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1、FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION Subject 1977 March 14, 2007 SUMMARY OF TOPICS The following changes in requirements are being proposed: 1. Revision of the Scope - Greater than 600 V Applications 2. Clarifi cation of the Requirements for Spacings 3. Clarifi cation of the
2、 Requirements for the Dielectric Voltage-Withstand Test 4. Clarifi cation of the Requirements for the Sequence of Testing 5. Revision of the Requirements for Test Potential in the Dielectric Voltage-Withstand Test 6. Revision of the Scope - Applicability to Other Standards 7. Revision of the Require
3、ments for Rubber Materials 8. Editorial Revision of the Requirements for the Accelerated Aging Test 9. Clarifi cation of the Requirements for the Temperature Test and for Markings 10. Revision of the Marking Requirements for Devices for Disconnecting Use 11. Addition of the Grounding Impedance Test
4、12. Addition of the Ratings Section 13. Revision of the Scope to Address UL 498 as a Supplement to this Standard 14. Revision of the Requirements for Current-Carrying Parts STP BALLOTS DUE: April 13, 2007 COMMENTS DUE: April 13, 2007 For your convenience in review, proposed additions to existing req
5、uirements are shown underlined and proposed deletions are shown lined-out. Proposed new requirements are identifi ed by (NEW). 1. Revision of the Scope - Greater than 600 V Applications RATIONALE Proposal submitted by: Jacob Killinger, Underwriters Laboratories Inc. Copyright Underwriters Laboratori
6、es Inc. Provided by IHS under license with ULLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION Connectors have been evaluated
7、 for greater than 600 V applications based on applying the end product requirements such as Spacings and Dielectric Withstand tests. Such connectors are used in high voltage applications in monitors, arc-lamp fi xtures, etc., which often utilize connectors in high voltage circuits up to 6 kV. These
8、high voltage applications are often at startup or of a short duration. Connectors evaluated for these specifi c end product high voltage applications have not been limited to the 600V maximum rating in 1.2. The spacing requirements and dielectric withstand test potential are based upon the requireme
9、nts of the end product. UL proposes a new Type 5 be established for connectors rated less than 31 A and from 601 V up to and including 6000 v ac or dc, or both. UL also proposes to identify the last explanatory paragraph of 1.2 as a Note since it contains no requirements. UL proposes to add Type 5 i
10、nto Tables 11.1 and 12.1 as well. Revisions to paragraph 11.1 are being proposed in Topic 2, but while unchanged in this topic, paragraph 11.1 is included here for ease of review. Revisions to paragraph 17.3 are also being proposed in Topic 5. Revisions to Table 12.1 are also being proposed in Topic
11、s 3 and 4. PROPOSAL 1.2 These requirements apply to devices categorized as follows (See Figure 1.1 ): a) Type 0 rated less than 8.3 A and less than 30 V rms (42 V peak); b) Type 1A rated less than 8.3 A and from 30 V up to and including 600 V ac or dc, or both; c) Type 1B rated from 8.3 A up to and
12、including 200 A, and less than 30 V rms (42 V peak); d) Type 2 rated from 8.3 A to less than 31 A and from 30 V up to and including 600 V ac or dc or both; e) Type 3 rated from 31 A up to and including 200 A and from 30 V up to and including 600 V ac or dc, or both. f) Type 4 rated from greater than
13、 200 A up to and including 1000 A, and up to and including 600 V ac or dc. g) Type 5 rated less than 31 A and from 601 V up to and including 6000 V ac or dc, or both. Type designations used in this Standard only serve as a guide to determine appropriate requirements, and do not represent an assigned
14、 rating. A device not without an assigned a current rating is considered either to be either a Type 0 or Type 1A depending upon the assigned voltage rating. This is generated text for fi gtxt. (UNCHANGED) 11.1 For devices as specifi ed in Table 11.1 there shall be a spacing through air or over surfa
15、ce of 1.2 mm (3/64 inch) or more for a device rated at 250 volts or less, and 3.2 mm (1/8 inch) or more for a device rated at more than 250 volts, between an uninsulated live part and: a) an uninsulated live part of opposite polarity, MARCH 14, 2007SUBJECT 1977-2- Copyright Underwriters Laboratories
16、 Inc. Provided by IHS under license with ULLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION b) an uninsulated grounded metal
