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1、BRITISH STANDARD BS EN 62271-101:2006 High-voltage switchgear and controlgear Part 101: Synthetic testing The European Standard EN 62271-101:2006 has the status of a British Standard ICS 29.130.10 ? Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c
2、) BSI BS EN 62271-101:2006 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 September 2006 BSI 2006 ISBN 0 580 49257 5 National foreword This British Standard was published by BSI. It is the UK implementation of EN 62271-101:2006. It is ide
3、ntical with IEC 62271-101:2006. It supersedes BS EN 60427:2001 which is withdrawn. The UK participation in its preparation was entrusted by Technical Committee PEL/17, Switchgear, controlgear, and HV-LV co-ordination, to Subcommittee PEL/17/1, High-voltage switchgear and controlgear. A list of organ
4、izations represented on PEL/17/1 can be obtained on request to its secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard cannot confer immunity from legal obligations.
5、Amendments issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD EN 62271-101 NORME EUROPENNE EUROPISCHE NORM July 2006 CENELEC European Committee for Electrotechnical Standardizatio
6、n Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 62271-101:2006 E IC
7、S 29.130.10 Supersedes EN 60427:2000 English version High-voltage switchgear and controlgear Part 101: Synthetic testing (IEC 62271-101:2006) Appareillage haute tension Partie 101: Essais synthtiques (CEI 62271-101:2006) Hochspannungs-Schaltgerte und -Schaltanlagen Teil 101: Synthetische Prfung (IEC
8、 62271-101:2006) This European Standard was approved by CENELEC on 2006-07-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and
9、 bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the respons
10、ibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hu
11、ngary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c) BSI
12、Foreword The text of document 17A/753/FDIS, future edition 1 of IEC 62271-101, prepared by SC 17A, High-voltage switchgear and controlgear, of IEC TC 17, Switchgear and controlgear, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 62271-101 on 2006-07-01. This Europea
13、n Standard supersedes EN 60427:2000. This standard shall be read in conjunction with EN 62271-100:2001. The numbering of the subclauses of Clause 6 is the same as in EN 62271-100. However, not all subclauses of EN 62271-100 are addressed; merely those where synthetic testing has introduced changes.
14、The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2007-04-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2009-07-01 Annex ZA h
15、as been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62271-101:2006 was approved by CENELEC as a European Standard without any modification. _ EN 62271-101:2006 2 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (
16、c) BSI 3 EN 62271-101:2006 CONTENTS 1 Scope 7 2 Normative references .7 3 Terms and definitions .7 4 Synthetic testing techniques and methods for short-circuit breaking tests 9 4.1 Basic principles and general requirements for synthetic breaking test methods 9 4.2 Synthetic test circuits and related
17、 specific requirements for breaking tests12 4.3 Three-phase synthetic test methods.15 5 Synthetic testing techniques and methods for short-circuit making tests.17 5.1 Basic principles and general requirements for synthetic making test methods .17 5.2 Synthetic test circuit and related specific requi
18、rements for making tests18 6 Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 through 6.111 of IEC 62271-100.19 Annex A (informative) Current distortion.39 Annex B (informative) Current injection methods 55 Annex C (informative) Volta
19、ge injection methods60 Annex D (informative) Duplicate circuit (transformer or Skeats circuit).63 Annex E (normative) Information to be given and results to be recorded for synthetic tests 66 Annex F (informative) Special procedures for testing circuit-breakers having parallel breaking resistors .67
20、 Annex G (informative) Synthetic methods for capacitive-current switching.70 Annex H (informative) Re-ignition methods to prolong arcing .82 Annex I (normative) Reduction in di/dt and TRV for test duty T100a86 Annex J (informative) Three-phase synthetic test circuits100 Annex K (normative) Test proc
