5、ly specification: Digital integrated TTL SCHOTTKY circuits Series 54S, 64S, 74S, 84S”. This standard is a harmonized specification with in the CECC system. Terminology and conventions. The text of the CECC specification has been accepted as suitable for publication, without deviation, as a British S
6、tandard. Certain terminology and conventions are used, however, that are not identical with those used in British Standards. Attention is particularly drawn to the following. The comma has been used throughout as a decimal marker. In British Standards it is current practice to use a full point on th
7、e baseline as the decimal marker. Cross references. The British Standard harmonized with CECC 00100 is BS E9000 “General requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Component Committee System” Part 1 “Basic rules”. The following International Sta
8、ndards are referred to in the text and for each there is a corresponding British Standard; these are listed below Scope. This standard lists the general information for ratings, characteristics and inspection requirements for a series of integrated circuits which shall be included as mandatory requi
9、rements in detail specifications in accordance with BS CECC 90000. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunit
10、y from legal obligations. International StandardCorresponding British Standard CECC 90000:1976BS CECC 90000:1977 Harmonized system of quality assessment for electronic components: Generic specification: Monolithic integrated circuits (Identical) CECC 90100:1976BS CECC 90100:1977 Harmonized system of
11、 quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits (Identical) IEC 191-2:1966BS 3934:1965 Dimensions of semiconductor devices (Related) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC
12、title page, pages ii to iv, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University,
13、 Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 ii BSI 04-2000 Contents Page Forewordiii 1Limiting conditions of use for the fa
14、mily1 2Recommended operating conditions and associated characteristics for the family2 3Supplementary information for gates2 4Inspection requirements3 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 901
15、02:1980 BSI 04-2000iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of
16、the System is to facilitate international trade by the harmonization of specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by
17、all member countries without further testing. This document has been formally approved by the CECC and has been prepared for those countries taking part in the System who wish to prepare and issue detail specifications for DIGITAL INTEGRATED CIRCUITS. It should be read in conjunction with document C
18、ECC 00100: Basic Rules (1974). Preface This family specification was prepared by CECC Working Group 9: Integrated Circuits. It contains the general information for the TTL-S series 54S, 64S, 74S and 84S. Together with the device type detail specification, usually prepared nationally, it forms the co
19、mplete detail specification for the device belonging to series 54S, 64S, 74S or 84S. The text of this specification was circulated to the CECC for voting in the documents CECC(Secretariat)558 in November 1976 and CECC(Secretariat)671 in December 1977 and was ratified by the CECC for printing as a CE
20、CC specification. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) B
21、SI BS CECC 90102:1980 BSI 04-20001 Page 1 of 8 CECC-Number Date of issue ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH:National Number CECC 90000:Generic specific., monolithic integrated circuits and Date of issue (if appropriate) CECC 90100:Sectional Spec., Digital monolithic integr.
