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1、J IS JAPANESE I N DUSTR IAL STANDARD Translated and Published by Japanese Standards Association a 4 Geometrical Product Specif i cat ions (G PS)- a Surface texture I Profile method- Terms, definitions and surface texture parameters ICs 01.040.17; 17.040.20 Descriptors : roughness (surface), smoothne
2、ss (surface), surface treatment, vocabulary Reference number : JIS B 0601 : 2001 (E) 15 S B 0601 : 2001 (IS0 4287 : 1997) Foreword This translation has been made based on the original Japanese Industrial Standard revised by the Minister of Economy, Trade and Industry through deliberations at the Jap
3、anese Industrial Standards Committee, as the result of proposal for revision of Japanese Industrial Standard submitted by the Japanese Standards Association (JSA) with the draft being attached, based on the provision of Article 12 Clause 1 of the Industrial Standardization Law. Consequently JIS B 06
4、01 : 1994 is revised, and JIS B 0660 : 1998 Surface roughness-Terminology-Part 1 : Surface and its parameters is withdrawn and integrated into this Standard. In this Standard “Ten-point mean roughness” which is used in Japan up to now, and “Center line average roughness” according to the former Stan
5、dard are described in Annex 1 and Annex 2, respectively for information. Date of Establishment: 1952-05-21 Date of Revision: 2001-01-20 Date of Public Notice in Official Gazette: 2001-01-22 Investigated by: Japanese Industrial Standards Committee Divisional Council on Machine Elements TIS B 0601 :20
6、01, First English edition published in 2001-11 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. b O JSA 2001 All rights reserved. Unless
7、otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan JAPANESE INDUSTRIAL STANDARD JIS B 0601 : 2001 (IS0 4287 : 19
8、97) Geometrical Product Specifications (GPS)- Surface texture : Profile method- Terms, definitions and surface texture parameters Introduction This Japanese Industrial Standard has been prepared based on IS0 4287 Geometrical Product Specifications (GPS)-Surface texture: Profile method- Terms, defini
9、tions and surface texture parameters issued in 1997 without modifying the technical contents. This Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see TR B 0007). It influences chain link 2 of the chains of standards on surface texture.
10、 For more detailed information on the relationship of this Standard to other standards and the GPS matrix model, see Annex D. Historically, the roughness profile and its parameters have been the only parts of surface texture characterization that have been well defined. A default relationship betwee
11、n Ac and A f is under consideration. In this Standard, ten-point mean roughness which is used in Japan even at present and center line average roughness which had been specified in the former standard are described in Annex 1 and Annex 2, respectively for information. The portions with solid sidelin
12、es or dotted underlines show the matters not in- cluded in the original International Standard. NOTE : TR B 0007 is identical with ISOPTR 14638 : 1995 Geometrical Product Specification (GPS)-Masterplan. 1 Scope This Standard specifies terms, definitions and parameters for the deter- mination of surf
13、ace texture (roughness, waviness and primary profile) by profiling methods. NOTE : The International Standard corresponding to this Standard is as follows. In addition, abbreviations which denote the degree of correspondence in the contents between the relevant International Standard and JIS are IDT
14、 (identical), MOD (modified) and NEQ (not equivalent) accord- ing to ISOAEC Guide 21. IS0 4287 : 1997 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Terms, definitions and surface texture parameters (IDT) 2 Normative references The following standards contain provisions wh
15、ich, through reference in this Standard, constitute provisions of this Standard. The most recent editions of the standards (including amendments) indicated below shall be applied. JIS B 0632 Geometrical Product Specification (GPS)-Surface texture : Profile method-Metrological characteristics of phas
16、e correct filters -,-,- 2 B 0601 : 2001 (IS0 4287 : 1997) NOTE : IS0 11562 : 1996 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Metrological characteristics of phase correct filters is identical with the said standard. JIS B 0633 Geometri.ca1 Product Specifications (GPS)-
17、Surface texture : Profile method-Rules and procedures for the assessment of surface texture NOTE : IS0 4288 : 1996 Geometrical Product Specifications (GPS)-Surface texture: Profile method-Rules and procedures for the assessment of surface texture is identical with the said standard. JIS B 0651 Surfa
