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1、I E STDeJIS C 5LDL-9-ENGL 1938 I I 4933b08 055b003 327 18 J IS JAPANESE I N DUSTR IAL STAN DA R D Translated and Published by Japanese Standards Association Fixed capacitors for use in electronic equipment Part 9: Sectional specifi- cation: Fixed capacitors of ceramic dieletric, class 2 ICs 31.060.2
2、0 Descriptors : capacitors, fixed capacitors, electronic equipment and components, ceramics, Reference number : JIS C 5101-9 : 1998 (E) ratings 17s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/1
3、3/2007 22:15:41 MDTNo reproduction or networking permitted without license from IHS -,-,- STD*JIS C 5101-9-ENGL 177 b) rated voltage (d.c. voltage may be indicated by the symbol - or -1; c) tolerance on rated capacitance; d) the dielectric sub-class, see Table II ( 2 . 2 . 5 ) ; e) year and month (o
4、r week) of manufacture; f) manufacturers name or trade mark; g) climatic category; h) manufacturers type designation; i) reference to the detail specification. 1 . 6 . 2 The capacitor shall be clearly marked with a), b) and c) stated in 1.6.1and with as many as possible of the remaining items as is
5、considered necessary. Any duplication of information in the marking on the capacitor should be avoided. 1 . 6 . 3 The package containing the capacitor(s) shall be clearly marked with all the information listed in 1 . 6 . 1 . 1 . 6 . 4 Any additional marking shall be so applied that no confusion can
6、arise. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted without license from IHS -,-,- 5 C 5101-9 : 1998 Section Two - Preferred ratings a
7、nd characteristics 2 Preferred ratings and characteristics 2.1 Preferred characteristics The values given in detail specifications shall preferably be selected from the following: 2.1.1 Preferred climatic categories The capacitors covered by this specifica- tion are classified into climatic categori
8、es according to 8 of JIS C 0010. The lower and upper category temperatures and the duration of the damp heat, steady state test shall be chosen from the following: Lower category temperature: -55 OC, -40 O C , -25 O C and -10 “C. Upper category temperature : +70 O C , +85 OC, +lo0 O C and +125 “C. D
9、uration of the damp heat, steady state test: 4, 10, 21 and 56 days. The severities for the cold and dry heat tests are the lower and upper category temperatures respectively. 2.2 Preferred values of ratings 2.2.1 Rated temperature For capacitors covered by this specification, the rated temperature i
10、s equal to the upper category temperature. 2.2.2 Rated voltage (UR) The preferred values of rated voltage are taken from the preferred values R5 series specified in JIS Z 8601 and are as stated below. However, rated voltage of R10 series stated below may be used, if other value is necessary . R5 ser
11、ies : 25-V, 40 V, 63 V, 100 V, 160 V, 250 V, 400 V, 630 V, 1 O00 V, R10 series : 50 V, 200 V, 500. V, 2 O00 V, 3 150 V and 5 O00 V 1 600 v, _4_000-Y_an6-_6_300-l! . Informative reference: Rated voltages of R10 series and of R5 series under- lined with dots which are widely employed in the market are
12、 added, since the original International Standard IEC 60384-9 says “If other values are needed they shall be chosen from the R10 series“ 2.2.3 Category voltage ( Uc) Since the rated temperature is defined as the up- per category temperature, the category voltage is equal to the rated voltage, as def
13、ined in JIS C 5101-1, 2.2.17. 2.2.4 Preferred values of rated capacitance and associated tolerance values 2.2.4.1 Preferred values of rated capacitance Rated capacitance values shall be taken from the series of JIS C 5063; the E3, E6 and E12 series are preferred. 2.2.4.2 Preferred tolerances on rate
14、d capacitance Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted without license from IHS -,-,- Tolerances (%o) Letter code E6 E6 and E12 I2
15、0 M I10 K -40 “CI +85 “C -25 “CI +85“C Without d.c. voltage applied -Wj$h-ytd. - d.c. - - - - voltage - - - - . applied - - - . . 6 C 5101-9 : 1998 Table I Preferred series I E3 and E6 I -20/+80 1- Z I -20/+50 I S I 2.2.5 Temperature characteristic of capacitance Table II denotes with a cross prefer
16、red values of temperature characteristics with and without d.c. volt- age applied. The method of coding the sub-class is also given e.g. a dielectric with a percentage change of f20 % without d.c. voltage applied over the tempera- ture range from -55 “C to +125 “C will be defined as a dielectric of
17、class 2C1. Table II Sub-class letter code Max. capacitagce change in % within the category tem- perature range with respect to the capacitance at 20 “C measured with and without a d.c. voltage applied -55 “CI +125 “C -55 “CI +85 “C -10 “C/ +85 O C 3 I4 2 1 6 I 2B X As specified in the detail ._ ._ .
