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1、BRITISH STANDARD BS CECC 30702:1993 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed capacitors of ceramic dielectric, class 2 (Assessment level P. Telecom level) Licensed Copy: London South Bank University, London South Bank Univer
2、sity, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 BSI 12-1999 ISBN 0 580 35650 7 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled
3、Copy, (c) BSI BS CECC 30702:1993 BSI 12-1999i Contents Page National forewordii Forewordiii Text of CECC 307021 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 ii BSI 12-1999 National forewor
4、d This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with CECC 30702:1989 “Harmonized system of quality assessment for electronic components. Blank Detail Specification: Fixed capacitors of ceramic dielectric,
5、class 2” published by the European Committee for Electrotechnical Standardization (CENELEC) Electronic Components Committee (CECC). It is a harmonized specification within the CECC system of quality assessment for electronic components. CECC 30702 was prepared by CECC WG3, “Capacitors” and the UK pa
6、rticipation in the drafting was provided by Subcommittee ECL/4/4, “Capacitors and electromagnetic interference suppression components for electronic equipment”, under the direction of Technical Committee ECL/4 “Capacitors and resistors for electronic equipment”. Scope. This standard lists the rating
7、s, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 30700:1991 in any detail specifications for this type of capacitor which requires inspection procedures at Assessment Level P (Telecom level). The British Standard which implem
8、ents the CECC Rules of Procedure is BS 9000 “General requirements for a system for electronic components of assessed quality” Part 2:1991 “Specification for the national implementation of the CECC system”. Detail specifications. Detail specifications shall comply with the requirements of this Blank
9、Detail Specification and BS CECC 00111 “Rule of Procedure 11” Specifications, Part 4:1991. “Regulations for CECC detail specifications”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application
10、. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International StandardCorresponding British Standard IEC 410:1973BS 6001 Sampling procedures for inspection by attributes Part 1:1991 Specification for sampling plans indexed by acceptabl
11、e quality level (AQL) for lot-by-lot inspection (Technically equivalent) CECC 30000: Issue 3:1983 Amendments 1 to 6 BS CECC 30000:1992 Harmonized system of quality assessment for electronic components. Generic specification: Fixed capacitors (Identical) CECC 30700: Issue 2:1989BS CECC 30700:1991 Har
12、monized system of quality assessment for electronic components. Sectional specification: Fixed capacitors of ceramic dielectric, class 2 (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to vi, pages 1 to 7 and a
13、back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontroll
14、ed Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 ii BSI 12-1999 Contents Page Forewordiii 1General data1 1.1Recommended method of mounting1 1.2Dimensions1 1.3Ratings and chara
15、cteristics1 1.4Related documents1 1.5Marking1 1.6Ordering information1 1.7Certified records of released lots2 1.8Additional information (not for inspection purposes)2 1.9Additional or increased severities or requirements to those specified in the generic and/or sectional specification2 2Inspection r
16、equirements2 2.1Procedures2 Table 11 Table 2 Values of capacitance and of voltage related to case sizes1 Table 2A Temperature characteristic of capacitance1 Table 3 Other characteristics2 Table 4A Lot-by-lot inspection (Group A and B)3 Table 4B Periodic Tests4 Licensed Copy: London South Bank Univer
17、sity, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 BSI 12-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENEL
18、EC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally
19、 recognized Mark, or Certificate of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This blank detail specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System w
20、ho wish to issue national harmonized specifications for FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification was prepared by CECC Working Group 3: “Capacitors”. The text of this bla
21、nk detail specification was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. DocumentVoting DateReport on the Voting CECC(Secretariat)2098January 1988CECC(Secretariat)2205 Licensed Copy: London South
22、 Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 iv BSI 12-1999 Key for page v The numbers between square brackets on page v correspond to the following indications which should be given: Identification of the detail sp
23、ecification 1 The name of National Standards Organization under whose authority the detail specification is drafted 2 The CECC Symbol and the number alloted by the CECC General Secretariat to the completed detail specification 3 The number and issue number of the national generic and sectional speci
24、fications 4 The national number of the detail specification, date of issue and any further information required by the national system. Identification of the capacitor 5 A short description of the type of capacitor 6 Information on typical construction (see examples given on page v) 7 Outline drawin
25、g with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines 8 Level of quality assessment 9 Quick reference data (Information given under 5 and 6 should be suitable for an entry in CECC 00200 and CECC 00300.) Licensed
26、 Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 BSI 12-1999v Specification available from: (National Standards Organization) CECC number and mark 30702 1 2 (National number of detail specification, d