22、 circuits Family Specification for TTL-Schottky-Circuits, series 54S, 64S, 74S, 84S Typical construction:Silicon monolithic bipolar cavity and non-cavity packages Outline and dimensions: See detail specification for specific type Terminal connections: See detail specification for specific type Asses
23、sment levels R, S, T and V 1 Limiting conditions of use for the family (not for inspection purposes) 1.1Maximum continuous supply voltage VCC 0,5 V + 7,0 V 1.2Maximum input voltages 1.2.1Max input voltageVI 0,5 V + 5,5 V (see individual detail spec) 1.2.2Max input voltage between multiple emitter tr
24、ansistor inputs VII+ 5,5 V 1.3Minimum and maximum operating ambient temperaturesTamb(C)min max 54S 55 + 125 64S 40 + 85 74S 0 + 70 84S 25 + 85 1.4Minimum and maximum storage temperaturesTstg 65 C + 150 C min max (unless otherwise prescribed in the detail spec) See the relevant Qualified Parts List f
25、or the availability of components qualified to this detail specification. Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 2 BSI 04-2000 2 Recommended operating conditions and associated chara
26、cteristics for the family (not for inspection purposes) (see also relevant detail specification) These apply over the operating temperature range, unless otherwise prescribed. 3 Supplementary information for gates Unused gates Inputs of unused gates should be connected in such a way that the output
27、is set to high level to ensure minimum power dissipation. Unused input of NAND/AND-gates Unused inputs shall be maintained at a positive voltage U 2,5 V (54S) or 2,7 V (64S, 74S, 84S), but shall not exceed the absolute maximum rating of 5,5 V. Some possible ways of handling unused inputs are: Connec
28、t unused inputs to an independent supply voltage preferably between 2,5 V (54S) or 2,7 V (64S, 74S, 84S) and 4,5 V. Connect unused inputs to an used input of the same gate if maximum fan-out of the driving output will not be exceeded at high level. Connect unused inputs to the high-level output of a
29、n unused gate. Connect unused inputs to VCC through a 1 k7 resistor so that if a transient which exceeds the 5,5 V maximum rating should occur, the impedance will be high enough to protect the input. One to 25 unused inputs may be connected to each 1 k7 resistor. Unused inputs of NOR/OR-gates Unused
30、 inputs shall be connected to ground. 2.1Positive supply voltageVCC4,5 5,5 V (54S) 4,75 5,25 V (64S, 74S, 84S) 2.2Most negative low level input voltage at an input current IIK = 18 mA VIKB1,2 V 2.3Minimum value of low level input voltageVILB0V 2.4Maximum value of low level input voltageVILA0,8 V 2.5
31、Minimum value of high level input voltageVIHB2V 2.6Maximum value of high level input voltageVIHA5,5 V 2.7Most positive low level output voltage at an output current of 2 mA the higher fanout (unless otherwise prescribed in the detail specification) VOLA0,5 V 2.8Most negative high level output voltag
32、e at an output current of 50 4A the higher fanoutVOHB 2,5 V (54S) 2,7 V (64S, 74S, 84S) 2.9Most positive high level output voltageVOHA 5,5 V (54S) 5,25 V (64S, 74S, 84S) 2.10DC noise margin at low level (VILA VOLA)VNL0,3 V 2.11DC noise margin at high level (VOHB VIHB)VNH0,5 V (54S) 0,7 V (64S, 74S,
33、84S) 2.12Dynamic characteristicssee relevant detail specification Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 BSI 04-20003 4 Inspection requirements NOTE 1All tests shall be performed at
34、Tamb = 25 C unless otherwise prescribed. NOTE 2The paragraph numbers refer to the generic specification, unless otherwise prescribed. NOTE 3The following abbreviations are used: IL=Inspection level AQL=Acceptance Quality level n=fix sample size c=acceptance criteria D=destructive ND=non destructive
35、P=Periodicity n.a.=not applicable Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2See Note 2ILAQL Limits See Note 2 Group A Inspection These tests are contained in the detail specification for the individual device type. They comprise the following sub-
36、groups: Sub-group A1ND Visual examination 4.2See relevant detail specification R, S, T, VI1,5See relevant detail spec. Sub-group A2ND Verification of the functionSee relevant detail specification R, S T, V II II 0,15 0,25 See relevant detail spec. Sub-group A3ND Static characteristics at 25 CSee rel
37、evant detail specification R, S, T, VII0,65See relevant detail spec. Sub-group A4aND Static characteristics at maximum operating temperature See relevant detail specification R S T, V S-4 S-4 n.a. 1,0 2,5 n.a. See relevant detail spec. Sub-group A4bND Static characteristics at minimum operating temp
38、erature See relevant detail specification R S T, V S-4 S-4 n.a. 1,0 2,5 n.a. See relevant detail spec. Sub-group A5ND Dynamic characteristics specification at 25 C See relevant detail specification R S, T, V S-4 S-4 1,5 2.5 See relevant detail spec. Notes on page 3 Licensed Copy: London South Bank U
39、niversity, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 4 BSI 04-2000 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2See Note 2ILAQL Limits See Note 2 Group B Inspection Sub-group B1ND
40、Dimensions 4.3IEC outline (See IEC 191-2 and see detail spec. for specific type) R, S, T, VS-41, 0See relevant detail spec. Sub-group B2D Solderability 4.6.10.1Solder both No ageing required R, S, T, VS-32, 54.6.10.1 Sub-group B3ND Sealing test (cavity packages)R, S, T, VII1, 0 Fine leak 4.6.9.1 Gro
41、ss leak 4.6.9.2 4.6.9.1 Test Qk 4.6.9.2 Test Qc 4.6.9.1 4.6.9.2 Sub-group B4R, S, T V S-4 n.a. 2,5 n.a. Change of temperature 4.6.8.1 4.6.8.1 Test NC T = Tstg min and max (See relevant detail specification) Endpoint tests 1) for cavity packages: Fine and gross leak test NDTest Qk 4.6.9.1 and Qc 4.6.
