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1、Electronic Industries Alliance 23 January 2004 SUBJECT: Standards Proposal No. 5053, Proposed Revision of ANSVEIA-576, Resistors, Rectangular, Surface Mount, Precision” (if approved, to be published as ANSVEIA-576-A). BACKGROUND: The P-I Committee, at its October 2003 meeting authorized circulation
2、of the document for SP balloting and public review comment. SP-5053 is herewith submitted to the P-I membership for voting and for ANSI public review and other interested parties for comment as steps towards standardization. Please provide the following information whether voting or commenting via p
3、ublic review. Number each comment whether it is either editorial andlor technical. Company Name - Comment No. Type of Comment Reference Suggested Change Rationale for Technical Change - Technical or Editorial - Page No., Clause No., Line - Change From: . To: . Add:, Delete: FOR PURPOSE OF COMMITTEE
4、VOTE: VOTING PERIOD EXPIRES MARCH 23,2004 FOR PURPOSE OF PUBLIC REVIEW: COMMENT PERIOD EXPIRES MARCH 23,2004 Prior to this date, you may forward your comments to the designated EIA contact noted below. Following the expiration of the comment period, this Standards Proposal will be submitted to the E
5、IA Technology Strategy (if approved to be published as ANSVEIA-576- A.) METHODS FOR ANSI PUBLIC REVIEW COMMENT SUBMISSION TO SUBMIT COMMENTS: (For expediency, we encourage the submittal of your comments via e-mail). E-mail your comments, prior to the deadline to: cvatesOecaus.orq. Include in the sub
6、ject line “ANSI SP- 5053 Comments”. Include the contact information indicated at the bottom of this page. (This method is preferred). Fax your comments, prior to the deadline, to 703-875-8908. Include this form with your signature FAX: 703-875-8908; Email: cvatesOecaus.org COMMENT PERIOD EXPIRES: MA
7、RCH 23,2004 Each comment submission should indicate either: I am providing the attached technical comments concerning standardization of the contents of SP-5053 as an American National Standard, and recommend that the attached, along with the reason(s) for making the recommendation, be considered by
8、 the P-I Committee. I am providing the attached editorial comments concerning standardization of the contents of SP-5053 as an American National Standard, and recommend that the attached, along with the reason(s) for making the recommendation, be considered by the P-1 Committee. DATE TEL: NAME (Plea
9、se print) NAME (Sig na t Ure) E-MAIL: COMPANY ADDRESS . -111- Copyright Electronic Components, Assemblies the first three digits represent significant figures and the last digit represents the number of zeros to follow. When the value of resistance is less than 1000, the letter “R” shall be substitu
10、ted for one of the significant digits to represent the decimal point. When the letter “R“ is used, succeeding digits of the group represent significant figures. The resistance value designations are shown in Table III. Zero ohm jumper chip resistors are identified by three zeros. 1.2.3.1 Standard Va
11、lues The standard values for every decade shall follow the sequence of IEC Publication 63. Refer to Table IV 1.2.4 Resistance Tolerance The resistance tolerance is identified by a single letter: “F” for 1%, “D” for OS%, “C” for 0.25%, “B” for 0.1%, and “A” for 0.05%. 1.2.5 Resistance Range The resis
12、tance range applicable to this standard is 10 ohms to 1 megohm, inclusive. Characteristics for nominal Copyright Electronic Components, Assemblies the “dipping“ method gives no measurement of the speed of wetting; it does, however, indicate whether adequate wetting can be achieved within the specifi
13、ed time. Evaluation: Units shall be visually examined under magnification to confirm a minimum coverage of 95% of clean and smooth solder on both top and bottom surface of the wrap-around termination. The solder coated surfaces may contain small amounts of scattered imperfections, such as pin holes,
14、 non-wetted or dewetted areas; however, these areas shall not be concentrated in one area or on one terminal surface. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/
15、2007 00:31:00 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-576-A Page 10 of 12 3.13 Leach Resistance - Demetallization a) Preparation: The resistors shall be prepared for solder bath immersion as specified in 3.12.1 (a) and (b). b) Immersion: Specimen shall be immers
16、ed in molten solder as specified in 3.12.1 (c), except the immersion profile shall be 30 L 5 seconds at 260 “C & 5 OC. NOTE: In wave soldering, the speed of dissolution of metallization is much greater than in a static dip. With wave, reflow or vapor-phase soldering, the component may be subjected t
17、o subsequent iron soldering for touchup repair. A long immersion at high temperature is therefore specified for testing the resistance of the metallization to dissolution in molten solder. Evaluation: a) Areas where metallization is lost during immersion as indicated by a void in the termination sur
18、face, shall not individually exceed 5% of the area of any single face of the terminal area, nor collectively exceed 10% of the total terminal area. b) The functional connection of the terminal area to the resistive element connection shall not be exposed. c) Where the metallization of a terminal ext
19、ends over edges onto adjacent surfaces, loss of metallization on the edges shall not exceed 10% of their total length. 3.14 Life Resistors shall be tested in accordance with the following: a) Mounting: Resistors shall be mounted on a test board as specified in 3.2.1. b) Measurement before test: Prio
20、r to the start ofthe test, the dc resistance shall be measured as specified in 3.4. c) Measurements: At the option of the tester, dc resistance measurement may be performed at the elevated ambient temperature (see (d) below). The initial dc resistance measurement shall be performed after stabilizati
21、on and within 8 hours of placement in the chamber. d) The test temperature shall be 70 “C ambient forced circulating air. The test specimen, however, shall be baffled e) Operating Conditions - Rated dc continuous working voltage shall be applied intermittently for 1.5 hours on, 0.5 so as not to be s
22、ubjected to direct air-flow. hour off. f) Measurements during test - The dc resistance shall be measured at 100 5 4, 500 k 8, and 1000 $: 24 hours and the change in resistance calculated. Measurements may be taken in or out of the chamber, but all measurements must be made under the same conditions.
