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1、J IS JAPANESE IN DUSTRIAL STA N DA R D Translated and Published by Ja pan ese Sta nda tds Association Geometrical Product Specification (GPS)-Surface texture : Prof i le method- Mot if parame te rs ICs 17.040.20 Descriptors : curves (geometry), product specification, products, specification Referenc
2、e number : JIS B 0631 : 2000 (E) 12 s PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-
3、,- B 0631 : 2000 (IS0 12085 : 1996) Foreword This translation has been made based on the original Japanese Industrial Standard established by the Minister of International Trade and Industry through deliberations at the Japanese Industrial Standards Committee according to the proposal of establishin
4、g a Japanese Industrial Standard from the Japanese Standards Association (JSA), with a draft of Industrial Standard based on the provision of Clause 1, Article 12 of the Industrial Standardization Law. Date of Establishment: 2000-03-20 Date of Public Notice in Official Gazette: 2000-03-21 Investigat
5、ed by: Japanese Industrial Standards Committee Divisional Council on Machine Elements JIC 8 0631 : 2000, First English edition published in 2002-07 Translated and published by: Japanese Standards Association 4-1-24, Akasaka, Minato-ku, Tokyo, 107-8440 JAPAN In the event of any doubts arising as to t
6、he contents, the original JIS is to be the final authority. O JSA 2002 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing
7、 from the publisher. Printed in Japan PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-
8、,- B 0631 : 2000 (IS0 12085 : 1996) Contents Page Introduction . 1 Scope 2 Normative references 3 Definitions 3.1 General definitions 3.2 Parameter definitions . 4 4.1 General 4.2 Conventional limits of motifs Theoretically exact operator of the motif method . 4.3 Depth discrimination Identification
9、 of roughness and waviness motifs through the combination of motifs Procedure for parameter calculation 4.4 4.5 5 Measuring conditions of parameters 5.1 Convention concerning traversing the primary profile 5.2 Recommended measurement conditions 5.3 Profile quantization step 5.4 Rule for acceptance .
10、 5.5 5.6 Use of motifs method for analysis of multiprocess surfaces . Indications on the drawings Annex A (normative) Calculation method for combination of motifs Annex B (informative) Relation between motif parameters and function of surfaces Annex C (informative) Relation to the GPS matrix model A
11、nnex D (informative) Bibliography 1 1 1 2 2 4 5 5 5 5 6 9 11 11 11 11 11 11 11 12 15 16 17 PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction
12、 or networking permitted without license from IHS -,-,- JAPANESE INDUSTRIAL STANDARD JIS B 0631 : 2000 (IS0 12085 : 1996) Geometrical Product Specification (GPS)- Surface texture : Profile method- Motif parameters Introduction This Japanese Industrial Standard has been prepared based on the first ed
13、ition of IS0 12085 Geometrical Product Specification (GPSI-Surface texture: Profile method-Motif parameters published in 1996 without modifying the techni- cal contents. This Standard is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see TR B 0007
14、). It influences links 2, 3 and 4 of the surface texture chain of standards on roughness profile and waviness profile. For more detailed information of the relation of this Standard to other GPS stan- dards, see Annex C. The approach described in this Standard facilitates the determining roughness a
15、nd waviness parameters from the primary profile by finding those motifs which char- acterize the surface under consideration. This method is independent of any profile filter and results in parameters which are based on the depth and spacing of the motifs. These parameters, which are complementary t
16、o those defined in IS0 4287, can be used to describe the functional properties of workpieces as indicated in Annex B. The portions underlined with dots are the matters not stated in the original In- ternational Standard. Remarks : TR B 0007 is identical with ISOPTR 14638 : 1995 Geometrical Prod- uct
17、 Specification (GPS)-Masterplan. 1 Scope This Standard defines terms and parameters used for determining sur- face texture by the motif method. It also describes the corresponding ideal operator and measuring conditions. 2 Normative references The following standards contain provisions which, throug
