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1、BRITISH STANDARD BS EN 169000:1993 Incorporating Amendment No. 1 Harmonized system of quality assessment for electronic components Generic specification: Quartz crystal controlled oscillators The European Standard EN 169000:1992, with the incorporation of amendment A1:1998, has the status of a Briti
2、sh Standard ICS 29.300 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169000:1993 This British Standard, having been prepared under the direction of the Electronic Components Standards Policy Committee, was published under the authori
3、ty of the Standards Board and comes into effect on 15 August 1993 BSI 05-1999 The following BSI references relate to the work on this standard: Committee reference ECL/11 Special announcement in BSI News July 1993 ISBN 0 580 22443 0 Cooperating organizations The European Committee for Electrotechnic
4、al Standardization (CENELEC), under whose supervision this European Standard was prepared, comprises the national committees of the following countries: AustriaItaly BelgiumLuxembourg DenmarkNetherlands FinlandNorway FrancePortugal GermanySpain GreeceSweden IcelandSwitzerland IrelandUnited Kingdom A
5、mendments issued since publication Amd. No.DateComments 10024July 1998Indicated by a sideline in the margin Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169000:1993 BSI 05-1999i Contents Page Cooperating organizationsInside front co
6、ver National forewordii Foreword2 Text of EN 1690007 National annex NA (informative) Committees responsible64 National annex NB (informative) Cross-references64 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN 169000:1993 ii BSI 05-1999
7、 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee and is the English language version of EN 169000:1992 Generic specification: Quartz crystal controlled oscillators, including amendment A1:1998 published by the Euro
8、pean Committee for Electrotechnical Standardization (CENELEC) Electronic Components Committee (CECC). BS EN 169000 supersedes BS 9620:1975, which is withdrawn. The British Standard which implements the CECC Rules of Procedure is BS 9000-2:1991 General requirements for a system for electronic compone
9、nts of assessed quality Part 2 Specification for the national implementation of the CECC system. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard doe
10、s not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, the EN title page, pages 2 to 64 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This
11、 will be indicated in the amendment table on the inside front cover. Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 169000 December 1992 + A1 February 1998 UDCSupersedes CECC 69000 Issue
12、1:1991 Descriptors: Quality, electronic components, quartz crystal controlled oscillators English version Generic Specification: Quartz crystal controlled oscillators (includes amendment A1:1998) Spcification Gnrique: Oscillateurs pilotes par quartz (inclut lamendement A1:1998) Fachgrundspezifikatio
13、n: Quarzoszillatoren (enthlt nderung A1:1998) This European Standard was approved by CENELEC Electronic Components Committee (CECC) on 3 December 1992. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the s
14、tatus of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CECC General Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (Engli
15、sh, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austr
16、ia, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and L
17、uxembourg. CECC CENELEC Electronic Component Committee Comit des Composants Electroniques du CENELEC CENELEC Komitee fr Bauelemente der Elektronik General Secretariat: Gartenstr. 179, D-6000 Frankfurt/Main 70 1992 Copyright reserved to CENELEC members Ref. No. EN 169000:1992 + A1:1998 E Licensed Cop
18、y: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169000:1992 BSI 05-1999 2 Foreword This specification was prepared by CECC WG 17 “Piezoelectric devices for frequency control and selection”. It is based, wherever possible, on the Publications of the I
19、nternational Electrotechnical Commission (IEC) and in particular on IEC 679-1: Quartz crystal controlled oscillators: Part 1: General information, test conditions and methods. The CECC voting procedure for the conversion of publication CECC 69000 Issue 1:1991 to EN has resulted in a positive vote. T
20、he voting report document CECC (Secretariat) 3253/11.92 has been submitted for formal approval and has been accepted. The reference document was approved by CECC as EN 169000:1992 on 3 December 1992. The following dates were fixed: Foreword to amendment A1 This amendment to the European Standard EN
21、169000:1992 was prepared by CLC/TC CECC/SC 49 (former WG 17). The text of the draft based on document CECC (Secretariat) 3336 was submitted to the formal vote; together with the voting report, circulated as document CECC (Secretariat) 3454, it was approved as amendment A1 to EN 169000:1992 on 1993-1
22、1-02. The following dates were fixed: Preface The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality.
