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1、BRITISH STANDARD CONFIRMED JUNE 1999 BS QC 300202:1985 IEC 384-15-2: 1984 QC 300202 Incorporating Amendment No. 1 Specification for Harmonized system of quality assessment for electronic components Fixed capacitors for use in electronic equipment Blank detail specification: Fixed tantalum capacitors
2、 with non-solid electrolyte and porous anode Assessment level E Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-2000 ISBN 0 580 34755 9 Amendments issued since publication Amd. No.Date
3、of issueComments 5946September 1988 Indicated by a sideline in the margin Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-2000i Contents Page National forewordii Introduction1 Section 1
4、. General data 1.1Recommended method(s) of mounting3 1.2Dimensions3 1.3Ratings and characteristics3 1.4Related documents4 1.5Marking4 1.6Ordering information4 1.7Certified records of released lots5 1.8Additional information5 1.9Additional or increased severities or requirements to those specified in
5、 the generic and/or sectional specification5 Section 2. Inspection requirements 2.1Procedures6 Table I3 Table IIA Values of capacitance and of voltage related to case sizes3 Table IIB Characteristics at high and low temperature4 Table IIC Impedance at . . . kHz (if applicable)4 Table III Other chara
6、cteristics5 Table IV6 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 ii BSI 04-2000 National foreword This Part of this British Standard has been prepared under the direction of the Electroni
7、c Components Standards Committee. It is identical with IEC Publication 384-15-2: “Fixed capacitors for use in electronic equipment. Blank detail specification: Fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E” published by the International Electrotechnical C
8、ommission (IEC). Terminology and conventions. The text of the International Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British S
9、tandard which implements IEC Publications QC 001001:1986 and QC 001002:1986 is BS 9000: “General requirements for a system for electronic components of assessed quality”: Part 3:1987 “Specification for national implementation of the IECQ basic rules and rules of procedure”. Scope. This standard list
10、s the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS QC 300200. Detail specification layout. In the event of conflict between the requirements of this specification and the provisions of BS 9000 the latter shall take prece
11、dence except that the front page layout will be in accordance with PD 9004:1986 BS 9000, CECC and IECQ UK administrative guide Circular Letter No. 15. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their corre
12、ct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardCorresponding British Standard IEC 384-1:1982 (QC 300000:1982) BS QC 300000:1983 Fixed capacitors for use in electronic equipment. Generic specification (Identical) IEC
13、 384-15:1982 (QC 300200:1982) BS QC 300200:1983. Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte (Identical) IEC 410:1973BS 6001: Sampling procedures for inspection by attributes: Part 1:1972 Specification for sampling plans indexed by acceptable quality level
14、(AQL) for lot-by-lot inspection (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 12 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated
15、 in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-20001 Introduction Blank detail specification A blank detail specification is a supple
16、mentary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements may not be considered as being in accordance with IEC specifications nor shall they so be described
17、. In the preparation of detail specifications the content of Sub-clause 1.4 of the sectional specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated. Identification of the deta
18、il specification 1 The “International Electrotechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national
19、system. 3 The number and issue number of the IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the capacitor 5 A short description of the type of capacitor. 6 Information on typical construction (when applicable). NOTEWhen the capacitor is n
20、ot designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively,
21、 this drawing may be given in an appendix to the detail specification. 8 Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause 3.5.4. This implies that one
22、blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9 Reference data on the most important properties, to allow comparison between the various capacitor types. Licensed Copy: London South Bank University, London So
23、uth Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 2 BSI 04-2000 1 IEC 384-15-2-XXX QC 300202-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 384-15-2 QC 300202 4 3 FIXED TANTALUM CAPACITORS WITH NON-SOLID ELECTROLYTE AND POR
24、OUS ANODE WITH LEAD OR TAG TERMINATIONS (Sub-family 2) 5 Outline drawing: (see Table I) (. . . angle projection) 7 Typical construction:6 Assessment level(s): E8 (Other shapes are permitted within the dimensions given) Performance grade: Information on the availability of components qualified to thi
25、s detail specification is given in the Qualified Products List. 9 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-20003 Section 1. General data 1.1 Recommended method(s) of mounting (to
26、 be inserted) (See Sub-clause 1.4.2 of IEC Publication 384-15) 1.2 Dimensions Table I 1.3 Ratings and characteristics Table IIA Values of capacitance and of voltage related to case sizes Case size reference Dimensions (in millimetres or inches and millimetres) LHd. . . . . . . . . NOTE 1When there i
27、s no case size reference, Table I may be omitted and the dimensions shall be given in Table IIA, which then becomes Table I. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. NOTE 3Other presentations of the above information may be necessary, but t
