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1、CIE 44 79 R 9006145 00017b3 249 ISBN 92 9034 044 4 COMMISSION INTERNATIONALE DE LCLAIRAGE INTERNATIONAL COMMISSION ON ILLUMINATION INTERNATIONALE BELEUCHTUNGSKOMM ISSION ABSOLUTE METHODS FOR REFLECTION MEASUREMENT Pub. No. CIE44 1 st Edition 1979/Reprint 1990 UDC: 535.24 Photometry 535.36 Light scat
2、tering 535.65:006 Standardization of colour measurement COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services This report has been approved by the majority of the Commi
3、ttee and is recommended for study and application. This report is not an Officially Agreed CIE Recommendation approved by the National C o m m i t t e e s of the Member Countries. It should be noted t h a t any recommendations in t h i s report are advisory and not mandatory. Ce rapport a reu lappro
4、bation de la majorit du Comit, et il est recommand pour les tudes e t applications. C e rapport n e s t pas une Recommandation o f f i c i e l l e de la C I E approuve par les Comits Nationaux des Pays M e m b r e s . I1 doit tre not que toute recommandation y figurant est donne titre de conseil e t
5、 non d obligation. D i e s e r Bericht entspricht der Mehrheit der Meinungen des Komitees und wird zum zuknftigen Studium empfohlen. Er ist keine Offiziell Anerkannte CIE-Empfehlung, die von den Nationalen Komitees der Mitgliedslander anerkannt wurde. Es muss darauf hingewiesen werden, dass alle Emp
6、fehlungen dieses Berichts nur als Anleitung dienen und nicht verbindlich sind. - 1 - COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services CIE 44 79 E 900bL45 0001765 O
7、LL Preface This technical report has been prepared by the CIE Technical Committee on Materials (TC-2.3), and w a s a part of the program of the TC-2.3 Subcommittee on Standards and Techniques under the chairmanship of W. Erb of PTB. The prime author of the document was Dr. N. Ooba of the Electrotech
8、nical Laboratory, Tanashi, Tokyo. The list of members who have been on the Committees r o s t e r during the period (1975-1979) are given below. Also l i s t e d , as consultants, are the members of the Subcommittee on Standards and Techniques who collaborate with the chairman i n the preparation of
9、 the report. It w a s not the intent of the Committee t o compare various known methods of absolute reflectance measurement or t o make a recommendatibn as t o which method is preferred over the other. Such a recommendation would require extensive additional experimental work t h a t could not be ca
10、rried out at t h i s t i m e . The a i m of the Committee was t o describe the available methods known t o the Committee and t h i s is the b e s t the Committee could do at t h i s t i m e . Members of TC-2.3 Australia Austria Be 1 g ium Bulgaria Canada Czechos lavakia Denmark Eng 1 and F i n i an
11、d France Germany Hungary Isr ae 1 Japan Nether 1 ands Norway Poland Por tug al Ruman i a Russia South Africa Spain Sweden Switaer land United States United States Members of Subcommittee on Standards and Techniques and Consultants J.E. Shaw H . R e i t e r W. Erb (Germany) - Chairman P . Massart M.
12、Artom ( I t a l y ) V . Stefanova F.W. B i l l m e y e r (USA) if. Budde W . Budde (Canada) J. Zetek F.J.J. Clarke (UK) Jens Gudum L . Fillinger (Hungary) F.J.J. Clarke H . Hammond (USA) T. Timonen H, Hemmendinger (USA) E. Barthes J. Krochmann (Germany) J. Krochmann R.D. o a a n o (Argentina) L. Fil
13、linger L. Morren (Belgium) H . L . Cahn Y. Mishima (Japan Gorow Baba M. Nonaka (Japan) F. Burghout S. Nndel (Germany) A. Augdal N. Ooba (Japan) M. Nowak H. R e i t e r (Austria) Joaquim Conceicao A. Reule (Germany) A. Pascale C.L. Sanders (Canada) Mme L . Dolgopolova J. Schanda (Hungary) I. Boyd R.
