《IEC-61967-2-2005.pdf》由会员分享，可在线阅读，更多相关《IEC-61967-2-2005.pdf（52页珍藏版）》请在三一文库上搜索。
1、 NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61967-2 Premire dition First edition 2005-09 Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 2: Mesure des missions rayonnes Mthode de cellule TEM et cellule TEM large bande Integrated circuits Measurement of electromagn
2、etic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method Numro de rfrence Reference number CEI/IEC 61967-2:2005 Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wi
3、ng, Bernie Not for Resale, 03/09/2007 21:19:25 MSTNo reproduction or networking permitted without license from IHS -,-,- Numrotation des publications Depuis le 1er janvier 1997, les publications de la CEI sont numrotes partir de 60000. Ainsi, la CEI 34-1 devient la CEI 60034-1. Editions consolides L
4、es versions consolides de certaines publications de la CEI incorporant les amendements sont disponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amende
5、ments 1 et 2. Informations supplmentaires sur les publications de la CEI Le contenu technique des publications de la CEI est constamment revu par la CEI afin quil reflte ltat actuel de la technique. Des renseignements relatifs cette publication, y compris sa validit, sont dispo- nibles dans le Catal
6、ogue des publications de la CEI (voir ci-dessous) en plus des nouvelles ditions, amendements et corrigenda. Des informations sur les sujets ltude et lavancement des travaux entrepris par le comit dtudes qui a labor cette publication, ainsi que la liste des publications parues, sont galement disponib
7、les par lintermdiaire de: Site web de la CEI (www.iec.ch) Catalogue des publications de la CEI Le catalogue en ligne sur le site web de la CEI (www.iec.ch/searchpub) vous permet de faire des recherches en utilisant de nombreux critres, comprenant des recherches textuelles, par comit dtudes ou date d
8、e publication. Des informations en ligne sont galement disponibles sur les nouvelles publications, les publications remplaces ou retires, ainsi que sur les corrigenda. IEC Just Published Ce rsum des dernires publications parues (www.iec.ch/online_news/justpub) est aussi dispo- nible par courrier lec
9、tronique. Veuillez prendre contact avec le Service client (voir ci-dessous) pour plus dinformations. Service clients Si vous avez des questions au sujet de cette publication ou avez besoin de renseignements supplmentaires, prenez contact avec le Service clients: Email: custserviec.ch Tl: +41 22 919
10、02 11 Fax: +41 22 919 03 00 Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For example, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For exa
11、mple, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant revi
12、ew by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity, is available in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under conside
13、ration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is also available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searc
14、hpub) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On- line information is also available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently
15、issued publications (www.iec.ch/online_news/justpub) is also available by email. Please contact the Customer Service Centre (see below) for further information. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Servic
16、e Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 . Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:19:25 MSTNo reproduction or networking permitted
17、without license from IHS -,-,- NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61967-2 Premire dition First edition 2005-09 Circuits intgrs Mesure des missions lectromagntiques, 150 kHz 1 GHz Partie 2: Mesure des missions rayonnes Mthode de cellule TEM et cellule TEM large bande Integrated circu
18、its Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 2005 Droits de reproduction rservs Copyright - all rights reserved Aucune partie de
19、 cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lditeur. No part of this publication may be reproduced or utilized in any form or by any means, electronic
20、or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, Switzerland Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch CO
21、DE PRIX PRICE CODE S Commission Electrotechnique Internationale International Electrotechnical Commission Copyright International Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:19:25 MSTNo reproduct
22、ion or networking permitted without license from IHS -,-,- 2 61967-2 CEI:2005 SOMMAIRE AVANT-PROPOS6 1 Domaine dapplication 10 2 Rfrences normatives.10 3 Termes et dfinitions12 4 Gnralits.12 5 Conditions dessai 12 5.1 Gnralits12 5.2 Tension dalimentation.12 5.3 Gamme de frquences 12 6 Equipement des
23、sai 12 6.1 Gnralits12 6.2 Blindage12 6.3 Appareil de mesure RF12 6.4 Pramplificateur 14 6.5 Cellule TEM 14 6.6 Cellule TEM/GTEM large bande .14 6.7 Terminaison de 50 .14 6.8 Gain du systme .14 7 Montage dessai .14 7.1 Gnralits14 7.2 Configuration dessai.14 7.3 PCB dessai 16 8 Procdure dessai.22 8.1
