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1、STD-JIS C LL02-2-ENGL 1977 4933b08 05b452b 552 I J IS 4 JIS C 1102-2 : 1997 JAPANESE I N DUSTR IAL STANDARD Translated and Published by Japanese Standards Association Direct acting indicating analogue electrical measuring instruments and their accessories Part 2 I Special requirements for ammeters a
2、nd voltmeters 4 ICs 17.220.20 Descriptors : electrical measuring instruments, ammeters, voltmeters Reference number : JIS C 1102-2 : 1997 (E) 7s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2
3、007 20:43:17 MDTNo reproduction or networking permitted without license from IHS -,-,- C 1102-2 : 1997 (IEC 51-2 : 1984) Foreword This translation has been made based on the original Japanese Industrial Standard established by the Minister of International lrade and Industry through deliberations at
4、 Japanese Industrial Standards Committee in accordance with the Industrial Standardization Law. By this establishment JIS C 1102 : 1981 was withdrawn and replaced with this Standard. Constitution o f Standard JIS C 1102 consists of the following 9 parts under the common title Direct acting indicatin
5、g analogue electrical measuring instruments and their accessories. Part 1 : Part 2: Part 3 : Part4: Part 5 : Part 6 : Part 7 : Part 8 : Part 9 : Definitions and general requirements common to all parts Special requirements for ammeters and voltmeters Special requirements for wattmeters and varmeters
6、 Special requirements for frequency meters Special requirements for phase meters, power factor meters and syn- chroscopes Special requirements for ohmmeters (impedance meters) and conduc- tance neters Special requirements for multi-function instruments Special requirements for accessories Recommende
7、d test methods Parts 2 to 9 are not complete in themselves and shall be read in conjunction with Part 1. Parts 1 to 8 are arranged in the same format and a standard relationship between subject and clause number is maintained throughout. In addition, tables, figures and annexes add a suffix to the p
8、art number in order to differ- entiate the parts. This re-arrangement will assist the reader of this Standard to distinguish information relating to the different types of instruments. Date of Establishment: 1997-10-20 Date of Public Notice in Official Gazette: 1997-10-20 Investigated by: Japanese I
9、ndustrial Standards. Committee Divisional Council on Electricity JIS C 1102-2: 1997, First English edition published in 2000-07 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the ori
10、ginal JIS is to be the final authority. f k 0 JSA 2000 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publis
11、her. Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproduction or networking permitted without license from IHS -,-,- Contents Page Introduction . 1 1 Sco
12、pe 1 . * 2 3 4 5 6 7 8 9 10 Definitions 1 1 Description, classification and compliance . Reference conditions and intrinsic errors . Nominal range of use and variations 1 2 Further electrical and mechanical requirements 4 Constructional requirements . 7 8 8 8 Information, general markings and symbol
13、s Markings and symbols for terminals . Tests to prove compliance with this Standard Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproduction or networking permitted witho
14、ut license from IHS -,-,- STDmJIS C LL02-2-ENGL 1797 4933bO8 05b1i527 Ebl JAPANESE INDUSTRIAL STANDARD JIS C 1102-2 : 1997 (IEC 51-2 : 1984) Direct acting indicating analogue electrical measuring instruments and their accessories Part 2 : Special requirements for ammeters and voltmeters Introduction
15、 This Japanese Industrial Standard has been prepared based on IEC 51-2, Direct acting indicating analogue electrical measuring instruments and their accessories Part 2 : Special requirements for ammeters and voltmeters issued in 1984 as the fourth edition without changing the technical contents. 1 S
16、cope 1.1 an analogue display. This Standard applies to direct acting indicating ammeters and voltmeters having Note : For multi-function instruments, see JIS C 1102-7. 1.2 Sub-clause 2.1.15.3 of JIS C 1102-1) used with ammeters and voltmeters. This Standard also applies to non-interchangeable access
17、ories (as defined in 1.3 to 1 . 8 See JIS C 1102-1. 2 Definitions See JIS C 1102-1. 3 Description, classification and compliance 3.1 Description tion as given in Sub-clause 2.2 of JIS C 1102-1. Ammeters and voltmeters shall be described according to their method of opera- 3.2 Classification noted by
