1、Edition1.02025-04INTERNATIONALSTANDARDNORMEINTERNATIONALEElectricalrelays-Testsandmeasurements-Part49:LongtermstabilityofsealingRelaiselectriques-Essaisetmesurages-Partie49:StabilitealongtermedePetancheite(vUs)寸olneoea寸，eegco9。山一THISPUBLICATIONISCOPYRIGHTPROTECTEDCopyright2025IEC,Geneva,SwitzerlandA
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15、04INTERNATIONALSTANDARDNORMEINTERNATIONALEElectricalrelays-Testsandmeasurements一Part49:LongtermstabilityofsealingRelaiselectriques-Essaisetmesurages-Partie49:StabilitealongtermedePetancheiteINTERNATIONALELECTROTECHNICALCOMMISSIONCOMMISSIONELECTROTECHNIQUEINTERNATIONALEICS29.120.70ISBN978-2-8327-0365
16、6Warning!Makesurethatyouobtainedthispublicationfromanauthorizeddistributor.Attention!Veuillezvousassurerquevousavezobtenucettepublicationviaundistributeuragree.RegisteredtrademarkoftheInternationalElectrotechnicalCommissionMarquedeposeedeIaCommissionElectrotechniqueInternationaleCONTENTSFOREWORD31
17、Scope52 Normativereferences53 Termsanddefinitions64 Testprocedure64.1 Purpose64.2 Procedure64.2.1 Preconditioning64.2.2 Mounting(supportingelements)64.2.3 Severity64.2.4 Testcycle74.3 Conditions85 Evaluation95.1 General95.2 Testreport9Bibliography10Figure1-Temperaturecycle8Internationalelectrotechni
18、calcommissionELECTRICALRELAYS-TESTSANDMEASUREMENTS-Part49:LongtermstabilityofsealingFOREWORD1) TheInternationalElectrotechnicalCommission(IEC)isaworldwideorganizationforstandardizationcomprisingallnationalelectrotechnicalcommittees(IECNationalCommittees).TheobjectofIECistopromoteinternationalco-oper
19、ationonallquestionsconcerningstandardizationintheelectricalandelectronicfields.Tothisendandinadditiontootheractivities,IECpublishesInternationalStandards,TechnicalSpecifications,TechnicalReports,PubliclyAvailableSpecifications(PAS)andGuides(hereafterreferredtoasIECPubIication(三).Theirpreparationisen
20、trustedtotechnicalcommittees;anyIECNationalCommitteeinterestedinthesubjectdealtwithmayparticipateinthispreparatorywork.International,governmentalandnon-governmentalorganizationsliaisingwiththeIECalsoparticipateinthispreparation.IECcollaboratescloselywiththeInternationalOrganizationforStandardization
21、ISO)inaccordancewithconditionsdeterminedbyagreementbetweenthetwoorganizations.2) TheformaldecisionsoragreementsofIEContechnicalmattersexpress,asnearlyaspossible,aninternationalconsensusofopinionontherelevantsubjectssinceeachtechnicalcommitteehasrepresentationfromallinterestedIECNationalCommittees.3
22、) IECPublicationshavetheformofrecommendationsforinternationaluseandareacceptedbyIECNationalCommitteesinthatsense.WhileallreasonableeffortsaremadetoensurethatthetechnicalcontentofIECPublicationsisaccurate,IECcannotbeheldresponsibleforthewayinwhichtheyareusedorforanymisinterpretationbyanyenduser.4) In
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24、doesnotprovideanyattestationofconformity.Independentcertificationbodiesprovideconformityassessmentservicesand,insomeareas,accesstoIECmarksofconformity.IECisnotresponsibleforanyservicescarriedoutbyindependentcertificationbodies.6) Allusersshouldensurethattheyhavethelatesteditionofthispublication.7) N
25、oliabilityshallattachtoIECoritsdirectors,employees,servantsoragentsincludingindividualexpertsandmembersofitstechnicalcommitteesandIECNationalCommitteesforanypersonalinjury,propertydamageorotherdamageofanynaturewhatsoever,whetherdirectorindirect,orforcosts(includinglegalfees)andexpensesarisingoutofth
