IEEE-1143-1994-R1999.pdf

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1、 IEEE Std 1143-1994 IEEE Guide on Shielding Practice for Low Voltage Cables Sponsor Insulated Conductors Committee of the IEEE Power Engineering Society Approved September 22, 1994 IEEE Standards Board Abstract: A concise overview of shielding options for various types of interference and recommenda

2、tions on shielding practices, including suggestions on terminating and grounding methods, are provided. Keywords: grounding methods, interference, low voltage cables, shielding practice, terminating methods The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, N

3、Y 10017-2394, USA Copyright 1995 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1995. Printed in the United States of America. ISBN 1-55937-460-8 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise,

4、without the prior written permission of the publisher. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or networking permitted without li

5、cense from IHS -,-,- IEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Insti

6、tute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The

7、 existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to chan

8、ge brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to review at least every fi ve years for revision or reaffi rmation. When a document is more than fi ve years old and has not been reaffi rmed, it is reaso

9、nable to conclude that its contents, although still of some value, do not wholly refl ect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, reg

10、ardless of membership affi liation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to spe

11、cifi c applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it is important to ensure that any interpretation has also received

12、the concurrence of a balance of interests. For this reason IEEE and the members of its technical committees are not able to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests f

13、or interpretations should be addressed to: Secretary, IEEE Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA IEEE Standards documents may involve the use of patented technology. Their approval by the Institute of Electrical and Electronics Engineers does not mean that using s

14、uch technology for the purpose of conforming to such standards is authorized by the patent owner. It is the obligation of the user of such technology to obtain all necessary permissions. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELice

15、nsee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or networking permitted without license from IHS -,-,- iii Introduction (This introduction is not a part of IEEE Std 1143-1994, IEEE Guide on Shielding Practice for Low Voltage Cables.) A guide on the u

16、se of shielding on low voltage cables was proposed in Subcommittee No. 9 of the Insulated Conductors Committee due to the lack of a single source of information on this topic. For example, information on shielding of medium voltage and high voltage cables was available in several documents, but the

17、same could not be said for low voltage cable. Subsequently, a task group was formed to develop the guide. It quickly became evident to the task group that an extensive amount of information was available on the shielding of low voltage cable. The task group began its work by preparing a bibliography

18、 of the information by key topic. These topics eventually made their way into an outline of the guide. A fi rst draft was prepared, and after review and comment, the draft was broken into two sections: Section I, covering shielding; and Section II, providing background information on the need for sh

19、ielding. This approach was taken because an understanding of the need for shielding helps achieve the purpose of the guidewhich is to provide the user with an understanding of cable shielding practices for low voltage cables. At the rime this guide was completed, the working group had the following

20、membership: Kenneth E. Bow , Chair James M. Daly Joel Kitchens Frank B. LaFetra Phil McGettigan Kenneth R. Strandberg Mark Tabbey Edward M. Walton Roland H. W. Watkins The following individuals also contributed to this guide. G. Y. R. Allen Howard J. Calhoun Eugene J. Daquamno Art Hirsh John Jeanmon

21、d Jim Lasley Mark Lowell John Merando George Mundell Z. Steve Paniri John Pryma John G. Quinn David Sahud Joseph H. Snow Dennis P. Symanski Anatoly Tsalivoich Edward E Vance Peter A. Woog The following persons were on the balloting committee: T. J. Al-Hussaini R. W. Allen, Jr. W. O. Andersen, Jr. R.