42、9.2 2) for non-cavity packages: Damp heat accelerated DTest Da 4.6.9.1 Electrical testsas for sub-groups A2 and A3 as for sub-gr. A2 and A3 of detail spec. Sub-group B5ND168 h + 72 h 10 at Tamb = 125 C, unless otherwise stated in the DS but not less than the max. operating temperature. (This may res
43、ult in the limiting values being exceeded. It shall be ascertained during setting up the DS, if the higher temperature is permissible for the duration of the endurance test.) R, S, T V S-4 n.a. 1,5 n.a. Electrical endurance 4.2 of CECC 90100 Endpoint tests Electrical tests as for sub-groups A2 and A
44、3 as for sub-gr. A2 and A3 of detail spec. Notes on page 3 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 BSI 04-20005 Examination or test D or ND Test Conditions Assessment level Inspection
45、 requirements See Note 2See Note 2Pnc Limits See Note 2 Group C Inspection Sub-group C1ND Dimension 4.3IEC outline All dimensions excluding those in sub-group B1 (see detail spec. for specific type) R, S, T, V3181 See relevant detail spec. Sub-group C2NDR, S, T3 Resistance to cleaning solvents 4.4 t
46、est XAVn.a.to be included later Sub-group C3DR, S, T, V3181 Robustness of terminations 4.6.12.2 4.6.12.2 Force (see relevant detail spec.) 4.6.12.2 no broken terminations Sub-group C4D4.6.11R, S, T, V3432 Resistance to soldering heat followed by change of temperature 4.6.8.1 or 4.6.8.3 T = Tstg min
47、and max (see relevant detail specification) Endpoint tests 1) for cavity packages: Fine and gross leak test Test Qk 4.6.9.1 Test Qc 4.6.9.2 2) for non-cavity packages: Damp heat accelerated Test Da 4.6.3.1 Electrical testsas for sub-groups A2 and A3 as for sub-gr. A2 and A3 of detail spec. Notes on
48、page 3 Licensed Copy: London South Bank University, London South Bank University, Sat Dec 09 01:27:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 90102:1980 6 BSI 04-2000 Examination or test D or ND Test Conditions Assessment level Inspection requirements See Note 2See Note 2Pnc Limits See No
49、te 2 Sub-group C5DR, S, T, V3181 (cavity packages) Shock 4.6.44.6.4 Peak acceleration 14 700 ms2 Pulse duration 0,5 ms Vibration, swept frequency 4.6.5 4.6.5 Applied in 3 mutual perpendicular axes, approximately 12 cycles in each direction Acceleration, steady state 4.6.7 4.6.7 196 000 ms2 axis Y1, Y2 Endpoint tests fine leak 4.6.9.1 gross leak 4.6.9.2 4.6.9.1 Test Qk 4.6.9.2 Test Qc 4.6.9.1 4.6.9.2 Electrical testsas for sub-groups A2 and A3 as for sub-gr. A2 and A3 of detail spec. Sub-group C6DR, S, T, V3322 (cavity p