27、ate of issue, National type number, if any) ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH: (Number of national generic and sectional specification) 4 3 Outline and dimensions: (First angle projection) 7DETAIL SPECIFICATION FOR FIXED CAPACITORS OF CERAMIC DIELECTRI
28、C, CLASS 2 5 TYPICAL CONSTRUCTION: (Examples) cylindrical/rectangular non-metallic/metallic case insulated/non-insulated axial/radial terminations 6 Assessment level P (Telecom level) 8 QUICK REFERENCE DATA:Rated capacitance range Capacitance tolerance d.c. rated voltage range Climatic category Perf
29、ormance grade 9 Information about manufacturers who have components qualified to this detail specification is available in the current CECC 00200: Qualified Products List. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy
30、, (c) BSI vi blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 BSI 12-19991 1 General data 1.1 Recommended method of mounting See 1.3.2 of CECC 30700 Issue 2. 1.2 Dimensions Table 1 1.3 R
31、atings and characteristics Table 2 Values of capacitance and of voltage related to case sizes Table 2A Temperature characteristic of capacitance 1.4 Related documents 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of 1.5 of CECC 30700 Issue 2. N
32、OTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) Tolerance
33、on rated capacitance. Case size reference Dimensions (in mm or inches and mm) LHd. . . NOTE 1When there is no case size reference, Table 1 may be omitted and the dimensions shall be given in Table 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal
34、dimensions with a tolerance. Capacitance range Tolerance on rated capacitance Rated voltage Climatic category Rated temperature Tangent of loss angle Insulation resistance Temperature characteristic of capacitance (see Table 2) (see Table 2) Rated voltage Rated capacitance (in pF and/or nF) Toleranc
35、e % Case sizeCase sizeCase sizeCase size Temperature range Permissible capacitance variation With no voltage appliedWith UR applied . C/+. C+. %/. %+. %/. % Generic specification:CECC 30000 Issue 3, Amdt. 1 6 Sectional specification:CECC 30700 Issue 2 Licensed Copy: London South Bank University, Lon
36、don South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 2 BSI 12-1999 c) Rated d.c. voltage. d) Temperature characteristic of capacitance. e) Number and issue reference of the detail specification and style reference. 1.7 Certified records of rele
37、ased lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table 3 O
38、ther characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedures shall be in accordance with 3.4 of the Sectional Specification, CECC 30700 Issue 2. 2.1.2 For Quality Conformance Inspection, the test schedule (Table 4) includes sampling, periodicity, sev
39、erities and requirements. The formation of inspection lots is covered by 3.5.1 of the Sectional Specification. Notes to Table 4A and Table 4B NOTE 1Sub-clause numbers of tests and performance requirements refer to the Sectional Specification, CECC 30700 Issue 2 and Section 1 of this specification. N
40、OTE 2Inspection Levels and AQLs are selected from IEC 410 Sampling Plans and Procedures for Inspection by Attributes. NOTE 4Specimens having passed the Group B non-destructive tests shall still satisfy the tests of Group A. NOTE 5As required in the detail specification. NOTE 6If required in the deta
41、il specification. NOTE 7No more than one defective is permitted from any one value. This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification. NOTE 3In this table:p=periodicity (in months) n=sample size c=acceptance crite
42、rion (permitted number of defectives) D=destructive ND=non-destructive IL=inspection level) IEC 410 AQL =acceptable quality level ) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 BSI 12-1999
43、3 Table 4A Lot-by-lot inspection (Group A and B) Clause number and test (see Note 1) Conditions of test (see Note 1) ILAQLPerformance requirements (see Note 1) (see Note 2) Sub-group A1 (ND)II1,0 % 4.2Visual examinationAs in 4.2 Marking legible and as specified in 1.5 of this specification 4.2Dimens
44、ions (gauging) As specified in Table 1 of this specification Sub-group A2 (ND)II0,25 % 4.3.1CapacitanceFrequency: . . . kHz Measuring voltage: . . . V Within specified tolerance 4.3.2Tangent of loss angleFrequency and measuring voltage same as in 4.3.1 As in 4.3.2(2) 4.3.4Voltage proof (Measuring po
45、int 1a) Method: . . .No breakdown or flashover 4.3.3Insulation resistance (Measuring point 1a) Method: . . .As in 4.3.3(2) Sub-group B1 (4) (ND)S-31,0 % 4.7SolderabilityMethod: . . .Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within .
46、 . . s, as applicable 4.16Solvent resistance of the marking (if applicable) Solvent: . . . Solvent temperature: . . . Method 1 Rubbing material: Cotton wool Recovery: . . . Marking legible Sub-Group B2a (4) (ND)S-22,5 % 4.4Temperature characteristic of capacitance Special preconditioning as in 4.1 C
47、apacitance Sub-Group B3 (D) 4.14Endurance test 168 h (lots combined over 1 week) n = 25 1 pd a This sub-group may be omitted if a corresponding test is carried out on each manufacturing batch of dielectric material. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 0
48、8 17:11:48 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30702:1993 4 BSI 12-1999 Table 4B Periodic Tests Clause number and test (see Note 1) Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Sub-group C1A (D)691 Part
49、 of sample of Sub-group C1 4.2Dimensions (detail) As specified in Table 1 of this specification 4.5Robustness of terminations Visual examinationNo visible damage 4.6Resistance to soldering heat Method: . . . Recovery: (24 2) h 4.6.1PreconditioningSpecial preconditioning as in 4.1 4.6.2Initial measurementCapacitance 4.15Component solvent resistance (if applicable) Solvent: . . . Solvent temperature: . . 4.6.4Final measurementsVisual examination Capacitance No visible damage Marking legible As in