17、 part, or c) a non-current carrying metal part that is exposed to contact by persons when the device is installed and used in the intended manner. Exception: Spacings less than those specifi ed are permitted if the device complies with the requirements in the Dielectric Voltage-Withstand Test, Secti
18、on 17. Table 11.1 Applicability of spacing requirements Type Uninsulated live part uninsulated live part of opposite polarity Uninsulated live part uninsulated grounded metal part Uninsulated live part exposed dead metal part 0NoNoNo 1AYesYesYes 1BYesYesNo 2YesYesYes 3YesYesYes 4YesYesYes 5YesYesYes
19、 (NEW) Figure 1.1 Connector type designations MARCH 14, 2007SUBJECT 1977-3- Copyright Underwriters Laboratories Inc. Provided by IHS under license with ULLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without licens
20、e from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION 11.1.1 Spacings on a Type 5 device shall meet the minimum required values for the intended end-use application. Table 12.1 Connector test programs Connector Type TypeTypeTypeTypeTypeTypeType TestSection01A1B2345 Accelerat
21、ed aging 13OOOOOOO Mold stress relief 14XXXXXXX Overload15OOOONN Temperature16YYXXXXX Dielectric voltage- withstand 17OOOOOX Resistance to arcing 18OOOONN Conductor secureness 19OOOOOOO Flammability19AOAOAOAOAOAOAOA X Required Y Required if device has an assigned current rating. O Optional for some
22、devices. Refer to test description for details. OA Optional for all devices. N Not permitted. 17.3 The test potential is to shall be: a) 500 volts for a Type 1B device; b) 1000 volts plus twice rated voltage for Types 1A, 2, 3, and 4 devices; c) the minimum required values for the intended end-use a
23、pplication for a Type 5 device, but not less than 2200 volts. 2. Clarifi cation of the Requirements for Spacings RATIONALE Proposal submitted by: Jacob Killinger, Underwriters Laboratories Inc. Paragraph 11.1 incorrectly states an or between the required through air and over surface spacings. This l
24、iterally can be interpreted to mean only one or the other of these is required. Spacings are traditionally measured for both the through air and over surface requirements. UL believes this or should be and and proposes this correction. To refl ect present practice, UL further proposes to revise the
25、requirements to clarify that the indicated spacings are minimum values. Paragraph 11.1 is also shown in Topic 1, unchanged, for ease of review of proposed requirements in that topic. MARCH 14, 2007SUBJECT 1977-4- Copyright Underwriters Laboratories Inc. Provided by IHS under license with ULLicensee=
26、IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION PROPOSAL 11.1 For devices as specifi ed in Table 11.1 there shall be a minimum spaci
27、ng through air or and over surface of 1.2 mm (3/64 inch) or more for a device rated at 250 volts or less, and a minimum of 3.2 mm (1/8 inch) or more for a device rated at more than 250 volts, between an uninsulated live part and: a) an uninsulated live part of opposite polarity, b) an uninsulated gr
28、ounded metal part, or c) a non-current carrying metal part that is exposed to contact by persons when the device is installed and used in the intended manner. Exception: Spacings less than those specifi ed are permitted if the device complies with the requirements in the Dielectric Voltage-Withstand
29、 Test, Section 17. 3. Clarifi cation of the Requirements for the Dielectric Voltage-Withstand Test RATIONALE Proposal submitted by: Jacob Killinger, Underwriters Laboratories Inc. The opening paragraph 17.1 can be misinterpreted such that the Dielectric Voltage-Withstand Test in Section 17 is only p
30、erformed when applying the reduced spacings exception to clause 11.1. In reality, the practice has been that the Dielectric Voltage-Withstand Test is always performed following the Temperature Test as stipulated in clause 17.2 regardless of whether it meets or does not meet the spacings in 11.1 or i
31、ts exception. To correct this misinterpretation, UL proposes revising 17.1 as well as Table 12.1 to refl ect present and correct practice. UL believes the wording in the exception to 11.1 already adequately addresses the need for performing the Dielectric Voltage-Withstand test when applying reduced
32、 spacing. No further elaboration is needed in Section 17, which has contributed to this past misinterpretation. Revisions to Table 12.1 are also being proposed in Topics 1 and 4. While unchanged, paragraph 17.2 is included here for ease of review. PROPOSAL 17 Dielectric Voltage-Withstand Test 17.1 D
