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1、I ? STD-JIS C 5943-ENGL 1997 4933b08 0549422 786 J IS JAPANESE I NDUSTRIAL STANDARD Translated and Published by Japanese Standards Association Measuring methods of laser diodes used for recording and playback ICs 31.260 Descriptors : lasers, diodes, recording engineering, solid lasers, semiconductor
2、 devices, semiconductors, electrical measurement, optical measurement Reference number : JIS C 5943 : 1997 (E) 16 S Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:27:58 MDTNo reproducti
3、on or networking permitted without license from IHS -,-,- STDmJIS C 5943-ENGL 1997 D 4933608 0549423 bL2 D C 5943 : 1997 Foreword This translation has been made based on the original Japanese Industrial Standard revised by the Minister of International Trade and Industry through deliberations at Jap
4、anese Industrial Standards Committee in accordance with the Industrial Standardization Law. Consequently, JIS C 5943 : 1990 has been revised and replaced with this Standard. In this revision, conformance of provisions between JIS and International Standard was taken into consideration. Attention is
5、drawn to the possibility that some parts of this Standard may conflict with a patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have technical properties. The relevant Minister an
6、d the Japanese Industrial Standards Committee are not responsible for identifying the patent right, application for a patent after opening to the public, utility model right or application for registration of utility model after opening to the public which have the said technical properties. Date of
7、 Establishment: 1990-01-01 Date of Revision: 1997-08-20 Date of Public Notice in Official Gazette: 1997-08-20 Investigated by: Japanese Industrial Standards Committee Divisional Council on Electronics JIS C 5943 : 1997, First English edition published in 1998-03 Translated and published by: Japanese
8、 Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the final authority. t J O JSA 1998 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in
9、any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Res
10、ale, 03/13/2007 22:27:58 MDTNo reproduction or networking permitted without license from IHS -,-,- STD.JIS C 5943-ENGL 1997 m 4933bO 0549424 559 m r JAPANESE INDUSTRIAL STANDARD JIS C 5943 : 1997 Measuring methods of laser diodes used for recording and playback Introduction Users should note that at
11、 application of this Standard, the norma- tive references to this Standard shall be referred at the same time. Further, it is often necessary to carry out comparison with and study on the similar standard(s), if any. This is a Japanese Industrial Standard prepared based on IEC 747-5, Semicon- ductor
12、 devices. Discrete devices and integrated circuits-Part 5 : Optoelectronic de- vices issued in 1992, and IEC 747-5 Amendment l issued in 1994, however, provisions not established in the International Standard are added in this Japanese Industrial Standard. 1 Scope This Japanese Industrial Standard s
13、pecifies measuring methods of laser diodes used for recording and playback as the light source (diodes included in an electronic circuit are excluded; hereafter referred to as “laser diodes”). Remarks 1 The normative references to this Standard are as follows. JIS C 1102 Electrical indicating instru
14、ments JIS C 5001 General rules for electronic components JIS C 5942 General rules of laser diodes used for recording and playback 2 The International Standard corresponding to this Standard is shown below. IEC 747-5 : 1992 Semiconductor devices. Discrete devices and inte- grated circuits-Part 5 : Op
15、toelectronic devices IEC 747-5 Amendment 1 : 1994 2 Definitions For the purpose of this Standard, the definitions specified in JIS C 5942 apply. 3 Atmospheric conditions for measurement 3.1 Standard conditions Unless otherwise specified the measurements shall be carried out under the standard condit
16、ions (temperature 15 O C to 35 O C , relative hu- midity 25 % to 85 % and air pressure 860 hPa to 1060 hPa) specified in 4.1 of JIS C 5001. If any doubt arises on the decision of the measured values under the standard conditions or if required especially the conditions of 3.3 shall be employed. If i
17、t is necessary to convert the measured data to that under the reference conditions, the conditions of 3.2 shall be employed as the basis. When it is difficult to carry out the measurements under this standard conditions, the measurements may be carried out under the conditions other than the standar