28、he above presentation should be followed as much as possible. Capacitance range (see Table IIA) Tolerance on rated capacitance Rated voltage (see Table IIA) Category voltage (if applicable) (see Table IIA) Climatic category Rated temperature Variation of capacitance with temperature (see Table IIB)
29、Tangent of loss angle (see Table IIB) Leakage current (see Table IIB) Impedance (if applicable) (see Table IIC) Reverse voltage (if required) Rated voltage Category voltagea Case sizeCase sizeCase sizeCase size Rated capacitance (in 4F) a If different from the rated voltage. Licensed Copy: London So
30、uth Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 4 BSI 04-2000 Table IIB Characteristics at high and low temperature Table IIC Impedance at . . . kHz (if applicable) 1.4 Related documents 1.5 Marking The marking of th
31、e capacitor and the packing shall be in accordance with the requirements of IEC Publication 384-15, Sub-clause 1.6. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors covered by this specifica
32、tion shall contain, in clear or in coded form, the following minimum information: a) Rated capacitance. b) Tolerance on rated capacitance. c) Rated d.c. voltage. d) Number and issue reference of the detail specification and style reference. URCR Capacitance change Maximum values Tan Impedance (100/1
33、20 Hz) Leakage current (%)(%)(7)(4A) (V)(4F)ARBAb20 CBbA20 CRBa A B R = Lower category temperature = Upper category temperature = Rated temperature a Measured with category voltage b If applicable Case size Impedance (7) 1 2 3 4 Generic specification:IEC Publication 384-1 (1982): Fixed Capacitors fo
34、r Use in Electronic Equipment. Part 1: Generic specification. Sectional specification: IEC Publication 384-15 (1982): Part 15: Sectional Specification: Fixed Tantalum Capacitors with Non-solid or Solid Electrolyte. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08
35、 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-20005 1.7 Certified records of released lots Required/not required. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or s
36、ectional specification NOTEAdditions or increased requirements should be specified only when essential. Table III Other characteristics This table is to be used for defining characteristics which are additional to or more severe than those given in the sectional specification. Licensed Copy: London
37、South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 6 BSI 04-2000 Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval, the procedures shall be in accordance with the Sectional Specificati
38、on, IEC Publication 384-15, Sub-clause 3.4. 2.1.2 For Quality Conformance Inspection, the test schedule (Table IV) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.5.1 of the Sectional Specification. Table IV NOTE 1Sub-clause nu
39、mbers of tests and performance requirements refer to the Sectional Specification, IEC Publication 384-15 and Section One of this specification. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p=
40、periodicity (in months) n= sample size c= acceptance criterion (permitted number of defectives) D= destructive ND= non-destructive IL= inspection level AQL= acceptable quality levelIEC Publication 410 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQL Performance r
41、equirements (see Note 1) (see Note 2) Group A inspection (lot-by-lot) Sub-group A1NDS-42.5 % 4.1Visual examinationAs in 4.1 Legible marking and as specified in 1.5 of this specification 4.1Dimensions (gauging) As specified in Table I of this specification Sub-group A2NDII1.0 % 4.2.1Leakage currentPr
42、otective resistance:u . . . 4A, . . . 7see Table IIB 4.2.2CapacitanceFrequency: . . . HzWithin specified tolerance Bias voltage: . . . V 4.2.3Tangent of loss angleFrequency: . . . Hzu . . . , see Table IIB 4.2.4Impedance (if applicable) Frequency: . . . kHzu . . . 7, see Table IIC Licensed Copy: Lon
43、don South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 BSI 04-20007 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQLPerformance requirements (see Note 1) (see Note 2) Grou
44、p B inspection (lot-by-lot) Sub-group B1DS-32.5 % 4.5SolderabilityWithout ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . . . s, as applicable Sub-group B2NDS-32.5 % 4.15Characteristics at high and low temper
45、ature (if required) The capacitors shall be measured at each temperature step Step 1: 20 C For use as reference value Leakage current Capacitance Tangent of loss angle Impedancea (at same frequency as Step 2) Step 2: Lower category temperature Capacitance u . . . %b Tangent of loss angleau . . . b I
46、mpedanceau . . . 7b Step 3: Rated temperature Leakage currentu . . . 4Ab Capacitance u . . . %b Tangent of loss angleau . . . b Step 4: Upper category temperature Leakage currentu . . . 4Ab Capacitanceu . . . %b Tangent of loss angleau . . . b a If applicable. b See Table IIB. %C C - %C C - %C C - L
47、icensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:02:41 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS QC 300202:1985 8 BSI 04-2000 Table IV Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability
48、 (see Note 3) Performance requirements (see Note 1) pnc Group C inspection (periodic) Sub-group C1AD691 Part of sample of Sub-group C1 4.3.1Initial measurement Capacitance 4.3Robustness of terminations Visual examinationNo visible damage and no leakage of electrolyte 4.4Resistance to soldering heat
49、Method: . . . 4.4.2Final measurements Visual examinationNo visible damage and no leakage of electrolyte Legible marking Sub-group C1BD6181 Other part of sample of Sub-group C1 4.6.1Initial measurement Capacitance 4.6Rapid change of temperature A= Lower category temperature B= Upper category temperature Five cycles Duration t = 30 min Recovery: 16 h 4.6.3Final measurements Leakage currentu . . . 4A, see Table IIB Capacitance u . . . % of value measured in