IEC-CISPR-16-2-1-2008.pdf

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1、 CISPR 16-2-1 Edition 2.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE Specification for radio disturbance and immunity measuring apparatus and methods Part 2-1: Methods of measurement of disturbances and immunity Conducted disturbance measurements Spcifications des mthodes et des appareils d

2、e mesure des perturbations radiolectriques et de limmunit aux perturbations radiolectriques Partie 2-1: Mthodes de mesure des perturbations et de limmunit Mesures des perturbations conduites CISPR 16-2-1:2008 INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL DES PERTUR

3、BATIONS RADIOLECTRIQUES Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or networking permitted without license from IHS -,-,- THIS PUBLICATION IS COPYRIGHT PROTECTED Copyri

4、ght 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member Natio

5、nal Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs.

6、Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si v

7、ous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: in

8、mailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publication

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18、csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or networking permitted without license from IHS -,-,- CISPR 16-2-1 Edi

19、tion 2.0 2008-10 INTERNATIONAL STANDARD NORME INTERNATIONALE pecification for radio disturbance and immunity measuring apparatus and methods Part 2-1: Methods of measurement of disturbances and immunity Conducted disturbance measurements Spcifications des mthodes et des appareils de mesure des pertu

20、rbations radiolectriques et de limmunit aux perturbations radiolectriques Partie 2-1: Mthodes de mesure des perturbations et de limmunit Mesures des perturbations conduites INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XB ICS 33.100.10; 33.100.20 PRICE CODE COD

21、E PRIX ISBN 2-8318-1002-1 INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE COMIT INTERNATIONAL SPCIAL DES PERTURBATIONS RADIOLECTRIQUES Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Copyright International Ele

22、ctrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 CISPR 16-2-1 IEC:2008 CONTENTS FOREWORD.6 1 Scope.8 2 Normative references8 3 Definitions 8 4 T

23、ypes of disturbance to be measured12 4.1 General .12 4.2 Types of disturbance .12 4.3 Detector functions .12 5 Connection of measuring equipment .13 5.1 General .13 5.2 Connection of ancillary equipment13 5.3 Connections to RF reference ground13 5.4 Connection between the EUT and the artificial main

24、s network 14 6 General measurement requirements and conditions 15 6.1 General .15 6.2 Disturbance not produced by the equipment under test 15 6.2.1 General .15 6.2.2 Compliance testing 15 6.3 Measurement of continuous disturbance 15 6.3.1 Narrowband continuous disturbance.15 6.3.2 Broadband continuo

25、us disturbance.15 6.3.3 Use of spectrum analyzers and scanning receivers.16 6.4 Operating conditions of the EUT 16 6.4.1 General .16 6.4.2 Normal load conditions.16 6.4.3 Duration of operation .16 6.4.4 Running-in/Warm-up time 16 6.4.5 Supply .16 6.4.6 Mode of operation16 6.5 Interpretation of measu

26、ring results.16 6.5.1 Continuous disturbance .16 6.5.2 Discontinuous disturbance .17 6.5.3 Measurement of the duration of disturbances .17 6.6 Measurement times and scan rates for continuous disturbance 17 6.6.1 General .17 6.6.2 Minimum measurement times 17 6.6.3 Scan rates for scanning receivers a

27、nd spectrum analyzers.18 6.6.4 Scan times for stepping receivers 19 6.6.5 Strategies for obtaining a spectrum overview using the peak detector.20 7 Measurement of disturbances conducted along leads, 9 kHz to 30 MHz.23 7.1 Introduction .23 7.2 Measuring equipment (receivers, etc.) .23 7.2.1 General .

28、23 7.2.2 Use of detectors for conducted disturbance measurements 23 7.3 Ancillary measuring equipment 24 7.3.1 General .24 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or

29、 networking permitted without license from IHS -,-,- CISPR 16-2-1 IEC:2008 3 7.3.2 Artificial networks (AN).24 7.3.3 Voltage probes.25 7.3.4 Current probes.25 7.4 Equipment under test configuration25 7.4.1 Arrangement of the EUT and its connection to the AN 25 7.4.2 Procedure for the measurement of

30、unsymmetric disturbance voltages with V-networks (AMNs).31 7.4.3 Measurement of common mode voltages at differential mode signal terminals38 7.4.4 Measurements using voltage probes 39 7.4.5 Measurement using a capacitive voltage probe (CVP) 41 7.4.6 Measurements using current probes.41 7.5 System te

31、st configuration for conducted emissions measurements.42 7.5.1 General approach to system measurements.42 7.5.2 System configuration42 7.5.3 Measurements of interconnecting lines.45 7.5.4 Decoupling of system components .45 7.6 In situ measurements 45 7.6.1 General .45 7.6.2 Reference ground 46 7.6.

