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1、The Institute of Electrical and Electronics Engineers, Inc. 345 East 47th Street, New York, NY 10017-2394, USA Copyright 1998 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1998. Printed in the United States of America. ISBN 1-55937-989-8 No part of thi
2、s publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 421.3-1997(R2004) (Revision of IEEE Std 421B-1979) IEEE Standard for High-Potential Test Requirements for Excitation Systems for Synchronous Ma
3、chines Sponsor Energy Development and Power Generation Committee of the IEEE Power Engineering Society Reaffirmed 8 December 2004 IEEE Standards Board Approved 9 December 1997 IEEE Standards Board Abstract: High-potential test voltages for excitation systems used with synchronous machines are establ
4、ished. Test voltages are established based on whether equipment is connected to the exciter power circuit or is electrically isolated from the exciter power circuit. Keywords: dielectric testing, excitation systems, test voltages Copyright The Institute of Electrical and Electronics Engineers, Inc.
5、Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinat-
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16、ity that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents
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18、s/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 1998 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std 421.3-1997, IEEE Standard for High-Potential Test Re
19、quirements for Excita- tion Systems for Synchronous Machines. ) This standard denes high-potential test requirements for excitation systems for synchronous machines. IEEE Std 421B-1979 established test voltages as a function of exciter output circuit and for all other circuits electrically isolated
20、from the exciter output circuit. This standard was written to agree with existing stan- dards as much as possible but expands the test voltages to account for stresses associated with high ceiling exciters. At the time that this standard was completed, the Hi-Pot Testing Task Force of the Equipment
21、Working Group of the Excitation Systems Subcommittee of the Energy Development and Power Generation Commit- tee had the following membership: R. A. Lawson, Chair The following persons were on the balloting committee that approved this standard for submission to the IEEE Standards Board: J. C. Agee M
22、. J. Basler R. Beaulieu K. E. Bollinger S. Corsi M. L. Crenshaw T. W. Eberly A. Godwani H. Herzog J. D. Hurley J. F. Luini O. P. Malik C. R. Mummert A. M. Murdoch R. C. Shaefer M. Zakhour L. D. Boydstun S. R. Brockschink R. O. Bylin D. Diamant G. R. Engman W. W. Fields J. H. Gurney T. J. Hammons K.
23、Hancock R. D. Handel T. A. Higgins J. D. Hurley H. J. Jones D. L. Kornegay P. R. H. Landrieu C. A. Lennon, Jr. G. L. Luri J. T. Madill O. P. Malik O. S. Mazzoni D. R. McCabe M. W. Migliaro W. R. Moon C. R. Pope B. M. Radimer G. P. Rahman J. R. Ribeiro D. M. Sawyer K. H. Sebra J. E. Stoner M. V. Thad
24、en E. T. Voelker Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- iv Copy
25、right 1998 IEEE. All rights reserved. When the IEEE Standards Board approved this standard on 9 December 1997, it had the following membership: Donald C. Loughry, Chair Richard J. Holleman, Vice Chair Andrew G. Salem, Secretary *Member Emeritus Also included are the following nonvoting IEEE Standard
26、s Board liaisons: Satish K. Aggarwal Alan H. Cookson Valerie E. Zelenty IEEE Standards Project Editor Clyde R. Camp Stephen L. Diamond Harold E. Epstein Donald C. Fleckenstein Jay Forster* Thomas F. Garrity Donald N. Heirman Jim Isaak Ben C. Johnson Lowell Johnson Robert Kennelly E. G. Al Kiener Jos
27、eph L. Koepnger* Stephen R. Lambert Lawrence V. McCall L. Bruce McClung Marco W. Migliaro Louis-Franois Pau Gerald H. Peterson John W. Pope Jose R. Ramos Ronald H. Reimer Ingo Rsch John S. Ryan Chee Kiow Tan Howard L. Wolfman Copyright The Institute of Electrical and Electronics Engineers, Inc. Prov
28、ided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 1998 IEEE. All rights reserved. v Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 1 2.Ref
29、erences 1 3.High-potential tests 2 3.1 General. 2 3.2 Type of tests. 3 4.Frequency and waveshape of test voltage 3 5.High-potential test considerations 3 6.Duration and application of test voltage 3 7.Measurement of test voltage 3 8.Test temperature. 4 9.Standard test voltages 4 9.1 Exciter power ci
30、rcuit 4 9.2 All other circuits (electrically isolated from the exciter power circuit). 4 Annex A(informative) Background and technical considerations . 5 Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, Us
31、er=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not
