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1、. . . . . . . . . IEEE Standard for Pad-Mounted Equipment- Enclosure Integrity for Coastal Environments IEEE Power Engineering Society Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 1 O01 6-5997, USA 1 O November 2005 IEEE Std C57.12.29“-2005 -,-,- -,-,- IEEE Std C57.12.29“-
2、2005 IEEE Standard for Pad-Mounted Equipment-Enclosure Integrity for Coastal Envi ron men ts Sponsor Transformers Committee of the IEEE Power Engineering Society Approved 10 May 2005 IEEE-SA Standards Board Abstract: Covered in this standard are conformance tests and requirements for the integrity o
3、f above-grade pad-mounted enclosures for application in coastal environments that contain apparatus energized in excess of 600 V and that may be exposed to the public including, but not limited to, the following types of equipment enclosures: pad-mounted capacitors or inductors, pad- mounted distrib
4、ution transformers, pad-mounted junction enclosures, pad-mounted metering equipment, pad-mounted switch gear. Keywords: enclosure integrity, pad-mounted equipment, switches, transformers The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright
5、 O 2005 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 10 November 2005. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educatio
6、nal classroom use can also be obtained through the Copyright Clearance Center. -,-,- This introduction is not part of EEE Std C57.12.29-2005, EEE Standard for Pad-Mounted Equipment-Enclosure Integrity for Coastal Environments. The Accredited Standards Committee on Transformers, Regulators, and React
7、ors, C57, has for a number of years been developing and correlating standards on these products. The data used in this work have been gathered from many sources, including the standards of the Institute of Electrical and Electronics Engineers and the National Electrical Manufacturers Association, re
8、ports of committees of the Edison Electric Institute, and others. This IEEE standard is a voluntary consensus standard. Its use becomes mandatory only when required by a duly constituted legal authority or when specified in a contractual relationship. To meet specialized needs and to allow innovatio
9、n, specific changes are permissible when mutually determined by the user and the producer, provided such changes do not violate existing laws and are considered technically adequate for the function intended. This standard was originally prepared by the Joint C57/C37 Working Group on Enclosures with
10、 J. Martin and then R C. Olen as chairman. This group is now the Enclosure Integrity Working Group of the IEEE Transformers Committee. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/ standards.ieee.org/readin/ieee/updates/erraindex
11、.h. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.ordreadindieee/interp/ index.htm1. Patents Attention is called to the possibility that implementation of this standard may require us
12、e of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be requ
13、ired to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. 1 111 Copyright O 2005 IEEE. All rights reserved. -,-,- Parti ci pants At the time this standard was completed, the Enclosure Integrity Working Group ha
14、d the following membership: Robert Olen, Chair Daniel Mulkey, Co-Chair Glenn Andersen Ignacio Ares Israel Barrientos Dana Basel Bikash Basu John Borst Paul Buchanan Joseph Carulli Tommy Copper Michael Culhane Kevin de la Houssaye Charlie Drexler Philip Fahey Ali Ghafourian Myron Gruber Jeremy Guarda
15、do Richard Hollingsworth Gael R. Kennedy Ron Kirker Brian Kiaponski Stanley Kostyal Raymond Loback Kent Miller Carl Niemann Ernest Nols Tim Olson Thomas Pekarek Ken Romano Jeff Schneider Stephen Shull Edward Smith Steve Snyder Ronald Stahara Giuseppe Termini Alan Traut Donnie Trivitt Shelby Walters
16、Dave Weigand Alan Wilks Michael Williams The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. David Ah0 James Gardner Paulette Payne Paul Barnhart Myron Gruber Thomas Pekarek Wallace Binder Dudley Gallo
17、way Alvaro Portillo Thomas Blair Eduardo Garcia James Ruggieri David Blew Ali Ghafourian Dinesh Sankarakurup John Borst Randall Groves Devki Sharrna Christopher Brooks Wayne Hansen Stephen Shull Carl Bush Kenneth Hanus H. Jin Sim Craig Colopy Michael Hardin Chuck Simmons Roy A. Coquitt, Jr. Edward H
18、organ, Jr. James E. Smith Tommy Cooper James D. Huddleston III James Smith Jerry Corkran Gael R. Kennedy Jerry Smith Michael Culhane Stanley Kostyal Ronald Stahara R. Daubert Gregory Luri John Sullivan Matthew Davis William Majeski John Teixeira Kevin de la Houssaye John Matthews Giuseppe Termini Gu