18、d Conditions if there is no dispute on the decision. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:27:58 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 C 5
19、943 : 1997 3.2 Reference conditions The reference conditions shall be that specified in 4.2 of JIS C 5001 (temperature 25 OC, relative humidity 45 % and air pressure 860 hPa to 1060hPa). However, only the temperature may be employed as the reference condition. 3.3 Referee conditions The referee cond
20、itions shall be the referee condition III, temperature grade 2 and relative humidity grade 2 temperature (2522) OC, relative humidity 45 % to 55 % and air pressure 860 hPa to 1060 hPa1 specified in 4.3 of JIS C 5001. 4 Measurement apparatus and equipment 4.1 Measurement power supply The d.c. power s
21、upply shall be of a ripple con- tent not exceeding 3 %, and the a.c. power supply shall be of a higher harmonic con- tent not exceeding 5 %. However, in the case of power frequency, the higher harmonic content shall be not mor than 10 %. Especially in the test in which the a.c. output is measured, t
22、he ripple content of d.c. power supply, higher harmonic content of a.c. power supply and the a.c. imped- ance of the d.c. power supply circuit through which a.c. current flows shall be made small to avoid the influence on the measurements. Further, enough protective means shall be provided against e
23、ntry of surges. 4.2 Instrument and measuring apparatus Unless otherwise specified, the in- strument shall be that of class index 0.5 specified in JIS C 1102, and the measur- ing apparatus shall have at least the equivalent accuracy, and their impedances shall be such that the influence on the measur
24、ing system is negligible. Remarks : If there is no instrument of class index 0.5 or better or measuring apparatus of equivalent accuracy as the standard product, the pro- vision of 4.2 does not apply. 4.3 Optical power meter The optical power meter shall be calibrated at the ap- propriate wavelength
25、 and shall have sufficiently flat sensitivity profile on its photo- receptive plane. 4.4 Optical spectrum analyzer The optical spectrum analyzer to be used for the measurements shall have, at the appropriate wavelength, enough dynamic range (enough low stray light), accuracy on abscissa (wavelength)
26、 and ordinate (level), and resolving power to separate emission spectrum. 5 Appearance The appearance shall be checked by means of a stereomicroscope andor metallurgical microscope in addition visual check. 6 Measuring methods of electrical and optical characteristics 6.1 Forward current (Id 6.1.1 P
27、urpose The purpose is to measure the forward current under specified con- ditions. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:27:58 MDTNo reproduction or networking permitted withou
28、t license from IHS -,-,- STD-JIS C 5943-ENGL 1997 M 4933608 054742b 321 Y C 5943 : 1997 6.1.2 Measuring circuit Carry out the measurement of forward current in the circuit of Fig. 1, in accordance with the method stated below. 6.1.3 Measuring method Let the laser diode to emit the specified radiant
29、power Po by applying a forward voltage, and measure the forward current If at that time. This measurement may be carried out by such a method that a current-voltage waveform is displayed on the picture plane of oscilloscope by using an a.c. power supply not exceeding 1 kHz. If the laser diode consum
30、es fairly large power and the temperature rise of the junction due to this power consumption largely affects the measured values, carry out the measurement by either of the methods given below and clearly state the method. (1) Use a d.c. power supply and carry out the measurement after the thermal e
31、qui- librium has been achieved. If the thermal equilibrium is not achieved, carry out the measurement after a prescribed time from initiation of application of the specified voltage. (2) Use pulses, or carry out the measurement in a short time so that the tempera- ture rise of the junction is neglig
32、ible. When pulses are used, clearly state the pulsewidth and duty cycle. 6.1.4 Precaution for measurement The photo-receptive plane of the optical power meter shall have enough size to receive total quantity of light to be emitted. Mini- mize the quantity of light returning from the photo-receiver o
33、f optical power meter to the laser diode. A measuring system employing an integrating sphere (Fig. 2) may be used instead of the optical power meter. Take care so that the radiant power Po of the laser diode caused by application of the forward voltage does not exceed the absolute maximum rated valu
