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1、IEEE Std 1309-2005 (Revision of IEEE Std 1309-1996) IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz I E E E 3 Park Avenue New York, NY 10016-5997, USA 9 December 2005 IEEE Electromagnetic Compatibility Society Recognized as an Ameri
2、can National Standard (ANSI) The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2005 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 9 December 2005. Printed in the United States of America.
3、IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. NOTEAttention is called to the possibility that implementation of this standard ma
4、y require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents for which a license may be required by an
5、IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. Copyright 2005 IEEE. All rights reserved.iii Introduction This standard provides calibration methods for electromagnetic (EM) field sensors and probes, excluding antennas pe
6、r se, for the frequency range of 9 kHz to 40 GHz. The original version of this standard was devel- oped and released in 1996 in response to the electromagnetic compatibility (EMC) test and measurement communitys need for standard (consensus) methods of calibration for commonly used EM field sensors
7、and probes. This version of the standard provides updates to the original 1996 version to clarify items that some users may have found difficult to understand, to expand details and examples with respect to determining and expressing calibration uncertainty, and to present additional technical backg
8、round information. Also, this version includes calibration methods for specific field probes used for commercial electronic products radiated immunity testing and H-field probe calibrations applicable to ANSI C63.19 B1a testing. This standard provides calibration methods that are appropriate to vari
9、ous frequency ranges and user requirements. Methods for creating standard electric and magnetic fields used for calibration are presented. Because the specific calibration needs for a particular field probe or sensor depend on its intended use, a method to specify and communicate calibration require
10、ments is provided. This standard also provides details for determining and expressing calibration uncertainty. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/stan- dards.ieee.org/reading/ieee/updates/errata/index.html. Users are en
11、couraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject m
12、atter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patents or patent applications for which a license may be required to implem
13、ent an IEEE standard or for con- ducting inquiries into the legal validity or scope of those patents that are brought to its attention. Participants IEEE Std 1309-2005 revises IEEE Std 1309-1996 and was prepared by the Working Group for IEEE Std 1309, which is sponsored by the Standards Development
14、Committee of the IEEE Electromagnetic Compatibility Society. The following is a list of committee members and significant contributors. aNumbers in brackets correspond to the numbers of the bibliography in Annex J. This introduction is not part of IEEE Std 1309-2005, IEEE Standard for Calibration of
15、 Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9 kHz to 40 GHz. ivCopyright 2005 IEEE. All rights reserved. John G. Kraemer, Chair Edwin L. Bronaugh, Vice Chair David Baron, Secretary Tim Harrington, Technical Editor The following members of the individual balloting committee vo
16、ted on this standard. Balloters may have voted for approval, disapproval, or abstention. When the IEEE-SA Standards Board approved this standard on 9 June 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Judith Gorman, Secretary *Member Emeritus Also include
17、d are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Michael D. Fisher IEEE Standards Project Editor George Barth Dennis Camell Zhong Chen Leanna Ehler Domenico Festa Rick Flor
18、es Harry Gaul Bruce Harlacher Mike Howard Steve King Galen Koepke Dennis Lewis Wolfgang Muellner Richard Rogers Rick Stewart David Baron Stephen Berger Edwin Bronaugh Mark Bushnell Ernesto Garcia Tim Harrington Werner Hoelzl Daniel Hoolihan Efthymios Karabetsos John Kraemer Dennis Lewis Angela Notho
19、fer Werner Schaefer Gil Shultz Thomas Staria Donald Sweeney William Ward Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohl
20、a Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman Copyright 2005 IEEE. All rights reserved.v Contents 1.Overview 1 1.1 Scope 1 1.2 Purpose. 2 1.3 Background 2 1.4 Grades of calibration 2 1.5