19、ru Dutt Dhingra Lee Matthews Alan Traut Randall Dotson Frank Mayle Shelby Walters Charles Drexler G. Michel Tom Wandeloski Gary Engmann Dan Mulkey Dave Wiegand Jorge Fernandez-Daher Robert Olen Alan Wilks Phillip Fahey T. W. Olsen Michael Williams Marcel Fortin Tim Olson Bill Wimmer Gerald Paiva iv
20、Copyright O 2005 IEEE. All rights reserved. -,-,- When the IEEE-SA Standards Board approved this standard on 10 May 2005, it had the following membership: Don Wright, Chair Steve M. Mills, Vice Chair Judith Gorman, Secreta y Chuck Adams Raymond Hapeman Stephen Berger Richard J. Holleman Mark D. Bowm
21、an Joseph A. Bruder Bob Davis Roberto de Marca Boisson Julian Forster* Arnold M. Greenspan Mark S. Halpin Richard H. Hulett Lowell G. Johnson Joseph L. Koepfmger* Herrnann Koch Thomas J. McGean *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Agg
22、arwal, NRC Representative Richard DeBlasio, DOE Representative Alan Cookson, NIST Representative Jennie Steinhagen IEEE Standards Project Editor Daleep C. Mohla Paul Nikolich T. W. Olsen Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Doug Topping Joe D. Watson V Copyright O 2005 I
23、EEE. All rights reserved. -,-,- Contents 1 . Overview 1 1.1 Scope . 1 1.2 Purpose 1 2 . Normative references 1 3 . Definitions 2 4 . Enclosure security 3 4.1 Test requirements 3 4.2 Test equipment 4 4.3 Resistance to foreign objects . 5 4.4 Test values . 6 5 . Enclosure design and coating system req
24、uirements . 7 5.1 Enclosure design requirements-bjective 7 5.2 Substrate requirements . 7 5.3 Coating system requirements . 8 5.4 Coating system test specimens 8 5.5 Coating system performance requirements 8 6 . Labels . 10 6.1 Purpose 10 6.2 Application 10 7 . General . 10 7.1 Shipment 10 7.2 Coati
25、ng repair procedure . 10 Annex A (normative) Procedure for comparative weight loss . 16 Annex B (informative) Pry bar . 17 B . 1 General 17 B.2 Drawings . 17 B.3 Assembly instnictions . 18 Annex C (informative) Bibliography 21 vi Copyright O 2005 IEEE . All rights reserved . -,-,- IEEE Standard for
26、Pad-Mounted Equipment-Enclosure Integrity for Coastal Environments 1. Overview 1.1 Scope This standard covers conformance tests and requirements for the integrity of above-grade pad-mounted enclosures intended for installation in coastal environments containing apparatus energized in excess of 600 V
27、 that may be exposed to the public including, but not limited to, the following types of equipment enclosures: a) Pad-mounted capacitors or inductors b) Pad-mounted distribution transformers c) Pad-mounted junction enclosures d) Pad-mounted metering equipment e) Pad-mounted switchgear This standard
28、does not cover installations that are under the exclusive control of electric utilities and that are located in such a manner that access to the equipment is controlled exclusively by the utility. 1.2 Purpose The purpose of this standard is to describe the requirements for a comprehensive integrity
29、system for pad- mounted enclosures providing long field life with minimum maintenance and positive safety features. 2. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated ref
30、erences, the latest edition of the referenced document (including any amendments or corrigenda) applies. 1 Copyright O 2005 IEEE. All rights reserved. -,-,- IEEE Std C57.12.29-2005 IEEE Standard for Pad-Mounted Equipment-Enclosure Integrity for Coastal Environments ASTM D523, Standard Test Method fo
31、r Specular Gloss. ASTM D1654-2005, Standard Test Method for Evaluation of Painted or Coated Specimens Subjected to Corrosive Environments. ASTM D3 170, Standard Test Method for Chipping Resistance of Coatings. ASTM D3359, Standard Test Methods for Measuring Adhesion by Tape Test. ASTM D3363, Standar
32、d Test Method for Film Hardness by Pencil Test. ASTM D4060, Standard Test Method for Abrasion Resistance of Organic Coatings by the Taber Abraser. ASTM D4585, Standard Practice for Testing Water Resistance of Coatings Using Controlled Condensation. ASTM D4587, Standard Practice for Fluorescent UV-Co
33、ndensation Exposures of Paint and Related Coatings. SAE 5400, Test for Chip Resistance of Surface Coatings.2 3. Definitions For the purposes of this standard, the following terms and definitions apply. e Authoritative Dictiona y ofIEEE Standards B10I3 should be referenced for terms not defined in th