18、h reference in this Standard, constitute provisions of this Standard. If the indication of the year of coming into effect is given to these referred standards, only the edi- tion of indicated year constitutes the provision of this Standard but the revision and amendment made thereafter are not appli
19、ed. The normative references without the indication of the year of coming into effect apply limiting only to the most recent edition. Technical drawings-Method of indicating surface texture on draw- ings Items cited from IS0 1302 : 1992 Technical drawings-Method of in- dicating surface texture are e
20、quivalent to the corresponding matters of the said standard. Surface texture-Instruments for the assessment of surface texture- Profile method IS0 3274 : 1996 Geometrical Product Specifications (GPSI-Surface texture : Profile method-Nominal characteristics of contact (stylus) instruments JIS B 0031
21、Remarks : JIS B 0651 . PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-,- 2 B 0631 : 2
22、000 (IS0 12085 : 1996) IS0 4287 : 1997 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Terms, definitions and surface texture parameters IS0 4288 : 1996 Geometrical Product Specifications (GPS)-Surface texture : Profile method-Rules and procedures for the assessment of surf
23、ace tex- ture 3 Definitions For the purposes of this Standard the following definitions apply. 3.1 General definitions 3.1.1 surface profile Profile (JIS B 0660 : 1998) that results from the intersec- tion of the real surface by a specified plane. (See IS0 4287.) . . 3.1.2 primary profile short wave
24、length filter, As. (See Table 1 and IS0 3274.) Total profile (JIS I 3 0660 : 1998) after application of the . 3.1.3 local peak of profile A part of a profile between two adjacent minima of the profile (see figure 1). Figure 1 Local peak of profile 3.1.4 local valley of profile A part of a profile be
25、tween two adjacent maxima of the profile (see figure 2). r Local valley of the profile Figure 2 Local valley of profile 3.1.5 motif A portion of the primary profile between the highest points of two local peaks of the profile, which are not necessarily adjacent (see . 4.4). A motif is characterized
26、by (see figures 3 and 5): - its length, ARi or AWi, measured parallel to the general direction of the profile; - its two depths, Hj and Hj+i, or HWj and HWj+i, measured perpendicular to the general direction of the primary profile; - its T characteristic, that is the smallest depth between the two d
27、epths (e.g. H. and H. 1. . ? J+I. PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-,- 3
28、 3 3 0631 : 2000 (IS0 12085 : 1996) 3.1.6 roughness motif Motif derived by using the ideal operator with limit valueA as specified in 4.2 and 5.2 (see figure 3). Note : By this definition, a roughness motif has a length ARi smaller than or equal to A. . T = MIN (Hj, Hj+d here: T =Hj+i Figure 3 Rough
29、ness motif 3.1.7 upper envelope line of the primary profile (waviness profile) Straight lines joining the highest points of peaks of the primary profile, after conventional discrimination of peaks as shown in clause 4 (see figure 4 ) . ,- Upper envelope line Figure 4 Upper envelope line 3.1.8 wavine
30、ss motif Motif derived on the upper envelope line by using the ideal operator with limit value B as . specified in 4.2 and 5.2 (see figure 5). T = MIN (HWj, HW,+i) here: T = HWj+i Figure 5 Waviness motif PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license wi
31、th JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-,- 4 B 0631 : 2000 (IS0 12085 : 1996) 3.2 Parameter definitions 3.2.1 mean spacing of roughness motifs, AR . The arithmetical mean val
32、ue of the lengths ARi of roughness motifs, within the evaluation length (see figure 6), i.e. 1 “ n i = l AR= -CAR, where n is the number of roughness motifs (equal to the number of ARi values). 3.2.2 mean depth of roughness motifs, R depths Hj of roughness motifs, within the evaluation length (see f
33、igure 6), i.e. The arithmetical mean value of the where rn is the number of Hj values. Note : The number of Hi values is twice the number of ARi values (m = 2n). 3.2.3 maximum depth of profile irregularity, Rx The largest depth, Hj, within the evaluation length. Example : On figure 6, Rx = H3. Figur