21、 Generic probe types. 3 2.Normative references. 4 3.Definitions . 5 4.Measurement methods. 7 4.1 Calibration methods. 7 4.2 Field sensor or probe orientation during frequency domain calibration 8 4.2.1Directional and positional effects 8 4.2.2Calibration data collection. 8 4.3 Field probe or sensor
22、orientation during time domain calibration. 10 5.Standard field generation methods 10 6.Calibration uncertainty 12 6.1 Standard uncertainty . 12 6.2 Combined standard uncertainty. 13 6.3 Expanded uncertainty 13 6.4 Reporting uncertainty 13 7.Characteristics to be measured 13 7.1 Frequency domain cal
23、ibration parameters. 13 7.1.1Dynamic range and amplitude calibration levels. 13 7.1.2Frequency response 14 7.1.3Isotropy 14 7.1.4Response time (optional). 15 7.1.5Time constant (optional) 15 7.1.6Modulation (optional) 16 7.2 Time domain calibration parameters . 16 7.2.1Amplitude 16 7.2.2Dynamic rang
24、e. 17 7.2.3Rise time 17 7.2.4Fall time (droop) 17 7.2.5Overshoot and ringing . 17 8.Procedures (measurement techniques). 17 8.1 Transfer standard sensors and probes 18 8.2 Working standard sensors and probes . 18 8.3 Frequency domain calibration procedure 19 8.3.1Lead and cable effects 19 8.3.2Frequ
25、ency domain measurement procedures. 19 viCopyright 2005 IEEE. All rights reserved. 8.3.3Response time measurement procedure. 21 8.3.4Field sensor or probe time constant measurement procedure 22 8.4 Time domain calibration procedure. 22 8.4.1Amplitude 23 8.4.2Dynamic range and amplitude calibration l
26、evels. 23 8.4.3Rise time 23 8.4.4Fall time (droop) 23 8.4.5Overshoot and ringing . 24 9.Documentation 24 9.1 Proper documentation 24 9.2 Test documentation 24 9.3 Calibration interval 24 9.4 Out-of-tolerance notification . 24 9.5 Certification to client or end user 24 Annex A (normative) Grades of c
27、alibration 26 A.1Grades of calibration 26 A.1.1Calibration type 26 A.1.2Minimum number of frequencies (frequency response) 26 A.1.3Minimum number of field levels (dynamic range) 29 A.1.4Isotropy. 29 A.1.5Response time (optional) 30 A.1.6Time constant (optional) 31 A.1.7Modulation (optional) 31 A.1.8
28、Illumination (immersion) conditions 31 A.2Grades of calibration notation summary 31 A.3Application cautions and examples . 32 A.3.1Grades of calibration Example 1. 33 A.3.2Grades of calibration Example 2. 34 Annex B (normative) Field generation setups and calculation methods. 37 B.1Electric and magn
29、etic field generation using TEM cell, 9 kHz200 MHz 37 B.1.1TEM cell electrical characteristics 38 B.1.2Higher order modes and standing waves 39 B.1.3Probe sensor size with respect to plate separation . 40 B.1.4Power measurement stability . 40 B.1.5TEM cell operated with termination impedance differe
30、nt from 50 W. 41 B.1.6Absorber-loaded TEM cells. 41 B.2Magnetic field generation using Helmholtz coils, 9 kHz10 MHz. 41 B.2.1Introduction 41 B.2.2Axial field strength accuracy 42 B.2.3Coil radius and spacing error effects 43 B.2.4Coil current and turns errors. 43 B.2.5Calculating radial field streng
31、th. 44 B.2.6Determining coil size . 45 B.2.7Maximum frequency of operation 46 B.2.8Extending the upper frequency limit 48 B.2.9Effects of loading. 48 B.2.10 Summary 48 B.3Open-ended waveguide source in anechoic chamber, 200450 MHz. 49 Copyright 2005 IEEE. All rights reserved.vii B.4Pyramidal horn an
32、tenna source in anechoic chamber, 450 MHz40 GHz 50 B.4.1Standard transmitting antenna equations . 50 B.4.2Measurement of power delivered to a transmitting device . 50 B.4.3Standard field equations for horn antenna in anechoic chamber . 52 B.5Waveguide chamber, 100 MHz2.6 GHz 54 B.6GTEM cell, 9 kHz1
33、GHz. 55 B.7Parallel plate transmission line 56 B.8Conical transmission line. 58 B.9Cone and ground plane 58 Annex C (informative) Miscellaneous factors affecting probe calibration and use 60 C.1Cables. 60 C.2Other parameters 61 C.2.1Readout device sampling effects 61 Annex D (normative) Probe calibr
34、ations for typical commercial electronic products radiated immunity test setups . 62 D.1Introduction 62 D.2Probe or sensor calibration requirements. 62 D.2.1Calibration frequency range. 62 D.2.2Frequency steps 62 D.2.3Field strength 62 D.2.4Linearity check for probe or sensor 63 D.2.5Probe isotropic
35、 response. 64 D.3Requirements for probe calibration environments (i.e., FAR) 64 D.3.1Power amplifier harmonics and spurious signals 64 D.3.2FAR site validation tests . 65 D.4Probe or sensor calibration procedures 66 D.4.1Calibration test setup 67 D.4.2Calibration test procedures. 67 Annex E (normati