34、is clause. 3.1 above grade: A term referring to an equipment use location above the high water line not intended for partial or total submersion. 3.2 axial force: A force applied along the axis of the pry bar from its handle to its pry tip. 3.3 coastal environment: The land area within 760 m (2500 f
35、t) of the mean high water line. 3.4 conformance tests: Certain performance tests are conducted to demonstrate compliance with the applicable standards. The test specimen is normally subjected to all planned routine tests prior to initiation of the conformance test program. NOTE-The conformance tests
36、 may, or may not, be similar to certain design tests. Demonstration of margins (capabilities) beyond the standard requirements is unnecessary? 3.5 design tests: Tests made by the manufacturer to determine the adequacy of the design of a particular type or model of equipment or its component parts to
37、 meet its assigned ratings and to operate satisfactorily under normal conditions and under special conditions if specified. These tests may be used to demonstrate compliance with applicable standards of the industry. 1 ASTM publications are available fkom the American Society for Testing and Materia
38、ls, 100 Barr Harbor Drive, West SAE publications are available from the Society of Automotive Engineers, 400 Commonwealth Drive, Warrendale, PA 15096, USA The numbers in brackets correspond to those of the bibliography in Annex C. Notes in text, tables, and figures of a standard are given for inform
39、ation only, and do not contain requirements needed to implement Conshohocken, PA 19428-2959, USA (http:/www.astm.org/). (http:/www.sae.org/). 2 4 the standard. 2 Copyright O 2005 IEEE. All rights reserved. -,-,- IEEE Std C57.12.29-2005 IEEE Standard for Pad-Mounted Equipment-Enclosure Integrity for
40、Coastal Environments NOTE-Design tests, sometimes called type tests, are made on representative apparatus or prototypes to verify the validity of design analysis and calculation methods and to substantiate the ratings assigned to all other apparatus of basically the same design. These tests may also
41、 be used to evaluate the modification of a previous design and to ensure that performance has not been adversely affected. Test data from previous similar designs may be used for current designs, where appropriate. Once made, the tests need not be repeated unless the design is changed so as to modif
42、y performance. 3.6 dry film thickness: Thickness of any applied coating(s) measured after curing. 3.7 enclosure security: The completely assembled apparatus will resist unauthorized entry when tested in accordance with the procedures of this standard. 3.8 gel coat: The material that provides the inh
43、ibition for ultraviolet protection and color to the fiber reinforced plastic (FRF). 3.9 padlock A locking device specified by the user that will prevent the disengagement of the pentahead device. (e.g., key or combination lock, one-time or twist lock, single-use lock, or similar device.) 3.10 pad-mo
44、unted enclosure: An enclosure containing electrical apparatus, typically located outdoors at ground level where the general public has direct contact with the exterior surfaces of the equipment. The general construction of this equipment shall be such that authorized personnel may obtain access to t
45、he apparatus inside the equipment compartment( s). 3.11 prying leverage: A force at right angles to the handle times the distance from this force to the point of insertion of the pry tip into a joint, crevice, or similar opening in enclosure. 3.12 routine tests: Tests made for quality control by the
46、 manufacturer on every device or representative samples, or on parts or materials as required to verify during production that the product meets the design specifications and applicable standards. NOTE l-Certain quality assurance tests on identified critical parts of repetitive high-production devic
47、es may be tested on a planned statistical sampling basis. NOTE 2-”Routine tests” are sometimes called “production tests.” 3.13 substrate: The material that provides structural integrity to the enclosure. 4. Enclosure security 4.1 Test requirements In addition to passing the tests defined in this sta
48、ndard, the construction of pad-mounted enclosure shall comply with the requirements of 4.1.1 through 4.1.9. 4.1.1 Enclosure mounting The bottom edge of the enclosure shall provide for flush mounting on a flat, rigid mounting surface. 4.1.2 Water resistance The enclosure shall restrict the entry of water (other than flood water) into the enclosure so as not to impair the operation of the apparatus inside. 3 Copyright O 2005 IEEE. All rights reserved. -,-,- IEEE Std C57.1