IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf

上传人:哈尼dd 文档编号:3658598 上传时间:2019-09-19 格式:PDF 页数:14 大小:213.29KB
返回 下载 相关 举报
IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf_第1页
第1页 / 共14页
IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf_第2页
第2页 / 共14页
IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf_第3页
第3页 / 共14页
IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf_第4页
第4页 / 共14页
IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf_第5页
第5页 / 共14页
亲,该文档总共14页,到这儿已超出免费预览范围,如果喜欢就下载吧!
资源描述

《IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf》由会员分享,可在线阅读,更多相关《IEEE Std 475-2000 IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz.pdf(14页珍藏版)》请在三一文库上搜索。

1、 The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2000 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2000. Printed in the United States of America. Print: ISBN 0-7381-2492-3SH94855

2、 PDF: ISBN 0-7381-2493-1 SS94855 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher. IEEE Std 475-2000 (Revision of IEEE Std 475-1983) IEEE Standard Measurement Procedure for Field Disturban

3、ce Sensors 300 MHz to 40 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 30 March 2000 IEEE-SA Standards Board Abstract: Test procedures for microwave field disturbance sensors to measure radio frequency (RF) radiated field strength of the funda

4、mental frequency, harmonic frequencies, near field power flux density, and nonharmonic spurious emissions of sensors operating within the frequency range of 300 MHz to 40 GHz are defined. Keywords: field disturbance sensors, field strength measurements, measurement instrumentation, spurious emission

5、s, test sites, test reports Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from IEEE Xplore. Restrictions apply. IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Com- mittees of the IEEE Standards A

6、ssociation (IEEE-SA) Standards Board. Members of the committees serve voluntarily and without compensation. They are not necessarily members of the Institute. The standards developed within IEEE represent a consensus of the broad expertise on the subject within the Institute as well as those activit

7、ies outside of IEEE that have expressed an interest in participating in the development of the standard. Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and

8、services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. Every IEEE Standard is subjected to

9、 review at least every fi ve years for revision or reaffi rmation. When a document is more than fi ve years old and has not been reaffi rmed, it is rea- sonable to conclude that its contents, although still of some value, do not wholly refl ect the present state of the art. Users are cautioned to ch

10、eck to determine that they have the latest edition of any IEEE Standard. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affi liation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together w

11、ith appropriate supporting comments. Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specifi c applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepare appropr

12、iate responses. Since IEEE Standards represent a consensus of all concerned interests, it is important to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not a

13、ble to provide an instant response to interpretation requests except in those cases where the matter has previously received formal consideration. Comments on standards and requests for interpretations should be addressed to: Secretary, IEEE-SA Standards Board 445 Hoes Lane P.O. Box 1331 Piscataway,

14、 NJ 08855-1331 USA IEEE is the sole entity that may authorize the use of certifi cation marks, trademarks, or other designations to indicate compliance with the materials set forth herein. Authorization to photocopy portions of any individual standard for internal or personal use is granted by the I

15、nstitute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus- tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permissi

16、on to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copy- right Clearance Center. Note: Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publicatio

17、n of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an IEEE standard or for conducting inquiries into the legal validity or sc

18、ope of those patents that are brought to its attention. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from IEEE Xplore. Restrictions apply. Copyright 2000 IEEE. All rights reserved. iii Introduction (This introduction is not part of IEEE Std 47

19、5-2000, IEEE Standard Measurement Procedure for Field Disturbance Sen- sors 300 MHz to 40 GHz.) This standard describes a test procedure for measurement of radio frequency (RF) emissions from micro- wave fi eld disturbance sensors to assist manufacturers, standard laboratories, and test engineers in

20、 determin- ing compliance with established technical specifi cations. The IEEE Standards Association (IEEE-SA) Standards Board authorized the IEEE Electromagnetic Com- patibility Society Standards Committee to update IEEE Std 475-1983 for consistency with other standards and regulatory requirements.