18、 the following class indices: Ammeters and voltmeters shall be classified in one of the accuracy classes de- 0.05, 0.1, 0.2, 0.3, 0.5, 1, 1.5, 2 , 2.5, 3, 5. 3.3 Compliance with the requirements of this Standard See JIS C 1102-1. 4 Reference conditions and intrinsic errors 4.1 Reference conditions S
19、ee JIS C 1102-1. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproduction or networking permitted without license from IHS -,-,- 4.2 Limits of intrinsic error; fiducial v
20、alue See JIS C 1102-1. 4.2.1 Correspondence between intrinsic error and accuracy class See JIS C 1102-1. 4.2.2 Fiducial value The fiducial value for an ammeter or a voltmeter corresponds to: 4.2.2.1 The upper limit of the measuring range for the following: - instruments with the mechanical and/or el
21、ectrical zero at one end of the scale; - instruments with the mechanical zero outside the scale irrespective of the po- sition of the electrical zero; - instruments with the electrical zero outside the scale irrespective of the posi- tion of the mechanical zero. The class index is marked using Symbo
22、l E-1 given in Table 111-1 (see JIS C 1102- 1, Clause8). 4.2.2.2 The sum of the electrical values, irrespective of sign, corresponding to the two limits of the measuring range when both the mechanical and the electrical ze- ros are displaced within the scale. The class index is marked using Symbol E
23、-1 given in Table 111-1 (see JIS C 1102- 1, Clause 8). 4.2.2.3 The span for an instrument whose scale marks do not correspond directly to its electrical input quantity. The class index is marked using Symbol E-10 given in Table 111-1 (see JIS C 1102- 1, Clause8). This sub-clause does not apply to a
24、voltmeter or ammeter designed to be used in conjunction with a shunt, a series resistor (impedance) or an instrument transformer. These instruments are to be treated in accordance with Sub-clauses 4.2.2.1 or 4.2.2.2, as appropriate. 4.2.2.4 For an instrument whose scale has been arranged to produce
25、a special ar- rangement of scale marks, the fiducial value (and therefore the permissible error) shall be as agreed between manufacturer and user. The fiducial value does not have to be the same at all points on the scale. 5 Nominal range of use and variations 5.1 Nominal range of use See JIS C 1102
26、-1 and Table 11-2. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS C 1102-2-ENGL 1997 H 4733b08 OC
27、b453L 9LT 3 C 1102-2 : 1997 (IEC 51-2 : 1984) Table 11-2 Limits of the nominal range of use and permissible variations additional to those given in Table 11-1 Limits of the nominal range of use unless otherwise marked Permissible variation expressed as a percentage of the class index or the recom- i
28、ended tests ns c 1102-9) Influence quantity 20 % 50 9 % 3 . 6 Ripple (45 H z to 65 H z and 90 H z to 130 Hz) on d.c. measured quantity for other than r.m.s. re- sponding instruments 1) other than rectifier loo % nstnunents without elec- ronic devices in their neasuring circuits: 20 % nstruments havi
29、ng elec- ronic devices in their neasuring circuits: 1 to 33) 3 . 7 . 1 Under consideration 100 9 % bference frequency + 10 % i r lower limit of reference tange for frequency -10 % md upper limit of reference Bange for frequency + 10 % 100 % 3 . 8 . 1 Frequency of a.c. measured quantity Magnetic fiel
30、d of external origin Zlass indices 3.5 and greater 3 . 5 Class indices D.3 and smailer 3% of the fiducial value 4) Moving magnet, moving iron and electrodynamic instruments if not astatic andlor not having a magnetic screen Ferrodynamic instruments if not astatic andor not having a magnetic screen 6
31、 % of the fiducial valued) 3% of the fiducial value 4: 0.4 W m 1.5 % of the fiducial value41 A l l other instru- ments 0.75 % of the fiducial value*) 1.5 % of the fiducia: value4: 1) For an r.m.s.-responding instrument which also responds to d.c., no permissible variation can be stated because the r
32、ipple is then part of the measured quan- tity. For a.c. quantities, the requirements for instruments relate to r.m.s. values ir- respective of the principle of operation of the instrument. However, instruments incorporating rectifier(s) (except r.m.s.-responding in- struments) usually respond to the
33、 rectified (mean) value of the waveform but are scaled to indicate the r.m.s. value of a sinusoidal waveform. If the wave- form is not sinusoidal, the indicated value may be seriously in error. However, if the waveform can be adequately characterized, this error is calculable. Re- quirements for the
