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1、 Reference number ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 INTERNATIONAL STANDARD ISO/IEC 10373-6 First edition 2001-05-31 AMENDMENT 2 2003-10-01 Identification cards Test methods Part 6: Proximity cards AMENDMENT 2: Improved RF test methods Cartes didentification Mthodes dessai Partie 6: Car
2、tes de proximit AMENDEMENT 2: Mthodes dessai RF amliores Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license
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6、tral Secretariat at the address given below. ISO/IEC 2003 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either
7、ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Case postale 56 CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyrightiso.org Web www.iso.org Published in Switzerland ii ISO/IEC 2003 All rights reserved Copyright Internation
8、al Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 All rights res
9、erved iii Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards thro
10、ugh technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also
11、 take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of the joint technical committee is to prep
12、are International Standards. Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote. Attention is drawn to the possibility t
13、hat some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Amendment 2 to ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology, Subcommittee SC
14、 17, Cards and personal identification. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- C
15、opyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC
16、 2003 All rights reserved 1 Identification cards Test methods Part 6: Proximity cards AMENDMENT 2: Improved RF test methods Page 2, 3.2 Add the following abbreviations and symbols: fcm Frequency of the operating field during the PICC load modulation test H Field strength of the PCD antenna field m M
17、odulation index as defined in 3.3 of ISO/IEC 14443-2 t1, t2 Pulse segments as defined in Figure 2 of ISO/IEC 14443-2 tr, tf Rise and fall times as defined in Figure 4 of ISO/IEC 14443-2 Page 5, 6.1.3 Replace the 2nd note with the following: “NOTE At 13,56 MHz the approximate inductance is 250 nH and
18、 the approximate resistance is 0,4 .“ Page 6, 6.1.3 Add a note after the last note: “NOTE The high impedance oscilloscope probe ground connection should be as short as possible, less than 20 mm or coaxial connection.” Page 6, 6.2 In the 4th sentence, replace the value “50 ” for P1 with the value “10
19、 ”. Page 6, Figure 4 Replace the figure with the following: Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without lice
20、nse from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) 2 ISO/IEC 2003 All rights reserved identical length twisted pairs or coaxial cables of less than 100 mm 240 1% 240 1% P1 10 PCD antenna to oscilloscope sense coil a sense coil b + - + - + - + - probe NOTE 1 In order to avoid any unintended misali
21、gnment in case of an unsymmetrical set-up the tuning range of the potentiometer P1 is only 10 . If the set-up cannot be compensated by the 10 potentiometer P1 the overall symmetry of the set-up should be checked. NOTE 2 The high impedance oscilloscope probe ground connection should be as short as po
22、ssible, less than 20 mm or coaxial connection. Figure 4 Test set-up (principle) Page 7, 6.2.3 Add the following sentence after the first sentence: “The dimensional tolerance shall be better than 0,5 mm.” Pages 8 and 9, Clause 7 Replace 7.1, 7.2 and 7.3 with the following: 7.1 PICC load modulation am
23、plitude 7.1.1 Purpose The purpose of this test is to determine the amplitude of the PICC load modulation signal within the operating field range Hmin, Hmax as specified in the base standard. Also the functionality of the PICC for Type A and Type B within their corresponding modulation ranges as defi
24、ned in the base standard shall be determined. 7.1.2 Test procedure Step 1: The load modulation test circuit of Figure 4 and the Test PCD assembly of Figure 5 are used. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, U
25、ser=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 All rights reserved 3 Adjust the RF power delivered by the signal generator to the test PCD antenna to the required field str
26、ength as measured by the calibration coil. Connect the output of the load modulation test circuit of Figure 4 to a digital sampling oscilloscope. The 10 potentiometer P1 shall be trimmed to minimise the residual carrier. This signal shall be at least 40 dB lower than the signal obtained by shorting
27、one sense coil. Step 2: The PICC under test shall be placed in the DUT position, concentric with sense coil a. The RF drive into the test PCD antenna shall be re-adjusted to the required field strength. Display a segment of at least two cycles of the waveform of the subcarrier load modulation on the
28、 digital sampling oscilloscope and store the sampled data in a file for analysis by a computer software programme (see Annex F). NOTE 1 Care should be taken to apply a proper synchronization method for low amplitude load modulation. Fourier transform exactly two subcarrier cycles of the sampled modu
29、lation waveform using suitable computer software. Use a discrete Fourier transformation with a scaling such that a pure sinusoidal signal results in its peak magnitude. In order to minimize transient effects, avoid to analyse a subcarrier cycle immediately following a non-modulating period or a phas
