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1、IEEE Std C57.13-2008 (Revision of IEEE Std C57.13-1993) IEEE Standard Requirements for Instrument Transformers IEEE 3 Park Avenue New York, NY 10016-5997, USA 28 July 2008 IEEE Power Engineering Society Sponsored by the Transformers Committee C57.13 Authorized licensed use limited to: IHS Stephanie
2、Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproductio
3、n or networking permitted without license from IHS -,-,- Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with I
4、EEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- IEEE Std C57.13TM-2008 (Revision of IEEE Std C57.13-1993) IEEE Standard Requirements for Instrument Transformers Sponsor Transformers Co
5、mmittee of the IEEE Power Engineering Society Approved 27 March 2008 IEEE-SA Standards Board Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc.
6、Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- Abstract: Electrical, dimensional, and mechanical characteristics are covered, taking into considera
7、tion certain safety features, for current and inductively coupled voltage transformers of types generally used in the measurement of electricity and the control of equipment associated with the generation, transmission, and distribution of alternating current. The aim is to provide a basis for perfo
8、rmance and interchangeability of equipment covered and to assist in the proper selection of such equipment. Safety precautions are also addressed. Accuracy classes for metering service are provided. The test code covers measurement and calculation of ratio and phase angle, demagnetization, impedance
9、 and excitation measurements, polarity determination, resistance measurements, short-time characteristics, temperature rise tests, dielectric tests, and measurement of open-circuit voltage of current transformers. Keywords: accuracy, current transformer, instrument transformer, primary winding, rate
10、d secondary voltage, routine tests, secondary winding, type tests, voltage transformer The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2008 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published
11、28 July 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use lim
12、ited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:
13、33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- iv Copyright 2008 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C57.13-2008, IEEE Standard Requirements for Instrument Transformers. This standard was prepared by the Instrument Transf
14、ormer Subcommittee of the Transformers Committee of the IEEE Power Engineering Society. The purpose of this standard is to cover the electrical, dimensional, and mechanical characteristics and to take into consideration certain safety features, for current and inductively coupled voltage transformer
15、s. The changes in this revision of this standard are to the rated voltage rating of voltage transformers to eliminate the confusion caused by the specification of the primary voltage and the system voltage for line to ground transformers. An addition of partial discharge testing was added to the tes
16、t section. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing
17、 or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made ava
18、ilable for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self- regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public aut
19、horities and private users, the IEEE does not waive any rights in copyright to this document. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc.
20、 Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- v Copyright 2008 IEEE. All rights reserved. Updating of IEEE documents Users of IEEE standards shou
21、ld be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with a
22、ny amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standar
23、ds.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the fo
24、llowing URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is
25、called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for ide
26、ntifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agre
27、ements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Associatio
28、n. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS
29、Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- vi Copyright 2008 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the IEEE C57.13 Revision Working Group had the
30、following membership: Thomas Nelson, Chair Anthony Jonnatti Vladimir Khalin Ross McTaggart Paul Millward Pierre Riffon James E. Smith Chris TenHaagen Alejandro Villasenor The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapp
