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1、 INTERNATIONAL STANDARD IEC 61000-4-33 First edition 2005-09 Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters Reference number IEC 61000-4-33:2005(E) BASIC EMC PUBLICATION Publication numbering As from 1 January
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8、19 03 00 INTERNATIONAL STANDARD IEC 61000-4-33 First edition 2005-09 Electromagnetic compatibility (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or uti
9、lized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919
10、 03 00 E-mail: inmailiec.ch Web: www.iec.ch For price, see current catalogue PRICE CODE Commission Electrotechnique Internationale International Electrotechnical Commission XB BASIC EMC PUBLICATION 2 61000-4-33 ? IEC:2005(E) CONTENTS FOREWORD4 INTRODUCTION 6 1Scope7 2Normative references7 3Terms and
11、 definitions8 4Measurement of high-power transient responses .9 4.1Overall measurement concepts and requirements9 4.2Representation of a measured response. 12 4.3Measurement equipment. 12 4.4Measurement procedures 27 5Measurement of low frequency responses. 27 6Calibration procedures 28 6.1Calibrati
12、on of the entire measurement channel 28 6.2Calibration of individual measurement channel components . 31 6.3Approximate calibration techniques 37 Annex A (normative) Methods of characterizing measured responses . 40 Annex B (informative) Characteristics of measurement sensors 45 Annex C (normative)
13、HPEM measurement procedures 59 Annex D (informative) Two-port representations of measurement chain components 62 Bibliography. 69 Figure 1 Illustration of a typical instrumentation chain for measuring high-power transient responses 10 Figure 2 Illustration of a balanced sensor and cable connecting t
14、o an unbalanced (coaxial) line where Iout + Iin = I1. 16 Figure 3 Examples of some simple baluns 4b . 18 Figure 4 A typical circuit for an in-line attenuator in the measurement chain. 18 Figure 5 Illustration of the typical attenuation of a nominal 20 dB attenuator for a 50? system, as a function of
15、 frequency. 19 Figure 6 Typical circuit diagram for an in-line integrator. 20 Figure 7 Plot of the transfer function of the integrating circuit of Figure 6. 20 Figure 8 Illustration of the frequency dependent per-unit-length signal transmission of a standard coaxial cable, and a semi-rigid coaxial l
16、ine 21 Figure 9 Illustration of sensor cable routing in regions not containing EM fields 24 Figure 10 Treatment of sensor cables when located in a region containing EM fields 25 Figure 11 Conforming cables to local system shielding topology. 26 Figure 12 Correct and incorrect methods of cable routin
17、g. 27 Figure 13 The double-ended TEM Cell for providing a uniform field illumination for probe calibration 29 Figure 14 Illustration of the single-ended TEM cell and associated equipment 30 Figure 15 Dimensions of a small test fixture for probe calibration 30 61000-4-33 ? IEC:2005(E) 3 Figure 16 Ele
18、ctrical representation of a measurement chain, (a) with the E-field sensor represented by a general Thevenin circuit, and (b) the Norton equivalent circuit for the same sensor 31 Figure 17 Example of a simple E-field probe. 34 Figure 18 Plot of the real and imaginary parts of the input impedance, Zi
19、, for the E- field sensor of Figure 17 34 Figure 19 Plot of the magnitude of the short-circuit current flowing in the sensor input for different angles of incidence, as computed by an antenna analysis code. 35 Figure 20 Plot of the magnitude of the effective height of the sensor for different angles
20、 of incidence. 36 Figure 21 High frequency equivalent circuit of an attenuator element 39 Figure A.1 Illustration of various parameters used to characterize the pulse component of a transient response waveform R(t) 41 Figure A.2 Illustration of an oscillatory waveform frequently encountered in high-
21、 power transient EM measurements. 41 Figure A.3 Example of the calculated spectral magnitude of the waveform of Figure A.2 . 44 Figure B.1 Illustration of a simple E-field sensor, together with its Norton equivalent circuit 46 Figure B.2 Magnitude and phase of the normalized frequency function)( ?F
22、for the field sensor 47 Figure B.3 Illustration of a simple B-field sensor, together with its Thevenin equivalent circuit 49 Figure B.4 Illustration of an E-field sensor over a ground plane used for measuring the vertical electric field, or equivalently, the surface charge density 50 Figure B.5 Illu
23、stration of the half-loop B-dot sensor used for measuring the tangential magnetic field, or equivalently, the surface current density 52 Figure B.6 Simplified concept for measuring wire currents . 53 Figure B.7 Construction details of a current sensor . 54 Figure B.8 Example of the measured sensor i
24、mpedance magnitude of a nominal 1 ? current sensor 55 Figure B.9 Geometry of the in-line I-dot current sensor 55 Figure B.10 Design concept for a coaxial cable current sensor . 56 Figure B.11 Shape and dimensions of a CIP-10 coaxial cable current sensor. 57 Figure B.12 Configuration of a coaxial cab
25、le I-dot current sensor 57 Figure D.1 Voltage and current relationships for a general two-port network . 62 Figure D.2 Voltage and current definitions for the chain parameters 63 Figure D.3 Cascaded two-port networks. 64 Figure D.4 Representation of the of a simple measurement chain using the chain
26、parameter matrices. 64 Figure D.5 Simple equivalent circuit for the measurement chain . 65 Figure D.6 A simple two-port network modelled by chain parameters 65 Table A.1 Examples of time waveform p-norms. 42 Table A.2 Time waveform norms used for high-power transient waveforms 42 Table D.1 Chain par
27、ameters for simple circuit elements. 66 4 61000-4-33 ? IEC:2005(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters FOREWORD 1) The International Electrotechnical Comm
28、ission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
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37、ion. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such
38、patent rights. International Standard IEC 61000-4-33 has been prepared by subcommittee 77C: High power transient phenomena, of IEC technical committee 77: Electromagnetic compatibility. It has the status of a basic EMC publication in accordance with IEC Guide 107. The text of this standard is based
39、on the following documents: FDISReport on voting 77C/156/FDIS77C/160/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 61000-4-33
40、 ? IEC:2005(E) 5 The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; wit
41、hdrawn; replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. 6 61000-4-33 ? IEC:2005(E) INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, funda
42、mental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and
43、measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts and published either as Internatio
44、nal Standards or as technical specifications or technical reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and a second number identifying the subdivision (example: 61000-6-1). 61000-4-33 ? IEC:2005(E) 7 ELECTROMAGNETIC
45、COMPATIBILITY (EMC) Part 4-33: Testing and measurement techniques Measurement methods for high-power transient parameters 1 Scope This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from high-power transient electromagn
46、etic parameters. These responses can include: ? the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scattered fields within a system under test); ? the current I (e.g., induced by a transient field or within a system under test); ? the voltage V (e.g., induced by a tr
47、ansient field or within a system under test); ? the charge Q induced on a cable or other conductor. NOTE The charge Q on the conductor is a fundamental quantity that can be defined at any frequency. The voltage V, however, is a defined (e.g., secondary) quantity, which is valid only at low frequenci
48、es. At high frequencies, the voltage cannot be defined as the line integral of the E-field, since this integral is path-dependent. Thus, for very fast rising pulses (having a large high-frequency spectral content) the use of the voltage as a measurement observable is not valid. In this case, the cha
49、rge is the desired quantity to be measured. These measured quantities are generally complicated time-dependent waveforms, which can be described approximately by several scalar parameters, or “ observables” . These parameters include: ? the peak amplitude of the response, ? the waveform rise-time, ? the waveform fall-time (or duration), ? the pulse width, and ? mathematically defined no