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1、IEEE Std C57.119-2001 IEEE Standards C57.119 TM IEEE Recommended Practice for Performing Temperature Rise Tests on Oil-Immersed Power Transformers at Loads Beyond Nameplate Ratings Published by The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA 12
2、 March 2002 Power Engineering Society Sponsored by the Transformers Committee IEEE Standards Print: SH94954 PDF: SS94954 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/
3、30/2008 02:23:39 MDTNo reproduction or networking permitted without license from IHS -,-,- The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2002 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Publis
4、hed 12 March 2002. Printed in the United States of America. Print: ISBN 0-7381-3005-2 SH94954 PDF: ISBN 0-7381-3006-0SS94954 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std C57.
5、119-2001 (R2008) IEEE Recommended Practice for Performing Temperature Rise Tests on Oil-Immersed Power Transformers at Loads Beyond Nameplate Ratings Sponsor Transformers Committee of the Power Engineering Society Reaffirmed 27 March 2008 Approved 6 December 2001 IEEE-SA Standards Board Abstract: Re
6、commendations are made, where possible, regarding the performance and evaluation of temperature rise tests on oil-immersed power transformers beyond nameplate ratings. The intent is to assist power transformer manufacturers, and the ultimate users, in evaluating thermal performance of the transforme
7、rs under varying loads. Keywords: bottom oil temperature, conditioning loads, hottest spot factor, loading, load tap changer, mineral-oil-immersed, power transformers, rated load, thermal capacity, top oil temperature Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by
8、IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:23:39 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of th
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25、 are brought to its attention. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:23:39 MDTNo reproduction or networking permitted without license from IHS -,-,-
26、 Copyright 2002 IEEE. All rights reserved. iii Introduction (This introduction is not a part of IEEE Std C57.119-2001, IEEE Recommended Practice for Performing Temperature Rise Tests on Oil-Immersed Power Transformers at Loads Beyond Nameplate Ratings.) This introduction provides background related
27、to the development of this recommended procedure. Addi- tional information may be found in Annex B. Over the years, there has been a marked increase in the practice of loading transformers beyond their name- plate rating. In the past, many transformers were loaded beyond nameplate rating only during
28、 short time emergencies. Today, many users have established loading practices which subject transformers to loads beyond nameplate rating on a planned basis during periods of seasonal or daily peak loads, in addition to unexpected loads occurring during short or long time emergencies. Former ANSI lo
29、ading guide C57.91 provided loading guidelines for distribution transformers, ANSI C57.92 provided loading guidelines for power transformers rated 100 MVA and below, and IEEE Std C57.115 provided loading guidelines for transformers rated above 100 MVA. All of these documents have been com- bined int
30、o a revised IEEE Std C57.91 . These documents provide transformer loading guidelines based on judgment gained from years of experience of loading transformers. However, prior to this document, no standard test procedure existed to evaluate the consequences of loading a transformer at loads beyond na
31、me- plate rating. Investigations carried out in the past by transformer users raised concern about the accuracy of the equations and empirical constants used in the transient loading equations of these loading guides. Their experience with monitoring operating transformers indicated that transformer
32、s could carry loads greater than nameplate rating, without apparent damage. Also, there has been concern that ancillary equipment, such as tap changers, bushings, and instrumentation may not have the same overload capabilities as the core and coil assembly. The above conditions and concerns led to a
33、 desire for a test procedure that would: a)Provide data on the thermal characteristics of oil-immersed transformers to be used to evaluate the accuracy of the equations and empirical constants used in the loading equations in the oil-immersed transformer loading guides. b) Demonstrate that a transfo
