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1、Recognized as an IEEE Std3%-l991 I American National Standard (ANSI) (Revision of IEEE S t d 393-1977) IEEE Standard for Test Procedures for Magnetic Cores IEEE Power Electronics Society Sponsored by the Electronics Transformer Technical Committee Vb Published b y the Institute of Electrical and Ele
2、ctronics Engineers, Inc, 345 East 47th Street, New York, Ivy 1001 USA. I IEE March 10, 1992 SH14514 COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Hand
3、ling Services IEEE 393 91 W 4805702 O500286 2 Recognized a8 an American National Standard (ANSI) IEEE SM 393-1991 (Revision of IEEE S t d 393-1977) IEEE Standard for Test Procedures for Magnetic Cores Sponsor Electronics Transformer Technicd Committee of the EEX Power Electronics society Approved Ju
4、ne 27,1991 IEEXStandardsBoard Approved December 9,1991 American National Standards Institute Abstract: Test methods useful in the design, analysis, and operation of magnetic cores in many types of applications are presented. Tests for specifying and/or measuring permeability, core loss, apparent cor
5、e loss, induction, hysteresis, thermal characteristics, and other properties are given. Most of the test methods described include specific parameter ranges, instrument accuracies, core sizes, etc., and may be used in the specification of magnetic cores for industrial and,military ap- plications. Mo
6、re generalized test procedures are included for the benefit of the R approved December 9,1991, Includes bibliographical references. “IEEE Std 393-1991 (revision of IEEE Std 393-1977).“ ISBN 1-50937-143-9 1. Magnetic cores-Testing-Standards-United States. I. IEEE Power Electronics Society. Electronic
7、s Tramformer Technical Committee. II. Title. American National Standards Institute.“ TK7872M2EiI63 1992 621.3973-420 92-2892 CIP COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electrical and Electronics Engineers, Inc
8、 Licensed by Information Handling Services IEEE 393 91 E Y805702 0500288 b Foreword (This foreword is not a part of IEEE Std 393-1991, IEEE Standard for Test Procedures for Magnetic Cores.) O The purpose of this standard is to present test methods useful in the design, analysis, and operation of mag
9、netic cores in many types of applications in electronics and related industries. Most of the test methods described include specific parameter ranges, instrument accuracies, core sizes, etc., which may be used in the specification of magnetic cores for industrial and military applications. Other sec
10、tions of the standard describe more generalized tes procedures, which are included more for the benefit of the R and D engineer and university student. This standard has been updated to include core materials, test methods, and information on measuring instruments. Information from two discontinued
11、standards is now included. The old standards were IEEE Std 106-1972, Standard Test Procedure for Toroidal Magnetic Amplifier Cores and IEEE Std 164-1962, Methods of Testing Bobbin Cores, SI units are used throughout this standard; equivalent CGS and English units are included in some definitions. Wh
12、enever possible, all definitions and symbols are in accordance with those of the International Electrotechnical Commission (IEC). The revision of this standard was prepared by the Working Group on Magnetic Cores-Test Codes Subcommittee of the Electronics Transformer Technical Committee of the IEEE P
13、ower Electronics Society. John Silgailis, Chair J. S. Andresen R. P. Carey Charles J. Elliott Herman Fickenscher P. K. Goethe Harold E. Lee Robert L. Sell John Tardy The following persons were on the balloting committee that approved this standard for o submission to the IEEE Standards Board: E. D.