32、3 Measurement with voltage probes 46 7.6.4 Selection of measuring points 46 8 Automated measurement of emissions47 8.1 Introduction: Precautions for automating measurements.47 8.2 Generic measurement procedure .47 8.3 Prescan measurements .48 8.4 Data reduction .49 8.5 Emission maximization and fina

33、l measurement 49 8.6 Post processing and reporting49 Annex A (informative) Guidelines to connection of electrical equipment to the artificial mains network (see Clause 5) .50 Annex B (informative) Use of spectrum analyzers and scanning receivers (see Clause 6) .57 Annex C (informative) Decision tree

34、 for use of detectors for conducted measurements (see 7.2.2) 60 Annex D (informative) Scan rates and measurement times for use with the average detector 62 Annex E (informative) Guidelines for the improvement of the test setup with ANs66 Bibliography72 Figure 1 Example of a recommended test setup wi

35、th PE chokes with three AMNs and a sheath current absorber on the RF cable 14 Figure 2 Measurement of a combination of a CW signal (“NB”) and an impulsive signal (“BB”) using multiple sweeps with maximum hold.20 Figure 3 Example of a timing analysis.21 Figure 4 A broadband spectrum measured with a s

36、tepped receiver .22 Figure 5 Intermittent narrowband disturbances measured using fast short repetitive sweeps with maximum hold function to obtain an overview of the emission spectrum .22 Figure 6 Test configuration: table-top equipment for conducted disturbance measurements on power mains .26 Copyr

37、ight International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 CISPR 16-2-1 IEC:2008 Figure 7 Arrangement of EUT and AMN at 40 cm distan

38、ce with a) vertical RGP and b) horizontal RGP27 Figure 8 Optional example test configuration for an EUT with only a power cord attached28 Figure 9 Test configuration: floor-standing equipment (see 7.4.1 and 7.5.2.2) .29 Figure 10 Example Test configuration: floor-standing and table-top equipment (se

39、e 7.4.1 and 7.5.2.2)30 Figure 11 Schematic of disturbance voltage measurement configuration (see also 7.5.2.2) .32 Figure 12a Schematic for measurement and power circuit 33 Figure 12b Equivalent voltage source and measurement circuit 33 Figure 12 Equivalent circuit for measurement of common mode dis

40、turbance voltage for class I (grounded) EUT 33 Figure 13a Schematic for power and measurement circuit 34 Figure 13b Equivalent RFI source and measurement circuit34 Figure 13 Equivalent circuit for measurement of common mode disturbance voltage for class II (ungrounded) EUT .34 Figure 14 RC element f

41、or artificial hand36 Figure 15 Portable electric drill with artificial hand.36 Figure 16 Portable electric saw with artificial hand36 Figure 17 Measuring example for voltage probes40 Figure 18 Measurement arrangement for two-terminal regulating controls.40 Figure A.1.50 Figure A.2.51 Figure A.3.51 F

42、igure A.4.51 Figure A.5.52 Figure A.6.52 Figure A.7.53 Figure A.8 AMN configurations .55 Figure C.1 Decision tree for optimizing speed of conducted disturbance measurements with peak, quasi-peak and average detectors.60 Figure D.1 Weighting function of a 10 ms pulse for peak (“PK”) and average detec

43、tions with (“CISPR AV”) and without (“AV”) peak reading; meter time constant 160 ms64 Figure D.2 Weighting functions of a 10 ms pulse for peak (“PK”) and average detections with (“CISPR AV”) and without (“AV”) peak reading; meter time constant 100 ms64 Figure D.3 Example of weighting functions (of a

44、 1 Hz pulse) for peak (“PK”) and average detections as a function of pulse width: meter time constant 160 ms.65 Figure D.4 Example of weighting functions (of a 1 Hz pulse) for peak (“PK”) and average detections as a function of pulse width: meter time constant 100 ms.65 Figure E.1 Parallel resonance

45、 of enclosure capacitance and ground strap inductance66 Figure E.2 Connection of an AMN to RGP using a wide grounding sheet for low inductance grounding67 Figure E.3 Impedance measured with the arrangement of Figure E.2 both with reference to the front panel ground and to the grounding sheet67 Copyr

46、ight International Electrotechnical Commission Provided by IHS under license with IECLicensee=Boeing Co/5910770001 Not for Resale, 01/29/2009 18:58:22 MSTNo reproduction or networking permitted without license from IHS -,-,- CISPR 16-2-1 IEC:2008 5 Figure E.4 VDF in the configuration of Figure E.2 m

47、easured with reference to the front panel ground and to the grounding sheet. (The AMN used has a flat frequency response of the VDF, which may be different for other AMNs)67 Figure E.5 Arrangement showing the measurement grounding sheet (shown with dotted lines) when measuring the impedance with ref

48、erence to RGP. The impedance measurement cable ground is connected to the measurement grounding sheet, whereas the inner conductor is connected to the EUT port pin. 68 Figure E.6 Impedance measured with the arrangement of Figure E.5 with reference to the RGP68 Figure E.7 VDF measured with parallel resonances in the AMN grounding 69 Figure E.8 Attenuation of a sheath current absorber measured in a 150- test ar

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