14、Sve (France) A. Cruz . W. Stanioch (Poland) Ake Stenius A. Stenius (Sweden) D . E i t l e H . Terstiege (Germany) F. G r u m (chairman) W.H. Venable (USA) M . Pearson (Secretary) Mateus A.R. Robertson (Canada) - 2 - COPYRIGHT International Commission on Illumination Licensed by Information Handling
15、Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services CIE 44 79 9006345 000L7bb T58 ABSOLUTE METHODS FOR REFLECTION MEASUREMENTS Summary Measurements of reflectance or reflectance factor are made by comparison t o appropriately chosen reference standar
16、ds. In 1969 the CIE recommended that the perfect reflecting diffuser be taken as the ideal standard. As there is no existing material which corresponds t o the perfect diffuser, the problem is one of transforming measurements made with reference t o real physical standards t o those of absolute valu
17、es r e l a t i v e t o the perfect reflecting diffuser. The main interest of t h i s report is the theory and procedures by which t h i s conversion is made rather than the properties of the materials, the measuring instruments or the preparation of the samples For this information the reader is req
18、uested t o refer to the original papers . The material has been classified i n t o principles of measurement rather than quantities t o be determined. These classifications are: Goriophotometric methods, Methods used i n hemispherical irradiators, Methods using hemispherical or spheroidal mirrors, M
19、ethods using Kubelka-Munk theory, Methods based on the theory of integrating sphere. The methods based on the theory of integrating sphere include: the two Taylors methods, the Benford method, the Sharp-Little method, and the Double sphere method. By compiling t h i s information under a single cove
20、r, the practitioners of t h i s type of measurement have thus an access t o a ready reference on t h i s complex subject. METHODES ABSOLUES DE MESURES DE LA REFLEXION Rsum Les mesures de facteur de rflexion e t de facteur de rflectance sont faites par comparaison avec des matriaux de rfrence convena
21、blement choisis. En 1969, la CIE recommanda que le diffuseur parfait par rfle- xion s o i t p r i s comme rfrence idale. Puisquil nexiste pas de matriau qui corresponde au diffuseur parfait, le problme est celui de la transformation des mesures faites par rf- rence un talon physique r e l , en mesur
22、es r e l a t i v e s au diffuseur parfait par rflexion. Lintr6-t principal de ce rapport est relatif la thorie et aux mthodes par lesquelles cette conversion est faite, plutt quaux proprits des matriaux, aux instruments de mesure ou ia prparation des chantillons. En ce qui concerne ces derniers s u
23、j e t s le lecteur est pri de se rfrer aux publications originales. - 3 - COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services CIE 44 79 9006345 O001767 994 Le s u j e
24、 t a 6 t h subdivis selon les principes de mesure, plutt que selon les grandeurs qui sont dtermines. C e s subdivisi,ons sont: Mthodes goniophotomtriques, Mthodes employant des diffuseurs hmisphriques, Mthodes u t i l i s a n t des miroirs sphriques ou sphroldaux, Mthodes fondes sur la thorie de Kub
25、elka e t Munk, Mthodes fondes sur la thorie des sphres dintgration. Les mthodes fondes sur la thorie des sphres d t intgration comprennent: les deux mthodes de Taylor, l a mthode de Benford, la mthode Sharp- L i t t l e et la mthode de la double sphre. En runissant cette information dans un mme docu
26、ment, les u t i l i s a t e u r s de ce type de mesures auront ainsi accs 5 une rfrence commode sur ce sujet complexe. ABSOLUTE REFLEXIONS-MESSMETHODEN Zusammenfassung B e i Messungen des R e f lexionsgrades oder des Ref lexionsfaktors wird i n der Praxis auf ausgewhlte Reflexionsnormale bezogen. 19
27、69 ha9 die CIE den vollkommen m a t t w e i s s e n Krper als ideales Normal empfohlen. D a es kein Material m i t den Eigenschaften des vollkommen mattweissen Krpers gibt, stellt sich die Aufgabe, die r e l a t i v zu verfgbaren Normalen erhaltenen Messergebnisse auf Absolutewerte, d.h. auf den vol
28、lkommen mattweissen Krper zu beziehen. Das Hauptaugenmerk dieses Berichtes r i c h t e t sich auf die Theorie und die Methoden,mit denen absolute Reflexions w e r t e gemessen werden knnen; die Eigenschaften der Materialien, die Messgerte und die Herstellung der Normale werden nur am Rande erwhnt. F
29、r nhere Ausknfte sei der Leser auf die Originalarbeiten verwiesen. D e r Bericht gliedert sich nach dem Prinzip der Messverfahren w i e folgt: goni ophot orne tr is Che M e thoden, Methoden m i t halbkugeligen Strahlern, Methoden m i t halbkugeligen oder sphrischen Spiegeln, Methoden, die auf der Ku
30、belka-Munk Theorie beruhen. Methoden, die auf der Theorie integrierender Kugeln aufbauen: Taylorsche Methoden, Benfordsche Methode, Sharp-Little Methode und Doppelkugelmethode. Durch die Zusammenstellung der Wirkungsweise der einzelnen Methoden i n einem Bericht Erhlt der auf diesem Gebiet arbeitend
31、e Praktiker einen Zugang zu einer geschlossenen Ubersicht ber e i n komplexes Thema. - 4 - COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services CIE 44 79 9006145 00037