32、for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 0
33、0:18:26 MDTNo reproduction or networking permitted without license from IHS -,-,- Copyright 1998 IEEE. All rights reserved. 1 IEEE Standard for High-Potential Test Requirements for Excitation Systems for Synchronous Machines 1. Overview 1.1 Scope This standard applies to high-potential testing of co
34、mplete excitation systems and their components for syn- chronous machines. The components of the excitation system are described in IEEE Std 421.1-1986. Also included are auxiliary devices that are exposed to excitation system stresses. On static exciters, auxiliary devices connected to both the inp
35、ut and output side of the rectier bridge are exposed to similar excitation system stresses. Examples of such auxiliary devices are temperature indicators, transducers, meters, etc. This standard does not cover the synchronous machine eld winding or eld circuit breaker and discharge resistor since ap
36、propriate standards exist for these devices. 1.2 Purpose The purpose of this standard is to establish requirements for high-potential dielectric testing of complete excitation systems and their components for synchronous machines. 2. References This standard shall be used in conjunction with the fol
37、lowing publications. When the following standards are superseded by an approved revision, the revision shall apply: ANSI C50.10-1990, American National Standard General Requirements for Rotating Electrical Machin- erySynchronous Machines. 1 ANSI C50.12-1982 (R1989), American National Standard Requir
38、ements for Salient Pole Synchronous Gen- erators and Generators/Motors for Hydraulic Turbine Applications. ANSI C50.13-1989, American National Standard Requirements for Rotating Electrical MachineryCylin- drical Rotor Synchronous Generators. 1 ANSI publications are available from the American Nation
39、al Standards Institute, 11 West 42nd Street, New York, NY 10036, USA. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networ
40、king permitted without license from IHS -,-,- IEEE Std 421.3-1997IEEE STANDARD FOR HIGH-POTENTIAL TEST REQUIREMENTS FOR 2 Copyright 1998 IEEE. All rights reserved. ANSI C50.14-1977 (R1989), American National Standard Requirements for Combustion Gas Turbine Driven Cylindrical Rotor Synchronous Genera
41、tors. IEEE Std 4-1995, IEEE Standard Techniques for High-Voltage Testing. 2 IEEE Std 95-1977 (Reaff 1991), IEEE Recommended Practice for Insulation Testing of Large AC Rotating Machinery with High Direct Voltage. IEEE Std 421.1-1986 (Reaff 1996), IEEE Standard Denitions for Excitation Systems for Sy
42、nchronous Machines. IEEE Std C37.13-1990 (Reaff 1995), IEEE Standard Low-Voltage AC Power Circuit Breakers Used in Enclosures. IEEE Std C37.18-1979 (Reaff 1996), IEEE Standard for Enclosed Field Discharge Circuit Breakers for Rotating Electric Machinery. IEEE Std C57.12.00-1993, IEEE Standard Genera
43、l Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers. IEEE Std C57.12.01-1989, IEEE Standard General Requirements for Dry-Type Distribution and Power Transformers Including Those With Solid Cast and/or Resin-Encapsulated Windings. 3 IEEE Std C57.12.91-1995, IEEE Standa
44、rd Test Code for Dry-Type Distribution and Power Transformers. NEMA ICS 1-1993, Industrial Control and Systems: General Requirements. 4 NEMA ICS 2-1993, Industrial Control and Systems: Controllers, Contactors and Overload Relays, Rated Not More Than 2000 Volts AC or 750 Volts DC. NEMA ICS 4-1993, In
45、dustrial Control and Systems: Terminal Blocks. NEMA ICS 5-1993, Industrial Control and Systems: Control Circuits and Pilot Devices. NEMA ICS 6-1993, Industrial Control and Systems: Enclosures. 3. High-potential tests 3.1 General High-potential tests, as used herein, are those tests required to estab
46、lish the adequacy of the various insula- tions of the excitation-system components to withstand the voltage stresses imposed during normal or tran- sient conditions. Transient conditions include faults, asynchronous operation, or other unusual operation. This standard does not relieve the manufactur
47、er of the responsibility to design and test for appropriate volt- age levels. 2 IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA. 3 IEEE Std C57.12.01-1989 has been withdrawn; however, copies can
48、be obtained from Global Engineering, 15 Inverness Way East, Englewood, CO 80112-5704, USA, tel. (303) 792-2181. 4 NEMA publications are available from the National Electrical Manufacturers Association, 1300 N. 17th St., Ste. 1847, Rosslyn, VA 22209, USA. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=OConnor, Maurice Not for Resale, 04/29/2007 00:18:26 MDTNo reproduction or networking permitted without license from IHS -,