14、Belanger R. P. Carey Charles J. Elliott Herman Fickenscher R. Fisher Rolf Frantz P. K. Goethe Nathan Grossner O. Kiltie L. Kirkwood Harold E. Lee Rueben Lee H. W. Lord William Lucarcz R. G. Noah David N. Ratliff Robert L. Sell John Silgailis John Tardy Ray Taylor Bruce Thackwray H. Tillinger R. G. W
15、olpert R. M. Wozniak When the IEEE Standards Board approved this standard on June 27, 1991, it had the following membership: Marco W. Migliaro, Chair Donald C . Loughry, Vice Chair Andrew G. Salem, Secretary Dennis Bodson Paul L. Borrill Clyde Camp James M. Daly Donald C. Fleckenstein Jay Forster* D
16、avid F. Franklin Ingrid Fromm Thomas L. Hannan Donald N. Heirman Kenneth D. Hendrix John W. Horch Ben C. Johnson Ivor N. Knight Joseph Koepfinger* Irving Kolodny Michael A. Lawler John E. May, Jr. Lawrence V. McCall T. Don Michael* Stig L. Nilsson John L. Rankine Ronald H. Reimer Gary S. Robinson Te
17、rrance R. Whittemore *Member Emeritus Kristin M. Dittmann IEEE Standards Department Project Editor COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handl
18、ing Services contents SECTION PAGE 1 . 2 . 3 . 4 . 5 . Scope . 9 Specific Types of Magnetic Cores to Which this Standard Applies 9 Specific Applications to Which this Standard Is Directed 9 References and Related Standards . 9 1 . 3 . 1 References 9 General Related Standards . 9 1.1 1.2 1.3 1.3.2 De
19、finitions . 10 Configurations., 10 3 . 1 Effect of the Configuration or Geometry of the Core Material on Finished Product 10 . 3 . 2 Basic Core Shapes 3 . 3 Epstein Strip Core Materials 4 . 1 Ferromagnetic . 4.2 Ferrites Symbols and Terms . 5 . 1 5 . 2 5.3 5.4 5 . 5 5 . 6 5.7 5 . 8 5 . 9 5.10 5.11 5
20、.12 5 . 1 3 Effective Parameters . Permeability 5.2.1 Initial Permeability . 5.2.2 Amplitude Permeability 5 . 2 . 3 Maximum Permeability 5.2.4 Incremental Permeability 5.2.5 Pulse Permeability . 5.2.6 Complex Permeability . 5.2.7 Differential Permeability . 5.2.8 Impedance Permeability . 5.2.9 Peak
21、Permeability Core Loss . 11 . 11 11 . 11 . 11 12 12 . 12 12 12 12 13 . 1 3 . 13 . 1 3 . 1 3 . 1 3 . 1 3 .- 5.3.1 5.4.1 Specific Core Loss . IY Apparent Core Loss 1 3 Specific Apparent Core Loss . 14 Equivalent Series Circuit Elements . 1 4 Equivalent Parallel Circuit Elements 1 4 Loss Angle (Dissipa
22、tion Factor) . 14 Relative Dissipation Factor . 14 5 . 7 . 1 5.7.2 Quality Factor. Q Leggs Equation Parameters . Saturation Induction. B, . 5.9.1 Peak Induction. B, . Residual Induction. B. 5.10.1 Remanent Induction . 5.10.2 Squareness Ratio . . 14 . 14 . 15 . 15 . 15 . 15 . 15 . Coercive Field or F
23、orce. Hc . 15 Hl and H2 Reset Field Strengths . 15 Reset Gain. G 15 Temperature Coefficient 15 5 . 1 2 . 1 AH . 15 5.12.2 t COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Lice
24、nsed by Information Handling Services 1 IEEE 393 91 q805702 0500290 4 = PAGE o SECTION 5.14 Temperature Factor of Permeability 15 5 . 1 5 Curie Temperature or Curie Point. T, . 15 5.16 Disaccommodation. . . . . . . . . . . . I . . . . . . . . I . . 15 5 . 1 6 . 1 Disaccommodation Factor . 1 6 5.17 M
25、agnetic Aging 16 5.18 Turns Factor . 1 6 5 . 1 9 Induction Factor, AL . 1 6 5.20 Volt-Second.Area . 1 6 5.21 Hysteresis Constant. qb 1 6 5.21 . 1 Hysteresis Core Constant. qi 1 6 Test Methods. . 17 6 . 1 Permeability Measurements. 17 Tests for Evaluating Cores With Pulsed Excitation., . 17 Reference
26、 Pulse Shape . 17 Pulse Magnetization Characteristics 1 8 6.2.3 Pulse Permeability . 24 Applications . 24 Series Bridge (Low Q) 3 Parallel Bridge (High Q) 31 Parallel Bridge (Low Q) . 31 6 . 6.2 6.2.1 6 . 2 . 2 6.2.4 Tests for Computer-Type Cores Used in Switching and Memory 6.3 Bridge Measurements
