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1、BRITISH STANDARD BS 9940-04.02: 1984 QC 400402 IEC 115-6-2: 1983 Specifications for Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification: Fixed resistor networks with individually measurable resistors of either d
2、ifferent resistance values or different rated dissipations Assessment Level E Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-2000 ISBN 0 580 34141 0 Amendments issued since publicatio
3、n Amd. No.DateComments Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-2000i Contents Page National forewordii Introduction1 Section 1. General data 1.1Recommended method(s) of mountin
4、g3 1.2Dimensions, ratings and characteristics3 1.3Related documents3 1.4Marking3 1.5Ordering information4 1.6Certified records of released lots4 1.7Additional information4 1.8Additional or increased severities or requirements to those specified in the generic and/or sectional specification4 Section
5、2. Inspection requirements 2.1Procedures4 Table I3 Table II4 Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 ii BSI 01-2000 National foreword This part of this British Standard has been prepa
6、red under the direction of the Electronic Components Standards Committee. It is identical with IEC Publication 115-6-2 (QC 400402): “Fixed resistors for use in electronic equipment. Blank detail specification: Fixed resistor networks with individually measurable resistors of either different resista
7、nce values or different rated dissipations. Assessments level E” published by the International Electrotechnical Commission (IEC). This standard is a harmonised specification within the IECQ system of quality assessment for electronic components. Terminology and conventions. The text of the Internat
8、ional Standard has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards. Cross-references. The British Standard harmonized with IECQ 001001 and 001002 is BS 9000 “General req
9、uirements for a system for electronic components of assessed quality”. In adopting the IEC text as a National Standard it has been noted that there is an omission from boxes 2 and 4 of the specification number in the IEC Quality Assessment System for Electronic Components (IECQ). This has been drawn
10、 to the attention of the IEC TC 40 Secretariat and the specification number has been inserted where necessary in this standard. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS 9940-04. Detail
11、specification layout. In the event of conflict between the requirements of this specification and the provisions of BS E9000, the latter shall take precedence except that the front page layout will be in accordance with BS 9000 Circular Letter No. 15 dated October 1980. A British Standard does not p
12、urport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International StandardsCorresponding British Standards IEC 63:1963BS 2
13、488:1966 Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment (Technically equivalent) IEC 115-1:1982 (QC 400000:1982) BS 9940: Fixed resistors for use in electronic equipment Part 0:1985 Generic specification (Identical) IEC
14、 115-6:1983 (QC 400400:1983) BS 9940: Fixed resistors for use in electronic equipment: Part 04:1983 Sectional specification: Fixed resistor networks with individually measurable resistors (Identical) IEC 410:1973BS 6001:1972: Sampling procedures and tables for inspection by attributes (Technically e
15、quivalent) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cov
16、er. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-20001 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specificatio
17、n and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with these requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specification
18、s the content of Sub-clause 1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page correspond to the following information which shall be inserted in the position indicated: Identification of the detail specification 1 The “International Electr
19、otechnical Commission” or the National Standards Organization under whose authority the detail specification is drafted. 2 The IEC or National Standards number of the detail specification, date of issue and any further information required by the national system. 3 The number and issue number of the
20、 IEC or national Generic Specification. 4 The IEC number of the blank detail specification. Identification of the resistor network 5 A short description of the type of resistor network. 6 Electrical circuit showing all resistors and connections contained in the network. Terminal pin numbers shall be
21、 shown. Alternatively, this drawing may be given in an appendix to the detail specification. 7 Information on typical construction (when applicable). NOTEWhen the resistor network is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this
22、position. 8 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 9 Application or group of applications covere
23、d and/or assessment level. NOTEThe assessment level(s) to be used in a detail specification shall be selected from the sectional specification, Sub-clause 3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the t
24、ests does not change. 10 Reference data on the most important properties, to allow comparison between the various resistor network types. Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 2 BSI
25、 01-2000 1IEC 115-6-2-XXX QC 400402-XXX 2 ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-6-2 QC 400402 4 3 FIXED RESISTOR NETWORKS WITH INDIVIDUALLY MEASURABLE RESISTORS OF DIFFERENT RESISTANCE VALUES OR RATED DISSIPATIONS 5 Outline drawing: (see Table I) (. . . angle projecti
26、on) 8 6 Insulated/non-insulated7 (Other shapes are permitted within the dimensions given) Assessment level(s): E Stability class: . . .% 9 Information on the availability of components qualified to this detail specification is given in the Qualified Products List. 10 Licensed Copy: London South Bank
