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1、EIA 364-55 85 3234600 006b389 T m- ANSI/EIA-364-55-1984 APPROVED NOVEMBER 28, 1984 , - 7 - EIA STANDARD TEST PROCEDURE #55 EIA-364-55 CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS I (This is a new Test Procedure and has n o t e e n previously published in the EIA/RS-364 Series) FEBRUARY 1
2、985 Engineering Department ELECTRONIC INDUSTRIES ASSOCIATION Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted wi
3、thout license from IHS -,-,- E I A 3b4-55 5 3234600 00bb390 b . - - y -. NOTICE EIA Engineering Standards and Publications are designed t o serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and impravement of product
4、s, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existence of such Standards and Pub- lications shall not in any respect preclude any member or non-member of EIA from manufacturing or selling products not conforming to such Stan
5、dards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other than EIA members, whether the standard is to be used either domestically or internationally. Recommended Standards and Publications are adopted by IA without regard to wheth
6、er or not their adoption may involve patents on articles, materials, or processes. By such action, EIA does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the Recom- mended Standard or Publication. +blished by ELEEIBNIC INDTJSTFtIES ASSOC
7、IATION Engineering Department 2001 Eye Street, N.W. Washington, D.C. 20006 Copyright 1985 EXJKTFDNIC I N D U m I m ASSOCIATION All rights reserved PRICE: $5.00 Printed inU.S.A. WJX: The prefix rlRSt* is being deleted in favor of “EIA.“ This change will eventually be reflected in all EIA Standards. e
8、ditorial change to provide more positive identification of the source for the standard - there is no technical significance to the change. This is simply an I I . Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111
9、001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted without license from IHS -,-,- E I A 364-55 85 m 3234600 0066391 m EIA-364-55 TEST PROCEDURE 1/55 CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CONNECTORS This EIA Recommended Standard is considered t
10、o have international standardization implications, but the IEC activity has not progressed to the point where a valid comparison between the ETA Recommended Standard and the IEC Recommendation can be made. i Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under li
11、cense with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted without license from IHS -,-,- 55 E I A 3b4-55 85 3234b00 00bb392 T EIA-364-55 Page 1 TEST. PROCEDURE 1/55 CURRENT CYCLING TEST PROCEDURE FOR ELECTRICAL CO
12、NNECTORS (From EIA Standards Proposal No. 1687, formulated under the cognizance of the EIA P-5.1 Working Group on Connectors.) NOTE: This TP-55 is a new Test Procedure and has not been previously published in the EIA/RC-364 series. 1.0 TP-55 CURRENT CYCLING 2.0 OBJECT The object of this test procedu
13、re is to detail a uniform test method for determining the electrical current cycling characteristics of mated electrical contacts or conductor-to- contact terminations. 3.0 PREPARATION OF THE SPECIMEN 3 . 1 A test sample shall consist of, but not be limited to, a mating pair of contacts such as a pi
14、n and socket, mating hermaphroditic contacts, or a printed circuit board (PCB) pad and its mating contact. In each case connector housing may be included. 3.2 When loose piece conductor terminated contacts or mated contact pairs with separable contact interfaces are prepared for testing, the samples
15、 shall be mounted in a manner that avoids any physical disturbance during the current cycling or measurement routine. Support fixtures, if needed, should be arranged to avoid their heat sinking the samples, and mating orientation and depth, if applicable, shall be within the design limits. 3 . 3 . I
16、f applicable, the contacts to be tested shall be crimped per applicable specifications on each end of appropriate test conductors. This enables the wiring of the test assembly into a series circuit without additional soldering or splicing. The conductor length between contacts shall be at least 18 i
17、nches (45 cm), unless otherwise specified in the Detail Specification. 3.4 Voltage connections for resistance or thermocouples, or both, for temperature readings may also be utilized if specified in the cognizant Specification. Copyright Electronic Components, Assemblies & Materials Association Prov
18、ided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted without license from IHS -,-,- - E I A 3b4-55 85 m 3234b00 00bb393 L = EIA-364-55 Page 2 a 3.5 Unless specified i n the cognizant Speci
19、fication, the test samples shall not be cleaned by any means prior t o the test, nor shall any lubricants or other coatings be applied for test purposes. 4.0 TEST METHOD 4.1 T e s t Equipment 4.1.1 An anmeter accurate t o +1% - f u l l scale or e.quiva 1 en t . 4.1.2 Power supply (ac or dc) capable
20、of delivering 4.1.3 Timer capable of controlling test cycle periods the required test current. with +1 - minute. 4.2 T e s t Procedure 4.2.1 “Contact Resistance Test Procedure for Electrical Connectors,“ TP-O6A (EIA RS-364-06A) shall be made prior t o the f i r s t cycle and upon completion of the f
21、inal cycle. 4.2.2 The wired samples shall be mounted i n a manner to allow free air circulation around each sample and to minimize conduction of heat from samples and surrounding equipment. The distance between each sample shall be constant. The test area shall be free of drafts or varying temperatu
22、re gradients which could affect the temperature of the samples. 4.2.3 Each wired sample shall be connected t o a power supply capable of supplying the test current specified. Where series interconnections are not practical, individual power sources shall be used. 4.2.4 Determine the current rating o
23、f the test samples from the cognizant Specification. 4.2.5 Determine the test current for the current cycling test from Table 1, or as specified i n the cognizant Specification. 4.2.6 Energize and subject the test samples t o a current cycling test of 500 cycles, or as Specified i n the cognizant Sp
24、ecification. Each cycle shall consist of one of the test methods specified i n Table 2. 00 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduct
25、ion or networking permitted without license from IHS -,-,- Test Conditions A R E I A 364-55 5 323LibOO 00bb394 3 = Test Current % Rated Current 100 1 3 E EIA-364-55 Page 3 u C D TABLE 1 I L 150 200 1 I Test Method 1 2 3 4 I TEST CONDITIONS I Cycle Time - Minutes ON OFF . 5 5 15 15 30 15 45 15 - TABL
26、E 2 TEST METHODS 5.0 DETAILS TO BE SPECIFIED The following details must be specified in Specification: the individual dual Test sample preparation (if special preparation required). Number of samples to be tested. Preconditioning or special environments. Initial and final measurements. Test current
27、(ac or dc) and cycle duration. Designation if contact is to be tested in or out of the connector housing. Length of conductor between contacts, if other than designated herein. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Emp
28、loyees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted without license from IHS -,-,- EIA-364-55 Page 4 (h) Number of cycles, if .other than 5.00 (i) Specify i.f contaoes shall .be series-wired i n multiple contact mmneceor 6.0 DOCUMENTATION
29、 The data sheet should contatin:” (a) T i t l e Of test. (b) (c) Test equipment used. Sample description and wiring configuration. (d) Test current candiltion, see Table 1. (e) Cycle duration methods, see Table 2. (f) No cycles. I. (g) Values and observations. (h) D a t e of test and .name ,o5f operator(s) performing test. e Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Japan, IHS Not for Resale, 12/17/2007 18:28:25 MSTNo reproduction or networking permitted without license from IHS -,-,-