27、. 29 Series Bridge. Low Impedance 3 6 . 9 . 1 6.3.2 6.3.3 6.3.4 6.4 Core Loss and Apparent Core Loss., 31 6 . 4 . 1 Core-Loss Measurements With SinusoidaWoltage Excitation 31 6.4.2 Core-Loss Measurements in Core Excited by Nonsinusoidal Signals . 31 Saturing Core Tests. . 36 6.5.1 Constant-Current F
28、lux-Reset (CCFR) Core Test Method . 36 6.5.2 Sine-Current-Excitation Core Test Method., 39 6.5.3 Presenting Magnetic Data on Core Materials . 44 6.6 Methods to Obtain Hysteresis Loops and Magnetization Curves. 44 6 . 6 . 1 General Considerations . 44 6.7 Direct Measurement of Flux Density., 48 6 . 7
29、 . 1 Hall-Effect Gaussmeter 48 6.8 Dynamic Hysteresis Loop Measurement . 49 6 . 8 . 1 Oscilloscope Techniques . 49 6 . 9 Voltmeter-Ammeter Methods . 50 6 . 9 . 1 Impedance Permeability . 50 6.9.2 Sine-Flux Test 50 6.9.3 Sine-Current Test . 52 6.9.4 Calculation of Mean Path Length . 53 6.9.5 Calculat
30、ion of Flux-Path Cross-Sectional Area . 53 6.9.6 Standard Test Conditions 53 6.9.7 Calculations of Induced Voltage 53 6.9.8 Test Procedure 53 . e 6.5 7 . Bibliography . 53 COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute o
31、f Electrical and Electronics Engineers, Inc Licensed by Information Handling Services IEEE 393 91 4805702 O500291 b FIGURES Fig 1 Fig 2 Fig 3 Fig 5 Fig 6 Fig 7 Fig 8 Fig 9 Fig 10 Fig 11 Fig 12 Fig 13 Fig 14 Fig 15 Fig 16 Fig 17 Fig 4 Fig 18 Fig 20 Fig 21 Fig 19 PAGE I Reference Pulse Shape 1 8 Pulse
32、 Magnetization Characteristic. 1 9 Test Circuit A . 20 Test Circuit B . 21 Pulse Magnetization Characteristics on Major and Minor Loops . 21 Pulse Magnetization Characteristics With Reset 21 Pulse Magnetization Characteristics With and Without Bias . 22 Core Pulse Magnetization Characteristic . 23 P
33、ulse Permeability Test Circuit . 24 Read Response Pulses . 26 Typical Test Circuit . 2 7 Bridge Circuits .3 2-33 Block Diagram of Wattmeter 35 Test Points for the Constant-Current Flux-Reset Core Test Method 36 Circuit for the Constant-Current Flux-Reset Core Test Method . 36 Basic Circuit for Sine-
34、Current Excitation Core Tester 40 Oscilloscope Presentation of E-I Loop of Test Core, Showing Calibrating and Measuring Marker Traces . 43 Elementary DC Hysteresis Loop Tester . 46 Simplified Hysteresigraph . 47 Sine-Flux Impedance Permeability Test . 5 1 Sine-Current Impedance Permeability Test . 5
35、2 I APPENDIX Methods to Obtain Hysteresis Loops and Magnetization Curves With Older Equipment . 56 Al . Determination of the Basic Symmetrical Hysteresis Loop 56 A2 . Determination of the Normal Magnetization Characteristic . 58 A3 . Determination of the Virgin Magnetization Curve 58 APPENDIX FIGURE
36、S Fig Al Fig A2 Hysteresis Loop Test Circuit 56 Hysteresis Loop 57 COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services IEEE 393 91 m 48057
37、02 O500292 8 m IEEE Standard for Test Procedures for Magnetic Cores i . Scope This standard specifies applicable tests to describe the significant properties of magnetic cores used in electronic applications. It is primarily concerned with magnetic cores of the type used in electronics transformers,
38、 magnetic amplifiers, inductors, and related devices. However, many of the tests specified herein are general in scope and adaptable to magnetic cores used in many other applica- tions. Standards covered by this publication include tests for specifying or measuring, or both, permeability, core loss,