21、 This revision was prepared by an appointed subcommittee of the Standards Development Committee of the Electromagnetic Compatibility Society. The members of this subcommittee were: Hugh W. Denny, Chair The following members of the balloting committee voted on this standard: When the IEEE-SA Standard

22、s Board approved this standard on 30 March 2000, it had the following membership: Donald N. Heirman, Chair James T. Carlo, Vice Chair Judith Gorman, Secretary *Member emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Alan Cookson, NIST Representative Donald R. Volz

23、ka, TAB Representative Noelle D. Humenick IEEE Standards Project Editor Edwin L. Bronaugh Joseph E. Butler Franz Gisin Donald N. Heirman John D. Osburn Art Wall H. Stephen Berger Edwin L. Bronaugh Joseph E. Butler Hugh W. Denny Andrew Drozd Donald N. Heirman Daniel D. Hoolihan John G. Kraemer Risabu

24、ro Sato Ralph M. Showers Donald L. Sweeney David L. Traver Satish K. Aggarwal Mark D. Bowman Gary R. Engmann Harold E. Epstein H. Landis Floyd Jay Forster* Howard M. Frazier Ruben D. Garzon James H. Gurney Richard J. Holleman Lowell G. Johnson Robert J. Kennelly Joseph L. Koepfi nger* Peter H. Lips

25、L. Bruce McClung Daleep C. Mohla James W. Moore Robert F. Munzner Ronald C. Petersen Gerald H. Peterson John B. Posey Gary S. Robinson Akio Tojo Donald W. Zipse Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from IEEE Xplore. Restrictions apply.

26、 iv Copyright 2000 IEEE. All rights reserved. Contents 1.Overview 1 1.1 Scope 1 1.2 Applications. 1 1.3 Description. 1 2.References 2 3.Definitions 3 4.Measurement instrumentation 3 4.1 General. 3 4.2 Receiver monitoring. 4 4.3 Calibration of measuring equipment 4 4.4 Measurement uncertainty. 5 5.Te

27、st facilities 5 5.1 General requirements. 5 5.2 Test-site requirements 5 6.General equipment configuration and operating conditions 5 6.1 Field disturbance sensor operating condition 5 6.2 Grounding 6 6.3 Shock and vibration isolators. 6 6.4 Temperature. 6 6.5 Humidity 6 7.Radiated emission testing

28、6 7.1 Measurement requirements 6 7.2 Measurement procedure. 6 8.Conducted emissions . 7 8.1 Applicability 7 8.2 Measurement procedure. 7 9.Test report 7 9.1 Field disturbance sensor description 8 9.2 Measuring equipment. 8 9.3 Test-site parameters. 8 9.4 Test procedure description. 8 9.5 Test data s

29、ummary. 8 9.6 Test data. 9 Annex A (informative)Bibliography 10 Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from IEEE Xplore. Restrictions apply. Copyright 2000 IEEE. All rights reserved. 1 IEEE Standard Measurement Procedure for Field Distur

30、bance Sensors 300 MHz to 40 GHz 1. Overview 1.1 Scope This standard defi nes test procedures for microwave fi eld disturbance sensors to measure radio frequency (RF) radiated fi eld strength of the fundamental frequency, harmonic frequencies, near fi eld power fl ux den- sity, and nonharmonic spurio

31、us emissions of sensors operating within the frequency range of 300 MHz to 40 GHz. Field disturbance perimeter protection systems that employ a balanced transmission line around the property being protected are not covered by this standard. 1.2 Applications Specifi c types of fi eld disturbance sens

32、ors to which this standard applies are as follows: a)RF intrusion detector b)Production line counter detector c)Anti-shoplifting detector d)Level sensor 1.3 Description 1.3.1 Field disturbance sensor A fi eld disturbance sensor is a device that employs a highly localized source of RF energy to detec

33、t the motion or presence of an object in the vicinity of the source, and in which the emitter and receiver (or detec- tor) are essentially at the same point, that is, a space-protected system. Authorized licensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from

34、IEEE Xplore. Restrictions apply. IEEE Std 475-2000IEEE STANDARD MEASUREMENT PROCEDURE FOR 2 Copyright 2000 IEEE. All rights reserved. 1.3.2 Characteristics A typical single channel microwave fi eld disturbance sensor operates at a nominal radiated center frequency of 0.915 GHz, 2.450 GHz, 5.800 GHz,

35、 10.525 GHz, or 24.125 GHz. It commonly employs a Gunn-type diode as a microwave oscillator, which is mounted in a waveguide cavity and coupled to a horn antenna or other directional radiator. It establishes an RF fi eld which, when perturbed by the motion of an intruder or refl ecting object in thi

