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1、BRITISH STANDARD CONFIRMED NOVEMBER 1986 BS 9300 C534 ISSUE 1 APRIL 1971 Electronic parts of assessed quality Silicon coaxial resistive switching diode Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C5
2、34 ISSUE 1 APRIL 1971 BSI 03-2000 ISBN 0 580 34380 4 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal o
3、bligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front co
4、ver. Amendments issued since publication Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C534 ISSUE 1 APRIL 1971 BSI 03-2000i Contents Page Table 1 Group A. Inspection3 Table 2 Grou
5、p B Inspection4 Table 3 Group D Inspection6 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9300 C534 ISSUE 1 APRIL 1971 ii BSI 03-2000 1. Specification CV 7534 Issue 1 dated 7 May 1964 with its existing ame
6、ndments which are reproduced below is hereby adopted as BS 9300 C534. 2. Devices inspected, released and supplied to this specification shall be marked CV 7534 and where applicable, with the letters KB. 3. The references to “Military specification”. “Commercial equivalents”. “Reliability assurance p
7、rovisions” or requirements and “Preparation for delivery” shall be disregarded. 4. In the Groups A, B and C inspection tables the references in the “K1007/NATO Ref” column shall be superseded by the appropriate reference given in BS 9300 Appendix C (Table 1 to Table 5 inclusive). 5. Additional requi
8、rements not covered by BS 9300 Appendix C are: 6. Published amendments (consolidated). Page 2.Delete “Joint Services Catalogue Number” and substitute “NATO stock number”; Delete “5960” and substitute “5961”. Page 4.Group B. Subgroup 2. Moisture resistance. The test shall be performed at temperature
9、= 35 2 C and at AQL 6.5 %. Page 4.Group B. Subgroup 7. The requirement for high temperature life shall not be deleted but shall be performed as specified. Group B. Subgroup 8. The operation life test shall be performed at inspection level S-4, AQL 6.5 %, for 160 hours under the conditions specified.
10、 Add Group C. Subgroup 5, Operation life, as in Group B, subgroup 8, but at inspection level S-3 for 2 000 hours. Page 6.Group D. Delete all requirements. Page 3.Group A. Subgroup 4. Minimum v.s.w.r. Test (1) position. Amend max. limit to read 1.99. Test (2) position. Amend max. limit to read 1.19.
11、Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 BSI 03-20001 Military specification CV 7534 Semi-conductor devices, diode Absolute Maximum Ratings: Primary Electrical Character
12、istics: Requirements Description:This Specification covers the detail requirements for a Silicon Coaxial Resistive Switching Diode and is in accordance with K1007 except where otherwise stated. Mechanical Dimensions and Outline:See Page 8 (Also Note A) Polarity:Red mark on body indicates positive po
13、larity of pin for forward bias. Device RatingTambTstgVRIRIFPtotPpkShockVib UnitCCVmAmAWWgg CV 7534 Min. Max. 100 55 120 50 5 75 1 50 100 10 NoteBC NOTES:A.When plugged into a holder contact is made to the open face shown in plane AA of the diode outline drawing Page 8. B.The maximum value quoted is
14、the total power dissipation inclusive of that contributed by the d.c. switching. C.The quoted value is the maximum value of incident power which may be applied to the diode when the mismatch in the coaxial mount presents a v.s.w.r. greater than 10 : 1 and when the r.f. pulse width does not exceed 10
15、 4secs. It is recommended that a small negative bias of about 5 volts be applied to the diode when it is used to switch power values which approach the maximum in order to reduce the effect of possible admittance changes. Where the mismatch provides a v.s.w.r. less than 10 : 1 the maximum power valu
16、e or pulse width must be reduced, for example, should the diode present a matched condition the pulse width must not exceed 4 4secs for an incident power level of 50 watts. CharacteristicIFVRIRVFFreq. Rangetpv.s.w.r.v.s.w.r. UnitmAVmAVMc/s/4sRatioRatio Min1 000 Max75 50 51.211,0000.50.10.1 NoteD.E.F
17、.G,HG,J NOTE D.At 50 mA. (A typical value at 50 mA forward current is 0.85 volts.) E.The actual frequency band over which the diode operates will depend on the design of the mount used. With a suitable mount, switching discrimination greater than 20 dB may be obtained. Typical operating characterist
18、ics are given on page 7. F.The switching time quoted is that obtained when switching over 15 dB range with diode set up in a suitable holder. G.As measured in a coaxial-type holder previously adjusted for unity v.s.w.r. when terminated by a matched 67 Ohms coaxial load. H.At zero bias. J.At 50 mA IF
19、. Reliability Assurance Requirements:Under discussion MarkingThe device shall be marked first with the CV number and a polarity marking. The date code shall appear on multiple packs of 100 or more and the manufacturers code on individual packs. Additional marking as K1007, Issue 3, Section B, 1.3.4
20、shall be on the packing. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 2 BSI 03-2000 Quality Assurance Provisions Preparation for Delivery Joint Services Catalogue Number Thi
21、s specification has been prepared by, and the Qualification Approval Authority is: Ministry of Aviation, Royal Radar Establishment, Malvern, Worcestershire, England. Destructive TestsThe tests listed in Table 2, Group B Inspection, Sub Group 3 are considered destructive. PackagingThe device shall be
22、 packed according to K1007 Issue 3. Section A 1.2.(c). No lead shield is required. CV 7534= 5960-99-037-3784 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 BSI 03-20003 Table
23、1 Group A. Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific conditions Min.Max. SUB GROUP 1 Visual and Mechanical Inspection SUB GROUP 2 Reverse Current v.s.w.r. (1) v.s.w.r. (2) SUB GROUP 3 Omitted SUB GROUP 4 Forward Voltage 5.1 8A.2.2 8
24、B.3.6 8B.3.6 8A.3.2 P(r.f) = 0 VR = 50 V Notes 1 and 3 f = 9 375 Mc/s 25 Mc/s. V = 0, P(r.f.) u 100 mW Notes 1 and 3 f = 9 375 Mc/s. 25 Mc/s. I0 = 50 mA, P(r.f.) u 100 mW Notes 1 and 3 IF= 50 mA, P(r.f.) = 0 0.65 0.65 6.5 I II IA IR VF 5 0.1 0.1 1.2 mA Ratio Ratio V Minimum v.s.w.r Test (1) Position
25、 Test (2) Position Electrical Angle Differential between minima positions L1 and L2 8B.3.6f = 9 375 Mc/s 25 Mc/s. P(r.f.) u 100 mW I0 = 0 Notes 1, 2, 3 I0 = 50 mA Notes 1, 2, 3 Note 4 L1 L2 1.73 0.93 160 1.97 1.17 200 cms cms degsL 1L2 Licensed Copy: London South Bank University, London South Bank U
26、niversity, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 4 BSI 03-2000 Table 2 Group B Inspection (See Page 2, Quality Assurance Provisions, Destructive Tests) Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref.