26、epublication,useof,orrelianceupon,thisIECPublicationoranyotherIECPublications.8) AttentionisdrawntotheNormativereferencescitedinthispublication.Useofthereferencedpublicationsisindispensableforthecorrectapplicationofthispublication.9) IECdrawsattentiontothepossibilitythattheimplementationofthisdocume
27、ntmayinvolvetheuseof（八）patent(三).IECtakesnopositionconcerningtheevidence,validityorapplicabilityofanyclaimedpatentrightsinrespectthereof.Asofthedateofpublicationofthisdocument,IEChadnotreceivednoticeof（八）patent(三),whichmayberequiredtoimplementthisdocument.However,implementersarecautionedthatthismayn
28、otrepresentthelatestinformation,whichmaybeobtainedfromthepatentdatabaseavailableathttps:/patents.iec.ch.IECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights.IEC63522-49hasbeenpreparedbyIECtechnicalcommittee94:Electricalrelays.ItisanInternationalStandard.ThetextofthisInternationalStanda
29、rdisbasedonthefollowingdocuments:DraftReportonvoting94/1134/FDIS94/1148/RVDFullinformationonthevotingforitsapprovalcanbefoundinthereportonvotingindicatedintheabovetable.ThelanguageusedforthedevelopmentofthisInternationalStandardisEnglish.ThisdocumentwasdraftedinaccordancewithISO/IECDirectives,Part2,
30、anddevelopedinaccordancewithISO/IECDirectives,Part1andISO/IECDirectives,IECSupplement,availableatwww.iec.ch/members_experts/refdocs.ThemaindocumenttypesdevelopedbyIECaredescribedingreaterdetailatwww.iec.ch/publications.AlistofallpartsofIEC63522series,publishedunderthegeneraltitleElectricalrelays-Tes
31、tsandmeasurements,canbefoundontheIECwebsite.ThisInternationalStandardistobeusedinconjunctionwithIEC63522-0:-1ThecommitteehasdecidedthatthecontentsofthisdocumentwillremainunchangeduntilthestabilitydateindicatedontheIECwebsiteunderwebstore.iec.chinthedatarelatedtothespecificdocument.Atthisdate,thedocu
32、mentwillbe reconfirmed, withdrawn,or revised.Electricalrelays-TESTSANDMEASUREMENTS-Part49:Longtermstabilityofsealing1 ScopeThispartofIEC63522isusedfortestingallkindsofelectricalrelaysandforevaluatingtheirabilitytoperformunderexpectedconditionsoftransportation,storageandallaspectsofoperationaluse.NOT
33、EExamplesforelectricalrelaysinthesenseofthisdocumentincludeelectromechanicalrelays,reedrelays,reedcontacts,reedswitches,solidstaterelays,timerelaysandtechnologycombinationsofthese.Thisdocumentdefinesastandardtestmethodforlongtermstabilityofsealing.2 NormativereferencesThefollowingdocumentsarereferre
34、dtointhetextinsuchawaythatsomeoralloftheircontentconstitutesrequirementsofthisdocument.Fordatedreferences,onlytheeditioncitedapplies.Forundatedreferences,thelatesteditionofthereferenceddocument(includinganyamendments)applies.IEC63522-0:-Electricalrelays-Testsandmeasurements-Part0:GeneralandguidanceU
35、nderpreparation.Stageatthetimeofpublication:IECCDV63522-0:2024.3Underpreparation.Stageatthetimeofpublication:IECFDIS63522-1:2024.Under-IEC63522-1:-,Electricalrelays-Testsandmeasurements-Part1:VisualinspectionandcheckofdimensionsIEC63522-4:-Electricalrelays-Testsandmeasurements-Part4:Dielectricstreng
36、thtestpreparation.Stageatthetimeofpublication:IECFDIS63522-4:2024.5UnderIEC63522-7:-Electricalrelays-Testsandmeasurements-Part7:Functionaltestspreparation.Stageatthetimeofpublication:IECFDIS63522-7:2024.Underpreparation.Stageatthetimeofpublication:IECFDIS63522-10:2024.7IEC63522-10:-,Electricalrelays
37、Testsandmeasurements-Part10:HeatingIEC63522-11:-,Electricalrelays-Testsandmeasurements-Part11:Enclosureprotectionanddegreeofprotection73 TermsanddefinitionsForthepurposesofthisdocument,thetermsanddefinitionsgiveninIEC63522-0apply.ISOandIECmaintainterminologydatabasesforuseinstandardizationatthefoll