34、rmer may be loaded with a specifi ed sequence of loads, including loads beyond nameplate rating, without exceeding those temperatures specifi ed or agreed upon by the user and manufacturer. c)Demonstrate that the ancillary equipment on an oil-immersed transformer would not impose limita- tions on th
35、ose loading conditions recommended in the loading guides. This guide describes three test procedures. Clause 9 describes a test procedure for determining the thermal characteristics of an oil immersed power transformer. Clause 10 describes a test procedure for performing load cycle temperature rise
36、tests to assess the capability of a transformer to be loaded with a specifi c load cycle. Clause 11 describes a recommended integrated procedure for determining thermal characteristics and performing a load cycle temperature rise test. It is anticipated that data obtained from tests performed in acc
37、ordance with these procedures will be col- lected and analyzed by a future IEEE Working Group to establish a database that can be utilized to improve the accuracy of the assumptions and equations used in future loading guides. References to other standards have been updated where applicable and all
38、units of measurements are speci- fi ed in metric units only, wherever practical All cooling class designations have been replaced with new cooling class designations per Table 2 of IEEE Std C57.12.00 .-2000. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under
39、license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:23:39 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright 2002 IEEE. All rights reserved. Participants The working group that coordinated the fi nal compilation of thi
40、s standard had the following membership: Subhash Tuli, Chair Kenneth J. Fleming At the time this recommended procedure was completed, the Thermal Test Working Group had the following membership: Robert L. Grubb, Chair Donald J. Fallon, Secretary Other individuals who have made signifi cant contribut
41、ions to the development of this document as former members of the Thermal Test Working Group are the following: Jacques Aubin Donald E. Ayers Ronald L. Barker Michael F. Barnes Barry L. Beaster William E. Boettger Jerry L. Corkran James Cross Frank David Jeff Fleeman Michael A. Franchek Monroe L. Fr
42、azier David F. Goodwin George Henry Keith R. Highton John J. Hinkson Virendra Jhonsa Eugene Kallaur Jim Long Donald L. Lowe John W. Matthews C. J. McMillen William J. McNutt C. K. Miller R. E. Minkwitz, Sr. Steve P. Moore Ed Norton Dennis Orten Mark D. Perkins V. Q. Pham Linden W. Pierce Donald W. P
43、latts Vallamkonda Sankar Vic Shenoy Hyeong Jin Sim Ronald W. Stoner Malcolm Thaden Subhash C. Tuli Robert A. Veitch Felipe N. Weffer Robert J. Whearty John J. Bergeron Orion O. Chew David H. DouglasJames J. Kunes Dave Takash Copyright The Institute of Electrical and Electronics Engineers, Inc. Provi
44、ded by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 02:23:39 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 2002 IEEE. All rights reserved. v The following members of the balloting committee voted on thi
45、s standard. Balloters may have voted for approval, disapproval, or abstention: When the IEEE-SA Standards Board approved this standard on 6 December 2001, it had the following membership: Donald N. Heirman, Chair James T. Carlo, Vice Chair Judith Gorman, Secretary *Member Emeritus Also included is t
46、he following nonvoting IEEE-SA Standards Board liaison: Alan Cookson, NIST Representative Donald R. Volzka, TAB Representative Noelle D. Humenick IEEE Standards Project Editor Paul Ahrens Dennis J. Allan Jim C. Arnold Jacques Aubin Ronald L. Barker Michael F. Barnes Oscar M. Bello Edward A. Bertolin
47、i Wallace B. Binder William E. Boettger Joe V. Bonucchi John D. Borst William Carter Don Chu Jerry L. Corkran Dan W. Crofts Robert C. Degeneff Robert M. DelVecchio Richard F. Dudley John A. Ebert Fred E. Elliott Don J. Fallon Joe Foldi Bruce I. Forsyth Ron Fox Michael A. Franchek Dudley L. Galloway
48、Saurabh Ghosh Donald A. Gillies David F. Goodwin Richard D. Graham Robert L. Grubb Ernest Hanique James H. Harlow Roger R. Hayes William R. Henning Keith R. Highton Philip J. Hopkinson Y. Peter Iijima Virendra Jhonsa Anthony J. Jonnatti Lars-Erik Juhlin Joseph J. Kelly Egon Koenig Barin Kumar John G
49、. Lackey Donald N. Laird Larry A. Lowdermilk Donald L. Lowe Joe D. MacDonald William A. Maguire John W. Matthews Jack W. McGill Charles Patrick McShane Joseph P. Melanson R. E. Minkwitz, Sr. Harold R. Moore Steve P. Moore Daniel H. Mulkey Charles R. Murray William H. Mutschler, Jr. Larry Nunnery Dennis Orten Bipin K. Patel Dhiru S. Patel Jesse M. Patton Da