30、e shift of the subcarrier. The resulting peak amplitudes of the upper and lower sidebands at fc + fs and fc - fs shall be above the value defined in the base standard. A REQA or a REQB command sequence as defined in ISO/IEC 14443-3 shall be sent by the Test PCD to obtain a signal or load modulation
31、response from the PICC. The frequency fcm of the carrier delivered by the signal generator to the test PCD antenna shall be such that two subcarrier cycles correspond exactly to an integer number of samples. The frequency which fulfils this requirement (with common oscilloscope sampling rates) and w
32、hich is the closest to the nominal carrier frequency fc defined in ISO/IEC 14443-2 is fcm = 13,559322 MHz. The discrete Fourier transformation shall be done at the exact sidebands frequencies generated by the PICC under test, i.e. fcm (1 fs/fc) and fcm (1 + fs/fc). If the programme given in Annex F
33、is used it shall be modified to replace 13,56 MHz by the exact value of fcm during the test. NOTE 2 In order to limit the worst case measurement error to approximately 5 % due to inexact frequencies the following tolerances apply: fcm = 13,559322 MHz, with a relative tolerance of 50 10-6 fcm measure
34、ment relative error + oscilloscope sampling rate relative error: 10 10-6 (The oscilloscope sampling rate error may be compensated if the fcm measurement is done by the digital sampling oscilloscope. A better than 10 10-6 relative uncertainty may be achieved by sampling more than 500 periods of unmod
35、ulated carrier and using interpolation to know precisely the time of the first and of the last rising edge of the carrier.) NOTE 3 In order to limit the measurement error due to noise (quantization noise, PICC noise) the following techniques may be used: increasing the oscilloscope sampling rate; in
36、creasing the number of subcarrier cycles used in the Fourier transformation. NOTE 4 For type B PICC load modulation test, the oscilloscope FFT option may also be used on a large number of subcarrier cycles with neither transient effect nor phase shift (i.e. on a stable part of synchronization time T
37、R1 as defined in ISO/IEC 14443-2:2001, 9.2.5, or on a stable part of SOF as defined in ISO/IEC 14443-3:2001, 7.1.4). 7.1.3 Test report The test report shall give the measured peak amplitudes of the upper and lower sidebands at fc + fs and fc - fs and the applied fields and modulations. Copyright Int
38、ernational Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) 4 ISO/IEC 2003 All
39、rights reserved 7.2 PICC reception 7.2.1 Purpose The purpose of this test is to verify the ability of the PICC to receive the PCD message under the specified conditions given in Tables 1 and 2. 7.2.2 Conditions for type A Table 1 defines the additional test conditions to be applied for type A. Table
40、 1 Additional test conditions for type A Condition H A/m t1 s t2 s 1 1,5 3 0,5 2 1,5 2 0,7 3 4,5 3 0,5 4 4,5 2 0,7 5 7,5 3 0,5 6 7,5 2 0,7 7.2.2.1 Test procedure Under the conditions defined in Table 1 the PICC shall answer to a REQA with ATQA. 7.2.2.2 Test report The test report shall confirm the i
41、ntended operation under the conditions defined in Table 1. 7.2.3 Conditions for type B Table 2 defines the additional test conditions to be applied for type B. Copyright International Organization for Standardization Provided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing
42、, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) ISO/IEC 2003 All rights reserved 5 Table 2 Additional test conditions for type B Condition H A/m m % tr s tf s 1 1,5 8 1 1 2 1,5 8 2 2 3 1,5 14 1
43、1 4 1,5 14 2 2 5 4,5 8 1 1 6 4,5 8 2 2 7 4,5 14 1 1 8 4,5 14 2 2 9 7,5 8 1 1 10 7,5 8 2 2 11 7,5 14 1 1 12 7,5 14 2 2 7.2.3.1 Test procedure Under the conditions defined in Table 2 the PICC shall answer to a REQB with ATQB. 7.2.3.2 Test report The test report shall confirm the intended operation und
44、er the conditions defined in Table 2. 7.3 PICC resonance frequency (informative) 7.3.1 Purpose The test may be used to measure the resonance frequency of a PICC. When two or more PICCs are placed in the same PCD energizing field, the resonance frequency of each PICC decreases. Care should be taken i
45、n designing each PICC resonance frequency. 7.3.2 Procedure The resonance frequency of a PICC is measured by using an impedance analyser or a LCR-meter connected to a calibration coil. The coil of the PICC should be placed on the calibration coil as close as possible, with the axes of the two coils b
46、eing congruent. The resonance frequency is that frequency at which the resistive part of the measured complex impedance is at maximum. 7.3.3 Test report The test report shall give the PICC resonance frequency and the measurement conditions. Copyright International Organization for Standardization Pr
47、ovided by IHS under license with ISO Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 05/08/2007 08:25:54 MDTNo reproduction or networking permitted without license from IHS -,-,- ISO/IEC 10373-6:2001/Amd.2:2003(E) 6 ISO/IEC 2003 All rights reserved Page 9, 8.1.2 Replace the step
48、 2 of procedure for Hmax test with the following: “2. Tune the Reference PICC (Annex D) to 19 MHz: a) Set jumper J1 to position a. b) Drive the calibration coil directly from a signal generator set at 19 MHz. c) Locate the calibration coil and the Reference PICC as close as possible with the axes of the two coils being congruent. d) Adjust the Reference PICC capacitor C2 to maximum dc voltage at R1. e