34、e. 6.1.5 Items to be specified in detail specifications (1) Operating temperature To, (2) Forward voltage Vf or radiant power Po Optical power I Zeter I R : protective resistor : d.c. ammeter : d.c. voltmeter - E : d.c. power supply Fig. 1 Measurement of forward current, forward voltage, radiant pow
35、er, threshold current and radiant power at threshold Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 22:27:58 MDTNo reproduction or networking permitted without license from IHS -,-,- STD.J
36、IS C 5943-ENGL 1997 m 4933b08 0549427 2b8 m 4 C 5943 : 1997 II I - 4 I f Vf I d.c. ammeter : d.c. voltmeter R : protectiveresistor E d.c. power supply DET : photo-receptive element s : screen Fig. 2 Measurement of forward current, forward voltage, radiant power, threshold current and radiant power a
37、t threshold using integrating sphere Remarks 1 The internal resistance of voltmeter shall be sufficiently large as compared with the resistance of the laser diode so that the mea- sured values are not influenced. 2 When an integrating sphere is used, the measuring device and the aperture shall be su
38、ficiently small as compared with the surface area of integrating sphere. The inside surface of integrating sphere and the screen shall be coated with a paint with a constant diffu- sion reflectivity (0.8 at the minimum). 6.2 Forward voltage (Vf) 6.2.1 Purpose The purpose is to measure the forward vo
39、ltage under specified con- ditions. 6.2.2 Measuring circuit Carry out the measurement of forward voltage in the circuit of Fig. 1, in accordance with the method stated below. 6.2.3 Measuring method Let the laser diode to emit the specified radiant power Po by applying a forward current II., and meas
40、ure the forward voltage Vf at that time. This measurement may be carried out by such a method that a current-voltage waveform is displayed on the picture plane of oscilloscope by using an a.c. power supply not exceeding 1 kHz. If the laser diode consumes fairly large power and the temperature rise o
41、f the junction due to this power consumption largely affects the measured values, carry out the measurement by either of the methods given below, and clearly state the met hod. (1) Use a d.c. power supply and carry out the measurement after the thermal equi- librium has been achieved. If the thermal
42、 equilibrium is not achieved, carry out the measurement after a prescribed time from initiation of emission of the specified radiant power. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/13/2007 2
43、2:27:58 MDTNo reproduction or networking permitted without license from IHS -,-,- STD.JIS C 5743-ENGL I997 m 4933608 0549428 l1T4 m 5 C 5943 : 1997 (2) Use pulses, or carry out the measurement in a short time so that the tempera- ture rise of the junction is negligible. When pulses are used, clearly
44、 state the pulsewidth and the duty cycle. 6.2.4 Precaution for measurement The photo-receptive plane of the optical power meter shall have enough size to receive total quantity of light to be emitted. Mini- mize the quantity of light returning from the photo-receiver of optical power meter to the la
45、ser diode. A measuring system employing an integrating sphere (Fig. 2) may be used instead of the optical power meter. Take care so that the radiant power Po of the laser diode caused by application of the forward current does not exceed the absolute maximum rated value. 6.2.5 Items to be specified
46、in detail specifications (1) Operating temperature Top (2) Forward current If or radiant power Po 6.3 Reverse voltage (Vr) 6.3.1 Purpose The purpose is to measure the reverse voltage under specified con- ditions. 6.3.2 Measuring circuit Carry out the measurement of reverse voltage in the circuit of
47、Fig. 3 in accordance with the method stated below. 6.3.3 Measuring method Pass the specified reverse current Ir through the laser diode, and measure the reverse voltage Vr at that time. This measurement may be carried out by such a method that a current-voltage waveform is displayed on the picture p
48、lane of oscilloscope by using an a.c. power supply not exceeding 1 kHz. If the laser diode consumes fairly large power and the temperature rise of the junction due to this power consumption largely affects the measured values, carry out the measurement by either of the methods given below and clearl
49、y state the method. (1) Use a d.c. power supply and carry out the measurement after the thermal equi- librium has been achieved. If the thermal equilibrium is not achieved, carry out the measurement after a prescribed time from initiation of passing the specified current. (2) Use pulses, or carry out the measurement in a sho