18、 _._ -80 f15 f15 2c X 2D 2E X X X 2F X X I - - X I 2R -I- 2x -I- - Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted without license from I
19、HS -,-,- 7 C 5101-9 1998 Sec tion Three - Quality assessment procedures 3 Quality assessment procedures 3 . 1 Primary stage of manufacture For single layer capacitors the primary stage of manufacture is the metallizing of the dielectric to form the electrodes; for multilayer capacitors it is the fir
20、st common firing of the dielectric-electrode as- sembly. 3 . 2 Structurally similar components Capacitors considered as being struc- turally similar are capacitors produced with similar processes and materials? though they may be of different case sizes and values. 3 . 3 Certified records of release
21、d lots The information required in 3 . 5 . 1 of JIS C 5101-1 shall be made available when prescribed in the detail specification and when requested by a purchaser. After the endurance test the parameters for which variables information is required are the capacitance change, tan 6 and the insulation
22、 resistance. 3 . 4 Qualification approval The procedures for qualification approval testing are given in 3 . 4 of the general specification, JIS C 5101-1. The schedule to be used for qualification approval testing on the basis of lot- by-lot and periodic tests is given in 3 . 5 of this specification
23、. The procedure using a fixed sample size schedule is given in 3 . 4 . 1 and 3 . 4 . 2 below. 3 . 4 . 1 Qualification approval on the basis of the fixed sample size proce- dure sampling The fixed sample size procedure is described in JIS C 5101-1, 3 . 4 . 2 b). The sample shall be representative of
24、the range of capacitors for which approval is sought. This may or may not be the complete range covered by the detail speci- fication. The sample shall consist of specimens having the lowest and highest voltages? and for these voltages the lowest and highest capacitances. When there are more than fo
25、ur rated voltages an intermediate voltage shall also be tested. Thus for the approval of a range, testing is required of either four or six values (capaci- tanceholtage combinations). When the range consists of less than four values, the number of specimens to be tested shall be that required for fo
26、ur values. Spare specimens are permitted as follows: a) One per value which may be used to replace the permitted defective in Group “O”. b) One per value which may be used as replacements for specimens which are defective because of incidents not attributable to the manufacturer. The numbers given i
27、n Group “O” assume that all groups are applicable. If this is not so the numbers may be reduced accordingly. When additional groups are introduced into the qualification approval test schedule, the number of specimens required for Group “O” shall be increased by the same number as that required for
28、the additional groups. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted without license from IHS -,-,- STD.JIS C 5101-9-ENGL 2998 I 4933b0
29、8 055bDLb 785 I 8 C 5101-9 : 1998 Table III gives the number of samples to be tested in each group or sub- group together with the permissible number of defectives for qualification approval tests. 3.4.2 Tests The complete series of tests specified in Tables III and IV are re- quired for the approva
30、l of capacitors covered by one detail specification. The tests of each group shall be carried out in the order given. The whole sample shall be subjected to the tests of Group “O” and then divided for the other groups. Specimens found defective during the tests of Group “O” shall not be used for the
31、 other groups. “One defective” is counted when a capacitor has not satisfied the whole or a part of the tests of a group. The approval is granted when the number of defectives does not exceed the specified number of permissible defectives for each group or sub-group and the total number of permissib
32、le defectives. Remarks: Tables III and IV together form the fixed sample size test sched- ule, for which Table III includes the details for the sampling and permissible defectives for the different tests or groups of tests, whereas Table IV together with the details of test con- tained in Section Fo
