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1、STD*JIS R 31Ob-ENGL 1978 D 4733b08 0553738 O02 = JIS JAPANESE INDUSTRIAL STANDARD Translated and Published by Japanese Standards Association Testing method on transmittance, reflectance and emittance of flat glasses and evaluation of solar heat gain coefficient ICs 81.040.20 Descriptors : flat glass
2、, transmittance, reflection factor, daylight factor, solar radiation, solar power, optical measurement Reference number : JIS R 3106 : 1998 (E) 12 s Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30
3、/2008 04:13:59 MDTNo reproduction or networking permitted without license from IHS -,-,- R 3106 : 1998 Foreword This translation has been made based on the original Japanese Industrial Standard revised by the Minister of International Trade and Industry through deliberations at Japanese Industrial S
4、tandards Committee in accordance with the Industrial Standardization Law. Consequently JIS R 3106 : 1985 is replaced with JIS R 3106 : 1998. Date of Establishment: 1985-02-01 Date of Revision: 1998-03-20 Date of Public Notice in Official Gazette: 1998-03-20 Investigated by: Japanese Industrial Stand
5、ards Committee Divisional Council on Ceramics JIS R 3106:1998, First English edition published in 1999-03 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to the contents, the original JIS is to be the
6、 final authority. . O JSA 1999 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. Printed in Japan Co
7、pyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 04:13:59 MDTNo reproduction or networking permitted without license from IHS -,-,- . STD-JIS R 3LOb-ENGL 1998 Li933b08 0553940 7b0 = JAPANESE IND
8、USTRIAL STANDARD JIS R 3106 1998 Testing method on transmittance, reflectance and emittance of flat glasses and evaluation of solar heat gain coefficient Introduction This Standards is the Japanese Industrial Standard prepared on the ba- sis of IS0 9060 Glass in building-Determination of light trans
9、mittance, solar direct transmittance, total solar energy transmittance and ultra violet transmittance, and re- lated glazingfactors, published as the first edition in 1990, without altering the techni- cal contents as to the corresponding parts. A part of the specified values (ultraviolet radiation
10、transmittance and color rendering properties), however, has not been em- ployed. 1 Scope This Japanese Industrial Standard specifies the testing methods to obtain the transmittance and reflectance for visible light and the transmittance, reflectance and absorptance for solar radiation, as well as th
11、e emissivity of thermal radiation at or- dinary temperature of the flat glasses () for buildings using the spectrophotometer, and the method to calculate the solar heat gain coefficient when these flat glasses are used in the windows of building. Note () The flat glasses mean those as given in the f
12、ollowing. However, such glasses of diffuse transmitting property as the figured glass and the like are excluded. Those flat glasses which have been manufactured by a continuous moulding process mainly using the soda lime silicate glass as the ma- terial. Those which have been processed with optical
13、thin film of wavelength selective reflection on the surface of a), i.e., the reflecting glass of the wavelength region of solar radiation such as solar reflective glass and the like, and the reflecting glass of the wavelength region of ordinary temperature thermal radiation such as low radiation gla
14、ss and the like. The laminated glass, tempered glass, heat-strengthened glass, etc. which have been processed with a) orb). The sealed insulating glass using the glass plates of a) to c) as the ma- terial. 2 Normative references The following standards contain provisions which, through reference in
15、this Standard, constitute provisions of this Standard. The most recent editions of the standards indicated below shall be applied. JIS R 3107 Evaluation on thermal resistance of flat glasses and thermal transmit- tance of glazing Copyright Japanese Standards Association Provided by IHS under license
16、 with JSALicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 04:13:59 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 R 3106 1998 JIS Z 8 1 13 JIS Z 8120 JIS Z 8401 Glossary of lighting terms Glossary of optical terms Rules for rounding off of nu
17、merical values 3 Definitions Z 8120 shall apply, and the rest of the terms shall be in accordance with the following. For the purpose of this Standard, the definitions in JIS Z 8113 and JIS visible light transmittance (visible light reflectance) As to the luminous flux (3) of incident daylight (7 pe