27、 Specific conditionsMin.Max. SUB GROUP 1 Physical SUB GROUP 2 Temperature Cycling Thermal Shock Moisture Resistance Post Sub-Group 2 Tests Reverse Current Forward Voltage SUB GROUP 3 Vibration Fatigue POST SUB-GROUP 3 Tests Reverse Current Forward Voltage SUB-GROUPS 4, 5 & 6 Omitted 5.1 5.5 5.6.2 5.
28、3.1 8A.2.2 8A.3.2 5.15.1 8A.2.2 8A.3.2 As in Drawing Page 8 3 cycles 55 C to 100 C 0 C to 100 C Max Temp. 33 C 2 C As in Group A, Sub-Croup 2. As in Group A, Sub-Group 4. As in Group A, Sub-Group 2 As in Group A, Sub-Group 4 6.5 6.5 6.5 IA IA I IR VF IR VF 5 1.2 5 1.2 mA V mA V SUB GROUP 7 High and
29、Low Temperature Life (Non operating) High Temperature Low Temperature 6.2.1 6.2.2 No Voltages. Tamb = 120 C No Voltages. Tamb = 55 C 6.5 I 150 150 Hours Hours Post High and Low Temperature Tests v.s.w.r. (1) v.s.w.r. (2) 8B.3.6 8B.3.6 As in Group A. Sub-Group 2 As in Group A. Sub-Group 2 0.1 0.1 Rat
30、io Ratio Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 BSI 03-20005 Table 2 Group B Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007
31、/NATO Ref. Specific conditionsMin.Max. Electrical Angle Differential between minima positions L1 and L2 SUB GROUP 8 Operating Life Life Test and points 500 hours Post Life Tests v.s.w.r. (1) v.s.w.r. (2) 6.3 8B.3.6 8B.3.6 As in Group A, Sub-Group 2 I0 = 80 mA, VR40 Vpk f = 50 c/s Tamb at any single
32、temperature between 25 C and 120 C As in Group A. Sub-Group 2 As in Group A. Sub-Group 2 6.5IA 160 1 000 200 0.1 0.1 degs Hours Ratio Ratio L 1L2 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Iss
33、ue 1 7th May 1964 6 BSI 03-2000 Table 3 Group D Inspection Examination or Test Test conditions AQL % Insp. Level Symbol Limits Units K1007/NATO Ref. Specific conditionsMin.Max. Group C Omitted SUB GROUP 1 Retest after 28 days holding period v.s.w.r (1) v.s.w.r (2) Electrical Angle Differential betwe
34、en measured minima positions L1 and L2 8B.3.6 8B.3.6 As in Group A Sub-Group 2 As in Group A Sub-Group 2 As in Group A Sub-Group 4 100 % 160 0.1 0.1 200 Ratio Ratio Degs. NOTES 1. All r.f. measurements shall be made in a coaxial type holder which has previously been adjusted to unity v.s.w.r. when t
35、erminated by a matched 67 ohm coaxial load. 2. The minimum position to be measured in a direction towards the load from the plane “AA” as given in the outline drawing page 8. 3. Applied d.c. source resistance not greater than 50 ohms. 4. This is defined as the phase variation of v.s.w.r. minima whic
36、h is obtained when the d.c. current applied to the diode is changed from that when I0= 0 to a value of I0 = 50 mA. It is expressed as the electrical angle which corresponds to the difference between the measured values of v.s.w.r. position L1 and L2. L 1L2 Licensed Copy: London South Bank University
37、, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 BSI 03-20007 Behaviour of typical diodes over frequency band Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006,
38、 Uncontrolled Copy, (c) BSI K1007/CV7534 Issue 1 7th May 1964 8 BSI 03-2000 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 03:57:51 GMT+00:00 2006, Uncontrolled Copy, (c) BSI blank Licensed Copy: London South Bank University, London South Bank University, Fri D
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