24、Gnralits22 8.2 Conditions ambiantes22 8.3 Vrification oprationnelle du DEE 22 8.4 Mesure des missions du DEE 22 9 Rapport dessai 24 9.1 Gnralits24 9.2 Conditions de mesure24 10 Niveaux de rfrence des missions du CI .24 Annexe A (informative) Exemple de formulaire de vrification de ltalonnage et du m
25、ontage .26 Annexe B (informative) Descriptions de la cellule TEM et de la cellule TEM large bande .28 B.1 Cellule TEM.28 B.2 Cellule TEM large bande.28 Annexe C (informative) Calcul du moment de diple partir des donnes mesures 30 C.1 Gnralits30 C.2 Calcul du moment de diple.30 Copyright Internationa
26、l Electrotechnical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:19:25 MSTNo reproduction or networking permitted without license from IHS -,-,- 61967-2 IEC:2005 3 CONTENTS FOREWORD.7 1 Scope.11 2 Normative referen
27、ces .11 3 Terms and definitions .13 4 General 13 5 Test conditions.13 5.1 General.13 5.2 Supply voltage.13 5.3 Frequency range .13 6 Test equipment.13 6.1 General.13 6.2 Shielding.13 6.3 RF measuring instrument 13 6.4 Preamplifier.15 6.5 TEM cell15 6.6 Wideband TEM/GTEM cell.15 6.7 50-Ohm terminatio
28、n.15 6.8 System gain 15 7 Test set-up.15 7.1 General.15 7.2 Test configuration15 7.3 Test PCB.17 8 Test procedure .23 8.1 General.23 8.2 Ambient measurement.23 8.3 DUT operational check 23 8.4 DUT emissions measurement23 9 Test report25 9.1 General.25 9.2 Measurement conditions25 10 IC emissions ref
29、erence levels.25 Annex A (informative) Example calibration la CEI ne peut pas tre tenue responsable de lventuelle mauvaise utilisation ou interprtation qui en est faite par un quelconque utilisateur final. 4) Dans le but dencourager luniformit internationale, les Comits nationaux de la CEI sengagent
30、, dans toute la mesure possible, appliquer de faon transparente les Publications de la CEI dans leurs publications nationales et rgionales. Toutes divergences entre toutes Publications de la CEI et toutes publications nationales ou rgionales correspondantes doivent tre indiques en termes clairs dans
31、 ces dernires. 5) La CEI na prvu aucune procdure de marquage valant indication dapprobation et nengage pas sa responsabilit pour les quipements dclars conformes une de ses Publications. 6) Tous les utilisateurs doivent sassurer quils sont en possession de la dernire dition de cette publication. 7) A
32、ucune responsabilit ne doit tre impute la CEI, ses administrateurs, employs, auxiliaires ou mandataires, y compris ses experts particuliers et les membres de ses comits dtudes et des Comits nationaux de la CEI, pour tout prjudice caus en cas de dommages corporels et matriels, ou de tout autre dommag
33、e de quelque nature que ce soit, directe ou indirecte, ou pour supporter les cots (y compris les frais de justice) et les dpenses dcoulant de la publication ou de lutilisation de cette Publication de la CEI ou de toute autre Publication de la CEI, ou au crdit qui lui est accord. 8) Lattention est at
34、tire sur les rfrences normatives cites dans cette publication. Lutilisation de publications rfrences est obligatoire pour une application correcte de la prsente publication. 9) Lattention est attire sur le fait que certains des lments de la prsente Publication de la CEI peuvent faire lobjet de droit
35、s de proprit intellectuelle ou de droits analogues. La CEI ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CEI 61967-2 a t tablie par le sous-comit 47A: Circuits intgrs, du comit dtudes 47 de l
36、a CEI: Dispositifs semiconducteurs. Le texte de cette norme est issu des documents suivants: FDIS Rapport de vote 47A/722/FDIS 47A/729/RVD Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Copyright International Electro
37、technical Commission Provided by IHS under license with IECLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/09/2007 21:19:25 MSTNo reproduction or networking permitted without license from IHS -,-,- 61967-2 IEC:2005 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRATED CIRC
38、UITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 kHz TO 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical com
39、mittees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technic
40、al Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmenta
41、l and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agr
42、eements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use
43、 and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promo
44、te international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indica
45、ted in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach t
46、o IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) an
47、d expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9
48、) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61967-2 has been prepared by subcommittee 47A: Integrated circuits, of IEC te