39、 apparent core loss, induction, hysteresis, thermal character- istics, and other properties of all commonly used types of magnetic cores. 1.1 Specific Types of Magnetic Cores to Which this Standard Applies (i) Wound strip cores (2) Die-stamped laminated cores (3) Cores using laminations formed by ch
40、emical milling or photoetching tech- niques (4) Pressed or molded cores 1.2 Specific Applications to Which this Standard Is Directed 1.2.1 Linear applications as in power supply transformers, audio transformers, control system transformers, many pulse transform- ers, capacitor reversing inductors, i
41、nstrument transformers, etc. 1.2.2 Nonlinear or saturating applications, including magnetic amplifiers, saturable in- ductors, ferroresonant devices, current rise delay inductors, and saturating inductors. 1.2.3 Specific applications not covered by this publication: magnetic cores for power distribu
42、tion industry; cores for microwave ap- plications. 1.3 References and Related Standards 1.3.1 References. The following publica- tions shall be used in conjunction with this standard: 111 ANSUASTM A-343-82 (861, Test Method for Alternating Current Magnetic Properties of Materials at Power Frequencie
43、s Using the Wattmeter-Ammeter-Voltmeter Method and 250 cm Epstein Test Frame.l 21 IEEE Std 100-1988, IEEE Standard Dictionary of Electrical and Electronics Terms-4th ed.2 C 3 l IEEE Std 390-1987, IEEE Standard for Pulse Transformers (ANSI). 41 Hamburg, D. R. and L. E. Unnewehr, “An electronic wattme
44、ter for nonsinusoidal low power factor power measurements,” IEEE Transactions on Magnetics, vol. MAG-7, no. 3, pp. 438442, Sept. 1971. C 5 1 Toppetto, A. A. and D. A. Henry, “Pulse In- ductance-Problems and Peculiarities.” Elec- tronic Components Conference, 1972. 1.3.2 General Related Standards. Th
45、e fol- lowing standards may be consulted for addi- tional guidance: ANSI/ASTM A-34-83 (88)el, Practice for Magnetic Materials. ASTM publications are available from the Customer Service Department, American Society for Testing and Materials, 1916 Race Street, Philadelphia, PA 19103, USA. 21EEE public
46、ations are available from the Institute of Electrical and Electronics Engineers, Service Center, 445 Hoes Lane, P.O. Box 1331, Piscataway, N J 08855-1331, USA. 9 COPYRIGHT Institute of Electrical and Electronics Engineers, Inc Licensed by Information Handling Services COPYRIGHT Institute of Electric
47、al and Electronics Engineers, Inc Licensed by Information Handling Services IEEE 393 91 E 4885702 0500293 T E : IEEE Std 393-1991 ANSI/ASTM A-340-90, Definition of Terms- Terms, Symbols, and Conversion Factors Re- lating to Magnetic Testing. ANSI/ASTM A-346-74 (88), Test Method for Alternating-Curre
48、nt Magnetic Performance of Laminated Core Specimens Using the Modified Hay Bridge Method. ANSI/ASTM A-347-85 (91), Test Method for Alternating-Current Magnetic Properties of Materials Using the Modified Hay Bridge Method with 25-cm Epstein Frame. ANSI/ASTM A-348-84, Test Method for Alternating-Curre
49、nt Magnetic Properties of Materials Using the Wattmeter-Ammeter- Voltmeter Method, 100 to 10,000 Hz and 25-cm Epstein Frame. ANSI/ASTM A-598-69 (1983), Test Method for Magnetic Properties of Magnetic Amplifier Cores. ANSI/ASTM A-698-74 (85)el, Test Method for Magnetic Shield Efficiency in Attenuating Alternating Magnetic Fields. ANSI/ASTM A-712-75 (911, Test Method for Electrical Resistivity of Soft Magnetic Alloys. ASTM A-717-81 (88)el, Test Method for Surface Insulation Resistivity of Single-Strip Specimens. ANWASTM A-718-75 (911, Test