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1、BRITISH STANDARD BS EN ISO 14880-3:2006 Optics and photonics Microlens arrays Part 3: Test methods for optical properties other than wavefront aberrations The European Standard EN ISO 14880-3:2006 has the status of a British Standard ICS 31.260 ? Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 1
2、9 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI BS EN ISO 14880-3:2006 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 30 June 2006 BSI 2006 ISBN 0 580 48721 0 National foreword This British Standard is the official English language ver
3、sion of EN ISO 14880-3:2006. It is identical with ISO 14880-3:2006. The UK participation in its preparation was entrusted by Technical Committee CPW/172, Optics and photonics, to Subcommittee CPW/172/9, Electro-Optical systems, which has the responsibility to: A list of organizations represented on
4、this subcommittee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by
5、 using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immuni
6、ty from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep UK interests informed; monitor related international and European developments and promulgate them in th
7、e UK. Summary of pages This document comprises a front cover, an inside front cover, the EN ISO title page, the EN ISO foreword page, the ISO title page, pages ii to v, a blank page, pages 1 to 14, an inside back cover and a back cover. The BSI copyright notice displayed in this document indicates w
8、hen the document was last issued. Amendments issued since publication Amd. No. DateComments Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN ISO 14880-3 June 2006 ICS 31.260 English Version
9、 Optics and phonotics - Microlens arrays - Part 3: Test methods for optical properties other than wavefront aberrations (ISO 14880-3:2006) Optique et phonotique - Rseaux de microlentilles - Partie 3: Mthodes dessai pour les proprits optiques autres que les aberrations du front donde (ISO 14880-3:200
10、6) Optik und Photonik - Mikrolinsenarrays - Teil 3: Prfverfahren fr optische Eigenschaften auer Wellenfrontaberrationen (ISO 14880-3:2006) This European Standard was approved by CEN on 3 May 2006. CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the condition
11、s for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CEN member. This European Standard exists in three offi
12、cial versions (English, French, German). A version in any other language made by translation under the responsibility of a CEN member into its own language and notified to the Central Secretariat has the same status as the official versions. CEN members are the national standards bodies of Austria,
13、Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. EUROPEAN COMMITTEE FOR STAND
14、ARDIZATION COMIT EUROPEN DE NORMALISATION EUROPISCHES KOMITEE FR NORMUNG Management Centre: rue de Stassart, 36 B-1050 Brussels 2006 CENAll rights of exploitation in any form and by any means reserved worldwide for CEN national Members. Ref. No. EN ISO 14880-3:2006: E Licensed Copy: sheffieldun shef
15、fieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Foreword This document (EN ISO 14880-3:2006) has been prepared by Technical Committee ISO/TC 172 “Optics and optical instruments“ in collaboration with Technical Committee CEN/TC 123 “Lasers and photonics “, the secretariat
16、of which is held by DIN. This European Standard shall be given the status of a national standard, either by publication of an identical text or by endorsement, at the latest by December 2006, and conflicting national standards shall be withdrawn at the latest by December 2006. According to the CEN/C
17、ENELEC Internal Regulations, the national standards organizations of the following countries are bound to implement this European Standard: Austria, Belgium, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, M
18、alta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. Endorsement notice The text of ISO 14880-3:2006 has been approved by CEN as EN ISO 14880-3:2006 without any modifications. EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffield
19、un, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI Reference number ISO 14880-3:2006(E) INTERNATIONAL STANDARD ISO 14880-3 First edition 2006-06-01 Optics and photonics Microlens arrays Part 3: Test methods for optical properties other than wavefront aberrations Optique et photon
20、ique Rseaux de microlentilles Partie 3: Mthode dessai pour les proprits optiques autres que les aberrations du front donde EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI ii Licensed Copy: sheffieldun sheffieldun, na, Sun
21、 Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iii Contents Page Foreword iv Introduction v 1 Scope . 1 2 Normative references. 1 3 Terms and definitions. 1 4 Substrate test 1 5 Microscope test method 1 5.1 Principle. 1 5.2 Measurement arrangement and test equipment 2 5.3 Preparation 4
22、6 Procedure 4 6.1 General. 4 6.2 Measurement of effective back or front focal length 4 6.3 Measurement of chromatic aberration . 4 6.4 Measurement of the uniformity of the focal spot positions. 5 7 Results and uncertainties 5 8 Coupling efficiency, imaging quality 6 9 Test report . 6 Annex A (inform
23、ative) Measurements with wavefront measuring systems. 8 Annex B (normative) Confocal measurement of effective back or front focal length of lens array 10 Annex C (informative) Coupling efficiency, imaging quality . 12 Annex D (normative) Measurement of the uniformity of the focal spot positions of a
24、 microlens array . 13 Bibliography. 14 EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI iv Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO membe
25、r bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmenta
26、l and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directi
27、ves, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies
28、 casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 14880-3 was prepared by Technical Committee ISO/TC 172, Optics and photonics, Su