34、 influence of a distorted waveform on rectified (mean) and peak-sensing instruments are therefore not specified. 2) Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproducti
35、on or networking permitted without license from IHS -,-,- STDmJIS C LLOZ-Z-ENGL 1997 D 4933608 0564532 856 U 4 .C 1102-2 : 1997 (IEC 51-2 : 1984) 3) The permissible variation due to a peak factor of other than fi (corresponding to a sine wave) is included in the permissible variation due to distorti
36、on of the measured quantity. For instruments having a peak factor capability greater than 3, the manu- facturer shall state: a) the instrument peak factor capability producing a variation of 100 % of the class index. b) the upper and lower limits of the frequency response (bandwidth) to 0.707 times
37、the indication at the reference frequency; c) the effective maximum rate of change of internal instrument a.c. amplifier response (slew rate), expressed in volts per second using appropriate S.I. prefixes. Peak factor relates to the total peak factor capability of the instrument and includes both th
38、e peak factor due to a distorted waveform and the peak factor due to spurious impulses (which may be random or harmonically related to the fundamental frequency) containing negligible average power. 4) Not as a percentage of the class index. 5 . 2 Limits of variations See JIS C 1102-1 and Table 11-2
39、. 5 . 3 Conditions for the determination of variations See JIS C 1102-1. 6 Further electrical and mechanical requirements 6 . 1 Voltage tests, insulation tests and other safety requirements See JIS C 1102-1. 6 . 1 . 1 For a fixed ammeter having the upper limit of its measuring range of 1 A to 10 A a
40、nd intended for use with a current transformer having a high over-current capability (Class P transformers as specified in IEC 185 : Current Transformers), the measuring circuit shall not open when the ammeter is subjected to 30 times the nominal secondary current“ of the associated current transfor
41、mer for a period of 2 s. A portable ammeter intended for similar use shall withstand 15 times the upper limit of its measuring range for a period of 2 s. These ammeters need not be functional after application of this overload but shall not then be open-circuit. For the recommended test, see JIS C 1
42、102-9, Sub-clause 4 . 8 . 6 . 2 Damping See JIS C 1102-1. L * IEC 185 uses the term “rated current“ for this concept. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/12/2007 20:43:17 MDTNo reproduc
43、tion or networking permitted without license from IHS -,-,- . 6.2.1 Overshoot See JIS C 1102-1. 6.2.2 Response time See JIS C 1102-1. However, the requirements of Sub-clauses 6.2.1 and 6.2.2 of JIS C 1102-1 do not - thermal instruments; - electrostatic instruments; - instruments having a freely susp
44、ended moving element; - instruments having a material pointer longer than 150 mm; - instruments in which the current or voltage corresponding to the upper limit of the measuring range is less than 200 pA or 20 mV; - special-purpose instruments where other response times may be required. Such instrum
45、ents will be the subject of agreement between manufacturer and user. apply to the following types of ammeters and voltmeters: 6 . 2 . 3 Impedance of the external measuring circuit See JIS C 1102-1. However, if the impedance of the external measuring circuit is not stated, it shall - more than 50 tim
46、es the impedance of the instrument for ammeters, milliammeters and microammeters; - less than 1/50 of the impedance of the instrument for voltmeters and millivoltmeters. be assumed to be, at the reference frequency: 6.3 Self-heating See JIS C 1102-1. 6.4 Permissible overloads 6.4.1 Continuous overlo
47、ad For the recommended test, see JIS C 1102-9, Sub-clause 4.6. Ammeters and voltmeters, together with their non-interchangeable accessory(ies), if any, except for instruments fitted with a non-locking switch, shall be subjected to a continuous overload of 120 % of the upper limit of the electrical i
48、nput quantity for a period of 2 h. After removal of the excitation, the sum of the temporary and any permanent residual deflections shall not exceed 1 % of the scale length. After having cooled to the reference temperature, the instrument together with its non-interchangeable accessory(ies), if any, shall comply with its accuracy require- ments; however the overload shall not be repeated. The continuous overload test shall be carried out under reference conditions. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, U