18、ce texture-Instruments for the assessment of surface texture- Profile method NOTE : IS0 3274 : 1996 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Nominal characteristics of contact (stylus) in- struments is identical with the said standard. 3 Definitions The definitions o
19、f terms used in this Standard are as follows. 3.1 General terms 3.1.1 profile filter filter which separates profiles into longwave and shortwave components NOTE : There are three filters used in instruments for measuring roughness, waviness Eind primary profiles (see Figure 1). They all have the sam
20、e transmission characteristics, defined in JIS B 0632, but different cut- off wave-lengths. 3.1.1.1 As profile filter filter which defines the intersection between the roughness and the even shorter wave components present in a surface (see Figure 1) 3.1.1.2 Ac profile filter filter which defines th
21、e intersection between the roughness and waviness components (see Figure 1) 3.1.1.3 A f profile filter filter which defines the intersection between the waviness and the even longer wave components present in a surface (see Figure 1) 3.1.2 coordinate system that coordinate system in which surface te
22、xture parameters are defined NOTE : It is usual to use a rectangular coordinate system in which the axes form a right-handed Cartesian set, the X-axis being the direction of tracing colinear with the mean line, the Y-axis also nominally lying on the real surface, and the Z-axis being in an outward d
23、irection (from the material to the surrounding medium). This convention is adopted throughout the rest of this Standard. b L. b , 4 . -,-,- 3 B 0601 : 2001 (IS0 4287 : 1997) 3.1.3 real surface O surface limiting the body and separating it from the surrounding medium 3.1.4 surface profile profile tha
24、t results from the intersection of the real surface by a specified plane (see Figure 2) NOTE : In practice, it is usual to choose a plane with a normal that nomi- nally lies parallel to the real surface and in a suitable direction. 3.1.5 primary profile See JIS B 0651. Total profile after applicatio
25、n of the short wavelength filter As. NOTE : The primary profile is the basis for evaluation of the primary profile parameters. Informative reference : Total profile is the digital form of the traced profile rela- tive to the reference mofile. with the vertical and hori- . zontal coordinates assigned
26、 to each other (JIS B 0651). . 3.1.6 roughness profile profile derived from the primary profile by suppressing the longwave component using the profile filter Ac; this profile is intentionally modified (see Figure 1) NOTES 1 The transmission band for roughness profiles is defined by the As and Ac pr
27、ofile filters (see JIS B 0632, 2.6 and 3 . 2 ) . 2 The roughness profile is the basis for evaluation of the roughness profile parameters. 3 The default relationship between Ac and As is given in JIS B 0651, 4.4. 3.1.7 waviness profile profile derived by subsequent application of the profile filter A
28、 f and the profile filter Ac to the primary profile, suppressing the longwave component using the profile fil- ter Af, and suppressing the shortwave component using the profile filter Ac; this profile is intentionally modified b 8 100 .+ $ bo bo Roughness profile Waviness profile Q P 50 O A S A f Wa
29、velength Figure 1 Transmission characteristic of roughness and waviness profiles -,-,- 4 B 0601 : 2001 (Is0 4287 : 1997) Surface profile Figure 2 Surface profile NOTES 1 The nominal form should first be removed from the total profile by 2 best-fit least-squares methods, before applying the ;If profi
30、le filter for separating the waviness profile. For circular nominal form, it is recommended that the radius should also be included in the least- squares optimization and not held fixed to the nominal value. This procedure for separating the waviness profile defines the ideal wavi- ness operator. Th
31、e transmission band for waviness profiles is defined by the Ac and A f profile filters (see JIS B 0632, 2 . 6 and 3 . 2 ) . 3 The waviness profile is the basis for evaluation of the waviness profile parameters. Informative references 1 Operator is a series of measuring principle, measur- ing method,
32、 measuring condition, data processing, etc. which are necessary for obtaining geometrical feature in the order for the purpose of introducing the concept of uncertainty. The ideal is a theoretically correct operator which has no error in measuring instrument and digitalized data, and has infinitivel
33、y large num- ber of discrete data. 2 _._._ The meaning of “the radius should be included in the least-squares optimization” is to obtain the radius of circular form optimally applicable to the data, by the least-squares _.- _._._._ optimization. ._._._. . . . ._._._._._ . . .-_.-.-_._ . _.-._-_._._.
