IEEE-62243-2005.pdf

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1、 INTERNATIONAL STANDARD IEC 62243 First edition 2005-07 IEEE 1232 Artificial intelligence exchange and service tie to all test environments (AI-ESTATE) Reference number IEC 62243(E):2005 IEEE Std. 1232(E):2002 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS unde

2、r license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. For exa

3、mple, IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to the base publication, the base publication incorporating amendment 1 and the base publica

4、tion incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to this publication, including its validity, is availabl

5、e in the IEC Catalogue of publications (see below) in addition to new editions, amendments and corrigenda. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is al

6、so available from the following: IEC Web Site (www.iec.ch) Catalogue of IEC publications The on-line catalogue on the IEC web site (www.iec.ch/searchpub) enables you to search by a variety of criteria including text searches, technical committees and date of publication. On-line information is also

7、available on recently issued publications, withdrawn and replaced publications, as well as corrigenda. IEC Just Published This summary of recently issued publications (www.iec.ch/online_news/ justpub) is also available by email. Please contact the Customer Service Centre (see below) for further info

8、rmation. Customer Service Centre If you have any questions regarding this publication or need further assistance, please contact the Customer Service Centre: Email: custserviec.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provid

9、ed by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- Artificial intelligence exchange and service tie to all test environments (AI-ESTATE) INTERNATIONAL STANDARD I

10、EC 62243 First edition 2005-07 IEEE 1232 Commission Electrotechnique Internationale International Electrotechnical Commission IEEE 2005 Copyright - all rights reserved IEEE is a registered trademark in the U.S. Patent any IEC National Committee interested in the subject dealt with may participate in

11、 this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the

12、two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have

13、the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misint

14、erpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding nationa

15、l or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) Attention is drawn to the possibility that some of the eleme

16、nts of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC/IEEE 62243 has been processed through IEC technical committee 93: Design automation. The text of this standard is based on the

17、following documents: IEEE Std FDIS Report on voting 1232 (2002) 93/214/FDIS 93/220/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives. The

18、committee has decided that the contents of this publication will remain unchanged until 2007. IEC 62243:2005(E) IEEE 1232-2002(E) 3 Published by IEC under licence from IEEE. 2005 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under li

19、cense with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- IEC/IEEE Dual Logo International Standards This Dual Logo International Standard is the result of an agreement between the IEC a

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37、ay require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an

38、 IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. IEC 62243:2005(E) IEEE 1232-2002(E) 4 Published by IEC under licence from IEEE. 2005 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engine

39、ers, Inc. Provided by IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (A

40、I-ESTATES) Sponsor IEEE Standards Coordinating Committee 20 Approved 13 November 2002 American National Standards Institute Approved 13 June 2002 IEEE-SA Standards Board Abstract: AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environm

41、ent. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate e

42、xchange of persistent diagnostic information between two reasoners, and also to provide a formal typing system for diagnostic services. This standard then defines the services to manipulate diagnostic information and to control a diagnostic reasoner. Keywords: AI-ESTATE, diagnosis, diagnostic interf

43、erence, diagnostic model, diagnostic services, dynamic content, fault tree, knowledge exchange, system test IEC 62243:2005(E) IEEE 1232-2002(E) 5 Published by IEC under licence from IEEE. 2005 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided b

44、y IHS under license with IEEELicensee=NASA Technical Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- This AI-ESTATE standard provides a formal framework for exchanging diagnostic knowledge and constructing diagnosti

45、c reasoners. The intent is to provide a standard framework for identifying required information for diagnosis and defi ning the diagnostic information in a machine-processable way. In addition, software interfaces are defi ned whereby diagnostic tools can be developed to process the diagnostic infor

46、mation in a consistent and reliable way. IEEE Introduction IEC 62243:2005(E) IEEE 1232-2002(E) 6 Published by IEC under licence from IEEE. 2005 IEEE. All rights reserved. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=NASA Techni

47、cal Standards 1/9972545001 Not for Resale, 04/21/2007 11:32:29 MDTNo reproduction or networking permitted without license from IHS -,-,- Artificial intelligence exchange and service 1. Overview The Artifi cial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) standard was de

48、veloped by the Diagnostic and Maintenance Control (D however, such implementations may not be portable. As shown in Figure 1, a diagnostic model can be moved from one AI-ESTATE implementation to another by translating it into the interchange format. Another AI-ESTATE implementation can then utilize this information as a complete package by translating the data and knowledge from the interchange format to its own internal form. The translation step is not a requirement; an AI-ESTATE implementation may use the interchange format for i

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