29、bcommittee SC 9, Electro-optical systems. ISO 14880 consists of the following parts, under the general title Optics and photonics Microlens arrays: Part 1: Vocabulary Part 2: Test methods for wavefront aberrations Part 3: Test methods for optical properties other than wavefront aberrations Part 4: T
30、est methods for geometrical properties EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI v Introduction This part of 14880 specifies methods of testing optical properties, other than wavefront aberrations, of microlens arra
31、ys. Examples of applications for microlens arrays include three-dimensional displays, coupling optics associated with arrayed light sources and photo-detectors, enhanced optics for liquid crystal displays, and optical parallel processor elements. The testing of microlenses is in principle similar to
32、 testing any other lens. The same parameters need to be measured and the same techniques used. However, in many cases the measurement of very small lenses presents practical problems which make it difficult to use the standard equipment that is available for testing normal size lenses. The market in
33、 microlens arrays has generated a need for agreement on basic terminology and test methods. Standard terminology and clear definitions are needed not only to promote applications but also to encourage scientists and engineers to exchange ideas and new concepts based on common understanding. This par
34、t of 14880 contributes to the purpose of the series of ISO 14880 standards which is to improve the compatibility and interchangeability of lens arrays from different suppliers and to enhance development of the technology using microlens arrays. The measurement of focal length is described in the bod
35、y of this part of ISO 14880 and the use of an alternative technique, interferometry, is described in Annex A. Measurement of the focal length of an array of microlenses, using a confocal technique, is described in Annex B. Coupling efficiency and imaging quality are discussed in Annex C. Measurement
36、 of the focal spot positions of an array of microlenses in parallel, using the Shack-Hartmann technique, is described in Annex D. EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI blank Licensed Copy: sheffieldun sheffieldu
37、n, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 1 Optics and photonics Microlens arrays Part 3: Test methods for optical properties other than wavefront aberrations 1 Scope This part of ISO 14880 specifies methods for testing optical properties, other than wavefront aberrations
38、, of microlenses in microlens arrays. It is applicable to microlens arrays with very small lenses formed on one or more surfaces of a common substrate and to graded index microlenses. 2 Normative references The following referenced documents are indispensable for the application of this document. Fo
39、r dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 14880-1, Optics and photonics Microlens arrays Part 1: Vocabulary ISO 10110-5, Optics and optical instruments Preparation of drawings for
40、optical elements and systems Part 5: Surface form tolerances 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 14880-1 apply. 4 Substrate test The optical quality of the substrate contributes to the quality of the focal positions defined by the microle
41、nses and shall be quantified in accordance with ISO 10110-5. 5 Microscope test method 5.1 Principle The basic principle is to locate, by optical means, the surface of the microlens under test. The effective back (front) focal length is determined by measuring the axial displacement necessary to loca
42、te the focal position. EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 2 5.2 Measurement arrangement and test equipment 5.2.1 General The testing of microlenses is similar in principle to testing larger lenses. In many ca
43、ses however, the measurement of very small lenses presents practical problems which make it difficult to use standard equipment. In general, two optical techniques can be used. One is based on microscopy, the other is based on interferometry. The first technique uses a microscope to locate, by focus
44、ing, the vertex of the microlens. The effective back (front) focal length is deduced from a measurement of the displacement necessary to refocus the microscope on the image of a distant source as shown in Figure 1. A focusing aid in the microscope such as a split-field focusing graticule enables the
45、 featureless vertex of a microlens to be more readily located when viewing with reflected light. For focal length measurements the distant point source may be the emitting tip of an optical fibre or an illuminated test graticule. Tests may be performed with white light or monochromatic illumination.
46、 The second technique uses wavefront sensing to locate the test surface or the centre of curvature. The location test may be carried out with the help of one of the following devices: Fizeau interferometer, Twyman-Green interferometer, lateral shearing interferometer, or Shack-Hartmann device. These
47、 are more fully described in ISO 14880-2 and ISO/TR 14999-1. One advantage of interferometry is that for strongly aberrated lenses, the variation in focal length with aperture radius can be readily deduced from the interference patterns. A disadvantage is that tests are restricted to the wavelength
48、of the interferometer light source. Key 1 distant point source 2 substrate and microlens producing focussed spot 3 microscope objective 4 axial adjustment of microscope to locate lens surface and focus 5 beamsplitter 6 source for focus location on lens surface 7 charge-coupled device (CCD) camera Fi
49、gure 1 A collimated source and microscope used to measure the effective back or front focal length of a microlens EN ISO 14880-3:2006 Licensed Copy: sheffieldun sheffieldun, na, Sun Nov 19 12:52:17 GMT+00:00 2006, Uncontrolled Copy, (c) BSI 3 Clauses 5 to 9 concentrate on the microscope technique while an interferometric technique is described in Annex A and a Shack-Hartmann technique in Annex D. The confocal measurement of the effective focal lengths