34、e 6 Roughness parameters 3.2.4 mean spacing of waviness motifs, AW The arithmetical mean value of the lengths AWi of waviness motifs, within the evaluation length (see figure 7), i.e. 1 “ AW=-CAWi i = where n is the number of waviness motifs (equal to the number of AW; values). 3.2.5 mean depth of w
35、aviness motifs, W The arithmetical mean value of the depths HWj of waviness motifs, within the evaluation length (see figure 7), i.e. where m is the number of HWj values. Note : The number of HWj values is twice the number of AWj values (rn = 2n). 3.2.6 maximum depth of waviness, Wx The largest dept
36、h HWj, within the evalu- ation length (see figure 7). PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without lice
37、nse from IHS -,-,- 5 B 0631 : 2000 (IS0 12085 : 1996) 3.2.7 total depth of waviness, Wte The distance, measured in a direction per- pendicular to the general direction of the primary profile (obtained by clause 4 and calculation method in Annex A), between the highest point and the lowest point of t
38、he upper envelope line of the primary profile (see figure 7). 2 2.5 pm 500 L x pm Figure 7 Waviness parameters 4 Theoretically exact operator of the motif method 4.1 This clause describes the identification conditions of motifs (length and depth discrimination) and presents the process for calculati
39、ng roughness and waviness parameters. General 4.2 as described in figure 8 are given under clause 5. Conventional limits of motifs The recommended values for limits A and B O Roughness motifs b) Waviness motifs Figure 8 Conventional limits of motifs 4.3 file for the assessment of surface roughness.
40、Depth discrimination The depth discrimination applies to the primary pro- 4.3.1 Discrimination based on minimum depth Divide the primary profile into sections of width A/2, and take the height of each rectangle. The local peaks taken into account are those whose depth is larger than 5 % of the mean
41、height of these rectangles (see figure 9). PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IH
42、S -,-,- 6 B 0631 : 2000 (IS0 12085 : 1996) L Local peak retained L Local peak rejected Height of this rectangle (example) (example) Z Figure 9 Depth discrimination 4.3.2 Discrimination based on-maximum depth For the roughness motifs the depths of which are Hi, the value Hj (mean value of Hj) and oHj
43、 (standard deviation) are calculated, Any depth of local peak or valley the value of which is larger than H = E j + 1.65 OH, is levelled equal to the H value (see figure 10). If the distribution of Hj is Gaussian, this condition concerns 5 % of the peaks and valleys. This discrimination obviates the
44、 risk of high isolated peaks interfering with the envelope line. Note : I I Figure 10 Discrimination based on maximum depth 4.4 Identification of roughness and waviness motifs through the combina- tion of motifs (These four conditions are related to figure 11.) In figure 11, R stands for roughness a
45、nd W for waviness. I one of the adjacent peaks. Envelope condition The first condition retains peaks, which are higher than II The second condition limits the length of motif to the A value (conventional limit between roughness and waviness) or the B value (conventional limit between waviness and re
46、sidual form), as defined in 4.2 and 5.2. Length condition III Enlargement condition The third condition eliminates the smallest peaks, by trying to find the largest motif possible. PROTECTED BY COPYRIGHT Copyright Japanese Standards Association Provided by IHS under license with JSALicensee=IHS Empl
47、oyees/1111111001, User=Wing, Bernie Not for Resale, 03/15/2007 22:55:39 MDTNo reproduction or networking permitted without license from IHS -,-,- 7 B 0631 : 2000 (IS0 12085 : 1996) It does not allow the combining of two motifs into one motif, if it results in a motif it is regarded a pair of motifs
48、(two adjacent motifs) the T characteristic of which is smaller than one of the two original motifs (71, Tz, see figure 111. (It elimi- nates small peaks which are inserted between large peaks.) IV Similar depth condition The fourth condition limits combination of motifs with similar depths, particularly for periodical surfaces. (It avoids eliminating peaks the depth of which is similar to adjacent peaks.) The combination algorithm shall be applied until no further combinat