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1、The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1993 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1993. Printed in the United States of America ISBN 1-55937-366-0 No part of this
2、 publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 664-1993 (Revision of IEEE Std 664-1980) IEEE Guide for Laboratory Measurement of the Power Dissipation Characteristics of Aeolian Vibration Dam
3、pers for Single Conductors Sponsor Transmission and Distribution Committee of the IEEE Power Engineering Society Approved September 15, 1993 IEEE Standards Board Abstract: The current methodologies, including apparatus, procedures, and measurement accura- cies, for determining the dynamic characteri
4、stics of vibration dampers and damping systems are described. Some basic guidance is provided regarding a given methods strengths and weakness- es. The methodologies and procedures described are applicable to indoor testing only. Keywords: aeolian, decay method, forced response method, inverse stand
5、ing wave ratio (ISWR) method, overhead conductors, power dissipation characteristics, power method, vibration dampers Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale,
6、04/28/2007 22:00:11 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the Standards Coordinating Committees of the IEEE Standards Board. Members of the committees serve voluntaril
7、y and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE that have expressed an interest in partici- pating in the de
8、velopment of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, mar- ket, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoi
9、nt expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and com- ments received from users of the standard. Every IEEE Standard is subjected to review at least every five years for revision or reaffirmation. When a do
10、cument is more than five years old and has not been reaffirmed, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard. Comments
11、 for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation with IEEE. Suggestions for changes in docu- ments should be in the form of a proposed change of text, together with appropriate supporting comments. Interpretations: Occasionally questions may
12、 arise regarding the meaning of portions of standards as they relate to specific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appro- priate responses. Since IEEE Standards represent a consensus of all concerned int
13、er- ests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason IEEE and the members of its technical com- mittees are not able to provide an instant response to interpretation requests except in those cases where the matter ha
14、s previously received formal consideration. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway, NJ 08855-1331 USA IEEE Standards documents are adopted by the Institute of Electrical and Electronics Eng
15、ineers without regard to whether their adoption may involve patents on articles, materials, or processes. Such adoption does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the standards documents. Copyright The Institute of Electrical and
16、 Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted without license from IHS -,-,- iii Introduction (This introduction is not a part of IEEE Std 664
17、-1993, IEEE Guide for Laboratory Measurement of the Power Dissipa- tion Characteristics of Aeolian Vibration Dampers for Single Conductors.) This guide describes current methodologies for the testing of vibration dampers in the laboratory. Included within the scope are specific descriptions of the a
18、pparatus, procedures, and measurement accuracies for the testing of vibration dampers. At the time this guide was completed, the Working Group on Overhead Conductor Dynamics had the follow- ing membership: Dale Douglass, ChairJohn Torok, Vice Chair Thomas J. AldertonClaude HardyJerry Reding James E.
19、 ApplequistD. G. HavardA. S. Richardson E. H. BennettJ. H. MalloryNeil P. Schmidt W. L. CalhounA. R. McCullochTapani O. Seppa Dennis DossMaurice MurphyPaul Springer Ed DziedzicRon OedemannKen W. Steele John E. FlynnM. A. PashaDavid Sunkle Tin FongJ. C. PohlmanJ. Ridley Thrash Kenneth GriffingDouglas
20、s O. ProctorH. Brian White Peter HagerdornP. D. QuinnWilliam Zollars C. B. Rawlins At the time this guide was completed, the Task Group on the Revision of IEEE Std 664 had the following membership: John Torok, Chair Dale DouglassA. S. RichardsonPaul Springer Denis NoiseuxDavid Sunkle The following p
21、ersons were on the balloting committee: James E. ApplequistGeorge G. KaradyR. J. Piwko James J. BurkeNestor KolcioJ. Poffenberger Vernon L. ChartierThomas J. McDermottW. Edward Reid Dale DouglassFranklin D. MyersDennis Reisinger Edwin J. “Tip” GoodwinG. B. NilesNeil P. Schmidt I. S. GrantStig L. Nil
22、ssonB. R. Shperling J. G. KappenmanJ. M. Van Name Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted witho
23、ut license from IHS -,-,- iv When the IEEE Standards Board approved this standard on September 15, 1993, it had the following membership: Wallace S. Read, ChairDonald C. Loughry, Vice Chair Andrew G. Salem, Secretary Gilles A. BarilJim IsaakDon T. Michael* Jos A. Berrios de la PazBen C. JohnsonMarco
24、 W. Migliaro Clyde R. CampWalter J. KarplusL. John Rankine Donald C. FleckensteinLorraine C. KevraArthur K. Reilly Jay Forster*E. G. “Al” KienerRonald H. Reimer David F. FranklinIvor N. KnightGary S. Robinson Ramiro GarciaJoseph L. Koepfinger*Leonard L. Tripp Donald N. HeirmanD. N. “Jim” LogothetisD
25、onald W. Zipse *Member Emeritus Also included are the following nonvoting IEEE Standards Board liaisons: Satish K. Aggarwal James Beall Richard B. Engelman David E. Soffrin Stanley I. Warshaw Valerie E. Zelenty IEEE Standards Project Editor Copyright The Institute of Electrical and Electronics Engin
26、eers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted without license from IHS -,-,- v Contents CLAUSEPAGE 1.Scope 1 2.Definitions . 1 3.General technical consideration
27、s. 2 4.Test methods and procedures using a conductor test span 2 4.1 Test span arrangement and general procedures. 2 4.2 ISWR method 6 4.3 Power method 9 4.4 Decay method 10 5.Forced response method 12 5.1 Apparatus and accuracy. 12 5.2 Test procedure 12 6.Reporting and procedural recommendations. 1