33、ur gives a complete summary of test condi- tions and performance requirements and indicates where e.g. for the test method or conditions of test a choice has to be made in the detail specification. The conditions of test and performance requirements for the fixed sample size test schedule shall be i
34、dentical to those pre- scribed in the detail specification for quality conformance in- spection. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking pe
35、rmitted without license from IHS -,-,- - G a , v m Q) 42 U al a al * -3 4 2 3 3 m m E Fi al a cr O Fi al P 7 d a E !i $ E m h W e rn .4 u al +I O Fi al P E - m STD.JIS C 5101-9-ENGL 1996 4933608 055bQ17 911 6 9 C 5101-9 : 1998 - N v m N N rl W rl - N v N Ca O Ca A O m r - - - - - - - - 1 - - - - I N
36、 I M rl Ca I C D rl i m bi I I m h h h h -Nm* w w w w Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-
37、JIS C 510L-9-ENGL 1998 I I 4933608 0556038 8519 10 C 5101-9 : 1998 m a , a O Fi a ci s o g z E a, (B (d ; $ s z o a ci m O k .- Y U a , O ci k a, Fi rn Y m CE $ E a , Fi 7 c9 a , k .r( 2 E k Fi a , a a c (d 4 m a , ci cc O m L . 3 4 O 2 ? o ci rn a, c II c1 z . . a , ? ci U .r( z 4 rn a) a II ci P 5
38、 a , (d u m .- E 0.1 H m U Fi a , . bi c .d 2 a) .6, c a a, O a , .- 5 m o u 5 m .- ci O a , 4 .r( a ci a , a a , a , m Fi a , a , o 5 d (d Fi a, O c, a a , U a , k Ul ho E . - with a minimum of five of any one value. For Sub-group B2 the sample shall include capacitors of every tem- perature charac
39、teristic represented in the lot. If there are less than five of any one value in the sample the basis for the drawing of samples shall be agreed between the manufacturer and the National Supervising Inspectorate, in the case of IEC Quality As- sessment System (IECQ). 2b) b) Group C inspection These
40、tests shall be carried out on a periodic basis. Samples shall be representative of the current production of the specified periods and shall be divided into high, medium and low capacitance values. In subsequent periods different voltage ratings and capacitance values in pro- duction shall be tested
41、 with the aim of covering the whole range. 3-5.2 Test schedule The schedule for the lot-by-lot and periodic tests for Quality Conformance Inspection is given in Section Two, Table IV of the Blank Detail Specification, JIS C 5101-9-1. 3 . 5 . 3 Delayed delivery When according to the procedures of JIS
42、 C 5101-1,3.5.2, re-inspection has to be made, solderability and capacitance shall be checked as specified in Group A and B inspection. 3.5.4 Assessment levels fication shall preferably be selected from the following Tables V A and V B: The assessment level(s) given in the blank detail speci- Table
43、V A Lot-by-lot quality inspection IL = inspection level AQL = acceptable quality level Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:15:41 MDTNo reproduction or networking permitted wi
44、thout license from IHS -,-,- 16 C 5101-9 : 1998 Inspection sub-group” C 1A C 1B c1 c2 c3 c4 Table V B Periodic quality inspection _._._- D* E F” G* n C P n C P n C P n C P 6 9 1 6 18 1 6 27 2 6 15 1 3 15 1 12 9 1 Section Four - Test and measurement procedures This section supplements the information
45、 given in JIS C 5101-1, Section Four. 4 Test and measurement procedures 4.1 Special preconditioning Unless otherwise specified in the detail specifi- cation, the special preconditioning, when specified in this document before a test or a sequence of tests, shall be made under the following condition
46、s: exposure at upper category temperature or at such higher temperature as may be specified in the detail specification during 1 h, followed by recovery during 24 h rt 1 h at stan- dard atmospheric conditions for testing. Remarks : Class 2 capacitors lose capacitance continuously with time ac- cordi
47、ng to a logarithmic law (this is called ageing). However if the capacitor is heated to a temperature above the Curie point of its dielectric then “de-ageing” takes place i.e. the capacitance lost through “ageing” is regained, and “ageing” recommences from the time when the capacitor recools. The pur
48、pose of special preconditioning is to bring the capacitor to a defined state regardless of its previous history. (See Annex A, Clause A4, for further information). 4.2 Visual examination and check of dimensions JIS C 5101-1, 4.4. 4.3 Electrical tests 4.3.1 Capacitance 4.7 of JIS C 5101-1, with the following details : Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/