36、s fi eld, causes a change (doppler shift) in the frequency of the microwave signal. The sensors receiver accepts a signal coupled directly from the internal oscillator and the external signals refl ected from the illuminated area. If the microwave frequency of the refl ected signal differs from that

37、 of the internal oscillator, this small difference in frequency is detected, amplifi ed, and used to activate an alarm or indicator. Since area coverage requirements vary in different installations, some fi eld disturbance sensors are provided with optional antennas offering a selection of different

38、 radiation beam widths. Some sensors emit a signal without intentional modulation, while others employ frequency, amplitude, or pulse modulation. Field disturbance sensors that contain digital processing circuitry may be classed as unintentional radiating or computing devices by the regulatory autho

39、rity. 2. References This standard shall be used in conjunction with the following publications. ANSI C63.2-1987, American National Standard for Electromagnetic Noise and Field Strength, 10 kHz to 40 GHzSpecifi cations. 1 ANSI C63.4-1992, American National Standard for Methods of Measurement of Radio

40、-Noise Emissions from Low-Voltage Electrical and Electronics Equipment in the Range of 9 kHz to 40 GHz. ANSI C63.14-1992, American National Standard Dictionary for Technologies of Electromagnetic Compati- bility (EMC), Electromagnetic Pulse (EMP), and Electrostatic Discharge (ESD). ANSI/NCSL Z540.1-

41、1994, American National Standard for CalibrationCalibration Laboratories in Mea- suring Test EquipmentGeneral Requirements. ANSI/NCSL Z540.2-1997, American Nation Standard for Expressing UncertaintyUS Guide to the Expression of Uncertainty in Measurement. CISPR 22:1993, Limits and Methods of Measure

42、ment of Radio Disturbance Characteristics of Information Technology Equipment, Second edition. 2 IEEE Std 149-1979 (Reaff 1990), IEEE Standard Test Procedures for Antennas. 3 IEEE Std 474-1973, IEEE Standard Specifi cations and Test Methods for Fixed and Variable Attenuators, DC to 40 GHz. 4 1 ANSI

43、publications are available from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA (http:/www.ansi.org/). 2 CISPR documents are available from the International Electrotechnical Commission, 3, rue de Varemb, Case Postale 131, CH 1211

44、, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). They are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA. 3 IEEE publications are available from the Institute of Electrical and Electron

45、ics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/). 4 IEEE Std 474-1973 has been withdrawn; however, copies can be obtained from Global Engineering, 15 Inverness Way East, Engle- wood, CO 80112-5704, USA, tel. (303) 792-2181 (http:/ Authorized lic

46、ensed use limited to: Peking University. Downloaded on December 26,2010 at 15:40:58 UTC from IEEE Xplore. Restrictions apply. IEEE FIELD DISTURBANCE SENSORS 300 MHZ TO 40 GHZStd 475-2000 Copyright 2000 IEEE. All rights reserved. 3 IEEE Std C95.1-1991, 1999 Edition, IEEE Standard for Safety Levels wi

47、th Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz. IEEE Std C95.3-1991, IEEE Recommended Practice for the Measurement of Potentially Hazardous Electromagnetic FieldsRF and Microwave. 3. Defi nitions For defi nitions of terms used, see ANSI C63.14-1992 and The I

48、EEE Standard Dictionary of Electrical and Electronic Terms B5. 4. Measurement instrumentation 4.1 General Use of proper measurement instrumentation is critical to obtaining accurate, reproducible results. 4.1.1 Measuring instruments The measurement instrument chosen for each required measurement sha

49、ll satisfy the minimum specifi ca- tions herein. 4.1.1.1 Power fl ux density The instrument used to measure power fl ux density shall comply with IEEE Std C95.3-1991. 4.1.1.2 Frequency The fundamental transmitter frequency ( f o ) shall be measured. A spectrum analyzer, receiver, microwave fre- quency counter, or commercial frequency meter may be used, provided the frequency of the measurement instrument is accurate enough to ensure that the device is operating within the specifi ed frequency band. 4.1.1.3 Field strength The fi eld strength shall be

展开阅读全文
相关资源
猜你喜欢
相关搜索

当前位置:首页 > 其他


经营许可证编号:宁ICP备18001539号-1