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1、BRITISH STANDARD BS CECC 30202:1988 Specification for Harmonized system of quality assessment for electronic components Blank detail specification Fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) Licensed Copy: London South Bank University, London South Bank Universi
2、ty, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 BSI 10-1999 ISBN 0 580 35553 5 Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Co
3、py, (c) BSI BS CECC 30202:1988 BSI 10-1999i Contents Page National forewordii Forewordii 1General data1 2Inspection requirements3 Table 11 Table 2A Values of capacitance related to voltages and case sizes1 Table 2B Characteristics at high and low temperature2 Table 2C Impedance at . . . kHz (if requ
4、ired)2 Table 3 Other characteristics3 Table 4A Lot by lot inspection (Group A and B)3 Table 4B Periodic Tests5 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 ii BSI 10-1999 National foreword
5、 This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 30202:1986 “Harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum
6、 capacitors with non-solid electrolyte, porous anode (sub-family 2)”. This standard is a harmonized specification within the CECC system. This standard supersedes BS CECC 30202:1981, which is withdrawn. Terminology and conventions. The text of the CECC specification has been approved as suitable for
7、 publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following: The comma has been used as a decimal marker. In British Standards it is current practice to use a ful
8、l point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC 00100 is BS 9000: “General requirements for a system for electronic components of assessed quality” Part 2:1983 “Specification for national implementation of CECC basic rules and rules of proc
9、edure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 30100. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of B
10、S 9000 the latter shall take precedence, except that the front page layout shall be in accordance with PD 9004:1986:BS 9000, CECC & IECQ administrative guide, Circular Letter No 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards
11、are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardCorresponding British Standard CECC 30000:1983BS CECC 30000:1984 Harmonized system of quality assessment for electronic components. Gener
12、ic specification: fixed capacitors (Identical) CECC 30200:1985BS CECC 30200:1986 Harmonized system of quality assessment for electronic components. Sectional specification: fixed tantalum capacitors with non-solid or solid electrolyte (Identical) IEC 410:1973BS 6001 Sampling procedures for inspectio
13、n by attributes: Part 1:1972 Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 to 10
14、 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Unc
15、ontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 BSI 10-1999 ii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the
16、 European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures fo
17、r electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This blank detail specification has been formally approved by the CECC, and h
18、as been prepared for those countries taking part in the System who wish to issue national harmonized specifications for FIXED TANTALUM CAPACITORS WITH NON-SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 2). It should be read in conjunction with the current regulations for the CECC System. At the date of
19、 printing of this specification the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the United Kingdom. Copies of it can be obtained from the addresses shown on the blue fly sheet.
20、 Preface This blank detail specification was prepared by CECC Working Group 3: “Capacitors”, and it is an editorially revised version of CECC 30202 Issue 1. It is one of a series of blank detail specifications all relating to the sectional specification CECC 30200, Issue 2. It is based, wherever pos
21、sible, on the Publications of the International Electrotechnical Commission and in particular on IEC 384-15-2: Part 15: Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E. The text of this blank detail specification was circulated to
22、 the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. This second issue of CECC 30202 shall be come effective for all new qualification approvals in June 1986. Issue 1 will continue to remain effective to cover all pa
23、st approvals. Key for page iii The numbers between square brackets on page iii correspond to the following indications which should be given: Identification of the harmonized detail specification DocumentVoting DateReport on the Voting CECC (Secretariat) 1665January 1985CECC (Secretariat) 1785 1The
24、name of National Standards Organization under whose authority the detail specification is published 2The CECC Symbol and the number alloted by the CECC General Secretariat to the completed detail specification 3The number and issue number of the national generic and sectional specifications 4The nat
25、ional number of the detail specification, date of issue and any further information required by the national system. Identification of the capacitor 5A short description of the type of capacitor 6Information on typical construction (see examples given on page iii) 7Outline drawing with main dimensio
26、ns which are of importance for interchangeability and/or reference to the national or international documents for outlines 8Level of quality assessment 9Quick reference data Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Co
27、py, (c) BSI BS CECC 30202:1988 BSI 10-1999iii 1CECC number and mark2 Specification available from: (National Standards Organization) (National number of detail specification, date of issue, National type number, if any) 4 ELECTRONIC COMPONENTS OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE W
28、ITH: (Number of national generic and sectional specification) 3 Outline and dimensions: (first angle projection)7 DETAIL SPECIFICATION FOR FIXED TANTALUM CAPACITORS WITH NON-SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 2) 5 TYPICAL CONSTRUCTION: (Examples) cylindrical/rectangular non metallic/metalli
29、c case insulated/non insulated axial/radial terminations 6 Assessment level E Performance grade 8 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, d.c. rated voltage range, climatic category, performance grade 9 Information about manufacturers who have components qualified to th
30、is detail specification is available in the current CECC 00200: Qualified Products List Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank Un
31、iversity, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 BSI 10-19991 1 General data 1.1 Recommended method of mounting See 1.3.2 of CECC 30200, Issue 2. 1.2 Dimensions Table 1 NOTE 1When there is no case size reference, Table 1 may be omitted and the dimensions sh
32、all be given in Table 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. 1.3 Ratings and characteristics Table 2A Values of capacitance related to voltages and case sizes Case size reference Dimensions (in mm) LHd. . .