21、edure using a three-phase current circuit and one voltage circuit .108 Annex L (normative) Splitting of test duties in test series taking into account the associated TRV for each pole-to-clear.127 Annex M (normative) Tolerances on test quantities for type tests 137 Annex ZA (normative) Normative ref
22、erences to international publications with their corresponding European publications141 Bibliography .140 Figure 1 Interrupting process Basic time intervals 31 Figure 2 Example of recovery voltage.32 Figure 3 Equivalent surge impedance of the voltage circuit for the current injection method.33 Figur
23、e 4 Making process Basic time intervals.34 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 62271-101:2006 4 Figure 5 Typical synthetic make circuit for single-phase tests .35 Figure 6 Typical synthetic make circuit for three-phase tests (
24、kpp = 1,5) .36 Figure 7 Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100s with kpp = 1,5 .37 Figure 8 Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100a with kpp = 1
25、,5.38 Figure A.1 Direct circuit, simplified diagram46 Figure A.2 Prospective short-circuit current 46 Figure A.3 Distortion current 46 Figure A.4 Distortion current 47 Figure A.5 Simplified circuit diagram 48 Figure A.6 Current and arc voltage characteristics for symmetrical current49 Figure A.7 Cur
26、rent and arc voltage characteristics for asymmetrical current 50 Figure A.8 Reduction of amplitude and duration of final current loop of arcing .51 Figure A.9 Reduction of amplitude and duration of final current loop of arcing .52 Figure A.10 Reduction of amplitude and duration of final current loop
27、 of arcing .53 Figure A.11 Reduction of amplitude and duration of final current loop of arcing .54 Figure B.1 Typical current injection circuit with voltage circuit in parallel with the test circuit-breaker 57 Figure B.2 Injection timing for current injection scheme with circuit B.1 .57 Figure B.3 T
28、ypical current injection circuit with voltage circuit in parallel with the auxiliary circuit-breaker.58 Figure B.4 Injection timing for current injection scheme with circuit B.3 .58 Figure B.5 Examples of the determination of the interval of significant change of arc voltage from the oscillograms59
29、Figure C.1 Typical voltage injection circuit diagram with voltage circuit in parallel with the auxiliary circuit-breaker (simplified diagram).61 Figure C.2 TRV waveshapes in a voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker62 Figure D.1 Transformer o
30、r Skeats circuit 64 Figure D.2 Triggered transformer or Skeats circuit65 Figure G.1 Capacitive current circuits (parallel mode).73 Figure G.2 Current injection circuit .74 Figure G.3 LC oscillating circuit75 Figure G.4 Inductive current circuit in parallel with LC oscillating circuit 76 Figure G.5 C
31、urrent injection circuit, normal recovery voltage applied to both terminals of the circuit-breaker77 Figure G.6 Synthetic test circuit (series circuit), normal recovery voltage applied to both sides of the test circuit breaker78 Figure G.7 Current injection circuit, recovery voltage applied to both
32、sides of the circuit-breaker 79 Figure G.8 Making test circuit.80 Figure G.9 Inrush making current test circuit.81 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 5 EN 62271-101:2006 Figure H.1 Typical re-ignition circuit diagram for prolong
33、ing arc-duration.83 Figure H.2 Combined Skeats and current injection circuits84 Figure H.3 Typical waveforms obtained during an asymmetrical test using the circuit in Figure H.2.85 Figure J.1a Three-phase synthetic combined circuit102 Figure J.1b Waveshapes of currents, phase-to-ground and phase-to
34、phase voltages during a three-phase synthetic test (T100s; kpp = 1,5 ) performed according to the three-phase synthetic combined circuit103 Figure J.2a Three-phase synthetic circuit with injection in all phases for kpp = 1,5 104 Figure J.2b Waveshapes of currents and phase-to-ground voltages during
35、a three- phase synthetic test (T100s; kpp =1,5) performed according to the three-phase synthetic circuit with injection in all phases105 Figure J.3a Three-phase synthetic circuit for terminal fault tests with kpp = 1,3 (current injection method) .106 Figure J.3b Waveshapes of currents, phase-to-grou
