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1、BRITISH STANDARD BS CECC 50000: Supplement No. 1:1983 Harmonized system of quality assessment for electronic components Generic specification: Discrete semiconductor devices Supplement No. 1: CECC assessed process average UDC 621.382 Licensed Copy: London South Bank University, London South Bank Uni
2、versity, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 This British Standard, having been prepared under the direction of the Electronic Components Standards Committee, was published under the authority of the Board of BSI and comes into effect on
3、 31 May 1983 BSI 09-1999 The following BSI references relate to the work on this standard: Committee reference ECL/12 Draft for comment 81/30525 DC ISBN 0 580 11979 3 Committees responsible for this British Standard This British Standard was published under the direction of the Electronic Components
4、 Standards Committee ECL/-. Its preparation was entrusted to Technical Committee ECL/12 upon which the following bodies were represented: British Broadcasting Corporation British Telecom Electronic Components Industry Federation Electronic Engineering Association Ministry of Defence National Supervi
5、sing Inspectorate Telecommunications Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No.Date of issueComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50
6、000:Supplement No. 1:1983 BSI 09-1999i Contents Page Committees responsibleInside front cover National forewordii Forewordiii Text of CECC 500001 Publication referred toInside back cover Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Un
7、controlled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 ii BSI 09-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 50000 “Harmonized system of
8、quality assessment for electronic components. Generic specification : Discrete semiconductor devices, Supplement 1” published in 1982 and is issued as Supplement No. 1 to BS CECC 50000:1981. For general information on terminology, quality assessment procedures, measurement conditions and related doc
9、uments reference should be made to the national foreword in BS CECC 50000. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer
10、 immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the CECC title page, pages ii to iv, pages 1 and 2, an inside back cover and a back cover. This standard has been updated (see copyright date) and may have had amendments
11、incorporated. This will be indicated in the amendment table on the inside front cover. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Licensed Copy: London South Bank University, London South Bank University,
12、Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 ii BSI 09-1999 Contents Page Forewordiii 1General1 2Procedure1 Figure 12 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy
13、, (c) BSI BS CECC 50000:Supplement No. 1:1983 BSI 09-1999iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic componen
14、ts of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate of Conformity. The components produced
15、under the System are thereby accepted by all member countries without further testing. At the date of the printing of this document, the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Sweden, Switzerland and the United K
16、ingdom. Preface This supplement was prepared by CECC Working Group 5 “Semiconductor diodes and transistors”. It was derived from the procedure proposed by CECC Working Group “Point 9” in document CECC (Secretariat) 1049. This supplement applies at present only to discrete semiconductor devices cover
17、ed by CECC 50000 and its subsidiary blank detail specifications. It is intended for use by manufacturers on a voluntary basis during a trial period which will be used to assess its value and practicality. At the end of the trial period, the procedure will be reexamined by CECC Working Group “Point 9
18、” in the light of experience gained during its experimental use. Voting The text of this supplement was circulated to the CECC for voting in the document listed below, and was ratified by the President of the CECC for publication as a CECC specification. DocumentVoting dateReport on the voting CECC
19、(Secretariat) 1120February 1982CECC (Secretariat) 1168 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv blank Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT
20、+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 BSI 09-19991 1 General 1.1 The procedure detailed hereafter is directed primarily to large scale production and is additional to what is prescribed in specifications. It is applicable, on a voluntary basis, when a manufactur
21、er wishes to give information on the “assessed process average” of his production, concerning non-operative devices. NOTEthe term “p.p.m.” was voluntarily discarded. 1.2 Non-operative devices are defined in 4.3.4 1) of CECC 50000, Issue 3, 1980, but the relevant detail specification may give a more
22、precise definition. Structural similarity, as defined in 3.3 and 3.3.1 of CECC 50000, is applicable. 1.3 When a manufacturer uses this procedure, he may declare the results obtained either in the Certified Test Records (RCE) or in the Certificate of Conformity, if used, or in a separate document, pr
23、ovided he refers to the “CECC assessed process average” and follows all the requirements of the procedure. 1.4 There is no need to amend detail specifications, since the use of the procedure is left to the manufacturers decision, but the ONS concerned shall be informed of the decision. 2 Procedure 2
24、.1 Results of inspection for non-operatives in every inspection lot, including rejected lots but not resubmitted lots, are accumulated over a sufficient number of lots to enter the operating part of Figure 1. The number of non-operative devices found is compared with that given in Figure 1 for the a
25、ccumulated sample size and the declared assessed process average. 2.2 The manufacturer can declare the relevant assessed process average only when the accumulated number of non-operatives found is less than given in Figure 1 for the accumulated sample. Assessment then proceeds on a continuing basis
26、with a moving total of allowable non-operatives, based on the accumulated number of tested devices (“accumulated sample size” in Figure 1). 2.3 Each individual inspection lot shall be sampled at least as specified in the detail specification, for non-operative devices, but a larger size may be chose
27、n by the manufacturer, who has to balance economic considerations against the time penalty if too small a sample is chosen. 2.4 It is necessary that the whole sample is tested, irrespective of the results for the release of the lot. For instance, if the AQL specified for non-operatives in the releva
28、nt specification is 0,1 % and the inspection lot is greater than 10 000, with inspection level II this gives a sample of 500 with 1 defective allowed and rejection of the lot on 2 defectives; if 2 defectives are found after only part of the sample has been tested, the lot shall be rejected but all r
29、emaining specimens in the sample shall be tested so that the total number of non-operatives actually found in the sample is recorded in the accumulated total. 2.5 All results shall be accumulated, with the exception of those from resubmitted lots (to avoid counting them twice) and from rogue lots, d
30、efined as those for which the number of non-operatives found is U 5 % of the sample. 2.6 Any defectives found during examination of the sample shall be retained for defect analysis. 2.7 Should the manufacturer fail to satisfy the requirements of Figure 1, corrective action will be taken and recorded
31、 ; release of lots can continue under the normal procedure of the detail specification, but reference to the CECC assessed process average can no longer be made in the documentation, until such time as further sampling has established that the results are again within the specified requirements. Lic
32、ensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 2 BSI 09-1999 Figure 1 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2
33、006, Uncontrolled Copy, (c) BSI BS CECC 50000:Supplement No. 1:1983 BSI 09-1999 Publication referred to See national foreword. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 17:15:01 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS CECC 50000: Supplement No. 1:198
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