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1、 IEC/PAS 62596 Edition 1.0 2009-01 PUBLICLY AVAILABLE SPECIFICATION PRE-STANDARD Electrotechnical products Determination of restricted substances Sampling procedure Guidelines IEC/PAS 62596:2009(E) Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=HP
2、Monitoring/1111111164 Not for Resale, 02/02/2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be repr
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10、1111111164 Not for Resale, 02/02/2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- IEC/PAS 62596 Edition 1.0 2009-01 PUBLICLY AVAILABLE SPECIFICATION PRE-STANDARD Electrotechnical products Determination of restricted substances Sampling procedure Guidelines INTE
11、RNATIONAL ELECTROTECHNICAL COMMISSION XA ICS13.020, 43.040.10 PRICE CODE ISBN 2-8318-1019-4 Registered trademark of the International Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=HP Monitoring/1111111164 Not for Resale
12、, 02/02/2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- 2 PAS 62596 IEC:2009(E) CONTENTS FOREWORD.4 INTRODUCTION.5 1 Scope.6 2 Normative references .6 3 Terms, definitions and abbreviations 6 3.1 Terms and definitions6 3.2 Abbreviations 8 4 Introduction to sam
13、pling .9 4.1 Introductory remark .9 4.2 Requirements and concerns for restricted substances.9 4.3 Complexity of electrotechnical products and related challenges 10 4.4 Strategies for sampling11 5 Sampling 13 5.1 Introductory remark .13 5.2 Partial disassembly .13 5.2.1 Example 1: Cell phone type A D
14、isassembly without tools14 5.2.2 Example 2: Cell phone type B Partial disassembly.15 5.3 Complete disassembly.16 5.4 Partial disjointment18 5.4.1 Introductory remark .18 5.5 Complete disjointment.20 5.5.1 Introductory remark .20 5.5.2 Typical examples of disjointment at the component level.20 5.5.3
15、Examples of disjointment at the base materials level Disjointment of integrated circuit (IC) chips22 5.6 Considerations of sampling and disjointment.25 5.6.1 Introductory remark .25 5.6.2 Sample size required.25 5.6.3 Sample size v. detection limit 26 5.6.4 Composite testing of disjointable samples
16、.27 5.6.5 Non-uniform “homogeneous materials” 28 5.6.6 Determination of sampling position of homogeneous materials 29 6 Conclusions and recommendations 29 Annex A (informative) Examples of procedures for sampling and disjointment .30 Annex B (informative) Probability of presence of restricted substa
17、nces40 Annex C (informative) Composite testing and sampling42 Annex D (informative) Tools used in sampling .44 Annex E (informative) Use of XRF screening techniques in sampling.45 Bibliography54 Figure 1 Generic iterative procedure for sampling11 Figure 2 Cell phone with battery charger and camera l
18、ens cap.14 Figure 3 Cell Phone with battery and back cover removed .15 Figure 4 Partial disassembly of a cell phone (type B) into its major components 16 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=HP Monitoring/1111111164 Not for Resale, 02/02/
19、2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- PAS 62596 IEC:2009(E) 3 Figure 5 Complete disassembly of the key pad 17 Figure 6 Complete disassembly of the bottom housing.17 Figure 7 Complete disassembly of the other housing/frame .18 Figure 8 Components of t
20、he TFT display of the cell phone after partial disjointment.19 Figure 9 Components of the main PWB of the cell phone after partial disjointment 19 Figure 10 Disjointment of lead frame component22 Figure 11 BGA package prior to disjointment .23 Figure 12 BGA package disjointed by the hand removal pro
21、cedure 23 Figure 13 Solder ball material collected from BGA using a hand removal procedure 24 Figure 14 BGA solder ball removal using the ball shear procedure.24 Figure 15 Cross-section of a 900 m wide lead oxide-based resistor (SMD) 28 Figure A.1 Example of methodology for sampling and disjointment
22、 31 Figure A.2 Methodology for sampling and disjointment.32 Figure A.3 Sampling of DVD player33 Figure A.4 Sampling of CRT 34 Figure A.5 Sampling of LCD TV .35 Figure A.6 Sampling of PDA/phone36 Figure A.7 Sampling of desk fan 37 Figure A.8 Compoments Example 1 thick film resistor38 Figure D.1 Hot g
23、as gun for removing the electronic components44 Figure D.2 Vacuum pin to remove the target electronic devices .44 Figure E.1 AC power cord, X-ray spectra of sampled sections .47 Figure E.2 RS232 cable and its X-ray spectra48 Figure E.3 Cell phone charger shown partially disassembled. 48 Figure E.4 P
24、WB and cable of cell phone charger .49 Figure E.5 Spots from 1,27 mm and 0,3 mm collimaters.50 Figure E.6 Examples of substance mapping on PWBs .52 Figure E.7 SEM-EDX image of Pb free solder with small intrusions of Pb (size = 30 m).53 Table 1 Possible restricted or screening substances from a cell