23、 Evaluation: When resistors are tested as specified, there shall be no evidence of mechanical damage and the change in resistance between the initial measurement and any of the succeeding measurements shall not exceed the value specified in Table II. 3.15 Resistance to Solvents: Resistors shall be t
24、ested for resistance to solvents in accordance with the procedures specified in Method 2 i 5 of a) They shall be visually examined for evidence of damage to the marking and coating over the resistive element MIL-STD-202. Copyright Electronic Components, Assemblies & Materials Association Provided by
25、 IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:31:00 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-5 76-A Page i1 of 12 4.0 QUALITY ASSESSMENT 4.1 Qualification (Certification of Design Performance) For q
26、ualification of a style, the test group shall comprise, as a minimum, the lowest, the critical and highest value for the style and resistance range being qualified. For qualification, a complete test sequence consisting of all the tests of Table V shall be conducted and the acceptability levels comp
27、lied with. 4.2 Quality Assurance Requirements: The testing listed below shall be conducted on an ongoing basis in order to verily the continued acceptability of the resistor performance. Where approved by the qualifying activity, the use of process control techniques may be substituted for some of t
28、he verification tests. The manufacturer shall prepare a test plan that describes the procedure to be used for test sampling and should include the frequency and resistance values of decades to be tested. 4.2.1 Group A: Tests listed under Group I of Table V are to be conducted on samples used for Gro
29、ups II, III, IV and IX. 4.2.2 Group B: Tests listed under Groups III through IX of Table V, shall be conducted as required for qualityiperformance audits, but not less frequently than monthly for Groups V and VI, quarterly for Group VIII, semiannually for Group VI1 and annually for Groups III, IV an
30、d IX. 4.2.3 Group C: Tests listed under Group II of Table V, shall be conducted on a semiannual basis. 4.2.4 A complete product evaluation consisting of all of Table V groups shall be conducted for qualification. Copyright Electronic Components, Assemblies & Materials Association Provided by IHS und
31、er license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:31:00 MDTNo reproduction or networking permitted without license from IHS -,-,- EIA-576-A Page 12 of 12 # UNITS/STYLE TABLE V TEST SEQUENCE AND ACCEPTABILITY LEVELS ACCIREJ EXAMINATION/TEST GROUP I
32、 Visual & Mechanical DC Resistance GROUP II Resistance-Temperature Characteristic Thermal Shock TEST METHOD 3.3 3.4 3.11 3.5 Short-Time Overload GROUP III 3.6 30 o/ 1 30 o/ 1 Moisture Resistance GROUP IV Life GROUP V Solderability Resistance to Solvents GROUP VI Leaching GROUP VI1 3.10 3.14 3.12 3.1
33、5 3.13 * NOTE: Number of units per Group are the minimum acceptable to statistically support reliability. When more than one value is tested, the test group shall be equally divided between the values, but shall have no fewer than 10 units per value. 30 36 30 30 o/ 1 o/ 1 o/ 1 o/ 1 Effects of Bondin
34、g GROUP VI11 3.8 Terminal Strength High Temperature Exposure GROUP IX 3.9 3.7 30 o/ 1 Copyright Electronic Components, Assemblies & Materials Association Provided by IHS under license with ECA Licensee=IHS Employees/1111111001, User=Wing, Bernie Not for Resale, 03/30/2007 00:31:00 MDTNo reproduction or networking permitted without license from IHS -,-,-