18、rpendicular to the glass surface, a ratio of the transmitted luminous flux (reflected luminous flux) to the incident luminous flux. Notes (2) (3) Herein, the daylight means the CIE daylight defined by the Interna- tional Commission on Illumination (abbreviated as CIE). In the CIE daylight, on the ba
19、sis of data of observation the spectral illuminance distribution of the daylight of the same color temperature as the color temperature of black body radiation is indicated by a relative value to the value of 560 nm in wavelength. The luminous flux shall be indicated by integrating the product of th
20、e radiant energy flux on each wavelength of radiation and the value of spectral luminous efficacy in wavelength (see JIS Z 8113 and JIS Z 8120). solar radiation transmittance (solar radiation reflectance) As to the radiant ener- gy flux of incident solar radiation (4) perpendicular to a glass surfac
21、e, a ratio of transmitted radiant energy flux (reflected radiant energy flux) to the incident radi- ant energy flux. Note (4) The solar radiation, herein, means the direct solar radiation, i.e., the ra- diation of near ultraviolet, visible and near infrared wavelength regions (300 nm to 2 500 nm) wh
22、ich reach directly to the ground transmitting through the atmosphere. light Irrespective of the distinction between the luminous flux and the radiant energy flux in the definitions of above mentioned a) and b), the “light“ and “radia- tion“ to be used in the terms of the “light spectrum“, “light mea
23、surement“, ray of light“ are synonymous, and are applied to the radiation of near ultraviolet, visible light and infrared. emissivity A ratio of the radiant flux (radiant power) of thermal radiation which is radiated into the space by a glass plate to the radiant flux of thermal radiation which is r
24、adiated by a black body of the same temperature. solar heat gain coefficient As to the incident solar radiation vertical to the win- dow glass surface, a ratio of the sun of the radiant energy flux of solar radiation which transmits the glass portion and the thermal current flux which has been ab- s
25、orbed in the glass and being transmitted to indoor side to the radiant energy flux of the incident solar radiation. Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 04:13:59 MDTNo reproduction
26、 or networking permitted without license from IHS -,-,- , 3 R 3106 1998 4 Measurement of spectral transmission factor and spectral reflection factor 4.1 Summary As regards the single glass plate, the measurement shall be carried out on itself, and as regards the sealed insulating glass, it shall be
27、carried out on the glass plates of the material thereof. In the measurement within the wavelength region of the visible light and solar ra- diation, measure the spectral transmission factor and spectral reflection factor of the wavelength given in Attached Table 1 as to the visible light, and in Att
28、ached Table 2 as to the solar radiation by the methods given in 4.3.2, using the spectrophotometer of 4.3.1. In the measurement within the wavelength region of the ordinary temperature thermal radiation, measure the spectral reflectance of the wavelength given in Attached Table 3 by the method given
29、 in 4.4.2, using the spectrophotometer of 4.4.1. 4.2 Sample In the case of the single glass plate, a segment cut out from itself, and in the case of the sealed insulating glass, the segments cut out from respective glass plates which are the material thereof shall be taken as the samples. The sample
30、s shall be those which have been cut out from the plate glass manufac- tured under the same conditions as the products or thin film processed plate glass and the like. Particularly in the case of the thin film processed glass, when being accom- panied with storage, transportation and the like from t
31、he manufacture of samples until the measurements, the surfaces of samples shall be kept free from damages and stains under dried condition. 4.3 Measurement i n the wavelength regions of visible light and solar radiation 4.3.1 Spectrophotometer The spectrophotometer to be used in the measurement shal
32、l be attached with the integrating sphere for light acceptance to the spectropho- tometer of the near ultraviolet, visible light and near infrared wavelength regions for the general chemical analysis, and shall satisfy the following conditions. Wavelength range The range of wavelength scale shall be
33、 300 nm to 2 500 nm, and shall be that of having the photometric accuracy in the range of 300 nm to 2 100 nm mentioned below in c). Resolving power The resolving power shall be 5 nm or under in the wavelength of under 380 nm, 10 nm or under in the wavelength of 380 nm to 780 nm, and 50 nm or under i