38、owingaddresses: IECElectropedia:availableathttps:/www.electropedia.org/ ISOOnlinebrowsingplatform:availableathttps:/www.iso.org/obp4Testprocedure4.1 PurposeThistestapplieswheresealingisnecessarytoensuretheproperfunctionality,safetyandperformanceagainstspecifiedparameters.Thistestapplieswheretheopera
39、tionalpropertiesoftherelaydependonaninternalgaschamber(e.g.contactchamber)withspecificproperties(e.g.evacuatedvolume,gas-f川edvolume.).ThetestshallbecarriedoutforRTIVorRTVrequirements.Whereapplicabletherelevantgaschambershallbetestedseparately.NOTEThisleakingtestisbasedonthecombinationofIEC60068-2-14
40、andIEC63522-11:-,4.3.4.2 Procedure4.2.1 PreconditioningIfrequired,theDUTmaybesubjectedtopreconditioningasspecifiedintherelevantspecification.4.2.2 Mounting(supportingelements)Thesupportingelement(三)ofthetestsampleshallhavethelowestpossibleimpactonthesamplesthemselvesandwithstandthetemperaturesduring
41、thetest.NOTEThiscanbeachievedbyusingmaterialwithveylowspecificheatorusingdesignesimplyingverylowcontacttothesamples,forexampleneedlecontacts.Inordertoapplyahigherrateoftemperaturechange,thethermocouplesshallbepositioneddirectlyontheterminalsascloseaspossibletotheDUTbody.4.2.3 SeverityTheseverityofth
42、etestisdefinedbythecombinationofthetwotemperatures,therateoftemperaturechange,theexposuretimeoftheDUTandthenumberofcycles.ThelowertemperatureTAshallbespecifiedintherelevantspecification.Ifnototherwisespecified,7kshallbe+5.Preferredvaluesare:-65,-55,-50,-40,-33,-25,-20oC5-10oC,-5,and+5.TheMighertempe
43、ratureTBshallbespecifiedintherelevantspecification.Ifnototherwisespecified,Tbshallbe+60.Preferredvaluesare:+200,+175oC5+155,+125,+100,+85,+70,+65,+60,+55,+50,+45,+40,+35and+30.Theairtemperatureshallbeloweredorraisedbetween90%and10%ofD=Tb-7)kwithinatoleranceof20%ofthetemperaturechangerate.Ifnototherw
44、isespecified,thetemperaturechangerateshallbe(10,2)Kmin.Preferredvaluesare:(10,2)Kmin,(30,6)Kmin,(51)Kmin,(102)Kmin,(153)Kmin.Theexposuretime,r1,toeachofthetwotemperaturesdependsupontheheatcapacityoftheDUT.Itcanbe3h,2h,1h,30min,or10min,orasspecifiedintherelevantspecification.Wherenoexposureperiodissp
45、ecifiedintherelevantspecificationitisunderstoodtobe3h.TheDUTshallbesubjectedto50consecutivecycles,unlessotherwisespecifiedintherelevantspecification.4.2.4 TestcycleTheDUTandthetemperatureintestchambershallbeattheambienttemperatureof+255K.Ifrequiredbytherelevantspecification,theDUTshallbebroughtintoo
46、peratingcondition.Theairtemperatureinthechambershallthenbeloweredtothespecifiedlowtemperature,7,atthespecifiedrate(seeFigure1).Aftertemperatureequilibriuminthechamberhasbeenreached,theDUTshallbeexposedtothelowtemperatureconditionforthespecifiedperiod,t.Theairtemperatureinthechambershallthenberaisedt
47、othespecifiedhightemperature,Tb,atthespecifiedrate(seeFigure1).Aftertemperatureequilibriuminthechamberhasbeenreached,theDUTshallbeexposedtothehightemperatureconditionforthespecifiedperiod,t.Theairtemperatureinthechambershallthenbeloweredtothevalueofthelaboratoryambienttemperature,255K,atthespecified
48、rate(seeFigure1).Thisprocedureconstitutesonecycle.FlrStCyCIeAVSeCondCyCleIECFigure1-TemperaturecycleAhigherrateofchangecanbeusedifthedifferencebetweenthetemperaturemeasuredonrelayterminalsandtheambienttemperatureofthechamberislessthan3,atlowertemperatureTXorathighertemperatureTb,orboth,beforetheendoftherequestedexposuretime(z1).Attheconclusionofth
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