34、_._. ._._. _._._ _._._._ _ . . 3 . 1 . 8 mean lines 3 . 1 . 8 . 1 line corresponding to the longwave profile component suppressed by the profile fil- ter Ac (see JIS B 0632, 3 . 2 ) mean line for the roughness profile -,-,- 5 B 0601 : 2001 (IS0 4287 : 1997) 3.1.8.2 line corresponding to the longwave
35、 profile component suppressed by the profile fil- ter A f (see JIS B 0632, 3.2) mean line for the waviness profile o ?, 3.1.8.3 line determined by fitting a least-squares line of nominal form through the primary profile mean line for the primary profile 3.1.9 sampling length Ip, Ir, Zu, length in th
36、e direction of the X-axis used for identifying the irregularities charac- terizing the profile under evaluation NOTE : The sampling length for the roughness Ir and waviness profiles Z w is numerically equal to the characteristic wavelength of the profile fil- ters Ac and Af, respectively. The sampli
37、ng length for primary profile, Zp, is equal to the evaluation length. 3.1.10 evaluation length In length in the direction of the X-axis used for assessing the profile under evaluation NOTES 1 The evaluation length may contain one or more sampling lengths. 2 For default evaluation lengths, see JIS B
38、0633, 4 . 4 . JIS B 0633 does not give default evaluation length for W-parameters. 3.2 Geometrical parameter terms 3.2.1 P-parameter parameter calculated from the primary profile 3.2.2 R-parameter parameter calculated from the roughness profile 3.2.3 W-parameter parameter calculated from the wavines
39、s profile NOTE : The parameters defined in clause 4 can be calculated from any profile. The first capital letter in the parameter symbol designates the type of the profile evaluated. For example, Ru is calculated from the rough- ness profile and Pt is calculated from the primary profile. 3.2.4 profi
40、le peak an outwardly directed (from material to surrounding medium) portion of the assessed profile connecting two adjacent points of the intersection of the profile with the X-axis 3.2.5 profile valley an inwardly directed (from surrounding medium to material) portion of the assessed profile connec
41、ting two adjacent points of the intersection of the assessed profile with the X-axis o -,-,- 6 B 0601 : 2001 (IS0 4287 : 1997) 3.2.6 height and/or spacing discrimination minimum height and minimum spacing of profile peaks and profile valleys of the assessed profile which should be taken into account
42、 NOTE : The minimum height of the profile peaks and valleys are usually speci- fied as a percentage of Pz, Rz, Wz or another amplitude parameter, and the minimum spacing as a percentage of the sampling length. 3.2.7 profile element profile peak and the adjacent profile valley (see Figure 3) NOTE : T
43、he positive or negative portion of the assessed profile at the begin- ning or end of the sampling length should always be considered as a profile peak or as a profile valley. When determining a number of profile elements over several successive sampling lengths, the peaks and valleys of the assessed
44、 profile at the beginning or end of each sampling length are taken into account once only at the beginning of each sampling length. 3.2.8 ordinate value Z(x) height of the assessed profile at any position x NOTE : The height is regarded as negative if the ordinate lies below the X-axis, and positive
45、 otherwise. dZ 3.2.9 local slope - dx slope of the assessed profile at a position xi (see Figure 4) NOTES 1 The numerical value of the local slope, and thus the parameters PAq, RAq and WAq, depends critically on the ordinate spacing AX. 2 A formula for estimating the local slope is The above formula
46、 should be used for the sample spacing stipu- lated in JIS B 0651 for the filter used, where xi and zi are the po- sition and the height respectively of the ith profile point and AX is the spacing between adjacent profile points. The fonnula for obtaining R local slnne is hased nn seven- point formu
47、la of numeric differential. Informative reference : ._._ ._ _ _ ._. _._. _ _._ . _. . _. . ._ ._._. _._. . - . - o - - : - - . : . ._ ._. -.+.- 4.5.5 Amplitude density profile height amplitude curve samp-2 probability density function of the orGlliate 2 (XI within the evaluation length (see Figure 1
48、3) NOTE : For profile height amplitude curve parameters, see 4.2. Mean line Figure 13 Profile height amplitude distribution curve -,-,- 16 B 0601 : 2001 (IS0 4287 : 1997) P U C R&c W8C as I C Lf Annex A (normative) Text equivalent Pdc Rdc WdC Ls Lc Lf In order to facilitate alphanumeric notation by means of computers, the follow- ing text equivalents are recommended: Parameter I Text equivalent -,-,- L 1 - 3 profile - output scaling 17 B 0601 : 2