27、 University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-20003 Section 1. General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publication 115-6.) 1.2 Dimensions, ratings and charac
28、teristics Table I 1.2.1 Ratings and characteristics of the resistor elements 1.2.2 Ratings and characteristics of the network 1.2.3 Derating Resistors covered by this specification are derated according to the following curve: (A suitable curve to be included in the detail specification) NOTESee als
29、o Sub-clause 2.2.3 of the sectional specification. 1.3 Related documents 1.4 Marking The marking of the components and packing shall be in accordance with the requirements of IEC Publication 115-6. Sub-clause 1.5. NOTEThe details of the marking of the component and packing shall be given in full in
30、the detail specification. StyleRated network dissipation at 70 C (W) Isolation voltage between elements (if applicable) (V) Dimensions All dimensions are in millimetres or inches and millimetres. Climatic category/ Low air pressure8.5 kPa (85 mbar) Generic Specification:IEC Publication 115-1(1982):
31、Fixed Resistors for use in Electronic Equipment Part 1: Generic Specification. Sectional Specification: IEC Publication 115-6(1983): Part 6: Sectional Specification: Fixed Resistor Networks with Individually Measurable Resistors. Licensed Copy: London South Bank University, London South Bank Univers
32、ity, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 4 BSI 01-2000 1.5 Ordering information Orders for resistor networks covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated element resistances. b) Toler
33、ance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released lots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those speci
34、fied in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publicatio
35、n 115-6, Sub-clause 3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodicity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Su
36、b-clause 4.3 of the Generic Specification, IEC Publication 115-1, shall be used. Table II NOTE 1Sub-clause numbers of tests and performance requirements refer to the Generic Specification, IEC Publication 115-1, except for resistance change requirements, which have to be selected from the Table I an
37、d Table II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are selected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p= periodicity (in months) n= sample size c= acceptance criterion (permitted number of d
38、efectives) D= destructive ND= non-destructive IL= inspection levelIEC Publication 410 AQL = acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQL Performance requirements (see Note 1)(see Note 2) Group A inspection (lot-by-lot) Sub-group A1NDS
39、-41.0 % 4.4.1Visual examinationAs in 4.4.1 Legible marking and as specified in 1.4 of this specification Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-20005 Table II Table II Sub-cla
40、use number and Test (see Note 1) D or ND Conditions of test (see Note 1) ILAQL Performance requirements (see Note 1)(see Note 2) Sub-group A2NDS-41.0 % 4.4.2Dimensions (gauging) As specified in Table I of this specification 4.5ResistanceAs in 4.5.2 Group B inspection (lot-by-lot) Sub-group B1 NDS-31
41、.0 % 4.7Voltage proof (Insulated networks only) Method: . . .No breakdown or flashover Sub-group B2DS-32.5 % 4.17SolderabilityWithout ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . . . s, as applicable 4.19R
42、apid change of temperature A = Lower category temperature B= Upper category temperature Visual examination Resistance No visible damage %R u (. . .% R + . . . 7) Sub-group B3NDS-32.5 % 4.8.4.2Temperature coefficient of resistance This test is applicable only when a temperature coefficient of resista
43、nce of less than 50.106/C is claimed. One cycle of 20 C to 70 C to 20 C only a: . . . 106/C Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Group C Inspection (periodic)
44、Sub-group C1A Half of the sample of Sub-group C1 D35 4.16Robustness of terminations See 2.3.9 of the sectional specification Visual examinationNo visible damage Resistance%R u (. . .% R +. . . 7) Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00
45、 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 6 BSI 01-2000 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc 4.18Resistance to soldering heat Method: . . .
46、 Visual examinationNo visible damage Legible marking Resistance%R u (. . .% R +. . . 7) 4.8Variation of resistance with temperature Lower category temperature/20 C u . . .% or !: . . . 106/C 20 C/upper category temperature u . . .% or !: . . . 106/C 4.13OverloadSee 2.3.4 of the sectional specificati
47、on Visual examinationNo visible damage Legible marking Resistance%R u (. . .% R +. . . 7) Sub-group C1B Other half of the sample of Sub-group C1 D35 4.19Rapid change of temperature A= Lower category temperature B= Upper category temperature Visual examination Resistance No visible damage %R u (. . .
48、% R +. . . 7) 4.22VibrationMethod of mounting: see 1.1 of this specification Procedure B4 Frequency range: 10 Hz to 500 Hz Amplitude: 0.75 mm or acceleration 98 m/s2 (whichever is the less severe) Total duration: 6 h Visual examination Resistance No visible damage %R u (. . .% R +. . . 7) %R R - %R
49、R - Licensed Copy: London South Bank University, London South Bank University, Fri Dec 08 02:28:19 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS 9940-04.02:1984 BSI 01-20007 Table II Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size and criterion of acceptability (see Note 3) Performance requirements (see Note 1) pnc Sub-group C1 Combined sample of specimens of Sub-groups C1A and C1B D3101 4.23Climatic sequence Dry heat