31、roval, or abstention. Michael Adams Steven Alexanderson Javier Arteaga Ali Al Awazi Michael Baldwin G. Bartok Martin Baur Robert Beresh Wallace Binder Stuart Bouchey Steven Brockschink Carl Bush Keith Chow Stephen Conrad Tommy Cooper Jorge E. Fernandez Daher Ratan Das Ronald L. Daubert Eric J. Davis
32、 F. A. Denbrock Kevin Donahoe Randall Dotson Paul Drum Donald Dunn Dureja, Surinder K. Paul R. Elkin Gary Engmann Marcel Fortin Saurabh Ghosh Manuel Gonzalez Charles Grose Randall Groves James Gurney Michael Haas Kenneth S. Hanus Thomas C. Harbaugh Ryusuke Hasegawa Roger Hedding Adrienne Hendrickson
33、 Gary Heuston Jerry Hohn Donald L. Hornak John J.Horwath Dennis Horwitz James Huddleston David W. Jackson David V. James Jose A. Jarque James Jones Gael Kennedy Joseph L. Koepfinger Jim Kulchisky Saumen Kundu Yeou Song Lee Blane Leuschner Lisardo Lourido William Lowe William Lumpkins G. Luri William
34、 Maguire Keith N. Malmedal William J. Marsh John W. Matthews Michael McDonald Mark F. McGranaghan Michael Meisinger Joseph Melanson Gary Michel Le Quang Minh William Moncrief Brian Mugalian Randolph Mullikin Jerry Murphy Kyaw Myint George Nail Krste Najdenkoski Bradley Nelson Arthur Neubauer Michael
35、 S. Newman Joe Nims Gary Nissen T. Olsen Chris Osterloh Lorraine Padden Joshua S. Park Dhiru S. Patel Ralph Patterson Allan St. Peter Vikram Punj Jeffrey Ray Johannes Rickmann Michael Roberts Thomas Schossig Robert Schuerger K.Sebra Tony Seegers Donald Sevcik Devki Sharma Stephen Shull Tarlochan Sid
36、hu Hyeong Sim Mark Simon Veselin Skendzic James E. Smith Larry E. Smith Aaron Snyder Richard Taylor Eric Udren Joseph J. Vaschak D. D. Weers Ray Young Roland Youngberg James Ziebarth Waldemar Ziomek Ahmed Zobaa Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008
37、 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without licen
38、se from IHS -,-,- vii Copyright 2008 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 27 March 2008, it had the following membership: Robert M. Grow, Chair Thomas A. Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeB
39、lasio Andrew Drozd Mark Epstein Alex Gelman William R. Goldbach Arnold M. Greenspan Kenneth S. Hanus James Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ronald C. Petersen Narayanan Ramachandran Jon Rosdahl Anne-Marie Sahazizian Malcolm V. Thade
40、n Howard L. Wolfman Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Bill Ash IEEE Standards Program M
41、anager, Technical Program Development Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEELicensee=IHS Emp
42、loyees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- viii Copyright 2008 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. General req
43、uirements 3 4.1 Service conditions 3 4.2 Effect of air density on flashover voltage 4 4.3 Frequency 4 4.4 Effect of altitude on temperature rise and effect of ambient temperature on permissible loading . 5 4.5 Basic impulse insulation levels, dielectric tests, and outdoor instrument transformer cree
44、page distance and wet tests 5 4.6 Temperature rise 8 4.7 Tests . 9 4.8 Construction 10 5. Accuracy classes for metering 12 5.1 Basis for accuracy classes 12 5.2 Expression of Transformer Correction Factor at 0.6 power factor (lagging) of metered load . 13 5.3 Standard accuracy classes 13 5.4 Limitin
45、g values of Ratio Correction Factor and phase angle for standard accuracy classes 13 6. Current transformers . 15 6.1 Terms in which ratings shall be expressed 15 6.2 Standard burdens . 15 6.3 Accuracy ratings for metering . 16 6.4 Accuracy ratings for relaying 18 6.5 Continuous thermal current rati
46、ng factors based on 30 C average ambient air temperature 19 6.6 Short time current ratings 19 6.7 Secondary winding-induced voltages 20 6.8 Nameplates 21 6.9 Terminals . 21 6.10 Application data . 21 6.11 Routine accuracy tests . 23 7. Voltage transformers 23 7.1 Terms in which ratings shall be expr
47、essed 23 7.2 Standard burdens . 29 7.3 Accuracy ratings 30 Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on October 13, 2008 at 12:37 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with
48、 IEEELicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 11/15/2008 20:33:15 MSTNo reproduction or networking permitted without license from IHS -,-,- ix Copyright 2008 IEEE. All rights reserved. 7.4 Thermal burden ratings 30 7.5 Nameplates 30 7.6 Terminals . 31 7.7 Short-circuit capability 31 7.8 Application data . 31 7.9 Induced voltage test . 31 7.1