34、n the wavelength of over 780 nm. Photometric accuracy In the wavelength range of 780 nm or under, the accura- cy of photometric value shall be 1 % or under of the maximum scale, and the re- peatability shall be 0.5 % or under, and in the wavelength range of exceeding 780 nm, those shall be 2 % or un
35、der and 1 % or under respectively. Wavelength accuracy The bias of the wavelength scale of the spectro- photometer shall be 1 nm or under from the center wavelength of the transmit- Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User
36、=Japan, IHS Not for Resale, 07/30/2008 04:13:59 MDTNo reproduction or networking permitted without license from IHS -,-,- STD. J I S R 310b-ENGL 97T 4 R 3106 1998 ting wavelength region of the spectroscope in the wavelength range of 780 nm or under, and be 5 nm or under in the wavelength range excee
37、ding 780 nm. 4.3.2 Measuring method As to the spectral transmission factor and spectral reflec- tion factor, measure the values at the wavelength given in Attached Table 1 or Attached Table 2. 4.3.2.1 Measurement of spectral transmission factor Inject a nearly parallel bundle of rays coming out of t
38、he exit slit of the spectrophotometer conforming to 4.3.1 from the normal direction of the sample surface, and measure the spectral transmission factor T ( A ) in the direction of its transmitted light. Take the air layer when the sample is not inserted into the light path as the standard sample, an
39、d consider its spectral trans- mission factor to be 1. Remarks : When the angle between both surfaces of the sample exceeds rad, the transmitted light of the sample shall be received by an in- tegrating sphere. 4.3.2.2 Measurement of spectral reflection factor Inject a nearly parallel bundle of rays
40、 coming out of the exit slit of the spectrophotometer conforming to 4.3.1, at an inci- dent angle not exceeding 15O, against the face of the sample of which a light trap has been mounted on the back face, and measure the spectral reflection factor p ( A ) re- ceiving the positive reflecting light by
41、 an integrating sphere. The discrepancy of the optical axes between the surface reflecting light and the primary reflecting light from the back face shall be 2 mm or under. The value of reflectance shall be determined by comparing with the value of the re- flectance of the standard sample. The stand
42、ard mirror finished surface reflecting body shall be the mirror finished surface reflecting body of which reflectance has been deter- mined by the absolute-reflectance measuring method. As to the standard sample for comparison, the standard mirror finished surface reflecting body or the mirror finis
43、hed surface reflecting body of which reflectance has been determined by the comparison with it, shall be used. 4.4 Measurement i n the wavelength region of ordinary temperature thermal radiation 4.4.1 Spectrophotometer The spectrophotometer to be used in the measurement shall be the infrared spectro
44、photometer for the general chemical analysis with the at- tachment for regular reflection measurement, and shall satisfy the following conditions, a) Wavelength range The wavelength range shall be that of capable of measuring at least 5 um to 25 wm (wave number 2 O00 cm- to 400 cm-), among the wavel
45、ength region 5 um to 50 Lm (wave number 2 O00 cm-“ to 200 cm-) of the thermal radia- tion at ordinary temperature. Resolving power The resolving power shall be 4 cm-* or under in the wave num- ber marking. b) Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS
46、 Employees/1111111001, User=Japan, IHS Not for Resale, 07/30/2008 04:13:59 MDTNo reproduction or networking permitted without license from IHS -,-,- STD-JIS R 310b-ENGL 1778 D Li733b08 0553944 30b = 5 R 3106 : 1998 c) Photometric accuracy The photometric scale shall be graduated by the compari- son
47、with the reflection radiant energy flux from the standard sample of known spectral reflection factor, and the accuracy of photometric value shall be 2 % or un- der of the maximum scale, and the repeatability shall be 1 % or under. Wavelength accuracy The bias of the wavelength scale of the spectroph
48、otometer shall be 1 cm- or under from the central wave number of the transmission wave- length region of the spectrophotometer, in the wave number marking. d) 4.4.2 Measurement of spectral reflection factor Inject the radiation ray flux onto the sample surface at an incident angle not exceeding 15“,
49、 and measure the regular reflec- tion flux in respect to the wavelengths given in Attached Table 3. For the standard sample for comparison, the surface mirror which has been vac- uum evaporated with aluminum on the surface of float plate glass shall be used. The standard conditions of the vacuum evaporation shall be a