25、phone 15 Table 2 Possible restricted substances in major components of the cell phone 16 Table 3 Examples of disjointment for typical small electronic components .21 Table 4 Minimum number of lead frame samples required for analytical testing .26 Table 5 Levels of a restricted substance in a composi
26、te sample 27 Table B.1 Probability of presence of restricted substances in materials and components used in electrotechnical products 40 Table C.1 Calculated maximum concentration for a composite sample based on detection limit .43 Table C.2 Required detection limit for a composite sample based on t
27、he maximum allowable concentration 43 Table E.1 Selection of samples for analysis of AC power cord .46 Table E.2 Selection of samples (testing locations) for analysis after visual inspection Cell phone charger49 Table E.3 Results of XRF analysis at spots 1 and 2 as shown in Figure E.6.52 Copyright I
28、nternational Electrotechnical Commission Provided by IHS under license with IECLicensee=HP Monitoring/1111111164 Not for Resale, 02/02/2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- 4 PAS 62596 IEC:2009(E) INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROTE
29、CHNICAL PRODUCTS DETERMINATION OF RESTRICTED SUBSTANCES SAMPLING PROCEDURE GUIDELINES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to
30、 promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Gu
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38、ance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the e
39、lements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. A Publicly Available Specification (PAS) is a technical specification not fulfilling the requirements for a standard, but made available to the public
40、. IEC-PAS 62596 has been processed by IEC technical committee 111: Environmental standardization for electrotechnical products and systems. The text of this PAS is based on the following document: This PAS was approved for publication by the P-members of the committee concerned as indicated in the f
41、ollowing document Draft PAS Report on voting 111/112/PAS 111/126/RVD Following publication of this PAS, which is a pre-standard publication, the technical committee or subcommittee concerned may transform it into an International Standard. This PAS shall remain valid for an initial maximum period of
42、 3 years starting from the publication date. The validity may be extended for a single 3-year period, following which it shall be revised to become another type of normative document, or shall be withdrawn. Copyright International Electrotechnical Commission Provided by IHS under license with IECLic
43、ensee=HP Monitoring/1111111164 Not for Resale, 02/02/2009 02:13:48 MSTNo reproduction or networking permitted without license from IHS -,-,- PAS 62596 IEC:2009(E) 5 INTRODUCTION In the electrotechnical industry, much emphasis has been placed on minimizing the environmental burden of its products. Wa
44、ste handling, recycling, chemicals and energy consumption are covered by regulations. Specifically, the use of materials containing lead (Pb), mercury (Hg), cadmium (Cd) and hexavalent chromium (Cr VI), as well as two types of brominated flame retardants (polybrominated biphenyls, PBBs, and polybrom
45、inated diphenyl ethers, PBDEs) in electrotechnical equipment is restricted in current and proposed regional legislation. To demonstrate compliance with these requirements, it may be necessary to analyse electrotechnical products for a variety of reasons: to supplement supply chain material declarati
46、ons (companies may choose to test products directly to determine compliance); companies may require their suppliers to perform analysis to support material declarations; companies may perform “spot checks“ of their suppliers to assess compliance enforcement authorities may perform testing as part of
47、 their market surveillance activities. IEC 62321 already provides test methods for the determination of six regulated substances in electrotechnical products. However, the preparatory steps before the analysis are critically important in obtaining accurate, reproducible results. Prior to this PAS, t
48、here was virtually no guidance or consensus as to how electrotechnical products should be sampled. The purpose of this PAS is primarily to complement IEC 62321 by providing agreed guidelines on how electrotechnical products, assemblies and components should be sampled to determine the levels of restricted substances present. Please note sampling and analytical testing is not the only way to obtain relevant information on the levels of substances