22、 H. Arndt T. P. Arnold T A. Balaska A. Barlow C. W. Blades D. T. Bogden V. J. Boliver R. R. Borowski K. E. Bow J. E. Bramfitt R. R. Burghardt J. L. Carlson P. L. Cinquemani W. E. Cole E. J. DAquamno S. J. Dale J. M. Daly J. A. DiCostanzo C. Doench J.P. DuPont G. S. Eager, Jr. R. M. Eichhorn H. El Ba

23、daly J. S. Engelhardt S. L. Fitzhugh A. Fitzpatrick E. O. Forster R. F. Frank R. D. Fulcomer J. B. Gardner P. Gazzana-Priaroggia R. B. Gear P. Giaccaglia A. Godoshian A. Gwal V. S. Harper R. Hartlein H. C. Hervig, Jr. S. V. Heyer R. W. Higginbottom L. J. Hiivala W. F. Jensen, Jr. D. R. Jeter C. V. J

24、ohnson L. J. Kelly F. E. Kimsey J. Kitchens H. T. Knox F. B. Koch A. Kong D. E. Koonce Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or

25、 networking permitted without license from IHS -,-,- iv M. Kopchik, Jr. F. E. LaFetra F. E. LaGase J. J. LaMarca C. Landinger J. S. Lasky J. H. Lawson R. H. Leuteritz T H. Ling J. V. Lipe M. E. Lowell G. Ludasi R. Luther J. P. Mackevich G. A. MacPhail M. A. Martin, Jr. I. J. Marwick S. G. Mastoras F

26、. M. McAvoy L. B. McClung A. R. McCulloch E. J. McGowan A. L. McKean W. J. McNulty J. D. Medek J. D. Mintz J. A. Moran, Jr. D. J. Nichols J. J. Pachot C. D. Palmer K. A. Petty J. S. Pirrong G. A. Polhill J. B. Prime, Jr. P. F. Pugh P. Ralston G. P. Rampley R. A. Resuali R. B. Robertson R. W. Samm E.

27、 L. Sankey W. E. Schuessler J. F. Shimshock B. E. Smith J. H. Snow T. F. Stabosz W.T. Starr D. R. Stein J. L. Steiner G. L. Stell, Jr. F. M. Stepniak G. A. Straniero M.D. Sweat W. K. Switzer J. Tanaka J. W. Tarpey F. A. Teti H. D. Thomas W. A. Thue A. C. Tingley D. Tomaszewski W. Torok D. B. Trinh S

28、. E. Turner J. R. Tuzinski D. A. Voltz C. F. Von Hermann, Jr. S. P. Walldorf E. M. Walton R. H. W. Watkins A. C. Westrom C. A. White W. D. Wilkens R. O. Wilkinson J. A. Williams W. G. Wimmer J. T. Zimnoch When the IEEE Standards Board approved this guide on September 22, 1994, it had the following m

29、embership: Wallace S. Read , Chair Donald C. Loughry , Vice Chair Andrew G. Salem , Secretary Gilles A. Baril Bruce B. Barrow Jos A. Berrios de la Paz Clyde R. Camp James Costantino Stephen L. Diamond Donald C. Fleckenstein Jay Forster * Ramiro Garcia Donald N. Heirman Richard J. Holleman Jim Isaak

30、Ben C. Johnson Sonny Kasturi Lorraine C. Kevra E.G. “Al” Kiener Ivor N. Knight Joseph L. Koepfinger * D. N. “Jim” Logothetis L. Bruce McClung Marco W. Migliaro Mary Lou Padgett Arthur K. Reilly Ronald H. Reimer Gary S. Robinson Leonard L. Tripp * Member Emeritus Also included are the following nonvo

31、ting IEEE Standards Board liaisons: Satish K. Aggarwal James Beall Richard B. Engelman Robert E. Hebner David E. Soffrin Stephen J. Huffman IEEE Standards Project Editor Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technic

32、al Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or networking permitted without license from IHS -,-,- v CLAUSEPAGE 1. Overview.1 1.1 Scope 1 1.2 Purpose. 1 2. References.1 3. Definitions.2 Section I: Shielding.5 4. Nature of interference .5 4.1 Definition of sources

33、 5 4.2 Nature of interference 5 4.3 Source-circuit interaction. 5 4.4 Types of interference 6 4.5 Sources of electromagnetic interference (EMI). 7 4.6 Electrical noise produced by power processing and control 8 5. Types of cable shielding .9 5.1 Introduction 9 5.2 Solid tube shield. 11 5.3 Single la