36、ve) H-field probe calibrations for ANSI C63.19 testing. 76 E.1Introduction 76 E.2Probe or sensor calibration requirements. 76 E.2.1Calibration frequency range. 76 E.2.2Frequency steps 76 E.2.3Field strength 76 E.2.4Linearity check for probe or sensor 77 E.2.5Probe isotropic response. 77 E.3Requireme
37、nts for probe calibration environments. 77 E.3.1Power amplifier harmonics and spurious signals 78 E.3.2GTEM cell validation tests 78 E.4Probe or sensor calibration procedures 79 E.4.1Calibration test setup 79 E.4.2Calibration test procedures. 79 Annex F (informative) Deconvolution 82 Annex G (inform
38、ative) Burst peak field measurements 84 Annex H (informative) Estimating uncertainty. 86 viiiCopyright 2005 IEEE. All rights reserved. H.1Standard uncertainty 86 H.1.1Type A (statistical method) 86 H.1.2Type B (other methods) 87 H.2Combined standard uncertainty. 88 H.3Expanded uncertainty 88 H.4Repo
39、rting uncertainty 89 H.5Additional uncertainty budget examples 90 Annex I (informative) Time domain pulse fidelity 94 Annex J (informative) Bibliography 96 Copyright 2005 IEEE. All rights reserved.1 IEEE Standard for Calibration of Electromagnetic Field Sensors and Probes, Excluding Antennas, from 9
40、 kHz to 40 GHz 1. Overview 1.1 Scope This standard provides calibration methods for electromagnetic (EM) field sensors and probes, excluding antennas per se, for the frequency range of 9 kHz to 40 GHz. Field injection probe (i.e., transmitting) cali- bration is not covered by this standard. This sta
41、ndard is not applicable to electromagnetic interference (EMI) emission measurement antennas, which have sometimes been referred to as probes, such as active and passive rod and loop antennas, generally used in the frequency range of 9 kHz to 30 MHz. Calibration of immersible and implantable probes f
42、or specific absorption rate (SAR) testing is not considered in this stan- dard; IEEE Std 1528-2003 B571 should be consulted for guidance on SAR probe calibrations. This standard provides various calibration methods that are appropriate to various frequency ranges and var- ious user requirements. The
43、se methods are applicable to any (e.g., active, passive, photonic) field sensor or probe. Methods are provided for frequency domain calibration and time domain (i.e., transient) calibration. Methods for creating standard electric and magnetic fields are described in Clause 5. Each method has calcula
44、ble field strengths and associated uncertainties. Each standard field method is individually addressed. The field generation information was obtained from IEEE Std 291-19912 and from IEEE Std C95.3- 2002, with additional information from sources listed in the bibliography.3 Further information on pr
45、obe calibration methods and applications guidance for frequencies below 100 kHz is given in IEEE PC95.3.1 B53, IEEE Std 1308-1994 B54, and IEEE Std 1460-1996 B55. Calibration methods for probes used for electronic-product radiated immunity testing in accordance with IEC 61000-4-3 B49 are 1Numbers in
46、 brackets correspond to the numbers of the bibliography in Annex J. 2Information about references can be found in Clause 2. 3For information purposes, it is noted that other documents describing probe calibrations have recently been developed or published. ISO Technical Report 10305-1 B57 describes
47、test setups similarly to IEEE Std 1309, but includes additional low-frequency setups. ISO Technical Report 10305-2 B58 is a direct adoption of IEEE Std 1309-1996. VDI/VDE/DGQ DKD 2622 Part 10 B120 describes frequency domain calibrations and measurement uncertainties using transverse electromagnetic
48、(TEM) and gigahertz transverse elec- tromagnetic (GTEM) cells. Finally, draft IEC 61000-4-33 B51 has a thorough description of setups and issues for time domain probe calibrations and use for EM pulse testing. IEEE Std 1309-2005IEEE STANDARD FOR CALIBRATION OF EM FIELD SENSORS AND PROBES 2Copyright
49、2005 IEEE. All rights reserved. described in Annex D. Calibration methods for probes used for testing near-fields of mobile telephones in accordance with ANSI Std C63.19-2001 B1 are described in Annex E. Most EM field measurements are made in the frequency domain, either at a single frequency or at a number of frequencies. The ever-increasing susceptibility of electronic circuits has awakened interest in transient EM phenomena such as electrostatic discharge (ESD), electromagnetic pulse (EMP), and system-generated transients, such as