28、3 7.Bibliography 16 AnnexList of symbols. 17 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted without li
29、cense from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted without license from IHS -,-,- 1 I
30、EEE Guide for Laboratory Measurement of the Power Dissipation Characteristics of Aeolian Vibration Dampers for Single Conductors 1. Scope The purpose of this guide is to describe the current methodologies, including apparatus, procedures, and measurement accuracies, for the testing of vibration damp
31、ers. In addition, some basic guidance is also pro- vided to inform the potential user of a given methods strengths and weaknesses (see clause 6). Due to the variety of vibration damper designs, more than one test method may be required to obtain the nec- essary information on dissipation characteris
32、tics. This guide is written to describe some of the procedures for determining the dynamic characteristics of vibration dampers and damping systems. It is hoped that it will assist in the standardization of the methods included as well as result in providing a more detailed per- spective in obtainin
33、g reliable information on a vibration dampers dissipation characteristics. Please note that the methodologies and procedures incorporated in this guide are applicable to indoor testing only and are in no way associated with the field testing of vibration dampers. By using the appropriate technique(s
34、) outlined, data can be acquired that can be utilized in the application of dampers; however, this topic is con- sidered beyond the scope of this guide. In general, it is hoped that this guide will provide an improved under- standing of vibration testing procedures. 2. Definitions 2.1 decay test met
35、hod: A test that determines the power dissipation characteristics of a damper by the measurement of the decay rate of the amplitude of motion of a span following a period of forced vibration at a natural frequency and a fixed test amplitude. 2.2 dynamics characteristics test: See: forced response te
36、st method. 2.3 forced response test method: A test that determines the power dissipation characteristics of a damper by the measurement of the force and velocity imparted to a damper that is mounted directly on the shaker. 2.4 inverse standing wave ratio test method: A test that determines the power
37、 dissipation characteristics of a damper by the measurement of antinodal and nodal amplitudes on the span at each tunable harmonic. 2.5 power test method: A test that determines the power dissipation characteristics of a damper by the measurement of the force and velocity imparted to the test span a
38、t the point of attachment to the shaker. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/28/2007 22:00:11 MDTNo reproduction or networking permitted without licens
39、e from IHS -,-,- IEEE Std 664-1993IEEE GUIDE FOR LABORATORY MEASUREMENT OF THE POWER DISSIPATION 2 3. General technical considerations The basic engineering approach to the control of vibration of overhead conductors is to compare the total power dissipation characteristics of vibration dampers and
40、of the conductor itself to the projected wind power input to the conductor span. The wind power input can be estimated by using the techniques described in B1, B2, and B5.1 The power lost to self-damping in conventional conductors can be obtained using the methods described in IEEE Std 563-1978 B7.
41、For a given conductor span at a given frequency and excitation level, the difference between the wind power input and the conductor self-damping is the amount of power that ideally should be dissipated by the vibration damper B10. This guide is written to quantify the power dissipation characteristi
42、cs of vibration dampers by applying an appropriate laboratory test method. The four test methods provided in this guide are: Inverse Standing Wave Ratio (ISWR), Power, Decay, and Forced Response. It is understood that the methods outlined here may not be all inclusive and that the development of new
43、 methodologies is strongly encouraged. Since there is a vari- ety of damping devices currently commercially available, the appropriateness of the method selected and the qualification/disqualification of a given product are left strictly up to the end user. In addition, this document is intended as
44、a guide to the practical and economical principal methods that have been usefully applied in the past, and which merit consideration by those contemplating the measurement of the dissipation characteristics of vibration dampers. A more detailed survey of previously used methods, along with a discuss
45、ion of errors associated with the laboratory testing environment, can be found in B9. 4. Test methods and procedures using a conductor test span This clause will outline the methods and procedures for tests using a conductor span B11, B12. The gen- eral apparatus described here will apply to the ISW
46、R, Power, and Decay methods. The methodology and procedures for the Forced Response method do not require the use of a conductor test span and are provided in clause 5. 4.1 Test span arrangement and general procedures The test spans construction should be as shown in figure 1. The shakers placement
47、and free span length may affect the number of measurements that can be performed on conductors. For example, it is recom- mended that a minimum of two loops be utilized to obtain satisfactory measurements (three loops for the ISWR method). Considering current typical test span lengths, the testing o
48、n large conductors may require a higher starting frequency than would normally be requested due to insufficient free span length. In addition, for small diameter conductors and shield wires, conditions may arise where a loop will form between the shaker and its nearest termination within the specified test frequency range. This may cause erroneous test results at these measurement points, thereby leading to discontinuity in the data. This does not nullify the entire test, but rather leaves the overall test subject to interpretation. Some recommendations for the sha