36、nd and phase-to-phase voltages during a three-phase synthetic test (T100s; kpp =1,3 ) performed according to the three-phase synthetic circuit shown in Figure J.3a.106 Figure J.3c TRV voltages waveshapes of the test circuit described in Figure J.3a .107 Figure K.1 Example of a three-phase current ci
37、rcuit with single-phase synthetic injection 118 Figure K.2 Representation of the testing conditions of Table K.1a.119 Figure K.3 Representation of the testing conditions of Table K.1b.120 Figure K.4 Representation of the testing conditions of Table K.2a.121 Figure K.5 Representation of the testing c
38、onditions of Table K.2b.122 Figure K.6 Representation of the testing conditions of Table K.3a.123 Figure K.7 Representation of the testing conditions of Table K.3b.124 Figure K.8 Representation of the testing conditions of Table K.4a.125 Figure K.9 Representation of the testing conditions of Table K
39、.4b.126 Figure L.1 Graphical representation of the test shown in Table L.1133 Figure L.2 Graphical representation of the test shown in Table L.2134 Table 1 Test circuits for test duties T100s and T100a .15 Table 2 Test duties T10, T30, T60 and T100s.16 Table 2a First-pole-to-clear factor: 1,5 Test p
40、arameters during three-phase interruption.16 Table 2b First-pole-to-clear factor: 1,3 Test parameters during three-phase interruption.16 Table 3 Synthetic test methods for test duties T10, T30, T60, T100s, T100a, SP, DEF, OP and SLF.29 Table I.1a Last current loop parameters for 50 Hz operation in r
41、elation to short-circuit test duty T100a = 45 ms.87 Table I.1b Last current loop parameters for 50 Hz operation in relation to short-circuit test duty T100a = 60 ms.88 Table I.1c Last current loop parameters for 50 Hz operation in relation to short-circuit test duty T100a = 75 ms.89 Table I.1d Last
42、current loop parameters for 50 Hz operation in relation to short-circuit test duty T100a = 120 ms .90 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 10 09:17:32 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 62271-101:2006 6 Table I.2a Last current loop parameters for 60 Hz operation in relation
43、 to short-circuit test duty T100a = 45 ms.91 Table I.2b Last current loop parameters for 60 Hz operation in relation to short-circuit test duty T100a = 60 ms.92 Table I.2c Last current loop parameters for 60 Hz operation in relation to short-circuit test duty T100a = 75 ms.93 Table I.2d Last current
44、 loop parameters for 60 Hz operation in relation to short-circuit test duty T100a = 120 ms .94 Table I.3a Last loop di/dt reduction for 50 Hz under three-phase conditions with the first pole to clear in phase A and the required asymmetry in phase C.95 Table I.3b Last loop di/dt reduction for 60 Hz u
45、nder three- phase conditions with the first pole to clear in phase A and the required asymmetry in phase C.96 Table I.4a Corrected TRV values for kpp = 1,3 and fr = 50 Hz.97 Table I.4b Corrected TRV values for kpp = 1,3 and fr = 60 Hz.98 Table I.4c Corrected TRV values for kpp = 1,5 and fr = 50 Hz .
46、99 Table I.4d Corrected TRV values for kpp = 1,5 and fr = 60 Hz.99 Table K.1a Demonstration of arcing times for a first-pole-to-clear factor of 1,5 109 Table K.1b Alternative demonstration of arcing times for a first-pole-to-clear factor of 1,5110 Table K.2a Demonstration of arcing times for a first
47、-pole-to-clear factor of 1,3 .111 Table K.2b Alternative demonstration of arcing times for a first-pole-to-clear factor of 1,3112 Table K.3a Demonstration of arcing times for a first-pole-to-clear factor of 1,5 .114 Table K.3b Alternative demonstration of arcing times for a first-pole-to-clear facto
48、r of 1,5115 Table K.4a Demonstration of arcing times for a first-pole-to-clear factor of 1,3 116 Table K.4b Alternative demonstration of arcing times for a first-pole-to-clear factor of 1,3117 Table L.1 Test procedure for a first-pole-to-clear factor of 1,5 .128 Table L.2a Alternative demonstration of arcing times for a first-pole-to-clear factor of 1,3129 Table L.2b Simplified test procedure for a first-pole-to-clear factor of 1,3 130 Table L.3 Test procedure for asymmetrical currents in the case of a first-pole-to- clear factor of 1,5131 Table L.4