33、evices to be evaluated in accordance with the Exception to 11.1 are to previously subjected to the temperature test shall be subjected to the test described in 17.2 17.4. Exception:Type 0 devices need not be tested. (UNCHANGED) 17.2 Immediately following the temperature test, the same devices shall
34、withstand, without arc-over or breakdown, for a period of 1 minute, the application of an essentially sinusoidal potential at a frequency in the range of 40 70 Hz. The test potential shall be applied between live parts of opposite polarity and between live parts and exposed non-current-carrying meta
35、l parts. MARCH 14, 2007SUBJECT 1977-5- Copyright Underwriters Laboratories Inc. Provided by IHS under license with ULLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR C
36、SDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION Table 12.1 Connector test programs Connector Type TypeTypeTypeTypeTypeType TestSection01A1B234 Accelerated aging 13OOOOOO Mold stress relief 14XXXXXX Overload15OOOON Temperature16YYXXXX Dielectric voltage- withstand 17O XO XO XO XO X Resistance to arcing 18O
37、OOON Conductor secureness 19OOOOOO Flammability19AOAOAOAOAOAOA X Required Y Required if device has an assigned current rating. O Optional for some devices. Refer to test description for details. OA Optional for all devices. N Not permitted. 4. Clarifi cation of the Requirements for the Sequence of T
38、esting RATIONALE Proposal submitted by: Jacob Killinger, Underwriters Laboratories Inc. Sections 15 (Overload test), 16 (Temperature test), 17 (Dielectric Voltage-Withstand test) and 18 (Resistance to Arcing test) are ambiguous regarding the need to perform some or all of these tests in proper seque
39、nce on the same samples. The requirement for sequential testing can be found in clauses 18.1 and 18.2, but this can easily be overlooked. This can also be verifi ed in Table B1 of CSA C22.2 No. 182.3. UL proposes adding a footnote to Table 12.1 and revising Sections 16 and 18 to more clearly refl ec
40、t this requirement. No revision to Section 17 is needed since the requirement is already contained in 17.2. Revisions to Table 12.1 are also being proposed in Topics 1 and 3. PROPOSAL MARCH 14, 2007SUBJECT 1977-6- Copyright Underwriters Laboratories Inc. Provided by IHS under license with ULLicensee
41、=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION Table 12.1 Connector test programs Connector Type TypeTypeTypeTypeTypeType TestSect
42、ion01A1B234 Accelerated aging 13OOOOOO Mold stress relief 14XXXXXX Overload a 15OOOON Temperature a 16YYXXXX Dielectric voltage- withstand a 17OOOOO Resistance to arcing a, b 18OOOON Conductor secureness 19OOOOOO Flammability19AOAOAOAOAOAOA X Required Y Required if device has an assigned current rat
43、ing. O Optional for some devices. Refer to test description for details. OA Optional for all devices. N Not permitted. a For female devices intended for current interruption the overload, temperature, dielectric voltage-withstand and resistance to arcing tests shall be performed in sequence using th
44、e same test specimens. b The resistance to arcing test may be performed on a separate set of specimens. See 18.2. 16.1.1 The temperature test shall be performed following the overload test, if applicable, on the same test specimens. 18 Resistance To Arcing Test 18.1 If an insulating material is used
45、 in the construction of the face of a female contact device in a way that the material is likely to be exposed to arcing while in service, the devices specimens that were subjected to 50 cycles of operation in the test described in Overload Test, Section 15, shall perform acceptably when subjected t
46、o an additional 200 cycles of operation under the overload test conditions, following the temperature and dielectric voltage-withstand tests. There shall not be any indication of electrical or mechanical failure, electrical tracking, formation of a permanent carbon path, or ignition of material. Exc
47、eption No. 1: A Type 0 device need not be subjected to this test. Exception No. 2: A device that is intended for disconnecting use, not for current interruption, and is marked in accordance with 20.4, need not be subjected to this test. Exception No. 3: A female contact device interlocked with an in
48、tegral switch or other means such that the circuit is opened before a mating male contact device can be inserted or withdrawn need not be subjected to this test. MARCH 14, 2007SUBJECT 1977-7- Copyright Underwriters Laboratories Inc. Provided by IHS under license with ULLicensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/16/2007 23:02:04 MDTNo reproduction or networking permitted without license from IHS -,-,- FOR INTERNAL UL OR CSDS USE ONLY NOT FOR OUTSIDE DISTRIBUTION 18.2 Alternatively to 18.1, one s