23、The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are th
24、ereby acceptable in all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for Quartz crystal controlled oscillators. It should b
25、e read in conjunction with the current regulations for the CECC System. Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electron
26、ic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The componen
27、ts produced under the System are thereby acceptable in all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmonized specifications for QUARTZ CRYSTAL
28、CONTROLLED OSCILLATORS. It should be read in conjunction with the current regulations for the CECC System. At the date of printing of this specification, the member countries of the CECC are, Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spai
29、n, Sweden, Switzerland and the United Kingdom. latest date of announcement of the EN at national level(doa) 1993-12-28 latest date of publication of an identical national standard(dop) 1994-06-28 latest date of declaration of national standards obsolescence1994-06-28 latest date of withdrawal of con
30、flicting national standards(dow) 2003-12-28 latest date by which the amendment has to be implemented at national level by publication of an identical national standard or by endorsement(dop) 1998-08-01 latest date by which the national standards conflicting with the amendment have to be withdrawn(do
31、w) 1999-08-01 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169000:1992 BSI 05-19993 Preface This specification was prepared by CECC WG 17: Piezoelectric devices for frequency control and selection. It is based, wherever possible, on th
32、e Publications of the International Electrotechnical Commission and in particular on IEC 679-1: Quartz crystal controlled oscillators: Part 1: General information, test conditions and methods. The text of this specification was circulated to the CECC for voting in the document(s) indicated (listed)
33、below and was ratified by the President of the CECC for printing as a CECC Specification. DocumentDate of Voting Report on the Voting CECC (Secretariat) 2569 August 1990 CECC (Secretariat)2697 CECC (Secretariat) 2714 February 1991 CECC (Secretariat)2775 Licensed Copy: sheffieldun sheffieldun, na, Fr
34、i Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169000:1992 4 BSI 05-1999 Contents Page Foreword2 Preface2 Section 1. Scope Section 2. General 2.1Order of precedence7 2.2Related documents7 2.3Units, symbols and terminology8 2.4Preferred ratings and characteristics15 2.5Marking15 Sect
35、ion 3. Quality assessment procedures 3.1Primary stage of manufacture16 3.2Structurally similar components16 3.3Subcontracting16 3.4Incorporated components16 3.5Manufacturers approval16 3.6Approval procedures16 3.7Procedures for capability approval17 3.8Procedures for qualification approval17 3.9Test
36、 procedures18 3.10Screening requirements18 3.11Rework and repair work18 3.12Certified test records18 3.13Validity of release18 3.14Release for delivery18 3.15Unchecked parameters18 Section 4. Test and measurement procedures 4.1General19 4.2Test and measurement conditions19 4.2.1Standard conditions f
37、or testing19 4.2.2Equilibrium conditions19 4.2.3Air flow conditions for temperature tests19 4.2.4Power supplies19 4.2.5Precision of measurement19 4.2.6Precautions20 4.2.7Alternative test methods20 4.3Visual inspection20 4.4Dimensioning and gauging procedures20 4.5Electrical test procedures20 4.5.1In
38、sulation resistance20 4.5.2Voltage proof21 4.5.3Input power22 Page 4.5.4Output frequency23 4.5.5Frequency/temperature characteristics24 4.5.6Frequency/load coefficient25 4.5.7Frequency/voltage coefficient25 4.5.8Frequency stability with thermal transient26 4.5.9Startup time27 4.5.10Stabilization tim
39、e28 4.5.11Frequency adjustment28 4.5.12Retrace characteristics28 4.5.13Oscillator output voltage (sinusoidal)29 4.5.14Oscillator output voltage (pulse waveform)30 4.5.15Oscillator output waveform (sinusoidal)30 4.5.16Oscillator output waveform (pulse)33 4.5.17Oscillator output power (sinusoidal)34 4
40、.5.18Oscillator output impedance (sinusoidal)34 4.5.19Re-entrant isolation34 4.5.20Output suppression of gated oscillators34 4.5.21Tri-state output characteristics35 4.5.22Amplitude modulation characteristics36 4.5.23Frequency modulation characteristics43 4.5.24Spurious responses46 4.5.25Phase noise
41、46 4.5.26Phase noise vibration47 4.5.27Phase noise acoustic48 4.5.28Noise pedestal48 4.5.29Spectral purity49 4.5.30Incidental frequency modulation49 4.5.31R.M.S. fractional frequency fluctuations50 4.5.32Electromagnetic interference (radiated)54 4.6Mechanical and environmental test procedures57 4.6.
42、1Robustness of terminations57 4.6.2Sealing tests57 4.6.3Soldering57 Licensed Copy: sheffieldun sheffieldun, na, Fri Nov 17 08:20:27 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EN 169000:1992 BSI 05-19995 Page 4.6.4Rapid change of temperature: two-fluid-bath method58 4.6.5Rapid change of temperature w
43、ith prescribed time transition58 4.6.6Bump58 4.6.7Vibration58 4.6.8Shock59 4.6.9Free fall59 4.6.10Acceleration, steady state59 4.6.11Acceleration 2g tip over59 4.6.12Acoustic noise59 4.6.13Low air pressure59 4.6.14Dry heat59 4.6.15Damp heat, cyclic59 4.6.16Cold59 4.6.1Climatic sequence60 4.6.18Damp
44、heat steady state60 4.6.19Salt mist cyclic60 4.6.20Mould growth60 4.6.21Immersion in cleaning solvents60 4.6.22Radiation hardness60 4.7Endurance test procedure60 4.7.1Ageing60 4.7.2Extended ageing61 4.7.3Power consumption ageing61 Annex A Load circuit for logic drive62 Figure 1 Example of the use of
45、 frequency offset10 Figure 2 Typical frequency fluctuation characteristics13 Figure 3 Characteristics of an output waveform14 Figure 4 Test circuits for insulation resistance measurements21 Figure 5 Test circuit for voltage proof test21 Figure 6 Test circuit for oscillator input power measurement22
46、Figure 7 Test circuit for oven and oscillator input power measurement23 Figure 8 Test circuit for measurement of output frequency method 124 Figure 9 Test circuit for measurement of output frequency method 224 Figure 10 Test circuit for measurement of frequency/temperature characteristics25 Page Fig
47、ure 11 Thermal transient behaviour of typical oscillator26 Figure 12 Test circuits for startup time measurement27 Figure 13 Typical oscillator stabilazation characteristic28 Figure 14 Example of retrace characteristic29 Figure 15 Test circuit for the measurement of output voltage30 Figure 16 Test ci
48、rcuit for the measurement of pulse outputs30 Figure 17 Test circuit for Harmonic distortion measurement31 Figure 18 Quasi-sinusoidal output waveforms32 Figure 19 Frequency spectrum for harmonic distortion33 Figure 20 Test circuit for the determination of isolation between output ports35 Figure 21 Te
49、st circuit for measuring suppression of gated oscillators35 Figure 22 Test circuit for Tri-state disable mode output current36 Figure 23 Test circuit for output gating time tri-state37 Figure 24 Test circuit for modulation index measurement37 Figure 25 Modulation waveform for index calculation38 Figure 26 Logarithmic signal amplitude scale38 Figure 27 Test circuit to determine amplitude modulation sensitivity39 Figure 28 Frequency Spectrum of amplitude modulation distortion39 Figure 29