33、. . . . Capacitance range(See Table 2A) Tolerance on rated capacitance Rated voltage(See Table 2A) Category voltage (if applicable)(See Table 2A) Climatic category Rated temperature Capacitance change with temperature(See Table 2B) Tangent of loss angle(See Table 2B) Leakage current(See Table 2B) Im
34、pedance (if required)(See Table 2C) Reverse voltage (if required) Rated voltage Category voltage (1) Case sizeCase sizeCase sizeCase size Rated capacitance (in nF or 4F) (1) If different from the rated voltage. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:
35、04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 2 BSI 10-1999 Table 2B Characteristics at high and low temperature Table 2C Impedance at . . . kHz (if required) 1.4 Related document 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requireme
36、nts of 1.5 of CECC 30200, Issue 2. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specification shall contain, in clear or in coded form, the following minimum information:
37、 1.7 Certified testrecords Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when ess
38、ential. URCRCapacitance changeMaximum values (V)(4F)% Tan (%) Impedance (7) (100/120 Hz) Leakage current (4A) TATRTBTAb 20 C TBb TA20 CTRTBa TA: Lower category temperature TB: Upper category temperature TR: Rated temperature a : Measured with category voltage b : If applicable Case sizeImpedance (7)
39、 1 2 3 4 Generic specification : CECC 30000 (Issue 3) Sectional specification: CECC 30200 (Issue 2) 1)Rated capacitance 2)Tolerance on rated capacitance 3)Rated d.c. voltage 4)Number and issue reference of the detail specification and style reference. Licensed Copy: London South Bank University, Lon
40、don South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 BSI 10-19993 Table 3 Other characteristics 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with 3.4 of CECC 30200, Issue 2. 2.1
41、.2 For Quality Conformance Inspection the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by 3.5.1 of CECC 30200, Issue 2. Notes to Table 4A and Table 4B NOTE 1Clause numbers of tests and performance requirements refer
42、to CECC 30200, Issue 2. NOTE 2Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC 410. Table 4A Lot by lot inspection (Group A and B) This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification.
43、 NOTE 3In Table 4A and Table 4B: P =periodicity (in months) n =sample size c=acceptance criterion (permitted number of defectives) D =destructive ND =non-destructive Clause number and testD or ND Conditions of testILAQL %Performance requirements (1)(3)(1)(2)(2)(1) Sub-Group A1NDS42,5 4.1 4.1 Visual
44、examination Dimensions (gauging) As in 4.1 Legible marking as specified in 1.5 of this specification As specified in Table 1 of this specification Sub-Group A2NDII1,0 4.2.1 4.2.2 4.2.3 4.2.4 Leakage current Capacitance Tangent of loss angle Impedance (if required) Protective resistance . . . 7 Frequ
45、ency: . . . Hz Bias voltage: . . . V Frequency: . . . Hz Frequency: . . . kHz k . . . . 4A, see Table 2B of this specification Within specified tolerance k . . . . , see Table 2B of this specification k . . . 7, see Table 2C of this specification Sub-Group B1NDS32,5 4.5SolderabilityWithout ageing Me
46、thod:Good tinning as evidenced by free flowing of the solder with wetting of the terminations or soldering time . . . . s, as applicable (1), (2) and (3): See notes on page 3 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled C
47、opy, (c) BSI BS CECC 30202:1988 4 BSI 10-1999 Table 4A Lot by lot inspection (Group A and B) Clause number and testD or ND Conditions of testILAQL %Performance requirements (1)(3)(1)(2)(2)(1) Sub-Group B2DS32,5 4.15 Characteristics at high and low temperatures (if required) The capacitors shall be m
48、easured at each temperature step Step 1: 20 C Leakage current Capacitance Tangent of loss angle Impedancea (at same frequency as Step 2) For use as reference value Step 2: Lower category temperature Capacitance Tangent of loss anglea Impedancea k values in Table 2B of this spec. Step 3: Rated temper
49、ature Leakage current Capacitance Tangent of loss anglea Impedancea k values in Table 2B of this spec. Step 4: Upper category temperature Leakage current Capacitance Tangent of loss anglea Impedancea k values in Table 2B of this spec. (1), (2) and (3): See notes on page 3 a If required Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:04:39 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 30202:1988 BSI 10-19