32、68 820 D 1. 2. 3 . 4. 5- 6 . 7. 7. 1 7-2 7.3 7.4 7-5 8. TABLE OF CONTENTS Page In tr odu c t i on Terminology Gon i oph ot orne tr i c Methods Methods Using Hemispherical Irradiators Methods Using Spherical or Spheroidal Mirrors Methods Based on the Kubelka-Munk Theory Methods Based on the Theory of
33、 Integrating Sphere Taylors Method (1) Taylors Method (2) Benfords Method Sharp-Little Method Double Sphere Method Summarizing Remarks References 6 a 10 19 22 26 31 32 37 39 41 44 45 5 1 - 5 - COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT Inte
34、rnational Commission on Illumination Licensed by Information Handling Services CIE Y Y 79 I I 9006345 0003769 767 1. Introduction Measurements of diffusely reflecting characteristics of materials are of great importance as the basic measurements of illuminating engineering, and have become more and
35、more requisite for many other fields of science, technology and industry that are concerned not only with human vision but also with various effects of every wavelength region of optical radiation on sub- stances. In general, measurements of such characteristics as reflectance or radiance factor are
36、 made by means of reflectometers in comparison with those of reference standards appropriately chosen. In connection with this, CIE recommended in 19311 that, in colorimetric measurements of opaque materials, smoked magnesium oxide was to be taken as the reference standard, but this is superseded by
37、 an ideal standard, i.e. the perfect reflecting diffuser since 1969.* In fact, there is no existing material corresponding to the perfect diffuser with sufficient approximation, so that the characteristics of the reference standards must be measured in absolute scale in order to correct the measured
38、 values of the sample to be tested when a high accuracy is required. The purpose of this report is to survey the methods that are used for measuring the absolute* reflection values of such reference standards, by outlining the papers which have so far been published on this subject. ;Measurements th
39、at relate the reflection values of a material to that of the perfect reflecting diffuser are often called “absolute“ measurements. -6- COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Informati
40、on Handling Services CIE 44 79 9006145 0001770 489 M The characteristic under investigation is expressed as the ratio of the reflected radiant flux from the sample t o be measured and the flux incident on it, but generally direct measurements of these two fluxes are not practicable. Therefore the re
41、lation is converted into a new relation between quantities which are practi- cally measurable w i t h a accuracy required. The main interests are then directed i n this report t o the theory and procedure i n which the above conversion is made, and accordingly descriptions on other subjects such as
42、the preparations o r the properties of the samples and such as measuring instruments are mostly omitted. The reader who wants t o study these subjects and the details of principles as w e l l is requested t o refer t o the original papers. As regards the properties and the preparations of reference
43、standards, several references are added t o the reference list. For the purpose of surveying the methods, it w i l l be more convenient t o classify them according to the principles of measure- ments rather than t o classify according t o the quantities t o be determined, because a group of differen
44、t quantities is sometimes measured on the basis of the same principle. Therefore, i n this report the following classification is made: -Goniphotometric methods -Methods using hemispherical irradiators -Methods using hemispherical or spheroidal mirrors -Methods based on Kubelka-Munk theory -Methods
45、based on the theory of integrating sphere. COPYRIGHT International Commission on Illumination Licensed by Information Handling Services COPYRIGHT International Commission on Illumination Licensed by Information Handling Services The formulas presented i n this report are those given by the authors q
46、uoted. For reasons of consistency, however, changes were sometimes made i n terminology and i n the use of symbols. It is a matter of course that the reported theories are often contro- versial because they are based on assumptions and approximations. I t was not the a i m of this report t o make re
47、fined studies on the theories but relate on them only as far as to seem necessary t o understand the experimental procedures. None of the formulas or methods are warranted by CIE. 2. Terminology In principle the terminology in t h i s report refers t o the CIE Vocabulary published i n 1970.3 Some ad
48、ditional remarks are as follows: (i) Radiant and luminous quantities are used inter- changeably hereinafter; papers published i n early dates are often concerned only with luminous quantities, so that terms such as luminous flux or luminance factor are used here for these papers, whereas recent pape
49、rs are mostly concerned with spectral quantities, sometimes including W o r IR regions, for which terms such as radiant flux or radiance factor are suitably used. Luminous quantities differ from radiant quantities only i n the respect that they are t o be measured w i t h detectors equivalent t o the CIE standard photometric observer, and this difference is not essential as far as this report is concerned. ( 2 ) The term reflectance factor