34、yer foil shield with drain wire 12 5.4 Multilayer shield with drain wire. 14 5.5 Spiral shield 14 5.6 Braided wire shield 14 5.7 Combination shields. 15 5.8 Overall shields 16 5.9 Conductive plastics 18 5.10 Shield and armor options . 19 5.11 Balanced mode transmission on twisted pairs . 21 5.12 Bal

35、anced mode transmission on shielded twisted pairs. 24 5.13 Twisted pairs for transmission of high-speed data. 26 6. Shielding application principles26 6.1 Functions 26 6.2 Single or multiconductor 27 6.3 Dedicated or multiplexed. 27 6.4 Cable construction types 27 6.5 Cable selection. 27 6.6 Shield

36、typesapplication guide 29 7. Grounding and installation30 7.1 Introduction 30 7.2 Shield grounded at one end 31 7.3 Shield grounded at both ends. 31 7.4 Transient protection with overall shields. 31 7.5 Grounding of cable with foil shields and overall shields. 34 Copyright The Institute of Electrica

37、l and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or networking permitted without license from IHS -,-,- vi CLAUSEPAGE 8. Shield testing methods37 8.1 General. 37 8.2 Continuo

38、us wave test methods. 37 8.3 Testing of overall shield for single or multiconductor cable. 39 9. Characterization of shielding44 9.1 General. 44 9.2 Shielding properties . 44 9.3 Architectural shielding effectiveness. 45 9.4 Transfer impedance 46 9.5 Shielding effectiveness of overall shield 48 9.6

39、Reduction factor with overall shields. 49 9.7 Transient (lightning) protection by overall shields 50 9.8 Aging effect on shielding. 51 Section II: Background and theory on need for shielding.57 10. Electrical noise susceptibility57 10.1 Introduction 57 10.2 Galvanic action 58 10.3 Combination effect

40、. 58 10.4 Transients or repetitive noise. 59 10.5 Nonlinear distortion . 62 11. Interaction (coupling)63 11.1 Introduction 63 11.2 Impedance coupling or common impedance coupling. 63 11.3 Magnetic coupling 63 11.4 Quasistatic electric coupling 63 11.5 Coupling by electromagnetic radiation 63 11.6 Cr

41、osstalk. 64 11.7 Crosstalk between coaxial cables. 64 11.8 Electromagnetic crosstalk 64 12. Electrical noise susceptibility65 12.1 Introduction 65 12.2 System boundaries . 66 12.3 Sensitivity to noise. 67 12.4 General susceptibility. 67 12.5 Susceptibility to transient electrical noise 67 13. Noise

42、induced from power systems67 13.1 Introduction 67 13.2 Interaction model . 68 14. Bibliography70 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo repro

43、duction or networking permitted without license from IHS -,-,- Copyright 1998 IEEE All Rights Reserved 1 IEEE Guide on Shielding Practice for Low Voltage Cables 1. Overview 1.1 Scope This function of this guide on shielding practice for low voltage cables is to inform and familiarize the reader with

44、 shielding practice. An overview of shielding practice, systems, and test methods is provided. These tests may not be standardized; however, they are included to inform the reader and provide an overview as to what has been done to characterize shielding. This guide provides the following: An enumer

45、ation of sources of electrostatic and electromagnetic interference A review of shielding techniques to control electrostatic and electromagnetic interference for varying types of low voltage cable uses for power, control and instrumentation services, including signal and communications cable An over

46、view of the functional characteristics of various types of shielding Criteria for defi ning the most favorable techniques to combat interference Suggested tests or techniques for measuring shielding effectiveness Recommendations on shielding practices, including suggestions on terminating and ground

47、ing methods 1.2 Purpose The main purpose of this guide is to show how shielding can be used to minimize the effects of interference on low voltage cables. The secondary purpose is to familiarize the user with the topic of shielding and provide background information on the need for shielding. Altern

48、ate approaches will be given to achieve these purposes. 2. References This guide should be used in conjunction with the following publications. When the following publications are superseded by an approved revision, the revision shall apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 12:02:33 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 Copyright 1998 IEEE All Rights Reserved IEEE Std

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